• Specification number WG Status
    select
    Meeting
    Target Release
    select
    TSG Status
    select
    Work Item
    Entities
Data pager
Data pager
1
Page size:
PageSizeComboBox
select
 31 items in 1 pages
 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1332157-A12.1.0Rel-12Correction to interference clarification in FeICIC requirements Details R4-136661 agreedRAN4#69Ericsson Details RP-131931 approvedRAN#62R412.2.0eICIC_enh_LTE-Core
See details 36.1332155-A12.1.0Rel-12Correction in RSTD test cases Details R4-136644 agreedRAN4#69Ericsson Details RP-131925 approvedRAN#62R412.2.0LCS_LTE
See details 36.1332151-A12.1.0Rel-12Correction to MTA requirements Details R4-136634 agreedRAN4#69Ericsson Details RP-131939 approvedRAN#62R412.2.0LTE_CA
See details 36.1332145-A12.1.0Rel-12Applying band simplification Details R4-136604 agreedRAN4#69Ericsson Details RP-131939 approvedRAN#62R412.2.0TEI11
See details 36.1332143-A12.1.0Rel-12Editorial corrections RRM Details R4-136602 agreedRAN4#69Ericsson Details RP-131927 approvedRAN#62R412.2.0TEI10
See details 36.1332135-A12.1.0Rel-12CSI Reporting in SCell Activation Requirements Details R4-136546 agreedRAN4#69Ericsson, Huawe... Details RP-131928 approvedRAN#62R412.2.0LTE_CA-Core
See details 36.1332129-F12.1.0Rel-12Correction on RMC pattern for 5MHz UE Transmit Timing Accuracy Tests Details R4-136401 agreedRAN4#69Huawei, HiSilicon Details RP-131967 approvedRAN#62R412.2.0LTE-RF
See details 36.1332123-A12.1.0Rel-12Remove the brackets of SNR values in RLM test cases in FeICIC R12 Details R4-136322 agreedRAN4#69Huawei, HiSilicon Details RP-131936 approvedRAN#62R412.2.0eICIC_enh_LTE-Perf
See details 36.1332111-A12.1.0Rel-12Corrections to CGI Reading in Autonomous Gap Details R4-136144 agreedRAN4#69Qualcomm Incorp... Details RP-131925 approvedRAN#62R412.2.0EHNB-RAN2
See details 36.13321061F12.1.0Rel-12Bands applicability in RSRP, RSRQ FDD-FDD Inter frequency tests for 5MHz Bandwidth Details R4-136912 agreedRAN4#69Anritsu Details RP-131942 approvedRAN#62R412.2.0LTE450_Brazil-Perf
See details 36.1332104-A12.1.0Rel-12Correction to Test cases A.9.2.9 and A.9.2.10 Details R4-136055 agreedRAN4#69Anritsu Details RP-131926 approvedRAN#62R412.2.0eICIC_LTE-Perf
See details 36.13320971A12.1.0Rel-12Correct ABS pattern for FeICIC for In-sync with MBSFN ABS for Rel. 12 Details R4-135602 agreedRAN4#68-BISQualcomm Incorp... Details RP-131936 approvedRAN#62R412.2.0eICIC_enh_LTE-Perf
See details 36.1332095-A12.1.0Rel-12Correction in cell search FeICIC test cases Details R4-135521 agreedRAN4#68-BISEricsson Details RP-131931 approvedRAN#62R412.2.0eICIC_enh_LTE-Core
See details 36.1332091-A12.1.0Rel-12Requirements clarification under different BWs in FeICIC Details R4-135507 agreedRAN4#68-BISEricsson, US Ce... Details RP-131931 approvedRAN#62R412.2.0eICIC_enh_LTE-Core
See details 36.13320841A12.1.0Rel-12Band simplification Details R4-135776 agreedRAN4#68-BISEricsson Details RP-131939 approvedRAN#62R412.2.0TEI11
See details 36.1332080-A12.1.0Rel-12Editorial corrections RRM Details R4-135421 agreedRAN4#68-BISEricsson Details RP-131939 approvedRAN#62R412.2.0TEI11
See details 36.1332078-A12.1.0Rel-12Correction in RSTD requirements Details R4-135415 agreedRAN4#68-BISEricsson Details RP-131925 approvedRAN#62R412.2.0LCS_LTE
See details 36.1332071-A12.1.0Rel-12Clarification on Pcell Interruption shall not occur before SF n+5 Details R4-135360 agreedRAN4#68-BISNSN, Nokia Corp... Details RP-131928 approvedRAN#62R412.2.0LTE_CA-Core
See details 36.1332058-A12.1.0Rel-12Inter-frequency WB-RSRQ FDD test case Details R4-135194 agreedRAN4#68-BISEricsson Details RP-131939 approvedRAN#62R412.2.0TEI11
See details 36.1332053-A12.1.0Rel-12Clarifications for intra-band non-contiguous CA R12 Details R4-135169 agreedRAN4#68-BISHuawei, HiSilicon Details RP-131939 approvedRAN#62R412.2.0TEI11
See details 36.1332044-A12.1.0Rel-12Correction of Proximity Indication Test Case Details R4-135106 agreedRAN4#68-BISQualcomm Incorp... Details RP-131925 approvedRAN#62R412.2.0EHNB-RAN2
See details 36.1332039-A12.1.0Rel-12Introduction of E-UTRAN TDD WB-RSRQ test case R12 Details R4-135098 agreedRAN4#68-BISHuawei, HiSilicon Details RP-131939 approvedRAN#62R412.2.0TEI11
See details 36.13320311A12.1.0Rel-12CR on PCell Interruptions For Inter-band CA During Measurements Details R4-135676 agreedRAN4#68-BISQualcomm Incorp... Details RP-131928 approvedRAN#62R412.2.0LTE_CA
See details 36.1332023-A12.1.0Rel-12Correction for the RSRP/RSRQ test cases in FeICIC R12 Details R4-135059 agreedRAN4#68-BISHuawei, HiSilicon Details RP-131936 approvedRAN#62R412.2.0eICIC_enh_LTE-Perf
See details 36.1332019-A12.1.0Rel-12Correction to the SNR values for RLM tests with MBSFN ABS in FeICIC R12 Details R4-135053 agreedRAN4#68-BISHuawei, HiSilicon Details RP-131936 approvedRAN#62R412.2.0eICIC_enh_LTE-Perf
See details 36.1332016-A12.1.0Rel-12Amendment on SCell Activation Delay Requirements in case no RS for measurement Details R4-134982 agreedRAN4#68-BISNSN, Nokia Corp... Details RP-131928 approvedRAN#62R412.2.0LTE_CA-Core
See details 36.1332013-A12.1.0Rel-12Amendment on SCell Activation Delay Requirements for other activation actions Details R4-134974 agreedRAN4#68-BISNSN, Nokia Corp... Details RP-131928 approvedRAN#62R412.2.0LTE_CA-Core
See details 36.1332010-F12.1.0Rel-12Correction to RSTD measurement accuracy side condition for Band 31 Details R4-134801 agreedRAN4#68-BISAnritsu Details RP-131941 approvedRAN#62R412.2.0LTE450_Brazil-Core
See details 36.1332009-A12.1.0Rel-12CRS Es/Iot for eICIC RSRP, RSRQ with MBSFN ABS Test Cases Details R4-134797 agreedRAN4#68-BISAnritsu Details RP-131926 approvedRAN#62R412.2.0eICIC_LTE-Perf
See details 36.1332003-A12.1.0Rel-12Corrections to CA Interruption Requirements Details R4-134764 agreedRAN4#68-BISAlcatel-Lucent Details RP-131928 approvedRAN#62R412.2.0LTE_CA
See details 36.1331996-A12.1.0Rel-12Corrections to CA event triggered tests on deactivated SCell with PCell interruption in non-DRX (Rel-12) Details R4-134622 agreedRAN4#68-BISRohde & Schwarz Details RP-131927 approvedRAN#62R412.2.0TEI10