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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.101-40380-F16.12.0Rel-16Correction for HST test setup from Rel-16 (TS 38.101-4, Rel-16) Details R4-2309311 agreedRAN4#107Huawei, HiSilicon Details RP-231354 approvedRAN#100RAN416.13.0NR_HST-Perf
See details 38.101-40370-F16.12.0Rel-16CR on 38.101-4: Introduction of channel model parameters definition specified for V2X requirements Details R4-2308846 agreedRAN4#107Huawei,HiSilicon Details RP-231351 approvedRAN#100RAN416.13.05G_V2X_NRSL-Perf
See details 38.101-40368-A16.12.0Rel-16CR on 38.101-4: Update PDSCH and PDCCH codebook configurations in 4Tx tests (Rel-16) Details R4-2308840 agreedRAN4#107Huawei,HiSilicon Details RP-231358 approvedRAN#100RAN416.13.0NR_newRAT-Perf
See details 38.101-40358-A16.12.0Rel-16CR to Candidate CCEs of SDR SA DL-CA Details R4-2307087 agreedRAN4#107Anritsu Corporation Details RP-231357 approvedRAN#100RAN416.13.0NR_newRAT-Perf
See details 38.101-403541F16.12.0Rel-16Correction CR for the Report Quantity for CQI Reporting Tests with 1TX Details R4-2309881 agreedRAN4#107Qualcomm Details RP-231358 approvedRAN#100RAN416.13.0NR_newRAT-Perf