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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 34.121-11291-F9.2.0Rel-9Correction to Downlink Physical Channels in DC-HSDPA Tests Details R5-106861 agreedRAN5#49Rohde & Schwarz Details RP-101147 approvedRAN#50R59.3.0
See details 34.121-11290-F9.2.0Rel-9Introduction of Test tolerances for 9.3.1C (Periodically Varying Radio Conditions) Details R5-106839 agreedRAN5#49Rohde & Schwarz Details RP-101146 approvedRAN#50R59.3.0TEI8_Test
See details 34.121-11289-F9.2.0Rel-9Update of legacy HSDPA performance test cases for UE HS-DSCH Physical Layer category 25 to 28 Details R5-106837 agreedRAN5#49Ericsson, ST-Er... Details RP-101160 approvedRAN#50R59.3.0RANimp-DC_MIMO_...
See details 34.121-11288-F9.2.0Rel-9CR to 34.121-1: Correction to UTRA FDD - E-UTRA FDD cell re-selection (UTRA lower priority) test case Details R5-106813 agreedRAN5#49NTT DOCOMO Details RP-101138 approvedRAN#50R59.3.0LTE-UEConTest_RF
See details 34.121-11287-F9.2.0Rel-9Annex K update Details R5-106485 agreedRAN5#49AT4Wireless Details RP-101138 approvedRAN#50R59.3.0LTE-UEConTest_RF
See details 34.121-11286-F9.2.0Rel-9Maintenance of Band 20 for UTRAN RRM test cases Details R5-106436 agreedRAN5#49Ericsson, ST-Er... Details RP-101147 approvedRAN#50R59.3.0
See details 34.121-11285-F9.2.0Rel-9Removal of lower limit for humidity in normal conditions Details R5-106417 agreedRAN5#49Nokia Details RP-101134 approvedRAN#50R59.3.0TEI_Test
See details 34.121-11285-F9.2.0Rel-9Removal of lower limit for humidity in normal conditions Details R5-106417  RAN5#49Nokia Details RP-101133 approvedRAN#50R59.3.0TEI_Test
See details 34.121-11284-F9.2.0Rel-9Correction to MIMO propagation conditions Details R5-106416 agreedRAN5#49Nokia Details RP-101137 approvedRAN#50R59.3.0TEI7_Test
See details 34.121-11283-F9.2.0Rel-9Applicability change to TC 9.3.7A and 9.3.7B in TS 34.121-1 Details R5-106414 agreedRAN5#49Nokia Details RP-101146 approvedRAN#50R59.3.0TEI8_Test
See details 34.121-11282-F9.2.0Rel-9Addition of cell mapping table to Type 3i tests Details R5-106413 agreedRAN5#49Nokia Details RP-101146 approvedRAN#50R59.3.0TEI8_Test
See details 34.121-11281-F9.2.0Rel-9Adding Band XII, XIII and XIV operation info into out-of-band blocking test case Details R5-106412 agreedRAN5#49Nokia Details RP-101134 approvedRAN#50R59.3.0TEI_Test
See details 34.121-11281-F9.2.0Rel-9Adding Band XII, XIII and XIV operation info into out-of-band blocking test case Details R5-106412  RAN5#49Nokia Details RP-101133 approvedRAN#50R59.3.0TEI_Test
See details 34.121-11280-F9.2.0Rel-9Correction to references in out-of-sync tests 5.4.4 and 5.4.4A Details R5-106411 agreedRAN5#49Nokia Details RP-101134 approvedRAN#50R59.3.0TEI_Test
See details 34.121-11280-F9.2.0Rel-9Correction to references in out-of-sync tests 5.4.4 and 5.4.4A Details R5-106411  RAN5#49Nokia Details RP-101133 approvedRAN#50R59.3.0TEI_Test
See details 34.121-11279-F9.2.0Rel-9Correction to UE Relative Code Domain Power Accuracy requirements Details R5-106409 agreedRAN5#49Nokia Details RP-101137 approvedRAN#50R59.3.0TEI7_Test
See details 34.121-11278-F9.2.0Rel-9CR to 34.121-1: Correction to UTRA FDD - E-UTRA FDD cell re-selection (UTRA higher priority) test case Details R5-106251 agreedRAN5#49NTT DOCOMO Details RP-101138 approvedRAN#50R59.3.0LTE-UEConTest_RF
See details 34.121-11277-F9.2.0Rel-9Correction to RCDP E-DCH 16QAM Details R5-106199 agreedRAN5#49Agilent Technologies Details RP-101136 approvedRAN#50R59.3.0TEI6_Test
See details 34.121-11276-F9.2.0Rel-9Correction in Procedure Settings for test case 9.2.1G and corresponding Annex F.6.3 Details R5-106159 agreedRAN5#49Agilent Technologies Details RP-101137 approvedRAN#50R59.3.0TEI7_Test