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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1332526-A11.9.0Rel-11Tolerance levels for measurements on UTRAN Details R4-145342 agreedRAN4#72Qualcomm Incorp... Details RP-141526 approvedRAN#65R411.10.0TEI9
See details 36.1332473-F11.9.0Rel-11Correction to periodicity of ABS pattern in feICIC RRM test cases Details R4-144437 agreedRAN4#72Anritsu Details RP-141530 approvedRAN#65R411.10.0eICIC_enh_LTE-Perf
See details 36.1332456-A11.9.0Rel-11Clarification to RSTD CA Reporting Delay tests Details R4-144207 agreedRAN4#72Spirent Communi... Details RP-141532 approvedRAN#65R411.10.0TEI11
See details 36.13324531F11.9.0Rel-11Correction of values in RSTD tests Details R4-145338 agreedRAN4#72Spirent Communi... Details RP-141532 approvedRAN#65R411.10.0TEI11