|
|
| 25.141 | 0062 | 1 | F | 3.3.0 | R1999 | Annex explaining implemntation of Test tolerance to Tests |
R4-001002
| | RAN4-#14 | |
RP-000703
| approved | RAN-#10 | R4 | 3.4.0 | TEI |
|
|
|
| 25.141 | 0059 | - | F | 3.3.0 | R1999 | Test tolerance for Spectrum emission mask |
R4-001000
| agreed | RAN4-#14 | |
RP-000593
| approved | RAN-#10 | R4 | 3.4.0 | TEI |
|
|
|
| 25.141 | 0058 | - | F | 3.3.0 | R1999 | Test tolerance for Adjacent Channel Leakage Ratio |
R4-001000
| agreed | RAN4-#14 | |
RP-000593
| approved | RAN-#10 | R4 | 3.4.0 | TEI |
|
|
|
| 25.141 | 0057 | - | F | 3.3.0 | R1999 | Test tolerance for Base station output power |
R4-001000
| agreed | RAN4-#14 | |
RP-000593
| approved | RAN-#10 | R4 | 3.4.0 | TEI |
|
|
|
| 25.141 | 0056 | - | F | 3.3.0 | R1999 | Editorial correction to uplink reference channel for 2048kbps. |
R4-000964
| agreed | RAN4-#14 | |
RP-000592
| approved | RAN-#10 | R4 | 3.4.0 | TEI |
|
|
|
| 25.141 | 0055 | - | F | 3.3.0 | R1999 | Editorial corrections on TS25.141, sections for test conditions |
R4-000840
| agreed | RAN4-#14 | |
RP-000592
| approved | RAN-#10 | R4 | 3.4.0 | TEI |
|
|
|
| 25.141 | 0054 | - | F | 3.3.0 | R1999 | Total power dynamic range in 25.141 |
R4-000833
| agreed | RAN4-#14 | |
RP-000592
| approved | RAN-#10 | R4 | 3.4.0 | TEI |
|
|
|
| 25.141 | 0053 | - | F | 3.3.0 | R1999 | Corrections of values, references and structures of test cases |
R4-000989
| agreed | RAN4-#14 | |
RP-000592
| approved | RAN-#10 | R4 | 3.4.0 | TEI |
|
|
|
| 25.141 | 0052 | - | F | 3.3.0 | R1999 | Clarifications for EVM definition |
R4-000821
| agreed | RAN4-#14 | |
RP-000592
| approved | RAN-#10 | R4 | 3.4.0 | TEI |
|
|
|
| 25.141 | 0051 | - | F | 3.3.0 | R1999 | Clarifications for EVM and PCDE measurement with respect to inclusion of the SCH |
R4-000818
| agreed | RAN4-#14 | |
RP-000592
| approved | RAN-#10 | R4 | 3.4.0 | TEI |
|