|
|
| 38.905 | 0674 | 1 | F | 17.5.0 | Rel-17 | Updated TP analysis MPR for CA in FR2 |
R5-225832
| agreed | RAN5#96-e | Ericsson |
RP-222007
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | TEI15_Test |
|
|
|
| 38.905 | 0673 | - | F | 17.5.0 | Rel-17 | Editorial correction for DC_1A_n5A |
R5-225108
| agreed | RAN5#96-e | ROHDE & SCHWARZ |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0672 | - | F | 17.5.0 | Rel-17 | Updating TP analysis for FR1 test case 6.3A.3.1_1 |
R5-225076
| agreed | RAN5#96-e | Huawei, Hisilicon |
RP-221953
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_RF_FR1-UEConTest |
|
|
|
| 38.905 | 0671 | - | F | 17.5.0 | Rel-17 | Adding TP analysis for new FR1 test case 6.3C.3.2 |
R5-225074
| agreed | RAN5#96-e | Huawei, Hisilicon |
RP-221953
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_RF_FR1-UEConTest |
|
|
|
| 38.905 | 0670 | - | F | 17.5.0 | Rel-17 | Updating test point selection criteria for FR1 SUL test cases |
R5-225065
| agreed | RAN5#96-e | Huawei, Hisilicon |
RP-222007
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | TEI15_Test, 5GS... |
|
|
|
| 38.905 | 0669 | - | F | 17.5.0 | Rel-17 | Incorrect TP analysis revision for test case 6.2D.2 |
R5-224965
| agreed | RAN5#96-e | Ericsson |
RP-222007
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | TEI15_Test, 5GS... |
|
|
|
| 38.905 | 0668 | - | F | 17.5.0 | Rel-17 | Editorial corrections to spurious emission test cases for DC_8A_n3A, DC_8A_n20A and DC_20A_n3A |
R5-224959
| agreed | RAN5#96-e | ZTE Corporation |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0667 | - | F | 17.5.0 | Rel-17 | Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_66A_n41A |
R5-224955
| agreed | RAN5#96-e | ZTE Corporation |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0666 | - | F | 17.5.0 | Rel-17 | Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_48A_n66A |
R5-224953
| agreed | RAN5#96-e | ZTE Corporation |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0665 | - | F | 17.5.0 | Rel-17 | Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_48A_n5A |
R5-224951
| agreed | RAN5#96-e | ZTE Corporation |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0664 | - | F | 17.5.0 | Rel-17 | Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n1A |
R5-224949
| agreed | RAN5#96-e | ZTE Corporation |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0663 | - | F | 17.5.0 | Rel-17 | Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_13A_n2A |
R5-224948
| agreed | RAN5#96-e | ZTE Corporation |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0662 | - | F | 17.5.0 | Rel-17 | Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n41A |
R5-224947
| agreed | RAN5#96-e | ZTE Corporation |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0661 | - | F | 17.5.0 | Rel-17 | Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n3A |
R5-224945
| agreed | RAN5#96-e | ZTE Corporation |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0660 | - | F | 17.5.0 | Rel-17 | Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_2A_n41A |
R5-224944
| agreed | RAN5#96-e | ZTE Corporation |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0659 | - | F | 17.5.0 | Rel-17 | Introduction of reference sensitivity test point analysis for DC_2A-66A_n41A |
R5-224940
| agreed | RAN5#96-e | ZTE Corporation |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0658 | - | F | 17.5.0 | Rel-17 | Editorial corrections to the timeline for introduction of test points |
R5-224938
| agreed | RAN5#96-e | ZTE Corporation |
RP-222007
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | TEI15_Test, 5GS... |
|
|
|
| 38.905 | 0657 | - | F | 17.5.0 | Rel-17 | General rule for TP selection for NR_U test cases |
R5-224901
| agreed | RAN5#96-e | Qualcomm Austri... |
RP-221966
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_unlic-UEConTest |
|
|
|
| 38.905 | 0656 | 1 | F | 17.5.0 | Rel-17 | Ref sensitivity TP selection for DC_21A_n79A |
R5-225831
| agreed | RAN5#96-e | Qualcomm Austri... |
RP-222007
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | TEI15_Test, 5GS... |
|
|
|
| 38.905 | 0655 | 1 | F | 17.5.0 | Rel-17 | Ref sensitivity TP selection for DC_8A_n79A |
R5-225830
| agreed | RAN5#96-e | Qualcomm Austri... |
RP-222007
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | TEI15_Test, 5GS... |
|
|
|
| 38.905 | 0654 | 1 | F | 17.5.0 | Rel-17 | Ref sensitivity TP selection for DC_5A_n78A |
R5-225829
| agreed | RAN5#96-e | Qualcomm Austri... |
RP-222007
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | TEI15_Test, 5GS... |
|
|
|
| 38.905 | 0653 | 1 | F | 17.5.0 | Rel-17 | Ref sensitivity TP selection for DC_8A_n78A |
R5-225828
| agreed | RAN5#96-e | Qualcomm Austri... |
RP-222007
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | TEI15_Test, 5GS... |
|
|
|
| 38.905 | 0652 | 1 | F | 17.5.0 | Rel-17 | Ref sensitivity TP selection for DC_3A_n77A |
R5-225827
| agreed | RAN5#96-e | Qualcomm Austri... |
RP-222007
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | TEI15_Test, 5GS... |
|
|
|
| 38.905 | 0651 | 1 | F | 17.5.0 | Rel-17 | Ref sensitivity TP selection for DC_1A_n77A |
R5-225826
| agreed | RAN5#96-e | Qualcomm Austri... |
RP-222007
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | TEI15_Test, 5GS... |
|
|
|
| 38.905 | 0650 | 1 | F | 17.5.0 | Rel-17 | Update Spurious emission TP R16 DC_5A_n2A |
R5-225716
| agreed | RAN5#96-e | Qualcomm Austri... |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0649 | - | F | 17.5.0 | Rel-17 | TP analysis for additional spurious emission for NS_14 |
R5-224886
| agreed | RAN5#96-e | Qualcomm Austri... |
RP-221952
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_bands_BW_R16... |
|
|
|
| 38.905 | 0648 | 1 | F | 17.5.0 | Rel-17 | Ref sensitivity TP selection for DC_2A_n41A |
R5-225825
| agreed | RAN5#96-e | Qualcomm Austri... |
RP-222007
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | TEI15_Test, 5GS... |
|
|
|
| 38.905 | 0647 | - | F | 17.5.0 | Rel-17 | A-MPR TP analysis for Rel-17 CA_n24-n77 |
R5-224873
| agreed | RAN5#96-e | Ligado Networks |
RP-221973
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0646 | - | F | 17.5.0 | Rel-17 | A-MPR TP analysis for Rel-17 CA_n24-n48 |
R5-224872
| agreed | RAN5#96-e | Ligado Networks |
RP-221973
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0645 | 1 | F | 17.5.0 | Rel-17 | A-MPR TP analysis for Rel-17 CA_n24-n41 |
R5-225739
| agreed | RAN5#96-e | Ligado Networks |
RP-221973
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0644 | 1 | F | 17.5.0 | Rel-17 | Test point analysis for reference sensitivity for many 4CA combos |
R5-225738
| agreed | RAN5#96-e | WE Certificatio... |
RP-221973
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0643 | 1 | F | 17.5.0 | Rel-17 | Tx Spurious emissions test point analysis for many UL CA combos |
R5-225737
| agreed | RAN5#96-e | WE Certificatio... |
RP-221973
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0642 | 1 | F | 17.5.0 | Rel-17 | Update to MPR for CA TP analysis to add PC2 requirements |
R5-225779
| agreed | RAN5#96-e | Huawei, HiSilicon |
RP-221979
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_RF_FR1_enh-U... |
|
|
|
| 38.905 | 0641 | 1 | F | 17.5.0 | Rel-17 | Update TP analysis for AMPR NS_05 and NS_05U |
R5-225746
| agreed | RAN5#96-e | MediaTek Beijin... |
RP-221978
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_PC2_UE_FDD-U... |
|
|
|
| 38.905 | 0640 | - | F | 17.5.0 | Rel-17 | Addition of test point analysis for TxD test cases |
R5-224792
| agreed | RAN5#96-e | Huawei, HiSilicon |
RP-221980
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_RF_TxD-UEConTest |
|
|
|
| 38.905 | 0638 | 1 | F | 17.5.0 | Rel-17 | TP analysis for ref sensitivity for Rel-16 NR CA combos |
R5-225715
| agreed | RAN5#96-e | Verizon Switzer... |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0637 | 1 | F | 17.5.0 | Rel-17 | Update TP analysis for Rel-16 CA_n66A_n77A |
R5-225714
| agreed | RAN5#96-e | Verizon Switzer... |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0636 | 1 | F | 17.5.0 | Rel-17 | Update TP analysis for Rel-16 CA_n5A_n77A |
R5-225713
| agreed | RAN5#96-e | Verizon Switzer... |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0635 | 1 | F | 17.5.0 | Rel-17 | Update TP analysis for Rel-16 CA_n2A_n77A |
R5-225712
| agreed | RAN5#96-e | Verizon Switzer... |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0634 | - | F | 17.5.0 | Rel-17 | Correction of test points analysis of some Rx test cases in 38.521-1 for the addition of test points for asymmetric channel bandwidths and UL-MIMO |
R5-224254
| agreed | RAN5#96-e | CAICT |
RP-222007
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | TEI15_Test, 5GS... |
|
|
|
| 38.905 | 0633 | - | F | 17.5.0 | Rel-17 | Adding test point analysis for A_MPR NS_27 with 30 MHz channel bandwidth |
R5-224207
| agreed | RAN5#96-e | Ericsson |
RP-221969
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_lic_bands_BW... |
|
|
|
| 38.905 | 0632 | 1 | F | 17.5.0 | Rel-17 | Introduction of spurious emission TP analysis for CA_n48A-n70A |
R5-225749
| agreed | RAN5#96-e | Nokia, Nokia Sh... |
RP-221967
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | LTE_NR_DC_CA_en... |
|
|
|
| 38.905 | 0631 | - | F | 17.5.0 | Rel-17 | Introduction of reference sensitivity test point analysis for DC_3A-7A-20A_n8A |
R5-224158
| agreed | RAN5#96-e | Nokia, Nokia Sh... |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0630 | 1 | F | 17.5.0 | Rel-17 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_3A_n8A |
R5-225711
| agreed | RAN5#96-e | Nokia, Nokia Sh... |
RP-221950
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.905 | 0629 | 1 | F | 17.5.0 | Rel-17 | Test point analysis for test 6.2.4_1 Configured transmitted power with Power Boost |
R5-225745
| agreed | RAN5#96-e | Keysight techno... |
RP-221963
| approved | RAN#97-e | TSG WG RAN5 | 17.6.0 | NR_RF_FR2_req_e... |
|