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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1337003-A14.16.0Rel-14Correction to test parameters for FDD and TDD intra-frequency RSRP for Cat-M1 UE in CEModeA Details R4-2016549 agreedRAN4#97-eQualcomm Incorp... Details RP-202513 approvedRAN#90-eRAN414.17.0TEI13
See details 36.13369651F14.16.0Rel-14CR on maintaining V2X test cases in TS36.133 R14 Details R4-2017063 agreedRAN4#97-eHuawei, HiSilicon Details RP-202512 approvedRAN#90-eRAN414.17.0TEI14