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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1335405-A13.9.0Rel-13Correct the core requirements refered in multiple TDD-TDD inter-frequency measurements test cases. Details R4-1713323 agreedRAN4#85Huawei,HiSilicon Details RP-172606 approvedRAN#78RAN413.10.0TEI12
See details 36.13353971F13.9.0Rel-13Correction on NPRACH configuration in RRC re-establishment test cases Details R4-1713907 agreedRAN4#85Huawei,HiSilicon Details RP-172610 approvedRAN#78RAN413.10.0NB_IOT-Perf
See details 36.13353941F13.9.0Rel-13Correctoin on random access test case Details R4-1713910 agreedRAN4#85Huawei, HiSilic... Details RP-172610 approvedRAN#78RAN413.10.0NB_IOT-Perf
See details 36.13353911F13.9.0Rel-13Correctoin on cell reselectoin test case Details R4-1713908 agreedRAN4#85Huawei,HiSilicon Details RP-172610 approvedRAN#78RAN413.10.0NB_IOT-Perf
See details 36.13353681F13.9.0Rel-13Introducing PBCH repetition for eMTC RRM test case Details R4-1713886 agreedRAN4#85Nokia, Nokia Sh... Details RP-172608 approvedRAN#78RAN413.10.0LTE_MTCe2_L1-Perf
See details 36.1335359-F13.9.0Rel-13RRM 4DL: Correction of cell powers for TC A.9.2.46 (Rel-13) Details R4-1712676 agreedRAN4#85Rohde & Schwarz... Details RP-172613 approvedRAN#78RAN413.10.0TEI13
See details 36.13353561F13.9.0Rel-13RRM NB-IoT: Correction to transmit timing accuracy test under enhanced coverage (Rel-13) Details R4-1714271 agreedRAN4#85Rohde & Schwarz Details RP-172611 approvedRAN#78RAN413.10.0NB_IOT-Perf
See details 36.1335326-F13.9.0Rel-13Correction to Test Parameters for FS3 Channel Occupancy tests Details R4-1712210 agreedRAN4#85ANRITSU LTD Details RP-172607 approvedRAN#78RAN413.10.0LTE_LAA-Perf
See details 36.13353231F13.9.0Rel-13Clarification on the SNR transition in NB-IoT RLM test for out-of-sync Details R4-1713949 agreedRAN4#85ANRITSU LTDAnri... Details RP-172609 approvedRAN#78RAN413.10.0NB_IOT-Perf
See details 36.1335311-F13.9.0Rel-13Correction of OCNG for LAA Test cases A.8.26.x, A.9.1.x, A.9.2.x Details R4-1712194 agreedRAN4#85ANRITSU LTD Details RP-172607 approvedRAN#78RAN413.10.0LTE_LAA-Perf
See details 36.1335298-F13.9.0Rel-13correctoin on cell reselectoin test case Details R4-1711341 agreedRAN4#84-BisHuawei, HiSilicon Details RP-172610 approvedRAN#78RAN413.10.0NB_IOT-Perf
See details 36.13352441F13.9.0Rel-13Correction to Rel-13 cat-M1 cell re-selection and RRC re-establishment test cases Details R4-1711990 agreedRAN4#84-BisEricsson Details RP-172574 approvedRAN#78RAN413.10.0LTE_feMTC-Perf,...
See details 36.13352411F13.9.0Rel-13Correction on coverage enhancement level for cat-M1 in IDLE state for Rel-13 MTC Details R4-1711657 agreedRAN4#84-BisEricsson Details RP-172583 approvedRAN#78RAN413.10.0LTE_feMTC-Core
See details 36.13352152B13.9.0Rel-13CR for RLM tests for non-BL/CE UE (R13) Details R4-1713887 agreedRAN4#85Qualcomm Incorp... Details RP-172608 approvedRAN#78RAN413.10.0LTE_MTCe2_L1-Perf
See details 36.13351711F13.9.0Rel-13Clarification on the SNR transition in NB-IoT RLM test for in-sync Details R4-1711670 agreedRAN4#84-BisQualcomm Incorp... Details RP-172609 approvedRAN#78RAN413.10.0NB_IOT
See details 36.1335160-F13.9.0Rel-13Correction of test requirement for LAA Test cases A.8.26.x Details R4-1710159 agreedRAN4#84-BisANRITSU LTD Details RP-172607 approvedRAN#78RAN413.10.0LTE_LAA-Perf