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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1332818-F11.11.0Rel-1136.133 CR to change CPICH Ec/No to CPICH Ec/Io in EUTRA FDD to UTRA FDD HO test cases Details R4-150921 agreedRAN4#74Qualcomm Inc. Details RP-150384 approvedRAN#67R411.12.0TEI11
See details 36.1332807-F11.11.0Rel-11UE Behaviour after Measurement Gap Details R4-150652 agreedRAN4#74Ericsson Details RP-150384 approvedRAN#67R411.12.0TEI11
See details 36.1332802-A11.11.0Rel-11Correction of RMC and OCNG pattern in event triggered tests without measurement gap Details R4-150617 agreedRAN4#74Rohde & Schwarz Details RP-150382 approvedRAN#67R411.12.0TEI10
See details 36.1332790-F11.11.0Rel-11CR on typo of referencing section name in CA measurements Details R4-150491 agreedRAN4#74LG Electronics Details RP-150384 approvedRAN#67R411.12.0TEI11
See details 36.1332784-F11.11.0Rel-11Time-domain measurement resource restriction pattern for serving cell in feICIC RSRP and RSRQ test cases Details R4-150457 agreedRAN4#74Anritsu Details RP-150384 approvedRAN#67R411.12.0eICIC_enh_LTE-Perf
See details 36.13327531A11.11.0Rel-11Maximum allowed layers for multiple monitoring for CA    Details RP-150065 approvedRAN#67Alcatel-Lucent,...11.12.0LTE_CA-Core
See details 36.1332749-A11.11.0Rel-11Remove incorrect note from CA RSTD Accuracy tests Details R4-150015 agreedRAN4#74Spirent Communi... Details RP-150382 approvedRAN#67R411.12.0TEI10
See details 36.1332746-F11.11.0Rel-11CR to Correct Implementation Errors in Intra-Frequency RSTD Measurement Reporting Delay Test Cases Details R4-150008 agreedRAN4#74Spirent Communi... Details RP-150384 approvedRAN#67R411.12.0TEI11