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| 38.903 | 0305 | - | F | 16.10.1 | Rel-16 | Correction of clause 3 |
R5-221304
| agreed | RAN5#94-e | Ericsson |
RP-220076
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | 5GS_NR_LTE-UEConTest |
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| 38.903 | 0304 | 1 | F | 16.10.1 | Rel-16 | Test Tolerance analysis for inter-frequency RRC re-establishment test case |
R5-221644
| agreed | RAN5#94-e | Ericsson |
RP-220076
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | 5GS_NR_LTE-UEConTest |
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| 38.903 | 0303 | - | F | 16.10.1 | Rel-16 | Test Tolerance analysis for inter-frequency RRC re-establishment test case |
R5-221287
| agreed | RAN5#94-e | Ericsson |
RP-220076
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | 5GS_NR_LTE-UEConTest |
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| 38.903 | 0302 | - | F | 16.10.1 | Rel-16 | Test Tolerance analysis for E-UTRA - NR FR1 Cell reselection tests for HST |
R5-221286
| agreed | RAN5#94-e | Ericsson |
RP-220101
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | NR_HST-UEConTest |
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| 38.903 | 0301 | 1 | F | 16.10.1 | Rel-16 | 38.903 Beam correspondence Measurement Uncertainties |
R5-221629
| agreed | RAN5#94-e | Keysight techno... |
RP-220076
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | 5GS_NR_LTE-UEConTest |
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| 38.903 | 0300 | 1 | F | 16.10.1 | Rel-16 | Update of predicted SNR upper bound for noise free SDR scenarios |
R5-221747
| agreed | RAN5#94-e | Qualcomm CDMA T... |
RP-220076
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | 5GS_NR_LTE-UEConTest |
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| 38.903 | 0299 | - | F | 16.10.1 | Rel-16 | Addition of test tolerance analysis for 6.6.8.3 NR SA CSI-RS based L1-SINR measurement |
R5-220998
| agreed | RAN5#94-e | Huawei, HiSilicon |
RP-220094
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | NR_eMIMO-UEConTest |
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| 38.903 | 0298 | - | F | 16.10.1 | Rel-16 | Addition of test tolerance analysis for 6.6.8.2 NR SA SSB based L1-SINR measurement |
R5-220997
| agreed | RAN5#94-e | Huawei, HiSilicon |
RP-220094
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | NR_eMIMO-UEConTest |
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| 38.903 | 0297 | - | F | 16.10.1 | Rel-16 | Addition of test tolerance analysis for 4.6.7.3 EN-DC CSI-RS based L1-SINR measurement |
R5-220996
| agreed | RAN5#94-e | Huawei, HiSilicon |
RP-220094
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | NR_eMIMO-UEConTest |
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|
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| 38.903 | 0296 | - | F | 16.10.1 | Rel-16 | Addition of test tolerance analysis for 4.6.7.2 EN-DC SSB based L1-SINR measurement |
R5-220995
| agreed | RAN5#94-e | Huawei, HiSilicon |
RP-220094
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | NR_eMIMO-UEConTest |
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| 38.903 | 0295 | - | F | 16.10.1 | Rel-16 | Addition of test tolerance analysis for 4.6.7.1 and 6.6.8.1 EN-DC and NR SA CSI-RS based L1-SINR measurement |
R5-220994
| agreed | RAN5#94-e | Huawei, HiSilicon |
RP-220094
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | NR_eMIMO-UEConTest |
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| 38.903 | 0294 | 1 | F | 16.10.1 | Rel-16 | Add Test Tolerance analyses for NR SA FR1 cell re-selection for UE configured with highSpeedMeasFlag-r16 Test cases |
R5-221656
| agreed | RAN5#94-e | Anritsu |
RP-220101
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | NR_HST-UEConTest |
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| 38.903 | 0293 | 1 | F | 16.10.1 | Rel-16 | Addition of TT analysis for FR2 BFR test cases |
R5-221840
| agreed | RAN5#94-e | Huawei, HiSilicon |
RP-220094
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | NR_eMIMO-UEConTest |
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| 38.903 | 0292 | 1 | F | 16.10.1 | Rel-16 | Addition of summary table for MU factors |
R5-221746
| agreed | RAN5#94-e | Huawei, HiSilicon |
RP-220076
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | 5GS_NR_LTE-UEConTest |
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| 38.903 | 0291 | 1 | F | 16.10.1 | Rel-16 | TT analysis for Mob_enh RRM TCs 7.3.3.1 |
R5-221814
| agreed | RAN5#94-e | Huawei,Hisilicon |
RP-220091
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | NR_Mob_enh-UEConTest |
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| 38.903 | 0290 | 1 | F | 16.10.1 | Rel-16 | TT analysis for Mob_enh RRM TCs 7.3.1.4 and 7.3.1.5 |
R5-221649
| agreed | RAN5#94-e | Huawei,Hisilicon |
RP-220091
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | NR_Mob_enh-UEConTest |
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| 38.903 | 0289 | - | F | 16.10.1 | Rel-16 | TT analysis for FR2 SSB intra-freq measurement with DRX TCs |
R5-220718
| agreed | RAN5#94-e | Huawei,Hisilicon |
RP-220076
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | 5GS_NR_LTE-UEConTest |
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| 38.903 | 0288 | 1 | F | 16.10.1 | Rel-16 | TT analysis for FR2 SSB intra-freq measurement without DRX TCs |
R5-221745
| agreed | RAN5#94-e | Huawei,Hisilicon |
RP-220076
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | 5GS_NR_LTE-UEConTest |
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| 38.903 | 0287 | 1 | F | 16.10.1 | Rel-16 | TT analysis for FR2 SSB based BFD TCs |
R5-221744
| agreed | RAN5#94-e | Huawei,Hisilicon |
RP-220076
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | 5GS_NR_LTE-UEConTest |
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| 38.903 | 0286 | 1 | F | 16.10.1 | Rel-16 | FR2 EVM MU definition in 38.903 |
R5-221743
| agreed | RAN5#94-e | Keysight Techno... |
RP-220076
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | 5GS_NR_LTE-UEConTest |
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| 38.903 | 0285 | - | F | 16.10.1 | Rel-16 | Test Tolerance analysis for FR1 CLI-RSSI measurement with non-DRX |
R5-220281
| agreed | RAN5#94-e | Qualcomm Tech. ... |
RP-220099
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | NR_CLI-UEConTest |
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| 38.903 | 0284 | 1 | F | 16.10.1 | Rel-16 | TT analysis for Mob_enh RRM TC 6.3.1.11+6.3.1.12 |
R5-221648
| agreed | RAN5#94-e | China Telecommu... |
RP-220091
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | NR_Mob_enh-UEConTest |
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| 38.903 | 0281 | 1 | F | 16.10.1 | Rel-16 | TT analysis for Mob_enh RRM TC 6.3.1.9+6.3.1.10 |
R5-221647
| agreed | RAN5#94-e | China Telecommu... |
RP-220091
| approved | RAN#95-e | TSG WG RAN5 | 16.11.0 | NR_Mob_enh-UEConTest |
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