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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.521-31104-F12.4.1Rel-12RRM: Inter-frequency testing for Band 30 Details R5-150857 agreedRAN5#66Rohde & Schwarz Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31103-F12.4.1Rel-12Updates of test procedures in activation and deactivation test cases Details R5-150908 agreedRAN5#66NTT DOCOMO, INC. Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31102-F12.4.1Rel-12RRM: Consideration of unsent measurement reports Details R5-150930 agreedRAN5#66Rohde & Schwarz Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31101-F12.4.1Rel-12feICIC RRM: Corrections to Cell-IDs Details R5-150903 agreedRAN5#66Rohde & Schwarz Details RP-150341 approvedRAN#67R512.5.0TEI11_Test 2G
See details 36.521-31100-F12.4.1Rel-12Addition of CA capability in RRM tests Details R5-150902 agreedRAN5#66Anritsu Ltd Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31099-F12.4.1Rel-12CA RRM: Correction to test frequencies and Cell-IDs Details R5-150901 agreedRAN5#66Rohde & Schwarz Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31098-F12.4.1Rel-12Uncerts and Test Tols for TCs 9.1.18.1+9.1.19.1 36.521-3 CR Details R5-150887 agreedRAN5#66Huawei, Anritsu Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31097-F12.4.1Rel-12Corrections to RRM test cases in clauses 5 and 8 Details R5-150886 agreedRAN5#66Ericsson Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31096-F12.4.1Rel-12Editorial correction to 8.14.2 and 8.15.2 Details R5-150885 agreedRAN5#66Qualcomm Incorp... Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31095-F12.4.1Rel-12Cell configuration mapping for 20MHz +10MHz CA RRM new cases Details R5-150884 agreedRAN5#66CMCC Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31094-F12.4.1Rel-12Uncerts and Test Tols for TCs 8.16.9+8.16.10 36.521-3 CR Details R5-150856 agreedRAN5#66Huawei, Anritsu Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31093-F12.4.1Rel-12Uncerts and Test Tols for TCs 8.16.13+8.16.14 36.521-3 CR Details R5-150852 agreedRAN5#66Huawei, Anritsu Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31092-F12.4.1Rel-12Update R11 RSRP Accuracy for E-UTRA Carrier Aggregation for 10MHz+5MHz Details R5-150847 agreedRAN5#66CMCC Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31090-F12.4.1Rel-12Clean up on cl.7 and cl.9 eICIC RRM test cases Details R5-150845 agreedRAN5#66Anritsu Ltd Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31089-F12.4.1Rel-12Correction to eICIC Radio link monitoring test cases Details R5-150844 agreedRAN5#66Qualcomm Incorp... Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31088-F12.4.1Rel-12Update TCs 9.2.11 for FDD RSRQ Accuracy for CA 20MHz Details R5-150843 agreedRAN5#66Ericsson Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31087-F12.4.1Rel-12Update of TCs 9.1.12 for FDD RSRP Accuracy for CA 20MHz Details R5-150842 agreedRAN5#66Ericsson Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31086-F12.4.1Rel-12Corrections to on time to identify the target UTRA TDD cell for blind redirection Details R5-150841 agreedRAN5#66ZTE Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31085-F12.4.1Rel-12New TC: TDD RSRQ Accuracy for E-UTRAN Carrier Aggregation for 20MHz + 10MHz Details R5-150815 agreedRAN5#66CMCC, Huawei Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31084-F12.4.1Rel-12New TC: TDD RSRP Accuracy for E-UTRAN Carrier Aggregation for 20MHz + 10MHz Details R5-150814 agreedRAN5#66CMCC, Huawei Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31083-F12.4.1Rel-12New TC: E-UTRAN TDD event triggered reporting on deactivated SCell with PCell interruption in non-DRX for 20MHz+10MHz bandwidth Details R5-150813 agreedRAN5#66CMCC, Huawei Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31082-F12.4.1Rel-12New TC: E-UTRAN TDD event triggered reporting under deactivated SCell in non-DRX for 20MHz+10MHz Details R5-150812 agreedRAN5#66CMCC, Huawei Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31081-F12.4.1Rel-12New TCs: RSRP absolute accuracy for E-UTRA CA Details R5-150808 agreedRAN5#66CMCC Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31080-F12.4.1Rel-12New TCs: inter frequency absolute RSRP accuracy requirements Details R5-150807 agreedRAN5#66CMCC Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31079-F12.4.1Rel-12New TCs: intra frequency absolute RSRP accuracy requirements Details R5-150806 agreedRAN5#66CMCC Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31078-F12.4.1Rel-12Update TDD RSRP Accuracy requirements for Carrier Aggregation Details R5-150531 agreedRAN5#66CMCC Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31077-F12.4.1Rel-12Update R10 intra frequency absolute RSRP accuracy requirements Details R5-150530 agreedRAN5#66CMCC Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31076-F12.4.1Rel-12Update R9 inter frequency absolute RSRP accuracy requirements Details R5-150529 agreedRAN5#66CMCC Details RP-150326 approvedRAN#67R512.5.0TEI9_Test 2G
See details 36.521-31075-F12.4.1Rel-12Update R8 inter frequency absolute RSRP accuracy requirements Details R5-150527 agreedRAN5#66CMCC Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31074-F12.4.1Rel-12Update R8 intra frequency absolute RSRP accuracy requirements Details R5-150526 agreedRAN5#66CMCC Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31073-F12.4.1Rel-12Cell configuration mapping for Rel 12 and forward absolute RSRP accuracy RRM cases Details R5-150523 agreedRAN5#66CMCC Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31072-F12.4.1Rel-12Error correction to TDD Absolute RSRQ Accuracy for E-UTRA Carrier Aggregation Details R5-150517 agreedRAN5#66CMCC Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31071-F12.4.1Rel-12Clean up on cl.9 feICIC RRM test cases Details R5-150425 agreedRAN5#66Anritsu Ltd Details RP-150341 approvedRAN#67R512.5.0TEI11_Test 2G
See details 36.521-31070-F12.4.1Rel-12Clean up on cl.7 and cl.8 feICIC RRM test cases Details R5-150424 agreedRAN5#66Anritsu Ltd Details RP-150341 approvedRAN#67R512.5.0TEI11_Test 2G
See details 36.521-31069-F12.4.1Rel-12Correction to feICIC common exceptions in AnnexH Details R5-150423 agreedRAN5#66Anritsu Ltd Details RP-150341 approvedRAN#67R512.5.0TEI11_Test 2G
See details 36.521-31068-F12.4.1Rel-12Correction to message exceptions in eICIC MBSFN ABS Details R5-150421 agreedRAN5#66Anritsu Ltd Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31067-F12.4.1Rel-12Correction to test procedure for LTE CA event reporting test case Details R5-150390 agreedRAN5#66Qualcomm Incorp... Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31066-F12.4.1Rel-12Update of Annex E and F for TCs 9.1.12 and 9.2.11 Details R5-150381 agreedRAN5#66Ericsson Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31065-F12.4.1Rel-12Addition of cell mapping for some test cases Details R5-150361 agreedRAN5#66Huawei Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31064-F12.4.1Rel-12Correction to RRM TCs 9.1.6.2 and 9.1.7.2 Details R5-150328 agreedRAN5#66Huawei Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31063-F12.4.1Rel-12Uncerts and Test Tols for TCs 9.2.23.2+9.2.24.2 36.521-3 CR Details R5-150327 agreedRAN5#66Huawei, Anritsu Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31062-F12.4.1Rel-12Uncerts and Test Tols for TCs 9.2.23.1+9.2.24.1 36.521-3 CR Details R5-150324 agreedRAN5#66Huawei, Anritsu Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31061-F12.4.1Rel-12RRM: Corrections to event triggered tests without measurement gap Details R5-150320 agreedRAN5#66Rohde & Schwarz Details RP-150328 approvedRAN#67R512.5.0TEI10_Test 2G
See details 36.521-31060-F12.4.1Rel-12Uncerts and Test Tols for TCs 9.1.20.2+9.1.21.2 36.521-3 CR Details R5-150318 agreedRAN5#66Huawei, Anritsu Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31059-F12.4.1Rel-12Uncerts and Test Tols for TCs 9.1.20.1+9.1.21.1 36.521-3 CR Details R5-150316 agreedRAN5#66Huawei, Anritsu Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31058-F12.4.1Rel-12Uncerts and Test Tols for TCs 9.1.18.2+9.1.19.2 36.521-3 CR Details R5-150314 agreedRAN5#66Huawei, Anritsu Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31057-F12.4.1Rel-12Uncerts and Test Tols for TCs 8.16.15+8.16.16 36.521-3 CR Details R5-150310 agreedRAN5#66Huawei, Anritsu Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31056-F12.4.1Rel-12Uncerts and Test Tols for TCs 8.16.11+8.16.12 36.521-3 CR Details R5-150306 agreedRAN5#66Huawei, Anritsu Details RP-150345 approvedRAN#67R512.5.0TEI12_Test 2G
See details 36.521-31055-F12.4.0Rel-12Introduction of Test Cases for RSRQ Accuracy for TDD-FDD CA Details R5-150256 agreedRAN5#66Anritsu Ltd Details RP-150343 approvedRAN#67R512.5.0LTE_CA_Rel12_3D... 2G
See details 36.521-31054-F12.4.1Rel-12Update Uncertainties for Test case 5.2.3, 5.2.6 Details R5-150246 agreedRAN5#66Ericsson Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31053-F12.4.1Rel-12Update Uncertainties for Test case 5.1.6 Details R5-150244 agreedRAN5#66Ericsson Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31052-F12.4.1Rel-12Update Uncertainties for Test case 5.1.5 Details R5-150242 agreedRAN5#66Ericsson Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31051-F12.4.1Rel-12Uncertainties to Annex F for RRM test cases Details R5-150232 agreedRAN5#66ZTE Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31050-F12.4.1Rel-12Test Tolerances for 8.8.2+8.10.2 E-UTRAN - GSM event triggered reporting when DRX is used Details R5-150230 agreedRAN5#66ZTE Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31049-F12.4.1Rel-12Test Tolernaces for 8.8.1+8.10.1 E-UTRAN - GSM event triggered reporting Details R5-150228 agreedRAN5#66ZTE Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31048-F12.4.1Rel-12Test Tolerances for 8.9.1 E-UTRAN FDD - UTRAN TDD event triggered reporting Details R5-150226 agreedRAN5#66ZTE Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31047-F12.4.1Rel-12Test Tolerances for 8.7.3 E-UTRAN TDD - UTRAN TDD SON ANR cell search reporting Details R5-150224 agreedRAN5#66ZTE Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31046-F12.4.1Rel-12Test Tolerances for 8.5.2 E-UTRAN FDD - UTRAN FDD SON ANR cell search reporting Details R5-150222 agreedRAN5#66ZTE Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31045-F12.4.1Rel-12Test Tolerance for 4.3.4.3 EUTRA TDD-UTRA TDD cell reselection Details R5-150220 agreedRAN5#66ZTE Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31044-F12.4.1Rel-12Test Tolerances for 4.3.1.3 E-UTRAN FDD - UTRAN FDD cell re-selection Details R5-150218 agreedRAN5#66ZTE Details RP-150323 approvedRAN#67R512.5.0TEI8_Test 2G
See details 36.521-31043-F12.4.1Rel-12Corrections to multicarrier handover from E-UTRA to UTRA requirements Details R5-150213 agreedRAN5#66ZTE Details RP-150341 approvedRAN#67R512.5.0TEI11_Test 2G