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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.521-40162-F16.1.0Rel-16Include PDSCH RMC for PDCCH demod FR1 test cases Details R5-198680 agreedRAN5#85Keysight Techno... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-40161-F16.1.0Rel-16Correction of SchedulingRequestResourceConfig periodicityAndOffset for TC 7.2.2.2.1_1 Details R5-198679 agreedRAN5#85Keysight Techno... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401601F16.1.0Rel-16Update PrachConfigIndex in 5.2.3.2.1_1 test case Details R5-199516 agreedRAN5#85Keysight Techno... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401581F16.1.0Rel-16Introduction of FR2 CQI test cases Details R5-199570 agreedRAN5#85Ericsson Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-40157-F16.1.0Rel-16Updated to Annex A and B for performance tests Details R5-198560 agreedRAN5#85Bureau Veritas Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401561F16.1.0Rel-16Editorial correction to CSI reporting tests Details R5-199422 agreedRAN5#85Anritsu Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401551F16.1.0Rel-16Correction to chapter 5 and 6 to be aligned with core spec Details R5-199421 agreedRAN5#85Anritsu Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-40154-F16.1.0Rel-16Correction to Sections 5.2 and 5.3 Details R5-198409 agreedRAN5#85Anritsu Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-40153-F16.1.0Rel-16Correction to 2Rx and 4Rx TDD FR1 Single PMI with 4Tx Type1 - SinglePanel codebook for both SA and NSA Details R5-198408 agreedRAN5#85Anritsu Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-40152-F16.1.0Rel-16Correction to 2Rx FDD FR1 periodic CQI reporting under AWGN conditions for both SA and NSA Details R5-198407 agreedRAN5#85Anritsu Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-40151-F16.1.0Rel-16Corrections to E-UTRA configurations for EN-DC test cases Details R5-198395 agreedRAN5#85Samsung R&D Ins... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401501F16.1.0Rel-16Update to FR2 PDCCH Demod test case Details R5-199532 agreedRAN5#85Qualcomm Finlan... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401491F16.1.0Rel-16Update to starting MCS index for CQI reporting test cases Details R5-199387 agreedRAN5#85Qualcomm Finlan... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401481F16.1.0Rel-16Clarification on PDCP SDU size for SDR SA Demod test case Details R5-199525 agreedRAN5#85Qualcomm Finlan... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401471F16.1.0Rel-16Clarification on PDCP SDU size for SDR NSA Demod test case Details R5-199526 agreedRAN5#85Qualcomm Finlan... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401461F16.1.0Rel-16Update to FR2 2Rx PDSCH Type A enhanced type X receiver test case Details R5-199425 agreedRAN5#85Qualcomm Finlan... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401451F16.1.0Rel-16Update to Annex G for minimum test time for FR2 Demod test cases Details R5-199388 agreedRAN5#85Qualcomm Finlan... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401441F16.1.0Rel-16Annex update for UE positioning procedure for Demod test cases Details R5-199531 agreedRAN5#85Qualcomm Finlan... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401431F16.1.0Rel-16Update to FR2 2Rx PDSCH Type A baseline receiver test case Details R5-199527 agreedRAN5#85Qualcomm Finlan... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-40142-F16.1.0Rel-16Update to FR1 4Rx FDD PDSCH Type A Demodulation performance Details R5-198281 agreedRAN5#85LG Electronics Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-40141-F16.1.0Rel-16Updates to Annex F Details R5-198248 agreedRAN5#85Ericsson Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401401F16.1.0Rel-16Adding new test case 6.2.3.2.2.2, 4Rx TDD FR1 aperiodic subband CQI reporting under fading conditions for both SA and NSA Details R5-199420 agreedRAN5#85Ericsson Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401391F16.1.0Rel-16Adding new test case 6.2.3.2.2.1, 4Rx TDD FR1 periodic wideband CQI reporting under fading conditions for both SA and NSA Details R5-199419 agreedRAN5#85Ericsson Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401381F16.1.0Rel-16Adding new test case 6.2.3.1.2.2, 4Rx FDD FR1 aperiodic subband CQI reporting under fading conditions for both SA and NSA Details R5-199418 agreedRAN5#85Ericsson Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401372F16.1.0Rel-16Adding new test case 6.2.3.1.2.1, 4Rx FDD FR1 periodic wideband CQI reporting under fading conditions for both SA and NSA Details R5-199079 agreedRAN5#85Ericsson Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401361F16.1.0Rel-16Addition of NR test case 6.4.2.1_1-FDD RI reporting Details R5-199385 agreedRAN5#85Huawei, HiSilic... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401351F16.1.0Rel-16Addition of NR test case 6.2.3.2.1.1-TDD periodical CQI Details R5-199417 agreedRAN5#85Huawei, HiSilic... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401341F16.1.0Rel-16Addition of NR test case 6.2.3.1.1.1-FDD periodical CQI Details R5-199384 agreedRAN5#85Huawei, HiSilic... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401331F16.1.0Rel-16Addition of NR test case 5.2.3.2.3_1-TDD type B 2x4 MIMO Details R5-199416 agreedRAN5#85Huawei, HiSilic... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401321F16.1.0Rel-16Addition of NR test case 5.2.3.2.2_1-TDD type A CSI-RS overlap 2x4 MIMO Details R5-199415 agreedRAN5#85Huawei, HiSilic... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401311F16.1.0Rel-16Addition of NR test case 5.2.3.1.3_1-FDD type B 2x4 MIMO Details R5-199414 agreedRAN5#85Huawei, HiSilic... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401301F16.1.0Rel-16Addition of NR test case 5.2.3.1.2_1-FDD type A CSI-RS overlap 4x4 MIMO Details R5-199383 agreedRAN5#85Huawei, HiSilic... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest
See details 38.521-401291F16.1.0Rel-16Addition of 5.2.2.1.3_1 2Rx FDD PDSCH mapping Type B Details R5-199382 agreedRAN5#85Huawei, HiSilic... Details RP-192467 approvedRAN#86TSG WG RAN516.2.05GS_NR_LTE-UEConTest