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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1331380-F10.6.0Rel-10On UE behavior in the uplink subframe after measurement GAP Details R4-123440 agreedRAN4#63CATT, Ericsson,... Details RP-120781 approvedRAN#56R410.7.0TEI10
See details 36.1331375-F10.6.0Rel-10PRS bandwidth in RSTD accuracy requirements Details R4-123069 agreedRAN4#63Ericsson, ST-Er... Details RP-120781 approvedRAN#56R410.7.0TEI10
See details 36.1331367-F10.6.0Rel-10OCNG correction in Phase I eICIC test cases Details R4-123042 agreedRAN4#63Ericsson, ST-Er... Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.13313652B10.6.0Rel-10Phase IIbis eICIC TDD absolute and relative RSRP accuracy with MBSFN ABS Details R4-123646 agreedRAN4#63Ericsson, ST-Er... Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.13313622B10.6.0Rel-10Phase IIbis eICIC FDD absolute and relative RSRP accuracy with MBSFN ABS Details R4-123644 agreedRAN4#63Ericsson, ST-Er... Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.13313602A10.6.0Rel-10Correction of a timer period in inter-frequency measurement tests Details R4-123579 agreedRAN4#63Ericsson, ST-Er... Details RP-120766 approvedRAN#56R410.7.0TEI8
See details 36.13313581A10.6.0Rel-10UL Transmit Timing Requirements Details R4-123641 agreedRAN4#63Renesas Mobile ... Details RP-120764 approvedRAN#56R410.7.0LTE-RF
See details 36.1331353-F10.6.0Rel-10Editorial corrections Details R4-123024 agreedRAN4#63Ericsson, ST-Er... Details RP-120780 approvedRAN#56R410.7.0TEI10
See details 36.13313461F10.6.0Rel-10Clarification for cell identification condition in inter-RAT SI reading requirement R10 Details R4-123559 agreedRAN4#63Huawei, HiSilicon Details RP-120777 approvedRAN#56R410.7.0TEI10
See details 36.13313431F10.6.0Rel-10Add Band 25 Io values R10 Details R4-123442 agreedRAN4#63Huawei, HiSilicon Details RP-120777 approvedRAN#56R410.7.0TEI10
See details 36.1331341-F10.6.0Rel-10Correction to RSTD measurement reporting delay requirement in CA R10 Details R4-122875 agreedRAN4#63Huawei, HiSilicon Details RP-120779 approvedRAN#56R410.7.0TEI10
See details 36.1331335-A10.6.0Rel-10Correction to E-UTRAN TDD redirection to UTRAN FDD test configuration R10 Details R4-122861 agreedRAN4#63Huawei, HiSilicon Details RP-120770 approvedRAN#56R410.7.0TEI9
See details 36.13313341F10.6.0Rel-10TDD CA RSTD Measurement Reporting Delay Test Case (Rel-10) Details R4-123471 agreedRAN4#63Alcatel-Lucent, LGE Details RP-120782 approvedRAN#56R410.7.0TEI10
See details 36.13313331F10.6.0Rel-10FDD CA RSTD Measurement Reporting Delay Test Case (Rel-10) Details R4-123469 agreedRAN4#63Alcatel-Lucent, LGE Details RP-120780 approvedRAN#56R410.7.0TEI10
See details 36.13313301A10.6.0Rel-10Correction to E-UTRAN FDD/TDD - UTRAN FDD /TDD enhanced cell identification test case R10 Details R4-123466 agreedRAN4#63Huawei, HiSilicon Details RP-120769 approvedRAN#56R410.7.0TEI9
See details 36.1331327-F10.6.0Rel-10Correction to RLM requirements in eICIC with Autonomous gaps R10 Details R4-122842 agreedRAN4#63Huawei, HiSilicon Details RP-120779 approvedRAN#56R410.7.0TEI10
See details 36.13313211F10.6.0Rel-10Addition of E-UTRAN TDD RSTD measurement accuracy test case in carrier aggregation R10 Details R4-123557 agreedRAN4#63Huawei, HiSilicon Details RP-120777 approvedRAN#56R410.7.0TEI10
See details 36.13313191F10.6.0Rel-10Addition of E-UTRAN FDD RSTD measurement accuracy test case in carrier aggregation R10 Details R4-123555 agreedRAN4#63Huawei, HiSilicon Details RP-120777 approvedRAN#56R410.7.0TEI10
See details 36.1331309-F10.6.0Rel-10Inter-frequency and Inter-RAT Requirements for Measurements without Measurement Gaps Details R4-122654 agreedRAN4#63Ericsson, ST-Er... Details RP-120781 approvedRAN#56R410.7.0TEI10
See details 36.13313051F10.6.0Rel-10In-Sync RLM test case in MBSFN ABS for E-UTRAN TDD R10 Details R4-123459 agreedRAN4#63Huawei, HiSilicon Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.13313001F10.6.0Rel-10In-Sync RLM test case in MBSFN ABS for E-UTRAN FDD R10 Details R4-123457 agreedRAN4#63Huawei, HiSilicon Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.13312982F10.6.0Rel-10CR on TDD RSRQ test case under Time Domain Measurement Resource Restriction with MBSFN ABS Rel10 Details R4-123648 agreedRAN4#63LG Electronics Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.13312921F10.6.0Rel-10Clarification on the number of monitoring layers for CA UEs Details R4-123479 agreedRAN4#63NTT DOCOMO Details RP-120773 approvedRAN#56R410.7.0LTE_CA-Core
See details 36.13312871F10.6.0Rel-10eICIC TDD out-of-sync RLM test case in MBSFN ABS Details R4-123453 agreedRAN4#63NTT DOCOMO Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.13312851F10.6.0Rel-10eICIC FDD out-of-sync RLM test case in MBSFN ABS Details R4-123451 agreedRAN4#63NTT DOCOMO Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.13312782F10.6.0Rel-10Intra-Frequency FDD RSRQ Accuracy under Time Domain Measurement Resource Restriction with MBSFN ABS Details R4-123650 agreedRAN4#63ZTE Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.13312761A10.6.0Rel-10RRM: Clarifications to the OCNG patterns Details R4-123572 agreedRAN4#63Rohde & Schwarz Details RP-120764 approvedRAN#56R410.7.0LTE-RF
See details 36.1331272-F10.6.0Rel-10Remove [ ] from eICIC RSRP, RSRQ Es/Iot side conditions Details R4-122254 agreedRAN4#63Anritsu Details RP-120782 approvedRAN#56R410.7.0TEI10
See details 36.1331270-A10.6.0Rel-10sr-ConfigIndex in TDD DRX test cases Details R4-122252 agreedRAN4#63Anritsu Details RP-120767 approvedRAN#56R410.7.0TEI8
See details 36.1331260-B10.6.0Rel-10Clarification on UE Rx-Tx with eICIC Details R4-122173 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120772 approvedRAN#56R410.7.0eICIC_LTE-Core
See details 36.1331259-F10.6.0Rel-10Bands 22, 23, 42 and 43 side conditions for inter-frequency measurements with autonomous gaps Details R4-122035 agreedRAN4#62-BISAnritsu Details RP-120777 approvedRAN#56R410.7.0TEI10
See details 36.1331250-F10.6.0Rel-10CR for 36.133: Aligning RSRQ measurement requirements in TS 36.133 with TS 36.101 regarding the modification of B41 REFSENS Details R4-121898 agreedRAN4#62-BISClearwire, Huaw... Details RP-120779 approvedRAN#56R410.7.0TEI10
See details 36.1331248-F10.6.0Rel-10RLM requirements with autonomous gaps for DRX Details R4-121756 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.13312421B10.6.0Rel-10Phase II eICIC TDD: absolute and relative RSRP accuracies in non-MBSFN ABS Details R4-122170 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.13312401B10.6.0Rel-10Phase II eICIC FDD: absolute and relative RSRP accuracies in non-MBSFN ABS Details R4-122168 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.1331238-F10.6.0Rel-10Cell identification requirements with DRX Details R4-121735 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.13312361F10.6.0Rel-10Reporting criteria requirements for carrier aggregation Details R4-122175 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120782 approvedRAN#56R410.7.0TEI10
See details 36.1331234-F10.6.0Rel-10Editorial corrections Details R4-121730 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120780 approvedRAN#56R410.7.0TEI10
See details 36.1331232-B10.6.0Rel-10No interruptions on PCell at SCell activation/ deactivation when measCycleSCell is smaller than 640 ms Details R4-121677 agreedRAN4#62-BISNTT DOCOMO Details RP-120781 approvedRAN#56R410.7.0TEI10
See details 36.1331229-A10.6.0Rel-10E-UTRAN FDD to UTRAN FDD RRC connection release with redirection test case when SI is not provided Details R4-121659 agreedRAN4#62-BISNTT DOCOMO, Hua... Details RP-120770 approvedRAN#56R410.7.0TEI9
See details 36.13312261A10.6.0Rel-10Finalization of Rel.9 cell reselection enhancement related test cases Details R4-122160 agreedRAN4#62-BISNTT DOCOMO Details RP-120770 approvedRAN#56R410.7.0TEI9
See details 36.1331222-F10.6.0Rel-10Test case for event-triggered reporting on deactivated SCell with PCell interruption Details R4-121526 agreedRAN4#62-BISCATT, Ericsson,... Details RP-120773 approvedRAN#56R410.7.0LTE_CA-Perf
See details 36.1331212-F10.6.0Rel-10CR to TS36.133 Corrections on RRC signalling in RLM test cases for eICIC Details R4-121287 agreedRAN4#62-BISZTE Details RP-120780 approvedRAN#56R410.7.0TEI10
See details 36.13312061F10.6.0Rel-10TDD RSRQ under Time Domain Measurement Resource Restriction with Non-MBSFN ABS R10 Details R4-122166 agreedRAN4#62-BISHuawei, HiSilicon Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.13312041F10.6.0Rel-10FDD RSRQ under Time Domain Measurement Resource Restriction with Non-MBSFN ABS R10 Details R4-122164 agreedRAN4#62-BISHuawei, HiSilicon Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.1331200-A10.6.0Rel-10E-UTRA TDD RRC connection release redirection to UTRA FDD test without SI provided R10 Details R4-121252 agreedRAN4#62-BISHuawei, HiSilic... Details RP-120770 approvedRAN#56R410.7.0TEI9
See details 36.13311971A10.6.0Rel-10Addition of E-UTRAN TDD-CDMA2000 1X event triggered reporting under fading propagation conditions test case R10 Details R4-122158 agreedRAN4#62-BISHuawei, HiSilic... Details RP-120769 approvedRAN#56R410.7.0TEI9
See details 36.13311941F10.6.0Rel-10Addition of E-UTRAN TDD-HRPD event triggered reporting under fading propagation conditions test case R10 Details R4-122155 agreedRAN4#62-BISHuawei, HiSilic... Details RP-120777 approvedRAN#56R410.7.0TEI10
See details 36.1331191-A10.6.0Rel-10Addition of E-UTRAN FDD - TDD Inter-frequency identification of a new CGI of E-UTRA cell using autonomous gaps test case R10 Details R4-121240 agreedRAN4#62-BISHuawei, HiSilic... Details RP-120769 approvedRAN#56R410.7.0TEI9
See details 36.1331188-A10.6.0Rel-10Addition of E-UTRAN FDD-TDD Inter-frequency event triggered reporting when DRX is used under fading propagation conditions in asynchronous cells R10 Details R4-121237 agreedRAN4#62-BISHuawei, HiSilic... Details RP-120769 approvedRAN#56R410.7.0TEI9
See details 36.1331185-A10.6.0Rel-10Addition of E-UTRAN TDD - FDD Inter-frequency identification of a new CGI of E-UTRA cell using autonomous gaps test case R10 Details R4-121234 agreedRAN4#62-BISHuawei, HiSilic... Details RP-120769 approvedRAN#56R410.7.0TEI9
See details 36.1331182-A10.6.0Rel-10Addition of E-UTRAN TDD-FDD Inter-frequency event triggered reporting when DRX is used under fading propagation conditions in asynchronous cells test case R10 Details R4-121231 agreedRAN4#62-BISHuawei, HiSilic... Details RP-120769 approvedRAN#56R410.7.0TEI9
See details 36.1331175-B10.6.0Rel-10OCNG Patterns for MBSFN ABS Details R4-121191 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120784 approvedRAN#56R410.7.0eICIC_LTE-Perf
See details 36.1331173-A10.6.0Rel-10RRC Connection Release with Redirection from E-UTRAN TDD to GERAN without System Information Details R4-121186 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120771 approvedRAN#56R410.7.0TEI9
See details 36.1331170-A10.6.0Rel-10RRC Connection Release with Redirection from E-UTRAN FDD to GERAN without System Information Details R4-121183 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120771 approvedRAN#56R410.7.0TEI9
See details 36.1331167-A10.6.0Rel-10OCNG and PDSCH for FDD-TDD event triggered reporting test cases Details R4-121180 agreedRAN4#62-BISAnritsu Details RP-120771 approvedRAN#56R410.7.0TEI9
See details 36.13311641A10.6.0Rel-10Corrections to FDD-TDD Inter-freq RSRP measurement accuracy test case parameters Details R4-122054 agreedRAN4#62-BISAnritsu Details RP-120770 approvedRAN#56R410.7.0TEI9
See details 36.1331161-F10.6.0Rel-10Resolve Band 41 omission between R4-120125 and R4-121106 Details R4-121173 agreedRAN4#62-BISAnritsu Details RP-120782 approvedRAN#56R410.7.0TEI10