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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.13310371F8.15.0Rel-8Correction of E-UTRAN TDD-TDD inter frequency handover test case in R8 Details R4-116152 agreedRAN4#61Huawei, HiSilicon Details RP-111681 approvedRAN#54R48.16.0TEI8
See details 36.1331036-F8.15.0Rel-8Thresholds and margins for RRM tests A.8.11.3 and A.8.11.4 Details R4-115632 agreedRAN4#61Anritsu Details RP-111680 approvedRAN#54R48.16.0LTE-RF
See details 36.1331029-F8.15.0Rel-8Correction for the identification time in DRX for UTRA TDD in R8 Details R4-115624 agreedRAN4#61Huawei, HiSilicon Details RP-111681 approvedRAN#54R48.16.0TEI8
See details 36.1330980-F8.15.0Rel-8Corrections of inter-frequency measurement accuracy RSRP test cases Details R4-114944 agreedRAN4#60-BISAnritsu Details RP-111681 approvedRAN#54R48.16.0TEI8