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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1332744-F11.10.0Rel-11Requirements for multicarrier handover from EUTRA to UTRA Details R4-146621 agreedRAN4#72-BISEricsson Details RP-142150 approvedRAN#66R411.11.0TEI11 2G
See details 36.13327391F11.10.0Rel-11Test case for inter-RAT HO to multicarrier UTRA Details R4-147833 agreedRAN4#73Ericsson Details RP-142149 approvedRAN#66R411.11.0TEI11
See details 36.1332737-F11.10.0Rel-11Corrections to E-UTRAN TDD RLM Out-of-sync under Time Domain Measurement Resource Restriction with CRS Assistance Information Details R4-147793 agreedRAN4#73ZTE, Anritsu Details RP-142149 approvedRAN#66R411.11.0TEI11
See details 36.1332735-F11.10.0Rel-11Corrections to E-UTRAN TDD RLM In-sync under Time Domain Measurement Resource Restriction with CRS assistance information Details R4-147791 agreedRAN4#73ZTE, Anritsu Details RP-142149 approvedRAN#66R411.11.0TEI11
See details 36.13327041F11.10.0Rel-11Introduction of UE requirements for PCell interruptions (Rel-11) Details R4-147832 agreedRAN4#73Nokia Networks,... Details RP-142149 approvedRAN#66R411.11.0LTE_CA-Core, TEI11
See details 36.1332702-A11.10.0Rel-11CR on PRS Signal Levels in RSTD Reporting Tests for Carrier Aggregation Details R4-147377 agreedRAN4#73Spirent Communi... Details RP-142144 approvedRAN#66R411.11.0TEI10
See details 36.1332685-A11.10.0Rel-11Correction on CA test cases in R11 Details R4-147207 agreedRAN4#73Huawei, HiSilicon Details RP-142144 approvedRAN#66R411.11.0LTE_CA-Perf
See details 36.1332655-A11.10.0Rel-11Correction to RSTD Intra Frequency Delay Test Case Details R4-147018 agreedRAN4#73Samsung Details RP-142144 approvedRAN#66R411.11.0TEI10
See details 36.1332643-A11.10.0Rel-11Clarifications to RSTD values Details R4-146853 agreedRAN4#73Spirent Communi... Details RP-142144 approvedRAN#66R411.11.0TEI10
See details 36.1332638-A11.10.0Rel-11Changes to RSTD CA Reporting Delay tests Details R4-146629 agreedRAN4#72-BISSpirent Communi... Details RP-142144 approvedRAN#66R411.11.0TEI10
See details 36.1332596-F11.10.0Rel-11Correction on Io value in CA 20MHz RSRQ test case R11 Details R4-146058 agreedRAN4#72-BISHuawei, HiSilicon Details RP-142147 approvedRAN#66R411.11.0LTE_CA-Perf
See details 36.1332568-A11.10.0Rel-11SCell activation and deactivation delay test case for unknown SCell R11 Details R4-145989 agreedRAN4#72-BISHuawei, HiSilic... Details RP-142144 approvedRAN#66R411.11.0LTE_CA-Perf
See details 36.1332565-F11.10.0Rel-11Correction to ABS pattern and CRS Es/Iot in feICIC RRM test cases Details R4-145986 agreedRAN4#72-BISAnritsu Details RP-142147 approvedRAN#66R411.11.0eICIC_enh_LTE-Perf
See details 36.13325521A11.10.0Rel-11Clarification on time to identify the target UTRA TDD cell for blind redirection from E-UTRA to UTRA TDD Details R4-146612 agreedRAN4#72-BISRAN4 Details RP-142144 approvedRAN#66R411.11.0TEI10
See details 36.1332537-A11.10.0Rel-11Correction of Es/Noc values in inter-frequency RSTD tests Details R4-145607 agreedRAN4#72-BISSpirent Communi... Details RP-142144 approvedRAN#66R411.11.0TEI10
See details 36.1332533-A11.10.0Rel-11Correction of PRS Signal Levels in RSTD Reporting Tests Details R4-145596 agreedRAN4#72-BISQualcomm Incorp... Details RP-142143 approvedRAN#66R411.11.0LCS_LTE