• Specification number WG Status
    select
    Meeting
    Target Release
    select
    TSG Status
    select
    Work Item
    Entities
Data pager
Data pager
1
Page size:
PageSizeComboBox
select
 52 items in 1 pages
 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1332445-A12.3.0Rel-12Removing square brackets in FeICIC test cases Details R4-143801 agreedRAN4#71Ericsson Details RP-140918 approvedRAN#64R412.4.0TEI11
See details 36.1332422-A12.3.0Rel-12Clean up the correction on PDSCH allocation in PRS subframe R12 Details R4-143303 agreedRAN4#71Huawei, HiSilicon Details RP-140911 approvedRAN#64R412.4.0LTE-RF
See details 36.1332419-F12.3.0Rel-12Editorial correction for band 31 in 36.133 Details R4-143291 agreedRAN4#71Huawei, HiSilicon Details RP-140945 approvedRAN#64R412.4.0LTE-RF
See details 36.1332416-A12.3.0Rel-12Correction to PCI configuration conditions in FeICIC tests R12 Details R4-143281 agreedRAN4#71Huawei, HiSilicon Details RP-140914 approvedRAN#64R412.4.0eICIC_enh_LTE-Perf
See details 36.13324151B12.3.0Rel-12Introduction of test cases for 5MHz +5MHz : E-UTRA event triggered reporting on deactivated SCell with PCell interruption in non-DRX Details R4-143862 agreedRAN4#71Ericsson Details RP-140937 approvedRAN#64R412.4.0LTE_CA_C_B27-Perf
See details 36.13324121B12.3.0Rel-12Introduction of test cases for 5MHz +5MHz : RSTD Measurement Accuracy in Carrier Aggregation for 5 + 5MHz bandwidth Details R4-143864 agreedRAN4#71Ericsson Details RP-140937 approvedRAN#64R412.4.0LTE_CA_C_B27-Perf
See details 36.13324101B12.3.0Rel-12Introduction of test cases for 5MHz +5MHz : RSTD Measurement Reporting Test Case Details R4-143863 agreedRAN4#71Ericsson Details RP-140937 approvedRAN#64R412.4.0LTE_CA_C_B27-Perf
See details 36.13323961F12.3.0Rel-12Inter frequency measurements using autonomous gaps Details R4-143874 agreedRAN4#71CATT,Huawei, Hi... Details RP-140928 approvedRAN#64R412.4.0LTE_TDD_eIMTA-Core
See details 36.13323952B12.3.0Rel-12Introduce RSRP/RSRQ measurement accuracy requirements for 3DL CA   Huawei, HiSilic... Details RP-140959 approvedRAN#64R412.4.0LTE_CA_B2_B5_B3...
See details 36.13323941B12.3.0Rel-12Introduce RRM measurement requirements for eIMTA Details R4-143873 agreedRAN4#71Huawei, HiSilic... Details RP-140928 approvedRAN#64R412.4.0LTE_TDD_eIMTA-Core
See details 36.1332390-B12.3.0Rel-12E-UTRAN TDD RSTD measurement accuracy in CA for 10MHz+5MHz Details R4-143070 agreedRAN4#71Huawei, HiSilicon Details RP-140923 approvedRAN#64R412.4.0LTE_CA_NC_B23-Core
See details 36.1332389-B12.3.0Rel-12E-UTRAN FDD RSTD measurement accuracy in CA for 10MHz+5MHz Details R4-143069 agreedRAN4#71Huawei, HiSilicon Details RP-140923 approvedRAN#64R412.4.0LTE_CA_NC_B23-Core
See details 36.1332388-B12.3.0Rel-12E-UTRAN TDD RSTD measurement reporting in carrier aggregation for 10MHz+5MHz Details R4-143067 agreedRAN4#71Huawei, HiSilicon Details RP-140923 approvedRAN#64R412.4.0LTE_CA_NC_B23-Core
See details 36.1332387-B12.3.0Rel-12E-UTRAN FDD RSTD measurement reporting in carrier aggregation for 10MHz+5MHz Details R4-143066 agreedRAN4#71Huawei, HiSilicon Details RP-140923 approvedRAN#64R412.4.0LTE_CA_NC_B23-Core
See details 36.1332386-B12.3.0Rel-12E-UTRAN TDD Event triggered reporting on deactivating Scells and interruption probability (0.5%) without DRX for 10MHz+5MHz Details R4-143065 agreedRAN4#71Huawei, HiSilicon Details RP-140939 approvedRAN#64R412.4.0LTE_CA_NC_B23-Perf
See details 36.1332385-B12.3.0Rel-12E-UTRAN FDD Event triggered reporting on deactivating Scells and interruption probability (0.5%) without DRX for 10MHz+5MHz Details R4-143063 agreedRAN4#71Huawei, HiSilicon Details RP-140939 approvedRAN#64R412.4.0LTE_CA_NC_B23-Perf
See details 36.1332384-F12.3.0Rel-12Correct Correlation Matrix and Antenna Configuration for RRM test cases A.8 Details R4-142859 agreedRAN4#71Anritsu Details RP-140945 approvedRAN#64R412.4.0TEI12
See details 36.1332383-F12.3.0Rel-12Correct Correlation Matrix and Antenna Configuration for RRM test cases A.4, A.7 Details R4-142858 agreedRAN4#71Anritsu Details RP-140945 approvedRAN#64R412.4.0TEI12
See details 36.1332382-A12.3.0Rel-12RRM: Remove square brackets from eICIC RLM test requirement (Rel-12) Details R4-142818 agreedRAN4#71Rohde & Schwarz Details RP-140911 approvedRAN#64R412.4.0eICIC_LTE-Perf
See details 36.1332379-A12.3.0Rel-12Correction to periodicity of ABS pattern in eICIC RRM test cases Details R4-142803 agreedRAN4#71Anritsu Details RP-140911 approvedRAN#64R412.4.0eICIC_LTE-Perf
See details 36.13323763F12.3.0Rel-12Introduce the support of 3DL CA to TS 36.133 Section 7.8 "Interruptions with Carrier Aggregation"   Alcatel-Lucent,... Details RP-140959 approvedRAN#64R412.4.0LTE_CA_B2_B5_B3...
See details 36.13323752F12.3.0Rel-12Introduce the support of 3DL CA to TS 36.133 Section 7.1 "UE transmit timing"   Alcatel-Lucent,... Details RP-140959 approvedRAN#64R412.4.0LTE_CA_B2_B5_B3...
See details 36.13323741B12.3.0Rel-12RRM requirements for TDD-FDD CA Details R4-143878 agreedRAN4#71Ericsson, Nokia, NSN Details RP-140930 approvedRAN#64R412.4.0LTE_CA_TDD_FDD-Core
See details 36.13323732B12.3.0Rel-12SCell activation and deactivation delay requirements for 3 DL CA   Ericsson, Alcat... Details RP-140959 approvedRAN#64R412.4.0LTE_CA_B2_B5_B3...
See details 36.13323661A12.3.0Rel-12SCell activation and deactivation delay test case for known SCell    Details RP-140743 approvedRAN#64Ericsson, CATT, ALU12.4.0LTE_CA-Core
See details 36.1332364-A12.3.0Rel-12Clean up for Band 29 Details R4-142282 agreedRAN4#70-BISEricsson Details RP-140918 approvedRAN#64R412.4.0TEI11
See details 36.13323601F12.3.0Rel-12Test case corrections for eICIC Details R4-143799 agreedRAN4#71Ericsson, Intel Details RP-140911 approvedRAN#64R412.4.0eICIC_LTE-Core
See details 36.1332357-A12.3.0Rel-12Editorial corrections RRM Details R4-142252 agreedRAN4#70-BISEricsson Details RP-140918 approvedRAN#64R412.4.0TEI11
See details 36.1332354-A12.3.0Rel-12RSTD inter-frequency requirements applicability Details R4-142245 agreedRAN4#70-BISEricsson Details RP-140910 approvedRAN#64R412.4.0LCS_LTE
See details 36.13323461B12.3.0Rel-12E-UTRAN TDD - UE Transmit Timing Accuracy Tests for SCell in sTAG Details R4-142351 agreedRAN4#70-BISNSN, Nokia Corp... Details RP-140945 approvedRAN#64R412.4.0TEI12
See details 36.13323451B12.3.0Rel-12E-UTRAN FDD - UE Transmit Timing Accuracy Tests for SCell in sTAG Details R4-142344 agreedRAN4#70-BISNSN, Nokia Corp... Details RP-140945 approvedRAN#64R412.4.0TEI12
See details 36.13323401B12.3.0Rel-12Test case for RACH on SCell Details R4-142321 agreedRAN4#70-BISEricsson, Intel... Details RP-140916 approvedRAN#64R412.4.0LTE_CA_enh-Perf
See details 36.1332339-B12.3.0Rel-12Introduction of Band 32/XXXII Details R4-142095 agreedRAN4#70-BISEricsson Details RP-140926 approvedRAN#64R412.4.0LTE_UTRA_SDL_Ba...
See details 36.1332338-F12.3.0Rel-12CQI feedback periodicity correction for RLM in eICIC/FeICIC test setup Details R4-142041 agreedRAN4#70-BISEricsson Details RP-140914 approvedRAN#64R412.4.0eICIC_enh_LTE-Core
See details 36.13323362F12.3.0Rel-12New Test Case for UE Transmit Timing Accuracy requirements in DRX Details R4-142517 agreedRAN4#70-BISFujitsu, Huawei... Details RP-140945 approvedRAN#64R412.4.0LTE-RF
See details 36.13323322B12.3.0Rel-12Introduction of test cases for 5MHz +5MHz : Event triggered reporting on deactivating Scells in non-DRX FDD and TDD Details R4-142628 agreedRAN4#71Ericsson Details RP-140937 approvedRAN#64R412.4.0LTE_CA_C_B27-Perf
See details 36.13323301B12.3.0Rel-12Introduction of test cases for 5MHz +5MHz : absolute and relative RSRP accuracies in CA for FDD and TDD Details R4-142349 agreedRAN4#70-BISEricsson Details RP-140937 approvedRAN#64R412.4.0LTE_CA_C_B27-Perf
See details 36.1332319-A12.3.0Rel-12Clarification on E-UTRAN TDD - UE Timing Advance Adjustment Accuracy Test R12 Details R4-141660 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140911 approvedRAN#64R412.4.0LTE-RF
See details 36.1332315-F12.3.0Rel-12Correction for OCNG pattern number in RRM tests R12 Details R4-141653 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140911 approvedRAN#64R412.4.0LTE-RF
See details 36.1332312-A12.3.0Rel-12Clarification on UE Transmit Timing Accuracy test cases in DRX mode R12 Details R4-141649 agreedRAN4#70-BISHuawei, HiSilic... Details RP-140910 approvedRAN#64R412.4.0LTE-RF
See details 36.1332307-F12.3.0Rel-12E-UTRAN TDD - UE Timing Advance Adjustment Accuracy Test for Scell in sTAG Details R4-141639 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140916 approvedRAN#64R412.4.0LTE_CA_enh-Perf
See details 36.1332306-F12.3.0Rel-12E-UTRAN FDD - UE Timing Advance Adjustment Accuracy Test for Scell in sTAG Details R4-141638 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140916 approvedRAN#64R412.4.0LTE_CA_enh-Perf
See details 36.1332302-A12.3.0Rel-12Introduce the CGI reading requirements in CA R12 Details R4-141631 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140911 approvedRAN#64R412.4.0LTE-RF
See details 36.1332294-B12.3.0Rel-12E-UTRAN TDD absolute and relative RSRQ accuracies in CA for 10MHz+5MHz Details R4-141597 agreedRAN4#70-BISHuawei, HiSilic... Details RP-140939 approvedRAN#64R412.4.0LTE_CA_NC_B23-Perf
See details 36.1332292-B12.3.0Rel-12E-UTRAN FDD absolute and relative RSRQ accuracies in CA for 5MHz+10MHz Details R4-141595 agreedRAN4#70-BISHuawei, HiSilic... Details RP-140939 approvedRAN#64R412.4.0LTE_CA_NC_B23-Perf
See details 36.1332291-B12.3.0Rel-12E-UTRAN TDD absolute and relative RSRP accuracies in CA for 10MHz+5MHz Details R4-141594 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140923 approvedRAN#64R412.4.0LTE_CA_NC_B23-Core
See details 36.1332290-B12.3.0Rel-12E-UTRAN FDD absolute and relative RSRP accuracies in CA for 10MHz+5MHz Details R4-141593 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140923 approvedRAN#64R412.4.0LTE_CA_NC_B23-Core
See details 36.1332289-B12.3.0Rel-12E-UTRAN TDD Event triggered reporting under deactivated Scell in non-DRX for 10MHz+5MHz Details R4-141592 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140939 approvedRAN#64R412.4.0LTE_CA_NC_B23-Perf
See details 36.1332288-B12.3.0Rel-12E-UTRAN FDD Event triggered reporting under deactivated Scell in non-DRX for 10MHz+5MHz Details R4-141591 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140939 approvedRAN#64R412.4.0LTE_CA_NC_B23-Perf
See details 36.1332278-A12.3.0Rel-12Removing DPCH for handover from E-UTRAN to UTRA TDD for Rel-12 Details R4-141419 agreedRAN4#70-BISCATT, Ericsson Details RP-140911 approvedRAN#64R412.4.0LTE_CA-Core
See details 36.13322681F12.3.0Rel-12UE Behaviour after Measurement Gap Details R4-142381 agreedRAN4#70-BISEricsson, Huawe... Details RP-140945 approvedRAN#64R412.4.0TEI12
See details 36.1332267-A12.3.0Rel-12RRM: Clean-up of time offset between cells in RSTD tests (Rel-12) Details R4-141273 agreedRAN4#70-BISRohde & Schwarz Details RP-140910 approvedRAN#64R412.4.0LCS_LTE