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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.13318191F10.10.0Rel-10Rel. 10 CR on Pcell interruption due to Scell activation/deactivation for DRX case Details R4-132927 agreedRAN4#67Nokia Siemens N... Details RP-130766 approvedRAN#60R410.11.0LTE_CA-Core
See details 36.13318131F10.10.0Rel-10Adding clarification for begin and end of measurement GAP for Rel-10 Details R4-132923 agreedRAN4#67CATT Details RP-130765 approvedRAN#60R410.11.0TEI10
See details 36.13318051F10.10.0Rel-10Clarification for UE Rx-Tx with eICIC Details R4-133009 agreedRAN4#67Ericsson, ST-Er... Details RP-130765 approvedRAN#60R410.11.0eICIC_LTE-Perf
See details 36.13318001F10.10.0Rel-10CR on measurements without gaps Details R4-132951 agreedRAN4#67NTT DOCOMO Details RP-130767 approvedRAN#60R410.11.0LTE_CA-Perf
See details 36.13317891F10.10.0Rel-10Correction on fading propagation condition for CA inter-RAT test cases R10 Details R4-132956 agreedRAN4#67Huawei, HiSilicon Details RP-130761 approvedRAN#60R410.11.0LTE-RF
See details 36.1331785-F10.10.0Rel-10TDD Absolute and relative RSRQ accuracies for CA with 20MHz BW (Rel-10) Details R4-132361 agreedRAN4#67Alcatel-Lucent Details RP-130767 approvedRAN#60R410.11.0LTE_CA-Perf
See details 36.1331783-F10.10.0Rel-10FDD Absolute and relative RSRQ accuracies for CA with 20MHz BW (Rel-10) Details R4-132358 agreedRAN4#67Alcatel-Lucent Details RP-130767 approvedRAN#60R410.11.0LTE_CA-Perf
See details 36.13317811F10.10.0Rel-10Clarification of Pcell in 36.133 R10 Details R4-132930 agreedRAN4#67Huawei, HiSilicon Details RP-130761 approvedRAN#60R410.11.0LTE-RF
See details 36.1331779-F10.10.0Rel-10Modification of OCNG patterns of RRM test configuration for 20MHz R10 Details R4-132351 agreedRAN4#67Huawei, HiSilicon Details RP-130765 approvedRAN#60R410.11.0TEI10
See details 36.13317771F10.10.0Rel-10E-UTRAN TDD absolute and relative RSRP accuracies for 20MHz in CA R10 Details R4-132922 agreedRAN4#67Huawei, HiSilicon Details RP-130767 approvedRAN#60R410.11.0LTE_CA-Perf
See details 36.13317751F10.10.0Rel-10E-UTRAN FDD absolute and relative RSRP accuracies for 20MHz in CA R10 Details R4-132921 agreedRAN4#67Huawei, HiSilicon Details RP-130767 approvedRAN#60R410.11.0LTE_CA-Perf
See details 36.1331766-A10.10.0Rel-10Corrections of E-UTRAN FDD CSG Proximity Indication Test Case (Rel-10) Details R4-132156 agreedRAN4#67Alcatel-Lucent,... Details RP-130763 approvedRAN#60R410.11.0TEI9
See details 36.1331761-F10.10.0Rel-10Phase I CA 20 MHz Tests: Event triggered reporting on deactivating Scells in non-DRX Details R4-132147 agreedRAN4#67Ericsson, ST-Er... Details RP-130767 approvedRAN#60R410.11.0LTE_CA-Perf
See details 36.13317591F10.10.0Rel-10Additional corrections on inter-frequency RSTD test parameters (Rel-10) Details R4-132920 agreedRAN4#67Alcatel-Lucent,... Details RP-130763 approvedRAN#60R410.11.0LCS_LTE
See details 36.1331757-A10.10.0Rel-10Additional corrections on intra-frequency RSTD test parameters (Rel-10) Details R4-132087 agreedRAN4#67Alcatel-Lucent,... Details RP-130763 approvedRAN#60R410.11.0LCS_LTE
See details 36.1331754-A10.10.0Rel-10Neighbour list for Test cases A.8.5.4, A.8.7.4, A.8.9.2 Details R4-132078 agreedRAN4#67Anritsu Details RP-130763 approvedRAN#60R410.11.0LTE-RF
See details 36.1331751-A10.10.0Rel-10GSM cell list size for Test Cases A.6.3.10, A.6.3.11 Details R4-132075 agreedRAN4#67Anritsu Details RP-130763 approvedRAN#60R410.11.0LTE-RF
See details 36.1331748-A10.10.0Rel-10TDD PRACH configuration index for Test Cases A.8.7.2, A.8.15.2 Details R4-132072 agreedRAN4#67Anritsu Details RP-130761 approvedRAN#60R410.11.0LTE-RF
See details 36.1331743-A10.10.0Rel-10RRM: Adding required measurement gap Details R4-132067 agreedRAN4#67Rohde & Schwarz Details RP-130763 approvedRAN#60R410.11.0LTE-RF
See details 36.1331742-A10.10.0Rel-10Time Alignment Timer in Test Case A.8.2.4 Details R4-132066 agreedRAN4#67Anritsu Details RP-130763 approvedRAN#60R410.11.0LTE-RF
See details 36.13317221F10.10.0Rel-10Impact of REFSENS requirements on the core specification Details R4-131944 agreedRAN4#66-BISEricsson, ST-Er... Details RP-130766 approvedRAN#60R410.11.0LTE_CA-Core
See details 36.13317201F10.10.0Rel-10Clarification on supported bandwidth combinations in RSTD requirements with CA Details R4-131884 agreedRAN4#66-BISEricsson, ST-Er... Details RP-130765 approvedRAN#60R410.11.0TEI10
See details 36.13317171F10.10.0Rel-10SCell Activation Delay Requirements in CA Details R4-131965 agreedRAN4#66-BISEricsson, ST-Er... Details RP-130766 approvedRAN#60R410.11.0LTE_CA-Core
See details 36.1331715-A10.10.0Rel-10Editorial corrections in RSTD requirements Details R4-131562 agreedRAN4#66-BISEricsson, ST-Er... Details RP-130763 approvedRAN#60R410.11.0TEI9
See details 36.1331705-A10.10.0Rel-10Section numbering correction Details R4-131529 agreedRAN4#66-BISEricsson, ST-Er... Details RP-130761 approvedRAN#60R410.11.0TEI8
See details 36.1331701-F10.10.0Rel-10Editorial corrections RRM Details R4-131517 agreedRAN4#66-BISEricsson, ST-Er... Details RP-130765 approvedRAN#60R410.11.0TEI10
See details 36.1331695-F10.10.0Rel-10Reference measurement channels for 20 MHz Tests Details R4-131476 agreedRAN4#66-BISEricsson, ST-Er... Details RP-130767 approvedRAN#60R410.11.0LTE_CA-Perf
See details 36.1331693-F10.10.0Rel-10Testing of CA tests with multiple BW combinations Details R4-131466 agreedRAN4#66-BISEricsson, ST-Er... Details RP-130767 approvedRAN#60R410.11.0LTE_CA-Perf
See details 36.1331691-A10.10.0Rel-10sr-ConfigIndex in TDD-FDD Inter-frequency event triggered DRX Test case A.8.14.2 Details R4-131402 agreedRAN4#66-BISAnritsu Details RP-130763 approvedRAN#60R410.11.0LTE-RF
See details 36.1331682-A10.10.0Rel-10Update on the GSM carrier RSSI measurement period when DRX is used Details R4-131289 agreedRAN4#66-BISResearch In Mot... Details RP-130761 approvedRAN#60R410.11.0TEI8
See details 36.13316781F10.10.0Rel-10RSRP, RSRQ RRM eICIC Test case cleanup Details R4-131858 agreedRAN4#66-BISAnritsu Details RP-130765 approvedRAN#60R410.11.0eICIC_LTE-Perf
See details 36.1331676-A10.10.0Rel-10Cell 1 levels for RSRP Test cases A.9.1.3 and A.9.1.4 Details R4-131278 agreedRAN4#66-BISAnritsu Details RP-130761 approvedRAN#60R410.11.0LTE-RF
See details 36.1331672-A10.10.0Rel-10Remove [ ] from GCI identification Test cases A.8.4.4 and A.8.4.5 Details R4-131263 agreedRAN4#66-BISAnritsu Details RP-130763 approvedRAN#60R410.11.0LTE-RF
See details 36.13316672F10.10.0Rel-10Corrections on RSTD measurement test cases (Rel-10) Details R4-132081 agreedRAN4#67Alcatel-Lucent,... Details RP-130763 approvedRAN#60R410.11.0LCS_LTE
See details 36.13316581F10.10.0Rel-10RRM test configurations for 20MHz R10 Details R4-131878 agreedRAN4#66-BISHuawei, HiSilicon Details RP-130765 approvedRAN#60R410.11.0LTE-RF
See details 36.1331656-F10.10.0Rel-10Clarification on inter-frequency RSTD measurement accuracy requirement R10 Details R4-131125 agreedRAN4#66-BISHuawei, HiSilic... Details RP-130763 approvedRAN#60R410.11.0LCS_LTE
See details 36.1331647-A10.10.0Rel-10Correction to test parameters for combined E-UTRA - E-UTRA and GSM cell search - Rel 10 Details R4-131042 agreedRAN4#66-BISRohde & Schwarz Details RP-130763 approvedRAN#60R410.11.0LTE-RF