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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1332444-F11.8.0Rel-11Removing square brackets in FeICIC test cases Details R4-143800 agreedRAN4#71Ericsson Details RP-140918 approvedRAN#64R411.9.0TEI11
See details 36.1332421-A11.8.0Rel-11Clean up the correction on PDSCH allocation in PRS subframe R11 Details R4-143302 agreedRAN4#71Huawei, HiSilicon Details RP-140911 approvedRAN#64R411.9.0LTE-RF
See details 36.1332414-F11.8.0Rel-11Correction to PCI configuration conditions in FeICIC tests R11 Details R4-143275 agreedRAN4#71Huawei, HiSilicon Details RP-140914 approvedRAN#64R411.9.0eICIC_enh_LTE-Perf
See details 36.1332381-A11.8.0Rel-11RRM: Remove square brackets from eICIC RLM test requirement (Rel-11) Details R4-142817 agreedRAN4#71Rohde & Schwarz Details RP-140911 approvedRAN#64R411.9.0eICIC_LTE-Perf
See details 36.1332378-A11.8.0Rel-11Correction to periodicity of ABS pattern in eICIC RRM test cases Details R4-142801 agreedRAN4#71Anritsu Details RP-140911 approvedRAN#64R411.9.0eICIC_LTE-Perf
See details 36.13323651A11.8.0Rel-11SCell activation and deactivation delay test case for known SCell    Details RP-140742 approvedRAN#64Ericsson, CATT, ALU11.9.0LTE_CA-Core
See details 36.1332363-F11.8.0Rel-11Clean up for Band 29 Details R4-142281 agreedRAN4#70-BISEricsson Details RP-140918 approvedRAN#64R411.9.0TEI11
See details 36.1332359-A11.8.0Rel-11Test case corrections for eICIC Details R4-142257 agreedRAN4#70-BISEricsson, Intel Details RP-140911 approvedRAN#64R411.9.0eICIC_LTE-Core
See details 36.13323561F11.8.0Rel-11Editorial corrections RRM Details R4-142377 agreedRAN4#70-BISEricsson Details RP-140918 approvedRAN#64R411.9.0TEI11
See details 36.1332352-A11.8.0Rel-11RSTD inter-frequency requirements applicability Details R4-142241 agreedRAN4#70-BISEricsson Details RP-140910 approvedRAN#64R411.9.0LCS_LTE
See details 36.1332337-F11.8.0Rel-11CQI feedback periodicity correction for RLM in eICIC/FeICIC test setup Details R4-142038 agreedRAN4#70-BISEricsson Details RP-140914 approvedRAN#64R411.9.0eICIC_enh_LTE-Core
See details 36.1332318-A11.8.0Rel-11Clarification on E-UTRAN TDD - UE Timing Advance Adjustment Accuracy Test R11 Details R4-141658 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140911 approvedRAN#64R411.9.0LTE-RF
See details 36.1332314-F11.8.0Rel-11Correction for OCNG pattern number in RRM tests R11 Details R4-141651 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140911 approvedRAN#64R411.9.0LTE-RF
See details 36.13323111F11.8.0Rel-11Clarification on UE Transmit Timing Accuracy test cases in DRX mode R11 Details R4-142372 agreedRAN4#70-BISHuawei, HiSilic... Details RP-140910 approvedRAN#64R411.9.0LTE-RF
See details 36.1332301-A11.8.0Rel-11Introduce the CGI reading requirements in CA R11 Details R4-141629 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140911 approvedRAN#64R411.9.0LTE-RF
See details 36.1332277-A11.8.0Rel-11Removing DPCH for handover from E-UTRAN to UTRA TDD for Rel-11 Details R4-141418 agreedRAN4#70-BISCATT, Ericsson Details RP-140911 approvedRAN#64R411.9.0LTE_CA-Core
See details 36.1332266-A11.8.0Rel-11RRM: Clean-up of time offset between cells in RSTD tests (Rel-11) Details R4-141272 agreedRAN4#70-BISRohde & Schwarz Details RP-140910 approvedRAN#64R411.9.0LCS_LTE