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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.52200681F16.6.0Rel-16Applicability for RRM NR HST test case 6.1.1.7 and 6.6.1.7 Details R5-211918 agreedRAN5#90-eCMCC Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.5220067-F16.6.0Rel-16Applicability of Error Vector Magnitude for V2X for non-concurrent operation Details R5-211610 agreedRAN5#90-eLG Electronics Details RP-210150 approvedRAN#91-eTSG WG RAN516.7.05G_V2X_NRSL_eV2...
See details 38.52200661F16.6.0Rel-16Addition of new RRM test cases to the applicability table in 4.2 Details R5-211917 agreedRAN5#90-eEricsson Details RP-210159 approvedRAN#91-eTSG WG RAN516.7.0NR_HST-UEConTest
See details 38.5220061-F16.6.0Rel-16Addition of applicability new test case 6.3.3.1.3 in TS 38.521-4 Details R5-211159 agreedRAN5#90-eChina Telecom Details RP-210158 approvedRAN#91-eTSG WG RAN516.7.0NR_perf_enh-UEC...
See details 38.5220060-F16.6.0Rel-16Addition of applicability new test case 6.3.2.1.3 in TS 38.521-4 Details R5-211158 agreedRAN5#90-eChina Telecom Details RP-210158 approvedRAN#91-eTSG WG RAN516.7.0NR_perf_enh-UEC...
See details 38.52200591F16.6.0Rel-16Update to applicability spec for 5G test cases Details R5-211853 agreedRAN5#90-eBureau Veritas,... Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.5220058-F16.6.0Rel-16Adding the test applicability of RF test cases for eMIMO Details R5-210792 agreedRAN5#90-eHuawei, HiSilicon Details RP-210151 approvedRAN#91-eTSG WG RAN516.7.0NR_eMIMO-UEConTest
See details 38.52200571F16.6.0Rel-16Adding test applicability for switching test case Details R5-211913 agreedRAN5#90-eHuawei, HiSilicon Details RP-210146 approvedRAN#91-eTSG WG RAN516.7.0NR_RF_FR1-UEConTest
See details 38.5220055-F16.6.0Rel-16Correction of applicability definitions for long DRX cycle related test cases Details R5-210506 agreedRAN5#90-eCAICT Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest
See details 38.52200541F16.6.0Rel-16Correction of applicability definitions for PUSCH HalfPi BPSK related test cases Details R5-211720 agreedRAN5#90-eCAICT Details RP-210136 approvedRAN#91-eTSG WG RAN516.7.05GS_NR_LTE-UEConTest