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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1333974-A14.0.0Rel-14CR on eD2D RRM tests Details R4-166812 agreedRAN4#80Qualcomm Incorp... Details RP-161611 approvedRAN#73RAN414.1.0LTE_eD2D_Prox-Perf
See details 36.1333973-A14.0.0Rel-14Power headroom reporting requirements Details R4-167120 agreedRAN4#80Ericsson Details RP-161609 approvedRAN#73RAN414.1.0NB_IOT-Perf
See details 36.1333972-A14.0.0Rel-14Correction to Radio Link Monitoring Requirements for NB-IoT Details R4-167060 agreedRAN4#80Qualcomm Incorp... Details RP-161637 approvedRAN#73RAN414.1.0NB_IOT-Core
See details 36.1333969-A14.0.0Rel-14Correction CR on UE Measurement Capability for NB-IOT Details R4-166649 agreedRAN4#80Qualcomm Incorp... Details RP-161637 approvedRAN#73RAN414.1.0NB_IOT-Core
See details 36.1333966-A14.0.0Rel-14Corrections on TDD Radio Link Monitoring Test for In-sync for Cat-M1 UE in CEModeA Details R4-166611 agreedRAN4#80Qualcomm Incorp... Details RP-161781 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333964-A14.0.0Rel-14Corrections on TDD Radio Link Monitoring Test for Out-of-sync for Cat-M1 UE in CEModeA Details R4-166609 agreedRAN4#80Qualcomm Incorp... Details RP-161781 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333962-A14.0.0Rel-14Corrections on HD-FDD Radio Link Monitoring Test for In-sync for Cat-M1 UE in CEModeA Details R4-166607 agreedRAN4#80Qualcomm Incorp... Details RP-161781 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333960-A14.0.0Rel-14Corrections on FD-FDD Radio Link Monitoring Test for In-sync for Cat-M1 UE in CEModeA Details R4-166605 agreedRAN4#80Qualcomm Incorp... Details RP-161781 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333958-A14.0.0Rel-14Corrections on FD-FDD Radio Link Monitoring Test for Out-of-sync for Cat-M1 UE in CEModeA Details R4-166603 agreedRAN4#80Qualcomm Incorp... Details RP-161781 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333947-A14.0.0Rel-14HD-FDD Radio Link Monitoring Test for Out-of-sync for Cat-M1 UE in CEModeA Details R4-166492 agreedRAN4#80Qualcomm Incorp... Details RP-161781 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333945-A14.0.0Rel-14E-UTRAN UE Timing Advance Adjustment Accuracy Test for NB-IoT UE in Enhanced Coverage Details R4-166450 agreedRAN4#80Ericsson, Huawe... Details RP-161609 approvedRAN#73RAN414.1.0NB_IOT-Perf
See details 36.13339371B14.0.0Rel-14Clarification for TAGs with FS3 cells Details R4-166788 agreedRAN4#80Nokia Details RP-161616 approvedRAN#73RAN414.1.0LTE_eLAA-Core
See details 36.13339351A14.0.0Rel-14Intra-frequency absolute and relative CSI-RSRP accuracies for SCell with FS3 Details R4-166790 agreedRAN4#80Nokia, Anritsu Details RP-161614 approvedRAN#73RAN414.1.0LTE_LAA-Perf
See details 36.1333934-A14.0.0Rel-14Inter-frequency event triggered reporting Details R4-166411 revisedRAN4#80Nokia Details RP-161614 approvedRAN#73RAN414.1.0LTE_LAA-Perf
See details 36.1333930-A14.0.0Rel-14CR for correction to some parameters in D2D RRM tests Details R4-166245 agreedRAN4#80Qualcomm Incorp... Details RP-161634 approvedRAN#73RAN414.1.0LTE_D2D_Prox-Perf
See details 36.13339261A14.0.0Rel-14CR OCNG pattern for in-band RRM tests Details R4-166677 agreedRAN4#80Ericsson Details RP-161780 approvedRAN#73RAN414.1.0NB_IOT-Perf
See details 36.1333923-A14.0.0Rel-14CR of test principle for DC test cases with different bandwidth combinations R14 Details R4-166090 agreedRAN4#80Huawei, HiSilicon Details RP-161784 approvedRAN#73RAN414.1.0TEI12
See details 36.1333920-A14.0.0Rel-14Modification on Conditions for NB-IoT inter-frequency Accuracy Requirements for UE Category NB1 R14 Details R4-166087 agreedRAN4#80Huawei, HiSilicon Details RP-161609 approvedRAN#73RAN414.1.0NB_IOT-Perf
See details 36.1333918-A14.0.0Rel-14Introduce inter-frequency NRSRQ measurement accuracy requirement R14 Details R4-166085 agreedRAN4#80Huawei, HiSilicon Details RP-161609 approvedRAN#73RAN414.1.0NB_IOT-Perf
See details 36.1333916-A14.0.0Rel-14CR of OCNG pattern for guard band for NB-IoT test cases R14 Details R4-166081 agreedRAN4#80Huawei, HiSilicon Details RP-161780 approvedRAN#73RAN414.1.0NB_IOT-Perf
See details 36.1333915-A14.0.0Rel-14CR: RMCs for NPDCCH RMCs for standalone and guard band NB-IoT test cases R14 Details R4-166080 agreedRAN4#80Huawei, HiSilicon Details RP-161609 approvedRAN#73RAN414.1.0NB_IOT-Perf
See details 36.1333914-A14.0.0Rel-14CR: RMCs for NPDCCH RMCs for standalone and guard band NB-IoT test cases R14 Details R4-166079 agreedRAN4#80Huawei, HiSilicon Details RP-161609 approvedRAN#73RAN414.1.0NB_IOT-Perf
See details 36.13339101A14.0.0Rel-14HD-FDD Inter-frequency RRC Re-establishment for UE category NB1 under enhanced coverage R14 Details R4-167084 agreedRAN4#80Huawei, HiSilicon Details RP-161609 approvedRAN#73RAN414.1.0NB_IOT-Perf
See details 36.13339081A14.0.0Rel-14HD-FDD Intra-frequency RRC Re-establishment for UE category NB1 under normal coverage R14 Details R4-167083 agreedRAN4#80Huawei, HiSilicon Details RP-161609 approvedRAN#73RAN414.1.0NB_IOT-Perf
See details 36.1333906-A14.0.0Rel-14CR for OCNG pattern for NB-IoT standalone operation R14 Details R4-166071 agreedRAN4#80Huawei, HiSilicon Details RP-161780 approvedRAN#73RAN414.1.0NB_IOT-Perf
See details 36.1333904-A14.0.0Rel-14CR for Conditions on NSCH s/Iot of identified and of the neighbour cell R14 Details R4-166069 agreedRAN4#80Huawei, HiSilicon Details RP-161637 approvedRAN#73RAN414.1.0NB_IOT-Core
See details 36.1333900-A14.0.0Rel-14Modification on requirement of measurement in RRC_CONNECTED for NB-IoT R14 Details R4-166063 agreedRAN4#80Huawei, HiSilicon Details RP-161637 approvedRAN#73RAN414.1.0NB_IOT-Core
See details 36.1333892-A14.0.0Rel-14CR for NB-IoT RRC re-establishment R14 Details R4-166044 agreedRAN4#80Huawei, HiSilicon Details RP-161637 approvedRAN#73RAN414.1.0NB_IOT-Core
See details 36.1333890-A14.0.0Rel-14Correction on UE Category M1 measurement requirement R14 Details R4-166041 agreedRAN4#80Huawei, HiSilicon, Details RP-161639 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Core
See details 36.1333886-A14.0.0Rel-14CGI requirement for eMTC R14 Details R4-166037 agreedRAN4#80Huawei, HiSilic... Details RP-161639 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Core
See details 36.1333884-A14.0.0Rel-14CR on eMTC maintenance R14 Details R4-166035 agreedRAN4#80Huawei, HiSilicon Details RP-161639 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Core
See details 36.1333878-A14.0.0Rel-14CR on PRACH configuration reference R14 Details R4-166019 agreedRAN4#80Huawei, HiSilicon Details RP-161782 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333876-A14.0.0Rel-14RSRP Intra frequency case for Cat-M1 UE in CEModeB R14 Details R4-166017 agreedRAN4#80Huawei, HiSilicon, Details RP-161610 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333874-A14.0.0Rel-14E-UTRAN TDD-TDD intra-frequency event triggered reporting under fading propagation conditions for Cat-M1 UE in CEModeB R14 Details R4-166015 agreedRAN4#80Huawei, HiSilicon, Details RP-161610 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333872-A14.0.0Rel-14E-UTRAN HD-FDD intra-frequency event triggered reporting under fading propagation conditions for Cat-M1 UE in CEModeB R14 Details R4-166013 agreedRAN4#80Huawei, HiSilicon Details RP-161610 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333870-A14.0.0Rel-14E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions for Cat-M1 UE in CEModeB R14 Details R4-166011 agreedRAN4#80Huawei, HiSilicon Details RP-161610 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333868-A14.0.0Rel-14E-UTRAN Intra frequency case for Cat-M1 UE in enhanced coverage R14 Details R4-166009 agreedRAN4#80Huawei, HiSilicon Details RP-161610 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333866-A14.0.0Rel-14Correction on accuracy test cases for CRS based measurement R14 Details R4-166006 agreedRAN4#80Huawei Details RP-161785 approvedRAN#73RAN414.1.0LTE_SC_enh_L1-Perf
See details 36.1333863-A14.0.0Rel-14Correction of Band group for TDD SCE test R14 Details R4-166003 agreedRAN4#80Huawei, HiSilicon Details RP-161785 approvedRAN#73RAN414.1.0LTE_SC_enh_L1-Perf
See details 36.1333860-A14.0.0Rel-14Correction on discovery signal conditions for SCE R14 Details R4-166000 agreedRAN4#80Huawei, HiSilicon Details RP-161785 approvedRAN#73RAN414.1.0LTE_SC_enh_L1-Perf
See details 36.1333857-A14.0.0Rel-14Modification on CSI-RS related CA test cases R14 Details R4-165997 agreedRAN4#80Huawei, HiSilicon, Details RP-161785 approvedRAN#73RAN414.1.0LTE_SC_enh_L1-Perf
See details 36.1333854-A14.0.0Rel-14Modification on inter-frequency CSI-RS related test cases R14 Details R4-165994 agreedRAN4#80Huawei, HiSilicon, Details RP-161785 approvedRAN#73RAN414.1.0LTE_SC_enh_L1-Perf
See details 36.13338491B14.0.0Rel-14CR on RACH in eLAA Details R4-166789 agreedRAN4#80Huawei, HiSilicon Details RP-161616 approvedRAN#73RAN414.1.0LTE_eLAA-Core
See details 36.1333848-A14.0.0Rel-14Correction on discovery signal conditions in LAA R14 Details R4-165982 agreedRAN4#80Huawei, HiSilicon Details RP-161638 approvedRAN#73RAN414.1.0LTE_LAA-Core
See details 36.1333846-A14.0.0Rel-14CR on inter-frequency infinite measurement in LAA R14 Details R4-165980 agreedRAN4#80Huawei, HiSilicon Details RP-161638 approvedRAN#73RAN414.1.0LTE_LAA-Core
See details 36.1333844-A14.0.0Rel-14Intra-frequency event triggered reporting under fading propagation conditions in synchronous cells in DRX based on CRS under Operation with Frame Structure 3 Details R4-165978 agreedRAN4#80Huawei, HiSilicon Details RP-161614 approvedRAN#73RAN414.1.0LTE_LAA-Perf
See details 36.1333842-A14.0.0Rel-14Intra-frequency event triggered reporting under fading propagation conditions in synchronous cells in non-DRX based on CRS under Operation with Frame Structure 3 Details R4-165976 agreedRAN4#80Huawei, HiSilicon Details RP-161614 approvedRAN#73RAN414.1.0LTE_LAA-Perf
See details 36.1333840-A14.0.0Rel-14Editorial correction on LAA measurement requirements Details R4-165974 agreedRAN4#80Huawei, HiSilicon Details RP-161638 approvedRAN#73RAN414.1.0LTE_LAA-Core
See details 36.1333838-A14.0.0Rel-14Difinition and abbreviation of frame structure 3 Details R4-165972 agreedRAN4#80Huawei, HiSilic... Details RP-161638 approvedRAN#73RAN414.1.0LTE_LAA-Core
See details 36.1333834-A14.0.0Rel-14CR on TDD-TDD inter-frequency RS-SINR accuracy test case R14 Details R4-165967 agreedRAN4#80Huawei, HiSilicon, Details RP-161612 approvedRAN#73RAN414.1.0LTE_MC_load-Perf
See details 36.1333832-A14.0.0Rel-14CR on FDD-FDD inter-frequency RS-SINR accuracy test case R14 Details R4-165965 agreedRAN4#80Huawei, HiSilicon, Details RP-161612 approvedRAN#73RAN414.1.0LTE_MC_load-Perf
See details 36.1333828-A14.0.0Rel-14Correction to DL RMCs for Cell1 in A 8.16.25 Details R4-165886 agreedRAN4#80Anritsu Details RP-161635 approvedRAN#73RAN414.1.0LTE_CA_B1_B40-Perf
See details 36.1333811-A14.0.0Rel-14RRC Re-establishment test for eMTC UEs in CEModeB Details R4-165863 agreedRAN4#80Ericsson Details RP-161610 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333806-A14.0.0Rel-14E-UTRAN UE Transmit Timing Accuracy Tests for Cat-M1 UE in CEModeB Details R4-165858 agreedRAN4#80Ericsson Details RP-161610 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333804-A14.0.0Rel-14Resolving TBDs in HD-FDD RLM test-cases for Rel-12 category 0 UEs Details R4-165856 agreedRAN4#80Ericsson Details RP-161634 approvedRAN#73RAN414.1.0LC_MTC_LTE-Core
See details 36.1333791-A14.0.0Rel-14RMCs for NPDSCH and NPDCCH for in-band for NB-IoT test cases Details R4-165817 agreedRAN4#80NTT DOCOMO, INC. Details RP-161609 approvedRAN#73RAN414.1.0NB_IOT-Perf
See details 36.1333787-F14.0.0Rel-14Correction to Band 66 notes in E-UTRA band groups in Rel-14 Details R4-165806 agreedRAN4#80Dish Network Details RP-161635 approvedRAN#73RAN414.1.0LTE_AWS_EXT
See details 36.1333785-A14.0.0Rel-14Correction to RSTD Test Cases for 1.4 MHz Details R4-165779 agreedRAN4#80Qualcomm Incorp... Details RP-161631 approvedRAN#73RAN414.1.0LCS_LTE, TEI9
See details 36.1333773-A14.0.0Rel-14Event triggered reporting on LAA deactivated SCells and interruption probability (0.5%) without DRX Details R4-165732 agreedRAN4#80CATT, CATR Details RP-161783 approvedRAN#73RAN414.1.0LTE_LAA-Perf
See details 36.1333771-A14.0.0Rel-14LAA SCell activation and deactivation for known SCells without DRX Details R4-165730 agreedRAN4#80CATT, CATR Details RP-161614 approvedRAN#73RAN414.1.0LTE_LAA-Perf
See details 36.1333769-A14.0.0Rel-14Editing change in TS36.133 for Rel-14 Details R4-165721 agreedRAN4#80CATT Details RP-161636 approvedRAN#73RAN414.1.0NB_IOT-Core
See details 36.1333767-A14.0.0Rel-14CR on modification on report mapping of TADV measurement in TS36.133 for Rel-14 Details R4-165719 agreedRAN4#80CATT Details RP-161640 approvedRAN#73RAN414.1.0TEI13
See details 36.1333761-A14.0.0Rel-14CR for Cat-M1 CEMode A RLM test cases: DRX TDD Details R4-165679 agreedRAN4#80Nokia Details RP-161781 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333759-A14.0.0Rel-14CR for Cat-M1 CEMode A RLM test cases: DRX HD-FDD Details R4-165677 agreedRAN4#80Nokia Details RP-161781 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333757-A14.0.0Rel-14CR for Cat-M1 CEMode A RLM test cases: DRX FDD Details R4-165675 agreedRAN4#80Nokia Details RP-161781 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333755-F14.0.0Rel-14CR of Applicability of requirements for xDL2UL CA Details R4-165623 agreedRAN4#80LG Electronics Details RP-161627 approvedRAN#73RAN414.1.0LTE_CA_R14_xDL2...
See details 36.1333754-A14.0.0Rel-14CR of TDD intrafrequency RSRQ meaurement accuracy test for SCell with FS3 Details R4-165622 agreedRAN4#80LG Electronics Details RP-161783 approvedRAN#73RAN414.1.0LTE_LAA-Perf
See details 36.1333753-A14.0.0Rel-14CR of FDD intrafrequency RSRQ meaurement accuracy test for SCell with FS3 Details R4-165621 agreedRAN4#80LG Electronics Details RP-161783 approvedRAN#73RAN414.1.0LTE_LAA-Perf
See details 36.1333752-A14.0.0Rel-14CR of TDD intrafrequency absolute and relative RSRP accuracy test for SCell with FS3 Details R4-165620 agreedRAN4#80LG Electronics Details RP-161783 approvedRAN#73RAN414.1.0LTE_LAA-Perf
See details 36.1333751-A14.0.0Rel-14CR of FDD intrafrequency absolute and relative RSRP accuracy test for SCell with FS3 Details R4-165619 agreedRAN4#80LG Electronics Details RP-161783 approvedRAN#73RAN414.1.0LTE_LAA-Perf
See details 36.13337441B14.0.0Rel-14CR of core requirements for V2V service Details R4-166754 agreedRAN4#80LG Electronics,... Details RP-161617 approvedRAN#73RAN414.1.0LTE_SL_V2V-Core
See details 36.1333743-A14.0.0Rel-14CR on RS-SINR measurement accuracy requirements Details R4-165577 agreedRAN4#80ZTE, CMCC Details RP-161612 approvedRAN#73RAN414.1.0LTE_MC_load-Perf
See details 36.1333741-A14.0.0Rel-14CR on RS-SINR FDD-TDD inter-frequency accuracy test case Details R4-165575 agreedRAN4#80ZTE Details RP-161612 approvedRAN#73RAN414.1.0LTE_MC_load-Perf
See details 36.1333740-A14.0.0Rel-14CR on RS-SINR TDD-FDD inter-frequency accuracy test case Details R4-165574 agreedRAN4#80ZTE Details RP-161612 approvedRAN#73RAN414.1.0LTE_MC_load-Perf
See details 36.1333729-A14.0.0Rel-14CR: Cat-M1 PRACH test cases for TDD in Enhanced Coverage Details R4-165437 agreedRAN4#80Nokia Details RP-161782 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333727-A14.0.0Rel-14CR: Cat-M1 PRACH test cases for HD-FDD in Enhanced Coverage Details R4-165435 agreedRAN4#80Nokia Details RP-161782 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333725-A14.0.0Rel-14CR: Cat-M1 PRACH test cases for FDD in Enhanced Coverage Details R4-165433 agreedRAN4#80Nokia Details RP-161782 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333721-A14.0.0Rel-14CR: Correction of Transmit Timing Accuracy Tests for Cat-M1 UE in CEModeA Details R4-165429 agreedRAN4#80Nokia Details RP-161610 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333719-A14.0.0Rel-14CR: Correction of Cat-M1 Intra-frequency handover test cases for CEModeA Details R4-165427 agreedRAN4#80Nokia Details RP-161610 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333717-A14.0.0Rel-14CR: OCNG patterns for Cat-M1 RRM Tests Details R4-165425 agreedRAN4#80Nokia Details RP-161610 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Perf
See details 36.1333715-A14.0.0Rel-14CR: Correction of E-CID RSRP measurement requirements for Cat-M1 UEs Details R4-165422 agreedRAN4#80Nokia Details RP-161639 approvedRAN#73RAN414.1.0LTE_MTCe2_L1-Core
See details 36.1333709-A14.0.0Rel-14CR: Corrections on Section 4.6 "Cell Selection and Re-selection Requirements for UE category NB1" Details R4-165415 agreedRAN4#80Nokia Details RP-161637 approvedRAN#73RAN414.1.0NB_IOT-Core
See details 36.1333707-A14.0.0Rel-14CR: Reference NPRACH Configuration for NB-IoT RRM test cases Details R4-165413 agreedRAN4#80Nokia Details RP-161780 approvedRAN#73RAN414.1.0NB_IOT-Perf
See details 36.1333705-A14.0.0Rel-14Channel occupancy accuracy requirements Details R4-165301 agreedRAN4#80Ericsson, Anritsu Details RP-161783 approvedRAN#73RAN414.1.0LTE_LAA-Perf
See details 36.1333703-A14.0.0Rel-14Known cell requirements Details R4-165299 agreedRAN4#80Ericsson Details RP-161638 approvedRAN#73RAN414.1.0LTE_LAA-Core
See details 36.1333699-A14.0.0Rel-14Applicability of intra-frequency maximum measurement time requirements Details R4-165295 agreedRAN4#80Ericsson Details RP-161638 approvedRAN#73RAN414.1.0LTE_LAA-Core
See details 36.1333697-A14.0.0Rel-14Intra-frequency TDD test cases for RS-SINR Details R4-165292 agreedRAN4#80Ericsson Details RP-161612 approvedRAN#73RAN414.1.0LTE_MC_load-Perf
See details 36.1333695-A14.0.0Rel-14Intra-frequency FDD test cases for RS-SINR Details R4-165290 agreedRAN4#80Ericsson Details RP-161612 approvedRAN#73RAN414.1.0LTE_MC_load-Perf
See details 36.13336912B14.0.0Rel-14eLAA RRM requirements Details R4-167161 agreedRAN4#80Ericsson Details RP-161616 approvedRAN#73RAN414.1.0LTE_eLAA-Core
See details 36.13336901B14.0.0Rel-14Higher resolution RSTD measurement report mapping Details R4-167038 agreedRAN4#80Ericsson Details RP-161619 approvedRAN#73RAN414.1.0UTRA_LTE_iPos_e...
See details 36.1333689-A14.0.0Rel-14LAA Average RSSI accuracy test Details R4-165122 agreedRAN4#80Ericsson Details RP-161614 approvedRAN#73RAN414.1.0LTE_LAA-Perf
See details 36.1333687-A14.0.0Rel-14LBT model for LAA RRM tests Details R4-165120 agreedRAN4#80Ericsson Details RP-161783 approvedRAN#73RAN414.1.0LTE_LAA-Perf
See details 36.1333685-A14.0.0Rel-14LAA channel occupancy test Details R4-165118 agreedRAN4#80Ericsson Details RP-161614 approvedRAN#73RAN414.1.0LTE_LAA-Perf
See details 36.1333683-A14.0.0Rel-14Square bracket removal for RLM antenna connection for 4 Rx capable UEs Details R4-165109 agreedRAN4#80Ericsson Details RP-161613 approvedRAN#73RAN414.1.0LTE_4Rx_AP_DL-Perf
See details 36.1333681-A14.0.0Rel-14Duration of T3 in RRM 4DL/5DL Test cases A.8.16.55, A.8.16.56, A.8.16.73, A.8.16.74. Details R4-165000 agreedRAN4#80Anritsu Details RP-161640 approvedRAN#73RAN414.1.0TEI13
See details 36.1333679-A14.0.0Rel-14Duration of T3 in RRM 3DL Test cases A.8.16.31, A.8.16.32, A.8.16.33, A.8.16.34. Details R4-164993 agreedRAN4#80Anritsu Details RP-161634 approvedRAN#73RAN414.1.0LTE_CA_B1_B3_B5-Perf