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 17 items in 1 pages
 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.1333944-F16.17.0Rel-16[NR_unlic-Perf] HO test cases under CCA update Details R4-2321001 agreedRAN4#109Qualcomm Incorp... Details RP-233342 approvedRAN#102RAN416.18.0NR_unlic-Perf
See details 38.1333930-F16.17.0Rel-16[NR_unlic] EN-DC intra-frequency measurement test cases for NR-U – R16 Details R4-2320978 agreedRAN4#109Qualcomm Details RP-233342 approvedRAN#102RAN416.18.0NR_unlic-Perf
See details 38.13338991F16.17.0Rel-16Correction of measurement gap parameters for additional rel-16 mandatory gap patterns test case Details R4-2321552 agreedRAN4#109Ericsson Details RP-233341 approvedRAN#102RAN416.18.0NR_RRM_enh
See details 38.13338961F16.17.0Rel-16Corrections to NR Measurements with Autonomous Gaps Details R4-2321541 agreedRAN4#109Nokia, Nokia Sh... Details RP-233330 approvedRAN#102RAN416.18.0TEI16, NR_RRM_e...
See details 38.1333868-A16.17.0Rel-16[NR_unlic-Core]: Modify the condition for gradual timing adjustment. Details R4-2320569 agreedRAN4#109ZTE Details RP-233342 approvedRAN#102RAN416.18.0NR_unlic-Core
See details 38.13338422F16.17.0Rel-16[NR_RRM_enh-Core] CR on the SCell activation Details R4-2321553 agreedRAN4#109ZTE Details RP-233341 approvedRAN#102RAN416.18.0NR_RRM_enh-Core
See details 38.1333824-A16.17.0Rel-16NR_newRAT-Perf CR clarification on MAC-CE based TCI state switch delay Details R4-2320277 agreedRAN4#109Nokia, Nokia Sh... Details RP-233334 approvedRAN#102RAN416.18.0NR_newRAT-Perf
See details 38.1333819-F16.17.0Rel-16[NR_RRM_Enh-Perf] CR on TCs for UE specific CBW change R16 Details R4-2320168 agreedRAN4#109Apple Details RP-233341 approvedRAN#102RAN416.18.0NR_RRM_enh-Perf
See details 38.1333744-F16.17.0Rel-16[NR_newRAT-Perf] Correction to CORESET RMC and SS-RSRQ accuracy test cases_R16 Details R4-2319339 agreedRAN4#109Huawei, HiSilicon Details RP-233333 approvedRAN#102RAN416.18.0NR_newRAT-Perf
See details 38.13337351F16.17.0Rel-16Correction on measurements for UE configured with relaxed measurement criterion Details R4-2321526 agreedRAN4#109Samsung Details RP-233340 approvedRAN#102RAN416.18.0NR_UE_pow_sav-Core
See details 38.1333730-A16.17.0Rel-16[NR_newRAT-Perf] CR of correction in TC A.6.5.5.4 Details R4-2319173 agreedRAN4#109Samsung, Anritsu Details RP-233333 approvedRAN#102RAN416.18.0NR_newRAT-Perf
See details 38.1333726-F16.17.0Rel-16Draft CR on inter-frequency measurement without gap in CHO Details R4-2319161 agreedRAN4#109Ericsson Details RP-233338 approvedRAN#102RAN416.18.0NR_Mob_enh-Core
See details 38.1333723-F16.17.0Rel-16Draft CR on CSSF in NR-U Details R4-2319158 agreedRAN4#109Ericsson Details RP-233342 approvedRAN#102RAN416.18.0NR_unlic-Core
See details 38.1333687-F16.17.0Rel-16On MRTD/MTTD requirement for inter-band non-collocated EN-DC/NE-DC (R16) Details R4-2318627 agreedRAN4#109Apple, OPPO Details RP-233330 approvedRAN#102RAN416.18.0TEI16
See details 38.1333684-F16.17.0Rel-16CR on RRM test cases with testability issues - R16 Details R4-2318624 agreedRAN4#109Apple Details RP-233330 approvedRAN#102RAN416.18.0TEI15_Test, 5GS...
See details 38.1333669-F16.17.0Rel-16[NR_RRM_Enh-Perf] Maintenance perf part CR on event triggered reporting tests with additional mandatory gap pattern R16 Details R4-2318457 agreedRAN4#109MediaTek inc. Details RP-233341 approvedRAN#102RAN416.18.0NR_RRM_enh-Perf
See details 38.1333661-F16.17.0Rel-16CR on R16 positioning test cases Details R4-2318345 agreedRAN4#109CATT Details RP-233342 approvedRAN#102RAN416.18.0NR_pos-Perf