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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.521-313331F17.3.0Rel-17MSD test configurations modification for US inter-band EN-DC combinations with n77 Details R5-221885 agreedRAN5#94-eApple Portugal Details RP-220112 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31332-F17.3.0Rel-17Addition of PC2 ENDC 4 combos into 38.521-3 TC7.3B.2 Details R5-221337 agreedRAN5#94-eVerizon Switzer... Details RP-220113 approvedRAN#95-eTSG WG RAN517.4.0ENDC_UE_PC2_R17...
See details 38.521-313311F17.3.0Rel-17Update for 7.3B.2 Details R5-221704 agreedRAN5#94-eQualcomm Korea Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31330-F17.3.0Rel-17Update Ref sense for r16 DC combos Details R5-221329 agreedRAN5#94-eQualcomm Korea Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-313291F17.3.0Rel-17Update for 7.3B.2.0 Min Requirements of Ref sensitivity for EN-DC Details R5-221773 agreedRAN5#94-eQualcomm Korea Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31328-F17.3.0Rel-17Editorial Update for 6.2B.4.2.3.1 Details R5-221325 agreedRAN5#94-eQualcomm Korea Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31327-F17.3.0Rel-17Update for reference sensitivity for EN_DC_r15 Details R5-221321 agreedRAN5#94-eQualcomm Korea Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31326-F17.3.0Rel-17Update for 6.5B.4.2 Additional Spurious Emissions for Intra-band non-contiguous EN-DC Details R5-221317 agreedRAN5#94-eQualcomm Korea Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-313251F17.3.0Rel-17Update Rx Requirements for 4 Rel-17 ENDC combos Details R5-221884 agreedRAN5#94-eVerizon Switzer... Details RP-220112 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-313241F17.3.0Rel-17Editorial correction for 6.5B.3.3 Spurious emission Details R5-221702 agreedRAN5#94-eQualcomm Korea Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31323-F17.3.0Rel-17Update of E-UTRA configuration Details R5-221268 agreedRAN5#94-eROHDE & SCHWARZ Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-313221F17.3.0Rel-17Addition of new CADC MPR TC 6.2B.2.4_1.1 Details R5-221772 agreedRAN5#94-eIntertek Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-313211F17.3.0Rel-17Introduction of DC_1A_n5A, DC_1A_n7A, DC_3A_n5A, DC_7A_n5A, DC_28A_n7A to UE co-existence spurious emission test case Details R5-221771 agreedRAN5#94-eEricsson Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-313201F17.3.0Rel-17Introduction of DC_1A_n5A, DC_1A_n7A, DC_3A_n5A, DC_7A_n5A, DC_28A_n7A to general spurious emission test case Details R5-221770 agreedRAN5#94-eEricsson Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31318-F17.3.0Rel-17Addition of 6.2B.4.2.3a TIB,c for Inter-band NE-DC within FR1 Details R5-221172 agreedRAN5#94-eCMCC Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31317-F17.3.0Rel-17Addition of 6.4B.2.3a.4 EVM Equalizer Flatness for inter-band NE-DC within FR1 Details R5-221171 agreedRAN5#94-eCMCC Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31316-F17.3.0Rel-17Addition of 6.2B.2.3a MPR for inter-band NE-DC within FR1 Details R5-221170 agreedRAN5#94-eCMCC Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-313151F17.3.0Rel-17Update of 3.2 and 3.3 on symbols and abbreviations Details R5-221706 agreedRAN5#94-eZTE Corporation Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31314-F17.3.0Rel-17Correction of 6.2B.1.1 for intra-band contiguous EN-DC maximum output power Details R5-221053 agreedRAN5#94-eZTE Corporation Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31313-F17.3.0Rel-17Update of Annex F for Adjacent Channel Selectivity for intra-band EN-DC Details R5-220981 agreedRAN5#94-eHuawei, Hisilicon Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31312-F17.3.0Rel-17Correction to out-of-band blocking for intra-band contiguous EN-DC Details R5-220980 agreedRAN5#94-eHuawei, Hisilicon Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31311-F17.3.0Rel-17Update of Adjacent Channel Selectivity for intra-band non-contiguous EN-DC Details R5-220979 agreedRAN5#94-eHuawei, Hisilicon Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31310-F17.3.0Rel-17Correction to Adjacent Channel Selectivity for intra-band contiguous EN-DC Details R5-220978 agreedRAN5#94-eHuawei, Hisilicon Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31309-F17.3.0Rel-17Correction to Maximum Input Level for intra-band contiguous EN-DC Details R5-220977 agreedRAN5#94-eHuawei, Hisilicon Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31308-F17.3.0Rel-17Correction to reference sensitivity for intra-band contiguous EN-DC Details R5-220976 agreedRAN5#94-eHuawei, Hisilicon Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-313071F17.3.0Rel-17Addition of transmit power configuration for EN-DC reference sensitivity Details R5-221931 agreedRAN5#94-eHuawei, Hisilicon Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31306-F17.3.0Rel-17Update of 6.2B.4.1.3 Configured Output Power for Inter-Band EN-DC Details R5-220968 agreedRAN5#94-eHuawei, HiSilicon Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31305-F17.3.0Rel-17Update of 6.2B.1.3 Maximum Output Power for Inter-Band EN-DC Details R5-220967 agreedRAN5#94-eHuawei, HiSilicon Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-313041F17.3.0Rel-17Addition of annex F for test cases for EN-DC configurations with 3 uplink Details R5-221910 agreedRAN5#94-eHuawei, HiSilicon Details RP-220110 approvedRAN#95-eTSG WG RAN517.4.0DC_Pcmax_3UL_CC...
See details 38.521-313031F17.3.0Rel-17Addition of new test case 6.2B.4.1.3_1 for Configured Output Power for inter-band EN-DC with 3 uplink Details R5-221909 agreedRAN5#94-eHuawei, HiSilicon Details RP-220110 approvedRAN#95-eTSG WG RAN517.4.0DC_Pcmax_3UL_CC...
See details 38.521-313021F17.3.0Rel-17Addition of new test case 6.2B.1.3_1 for Maximum Output Power for inter-band EN-DC with 3 uplink Details R5-221908 agreedRAN5#94-eHuawei, HiSilicon Details RP-220110 approvedRAN#95-eTSG WG RAN517.4.0DC_Pcmax_3UL_CC...
See details 38.521-31301-F17.3.0Rel-17Addition of common uplink configuration for E-UTRA intra-band contiguous CA Details R5-220961 agreedRAN5#94-eHuawei, HiSilicon Details RP-220110 approvedRAN#95-eTSG WG RAN517.4.0DC_Pcmax_3UL_CC...
See details 38.521-313001F17.3.0Rel-17Correction of General Spurious emissions requirements for Rel-16 inter-band EN-DC FR1 two band combinations Details R5-221769 agreedRAN5#94-eNokia, Nokia Sh... Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31299-F17.3.0Rel-17Correction to test frequency of EN-DC 28_n51 in 7.3B.2.3 Details R5-220904 agreedRAN5#94-eAnritsu Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31298-F17.3.0Rel-17Correction to measurement timing for EN-DC combination with FDD and TDD Details R5-220902 agreedRAN5#94-eAnritsu Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-312971F17.3.0Rel-17Correction to test requirement of DC_xxA_n41A in 6.5B.3.3.1 Details R5-221768 agreedRAN5#94-eAnritsu Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31296-F17.3.0Rel-17Definition of MTSU for 7.6B.3.3_1.1 Details R5-220896 agreedRAN5#94-eAnritsu Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-312951F17.3.0Rel-17Correction to test procedure of FR1 EN-DC Spurious test for EN-DC only capable UE Details R5-221701 agreedRAN5#94-eAnritsu Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-312941F17.3.0Rel-17Definition of MTSU and TT for Intra-band EN-DC additional spurious emissions test cases Details R5-221700 agreedRAN5#94-eAnritsu, DOCOMO... Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-312931F17.3.0Rel-17Correction of ON OFF time mask for inter-band EN-DC including FR2 Details R5-221699 agreedRAN5#94-eAnritsu Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-312921F17.3.0Rel-17Update of MOP TC for PC2 ENDC configurations Details R5-221892 agreedRAN5#94-eChina Unicom Details RP-220113 approvedRAN#95-eTSG WG RAN517.4.0ENDC_UE_PC2_R17...
See details 38.521-31291-F17.3.0Rel-17Update Tx test cases for DC_n28A_3A, DC_n28A_3C, DC_n28A_39A, DC_n28A_39C Details R5-220766 agreedRAN5#94-eCMCC Details RP-220112 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31290-F17.3.0Rel-17Introduction of maximum output power test requirements for DC_1A_n5A, DC_1A_n7A, DC_3A_n5A, DC_7A_n5A and DC_28A_n7A Details R5-220759 agreedRAN5#94-eEricsson Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-312891F17.3.0Rel-17Updating on 6.5B.3.3.2 Spurious emission for UE co-existence for inter-band within FR1 including n1 Details R5-221698 agreedRAN5#94-eNTT DOCOMO INC. Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-312881F17.3.0Rel-17Clarification on clause number of NE-DC for Rx test cases Details R5-221703 agreedRAN5#94-eCMCC Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-312871F17.3.0Rel-17Clarification on clause number of NE-DC for Tx test cases Details R5-221697 agreedRAN5#94-eCMCC Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31286-F17.3.0Rel-17Adding RIB,c for Inter-band NE-DC Details R5-220655 agreedRAN5#94-eCMCC Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-312851F17.3.0Rel-17Update NE-DC configurations for DC_n28A_3A, DC_n28A_3C, DC_n28A_39A, DC_n28A_39C Details R5-221886 agreedRAN5#94-eCMCC Details RP-220112 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31284-F17.3.0Rel-17Addition of 6.4E.2.1 Error Vector Magnitude for V2X Details R5-220540 agreedRAN5#94-eTTA Details RP-220092 approvedRAN#95-eTSG WG RAN517.4.05G_V2X_NRSL_eV2...
See details 38.521-31283-F17.3.0Rel-17Addition of 6.4E.1 Frequency error for V2X Details R5-220539 agreedRAN5#94-eTTA Details RP-220092 approvedRAN#95-eTSG WG RAN517.4.05G_V2X_NRSL_eV2...
See details 38.521-31282-F17.3.0Rel-17Correction on test requirements for TC 6.5B.3.3.2 Details R5-220538 agreedRAN5#94-eTTA Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31281-F17.3.0Rel-17Update to R17 Configuration for DC Details R5-220432 agreedRAN5#94-eBureau Veritas,... Details RP-220112 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31280-F17.3.0Rel-17Update to R16 Configuration for DC Details R5-220431 agreedRAN5#94-eBureau Veritas,... Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-312781F17.3.0Rel-17Regrouping DC Configuration in clause 5 Details R5-221705 agreedRAN5#94-eBureau Veritas,... Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31277-F17.3.0Rel-17Introduction of DC_28A_n7A-n78A reference sensitivity test requirements Details R5-220390 agreedRAN5#94-eEricsson Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31276-F17.3.0Rel-17Introduction of DC_7A-n78A reference sensitivity test requirements Details R5-220387 agreedRAN5#94-eEricsson Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31275-F17.3.0Rel-17Introduction of DC_7A-n5A reference sensitivity test requirements Details R5-220384 agreedRAN5#94-eEricsson Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31274-F17.3.0Rel-17Introduction of DC_3A-n5A reference sensitivity test requirements Details R5-220382 agreedRAN5#94-eEricsson Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31273-F17.3.0Rel-17Introduction of DC_1A-n5A reference sensitivity test requirements Details R5-220380 agreedRAN5#94-eEricsson Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-312721F17.3.0Rel-17Update Tx TC for 4 Rel-17 combos Details R5-221883 agreedRAN5#94-eVerizon Switzer... Details RP-220112 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31271-F17.3.0Rel-17Update for 6.5B.3.3.2 Spurious emission band UE co-existence for 4 Rel-17 combos Details R5-220371 agreedRAN5#94-eVerizon Switzer... Details RP-220112 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31270-F17.3.0Rel-17Update general spurious emissions 6.5B.3.3.1 for 4 Rel-17 ENDC combos Details R5-220369 agreedRAN5#94-eVerizon Switzer... Details RP-220112 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-312691F17.3.0Rel-17FR2 NSA EVM test case editor notes update Details R5-221696 agreedRAN5#94-eKeysight Techno... Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31268-F17.3.0Rel-17Adding reference sensitivity requirements for Rel-16 inter-band EN-DC FR1 two band combinations Details R5-220323 agreedRAN5#94-eNokia, Nokia Sh... Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31267-F17.3.0Rel-17Adding Reference sensitivity exceptions and MSD test points for Rel-16 inter-band EN-DC FR1 two band combinations Details R5-220322 agreedRAN5#94-eNokia, Nokia Sh... Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-312661F17.3.0Rel-17Introduction of Spurious emissions band UE co-existence requirements for Rel-16 inter-band EN-DC FR1 two band combinations Details R5-221767 agreedRAN5#94-eNokia, Nokia Sh... Details RP-220086 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31265-F17.3.0Rel-17Introduction of General Spurious emissions requirements for Rel-16 inter-band EN-DC FR1 two band combinations Details R5-220315 agreedRAN5#94-eNokia, Nokia Sh... Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-31264-F17.3.0Rel-17Introduction of Output power requirements for Rel-16 inter-band EN-DC FR1 two band combinations Details R5-220314 agreedRAN5#94-eNokia, Nokia Sh... Details RP-220085 approvedRAN#95-eTSG WG RAN517.4.0NR_CADC_NR_LTE_...
See details 38.521-312621F17.3.0Rel-17Update MOP for inter-band NE-DC within FR1 Details R5-221695 agreedRAN5#94-eCMCC Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31261-F17.3.0Rel-17Clarifications on 5G NR connectivity options for RF FR1 and FR2 Details R5-220275 agreedRAN5#94-eCMCC Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31260-F17.3.0Rel-17FR1 NSA IBC - ACLR clean up to leverage MPR test definition Details R5-220260 agreedRAN5#94-eKeysight Techno... Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31259-F17.3.0Rel-17Introduction of new V2X test cases in 7.8E Details R5-220089 agreedRAN5#94-eCAICT Details RP-220092 approvedRAN#95-eTSG WG RAN517.4.05G_V2X_NRSL_eV2...
See details 38.521-31258-F17.3.0Rel-17Introduction of new V2X test cases in 7.7E Details R5-220088 agreedRAN5#94-eCAICT Details RP-220092 approvedRAN#95-eTSG WG RAN517.4.05G_V2X_NRSL_eV2...
See details 38.521-31257-F17.3.0Rel-17Introduction of new V2X test cases in 7.6E Details R5-220087 agreedRAN5#94-eCAICT Details RP-220092 approvedRAN#95-eTSG WG RAN517.4.05G_V2X_NRSL_eV2...
See details 38.521-31256-F17.3.0Rel-17Correction of Editor Note and reference section numbers in 6.5B.3.4.2_1 Details R5-220070 agreedRAN5#94-eCAICT Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31255-F17.3.0Rel-17Correction of reference section numbers in 6.4B.2.4.5.4.1 Details R5-220069 agreedRAN5#94-eCAICT Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31254-F17.3.0Rel-17Correction of test config table for 6.3B.3_1.1 Details R5-220068 agreedRAN5#94-eCAICT Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-312531F17.3.0Rel-17Correction of 6.5B.2.3.3 to include 6.5.2.4.2 of 38.521-1 Details R5-221694 agreedRAN5#94-eCAICT Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-312521F17.3.0Rel-17Correction of Test applicability of 6.2B.3.3 Details R5-221693 agreedRAN5#94-eCAICT Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest
See details 38.521-31251-F17.3.0Rel-17Correction of Test applicability of 6.2B.2.3 Details R5-220063 agreedRAN5#94-eCAICT Details RP-220075 approvedRAN#95-eTSG WG RAN517.4.05GS_NR_LTE-UEConTest