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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.521-20768-F15.2.0Rel-15Applicability and ICS for CA RF and RRM test cases Details R5-185442 agreedRAN5#80Bureau Veritas,... Details RP-181579 approvedRAN#81TSG WG RAN515.3.0TEI10_Test
See details 36.521-20767-F15.2.0Rel-15Resubmission of Cat1bis applicability CR Details R5-184982 agreedRAN5#80ETSI MCC (Qualc... Details RP-181563 approvedRAN#81TSG WG RAN515.3.0LTE_UE_cat_1RX-...
See details 36.521-20766-F15.2.0Rel-15Cat1bis test cases applicability Details R5-184980 agreedRAN5#80Qualcomm Austri... Details RP-181563 approvedRAN#81TSG WG RAN515.3.0LTE_UE_cat_1RX-...
See details 36.521-207631F15.2.0Rel-15Add a new test condition for test case 8.13.3.1.2.5. Details R5-185376 agreedRAN5#80CGC Inc. Details RP-181562 approvedRAN#81TSG WG RAN515.3.0LTE_4Rx_AP_DL_C...
See details 36.521-20761-F15.2.0Rel-154Rx branches in some 4DL CA and 5DL CA Demodulation test cases Details R5-184892 agreedRAN5#80Ericsson Details RP-181579 approvedRAN#81TSG WG RAN515.3.0TEI10_Test
See details 36.521-20758-F15.2.0Rel-15Correction to Applicability Condition of TS 36.521-1 Test Cases 6.6.2.2A.1 and 6.6.3.3A.1 Details R5-184809 agreedRAN5#80Intel Corporati... Details RP-181579 approvedRAN#81TSG WG RAN515.3.0TEI10_Test
See details 36.521-207571F15.2.0Rel-15Correction to band selection criteria applicability for HPUE devices that support Power Class 1 & 2 Details R5-185549 agreedRAN5#80Intel Corporati... Details RP-181583 approvedRAN#81TSG WG RAN515.3.0TEI14_Test
See details 36.521-207551F15.2.0Rel-15Applicability for New UL 256QAM test cases: 6.6.2.2_2 and 6.6.2.3A.3_2 Details R5-185428 agreedRAN5#80Ericsson Details RP-181568 approvedRAN#81TSG WG RAN515.3.0LTE_UL_CAP_enh-...
See details 36.521-207531F15.2.0Rel-15Applicabilities addition of test cases 8.3.1.1.9 and 8.3.2.1.10 Details R5-185389 agreedRAN5#80TTA Details RP-181557 approvedRAN#81TSG WG RAN515.3.0LTE_EBF_FDMIMO-...
See details 36.521-207511F15.2.0Rel-15Addition of applicability for TC6.6.3.3_2 Details R5-185407 agreedRAN5#80TTA Details RP-181568 approvedRAN#81TSG WG RAN515.3.0LTE_UL_CAP_enh-...
See details 36.521-20749-F15.2.0Rel-15Table format correct and removed redundant line for RF clause 6 test cases Details R5-184584 agreedRAN5#80Bureau Veritas Details RP-181577 approvedRAN#81TSG WG RAN515.3.0TEI8_Test
See details 36.521-207481F15.2.0Rel-15Table format correct and removed redundant line for RF clause 7 test cases Details R5-185528 agreedRAN5#80Bureau Veritas Details RP-181577 approvedRAN#81TSG WG RAN515.3.0TEI8_Test
See details 36.521-20746-F15.2.0Rel-15Applicability C20 updated for intra-band contigous DL CA tests Details R5-184581 agreedRAN5#80Bureau Veritas Details RP-181579 approvedRAN#81TSG WG RAN515.3.0TEI10_Test
See details 36.521-207441F15.2.0Rel-15Addition of applicability of RRM IncMon test cases Details R5-185453 agreedRAN5#80Ericsson Details RP-181553 approvedRAN#81TSG WG RAN515.3.0LTE_UTRA_IncMon...
See details 36.521-207421F15.2.0Rel-15Correction of applicability to TS 36.521-2 for HPUE RF test cases Details R5-185541 agreedRAN5#80CMCC Details RP-181582 approvedRAN#81TSG WG RAN515.3.0TEI13_Test
See details 36.521-20741-F15.2.0Rel-1536.521-2 updates for category M2 test cases Details R5-184325 agreedRAN5#80Ericsson Details RP-181567 approvedRAN#81TSG WG RAN515.3.0LTE_feMTC-UEConTest
See details 36.521-20740-F15.2.0Rel-15Addition of test applicability for Rel-13 B5C new TC 8.16.47-50 Details R5-184294 agreedRAN5#80Huawei,HiSilicon Details RP-181556 approvedRAN#81TSG WG RAN515.3.0LTE_CA_enh_b5C_...
See details 36.521-207381F15.2.0Rel-15Addition of test applicabilities of multiple V2X test cases Details R5-185374 agreedRAN5#80Huawei,HiSilicon Details RP-181564 approvedRAN#81TSG WG RAN515.3.0LTE_V2X-UEConTest