|
| 38.522 | 0068 | 1 | F | 16.6.0 | Rel-16 | Applicability for RRM NR HST test case 6.1.1.7 and 6.6.1.7 |
R5-211918
| agreed | RAN5#90-e | CMCC |
RP-210159
| approved | RAN#91-e | TSG WG RAN5 | 16.7.0 | NR_HST-UEConTest |
|
|
| 38.522 | 0067 | - | F | 16.6.0 | Rel-16 | Applicability of Error Vector Magnitude for V2X for non-concurrent operation |
R5-211610
| agreed | RAN5#90-e | LG Electronics |
RP-210150
| approved | RAN#91-e | TSG WG RAN5 | 16.7.0 | 5G_V2X_NRSL_eV2... |
|
|
| 38.522 | 0066 | 1 | F | 16.6.0 | Rel-16 | Addition of new RRM test cases to the applicability table in 4.2 |
R5-211917
| agreed | RAN5#90-e | Ericsson |
RP-210159
| approved | RAN#91-e | TSG WG RAN5 | 16.7.0 | NR_HST-UEConTest |
|
|
| 38.522 | 0061 | - | F | 16.6.0 | Rel-16 | Addition of applicability new test case 6.3.3.1.3 in TS 38.521-4 |
R5-211159
| agreed | RAN5#90-e | China Telecom |
RP-210158
| approved | RAN#91-e | TSG WG RAN5 | 16.7.0 | NR_perf_enh-UEC... |
|
|
| 38.522 | 0060 | - | F | 16.6.0 | Rel-16 | Addition of applicability new test case 6.3.2.1.3 in TS 38.521-4 |
R5-211158
| agreed | RAN5#90-e | China Telecom |
RP-210158
| approved | RAN#91-e | TSG WG RAN5 | 16.7.0 | NR_perf_enh-UEC... |
|
|
| 38.522 | 0059 | 1 | F | 16.6.0 | Rel-16 | Update to applicability spec for 5G test cases |
R5-211853
| agreed | RAN5#90-e | Bureau Veritas,... |
RP-210136
| approved | RAN#91-e | TSG WG RAN5 | 16.7.0 | 5GS_NR_LTE-UEConTest |
|
|
| 38.522 | 0058 | - | F | 16.6.0 | Rel-16 | Adding the test applicability of RF test cases for eMIMO |
R5-210792
| agreed | RAN5#90-e | Huawei, HiSilicon |
RP-210151
| approved | RAN#91-e | TSG WG RAN5 | 16.7.0 | NR_eMIMO-UEConTest |
|
|
| 38.522 | 0057 | 1 | F | 16.6.0 | Rel-16 | Adding test applicability for switching test case |
R5-211913
| agreed | RAN5#90-e | Huawei, HiSilicon |
RP-210146
| approved | RAN#91-e | TSG WG RAN5 | 16.7.0 | NR_RF_FR1-UEConTest |
|
|
| 38.522 | 0055 | - | F | 16.6.0 | Rel-16 | Correction of applicability definitions for long DRX cycle related test cases |
R5-210506
| agreed | RAN5#90-e | CAICT |
RP-210136
| approved | RAN#91-e | TSG WG RAN5 | 16.7.0 | 5GS_NR_LTE-UEConTest |
|
|
| 38.522 | 0054 | 1 | F | 16.6.0 | Rel-16 | Correction of applicability definitions for PUSCH HalfPi BPSK related test cases |
R5-211720
| agreed | RAN5#90-e | CAICT |
RP-210136
| approved | RAN#91-e | TSG WG RAN5 | 16.7.0 | 5GS_NR_LTE-UEConTest |
|