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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.521-20418-F16.4.0Rel-16Adding FR2 PDCCH Aggregation Level in Annex C.3    Details RP-201671 approvedRAN#89-eHuawei, HiSilicon16.5.05GS_NR_LTE-UEConTest
See details 38.521-204171F16.4.0Rel-16FR2 EIRP OFF power MU updates Details R5-204864 agreedRAN5#88-eKeysight Techno... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-204151F16.4.0Rel-16Update of Tx signal quality test cases Details R5-204764 agreedRAN5#88-eROHDE & SCHWARZ Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-20414-F16.4.0Rel-16Update of FR2 OBW test case Details R5-204266 agreedRAN5#88-eROHDE & SCHWARZ Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-20413-F16.4.0Rel-16Editorial correction of Annex C.3 Connection Details R5-204265 agreedRAN5#88-eROHDE & SCHWARZ Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-20412-F16.4.0Rel-16Editorial correction of ACLR CA test cases Details R5-204264 agreedRAN5#88-eROHDE & SCHWARZ Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-204111F16.4.0Rel-16FR2 Minimum output power MU updates Details R5-204863 agreedRAN5#88-eKeysight Techno... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-204101F16.4.0Rel-16FR2 Minimum output power measurement period definition Details R5-204919 agreedRAN5#88-eKeysight Techno... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-204091F16.4.0Rel-16CR to TS 38.521-2 on DUT alignment options Details R5-204923 agreedRAN5#88-eROHDE & SCHWARZ Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-204081F16.4.0Rel-16CR to 38.521-2 on QoQZ Verification Clarification Details R5-204862 agreedRAN5#88-eKeysight Techno... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-204071F16.4.0Rel-16CR to 38.521-2 to allow vendor declarations related to beam peak searches Details R5-204861 agreedRAN5#88-eKeysight Techno... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-204061F16.4.0Rel-16CR to 38.521-2 to adjust the test step sequences Details R5-204860 agreedRAN5#88-eKeysight Techno... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-204041F16.4.0Rel-16Update to UE maximum output power for CA Details R5-204918 agreedRAN5#88-eAnritsu Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-204031F16.4.0Rel-16CR to update MU and TT in 38.521-2 Details R5-204856 agreedRAN5#88-eAnritsu Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-204021F16.4.0Rel-16Clean up complete status for FR2 SA test cases Details R5-204917 agreedRAN5#88-eAnritsu Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-204011F16.4.0Rel-16CR to TS 38.521-2: Correction to MB relaxation minimum requirements Details R5-204859 agreedRAN5#88-eSamsung R&D Ins... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-204001F16.4.0Rel-16CR to TS 38.521-2: Annex F EIRP OFF Power Details R5-204922 agreedRAN5#88-eSamsung R&D Ins... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203991F16.4.0Rel-16CR to TS 38.521-2: Correction to time mask requirements Details R5-204916 agreedRAN5#88-eSamsung R&D Ins... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203981F16.4.0Rel-16CR to 38.521-2 to update Transmit OFF Power Details R5-204915 agreedRAN5#88-eSamsung R&D Ins... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203971F16.4.0Rel-16CR to 38.521-2 to update Absolute Power Tolerance for CA on the order of test steps Details R5-204858 agreedRAN5#88-eSamsung R&D Ins... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203961F16.4.0Rel-16Addition of modified MPR behavior Details R5-204921 agreedRAN5#88-eHuawei, HiSilicon Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203951F16.4.0Rel-16Addition of UL power setting for Rx test cases Details R5-204765 agreedRAN5#88-eHuawei, HiSilic... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-20394-F16.4.0Rel-16Updating beam correspondance capability Details R5-203969 agreedRAN5#88-eHuawei, HiSilicon Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203931F16.4.0Rel-16Miscellaneous corrections due to core spec alignment Details R5-204763 agreedRAN5#88-eHuawei, HiSilic... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-20392-F16.4.0Rel-16Alignment of general sections with core spec of SA FR2 R15 Details R5-203875 agreedRAN5#88-eCAICT Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203891F16.4.0Rel-16FR2 RefSens and EIS spherical PC3 MBR table update Details R5-204920 agreedRAN5#88-eQualcomm Wirele... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203881F16.4.0Rel-16Updates to test case 6.3.4.3, relative power tolerance Details R5-204914 agreedRAN5#88-eEricsson Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203861F16.4.0Rel-16Introduction of New TC 6.4A.2.3.7 In-band emissions for 8UL CA Details R5-204717 agreedRAN5#88-eLG Electronics Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203851F16.4.0Rel-16Introduction of New TC 6.4A.2.3.6 In-band emissions for 7UL CA Details R5-204716 agreedRAN5#88-eLG Electronics Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203841F16.4.0Rel-16Correction to test cases 6.4A.2.3.x In-band emissions for 3 to 6 UL CA Details R5-204715 agreedRAN5#88-eLG Electronics Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203831F16.4.0Rel-16Correction to TC 6.4A.2.3.1 In-band emissions for 2UL CA Details R5-204714 agreedRAN5#88-eLG Electronics Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203821F16.4.0Rel-16Correction to test configuration for Carrier leakage for CA Details R5-204713 agreedRAN5#88-eLG Electronics Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203811F16.4.0Rel-16Adding FR2 PDCCH Aggregation Level in Annex C.3 Details R5-204718 not pursuedRAN5#88-eHuawei, Hisilicon   16.5.05GS_NR_LTE-UEConTest
See details 38.521-203801F16.4.0Rel-16Beam correspondence - SRS configuration corrections in section 6.6.1 Details R5-204857 agreedRAN5#88-eKeysight Techno... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-203791F16.4.0Rel-16Beam correspondence - SRS configuration corrections in annex K.1.1 Details R5-204865 agreedRAN5#88-eKeysight Techno... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest
See details 38.521-20373-F16.4.0Rel-16Clarification of Interferer frequency selection in FR2 IBB test case 7.6.2 Details R5-203292 agreedRAN5#88-eKeysight Techno... Details RP-201450 approvedRAN#89-eTSG WG RAN516.5.05GS_NR_LTE-UEConTest