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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.52202991F17.8.0Rel-17Applicability update for FR2 TCI state switch tests Details R5-233693 agreedRAN5#99Qualcomm France Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.5220298-F17.8.0Rel-17Applicability updates to FR2 RF tests Details R5-233253 agreedRAN5#99Apple Inc Details RP-230960 approvedRAN#100TSG WG RAN517.9.0NR_RF_FR2_req_e...
See details 38.52202971F17.8.0Rel-17Addition of applicability for FR2 RF phase continuity test Details R5-233687 agreedRAN5#99Apple Inc Details RP-230939 approvedRAN#100TSG WG RAN517.9.0NR_cov_enh-UEConTest
See details 38.52202961F17.8.0Rel-17Update to handle the test case applicability with different branches Details R5-233685 agreedRAN5#99Bureau Veritas ... Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.52202951F17.8.0Rel-17Correction to applicability of 5G test cases Details R5-233728 agreedRAN5#99Bureau Veritas ... Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.5220294-F17.8.0Rel-17Update applicability for in-band blocking FR2 CA test cases Details R5-233177 revisedRAN5#99ROHDE & SCHWARZ   17.9.0TEI15_Test, 5GS...
See details 38.52202931F17.8.0Rel-17Update of applicability for FR2 CA test cases Details R5-233727 agreedRAN5#99ROHDE & SCHWARZ Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.52202911F17.8.0Rel-17Addition of applicabiltiy for NR feMIMO test cases Details R5-233689 agreedRAN5#99Huawei, HiSilicon Details RP-230940 approvedRAN#100TSG WG RAN517.9.0NR_feMIMO-UEConTest
See details 38.52202901F17.8.0Rel-17Update to test applicability of SUL test cases Details R5-233715 agreedRAN5#99Huawei, HiSilicon Details RP-230947 approvedRAN#100TSG WG RAN517.9.0NR_redcap_plus_...
See details 38.5220289-F17.8.0Rel-17Update to test applicability of beam correspondence Details R5-233032 agreedRAN5#99Huawei, HiSilicon Details RP-230924 approvedRAN#100TSG WG RAN517.9.0NR_RF_FR2_req_e...
See details 38.5220287-F17.8.0Rel-17Applicability of FR2 RedCap reselection test cases Details R5-232928 agreedRAN5#99Ericsson Details RP-230947 approvedRAN#100TSG WG RAN517.9.0NR_redcap_plus_...
See details 38.52202851F17.8.0Rel-17Applicability update for CLI test cases Details R5-233731 agreedRAN5#99Qualcomm Europe... Details RP-230921 approvedRAN#100TSG WG RAN517.9.0NR_CLI-UEConTest
See details 38.5220284-F17.8.0Rel-17Adding applicability for MMSE-IRC test cases Details R5-232834 agreedRAN5#99China Telecom Details RP-230937 approvedRAN#100TSG WG RAN517.9.0NR_demod_enh2-U...
See details 38.5220283-F17.8.0Rel-17Update to R17 NR HST FR1 enh test cases applicability Details R5-232812 agreedRAN5#99CMCC, Ericsson Details RP-230956 approvedRAN#100TSG WG RAN517.9.0NR_HST_FR1_enh-...
See details 38.52202811F17.8.0Rel-17Update to R16 NR CADC configuration test cases applicability Details R5-233736 agreedRAN5#99CMCC, Intertek,... Details RP-230918 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.52202801F17.8.0Rel-17Correction to applicability for performance test cases Details R5-233692 agreedRAN5#99TTA Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, NR_...
See details 38.5220279-F17.8.0Rel-17Correction to test applicability for UL MIMO test cases Details R5-232756 agreedRAN5#99Huawei, HiSilicon Details RP-230981 approvedRAN#100TSG WG RAN517.9.0TEI16_Test, NR_...
See details 38.5220278-F17.8.0Rel-17Addition of test applicability for SUL test cases with UL MIMO Details R5-232742 agreedRAN5#99Huawei, HiSilicon Details RP-230930 approvedRAN#100TSG WG RAN517.9.0NR_bands_UL_MIM...
See details 38.52202771F17.8.0Rel-17Update to RRM applicability rules and test optimization - 38.522 Details R5-233691 agreedRAN5#99Qualcomm France Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.5220276-F17.8.0Rel-17Addition of applicability for test case 6.5F.2.4.2 Details R5-232580 agreedRAN5#99Ericsson Details RP-230925 approvedRAN#100TSG WG RAN517.9.0NR_unlic-UEConTest
See details 38.5220275-F17.8.0Rel-17Addition of applicability for RedCap demod test cases Details R5-232578 agreedRAN5#99Ericsson Details RP-230947 approvedRAN#100TSG WG RAN517.9.0NR_redcap_plus_...
See details 38.52202741F17.8.0Rel-17Update of eMG case applicabilities Details R5-233710 agreedRAN5#99MediaTek Inc. Details RP-230963 approvedRAN#100TSG WG RAN517.9.0NR_MG_enh-UEConTest
See details 38.5220273-F17.8.0Rel-17Correction to applicability of RedCap RRM TCs Details R5-232458 agreedRAN5#99Huawei, HiSilicon Details RP-230947 approvedRAN#100TSG WG RAN517.9.0NR_redcap_plus_...
See details 38.5220272-F17.8.0Rel-17Adding applicability UE Rx-Tx time difference measurement for propagation delay compensation using TRS in FR2 Details R5-232274 agreedRAN5#99Nokia, Nokia Sh... Details RP-230955 approvedRAN#100TSG WG RAN517.9.0NR_IIOT_URLLC_e...
See details 38.52202711F17.8.0Rel-17Completion of applicability for DC_CA test cases Details R5-233686 agreedRAN5#99Nokia, Nokia Sh... Details RP-230926 approvedRAN#100TSG WG RAN517.9.0LTE_NR_DC_CA_en...
See details 38.52202701F17.8.0Rel-17Addition of applicability for 5GS HST FR2 test case Details R5-233506 agreedRAN5#99Nokia, Nokia Sh... Details RP-230957 approvedRAN#100TSG WG RAN517.9.0NR_HST_FR2-UEConTest
See details 38.5220269-F17.8.0Rel-17Adding applicability statement for SCell Activation and deactivation for SCell in FR2 inter-band in non-DRX Details R5-232129 agreedRAN5#99Nokia, Nokia Sh... Details RP-230960 approvedRAN#100TSG WG RAN517.9.0NR_RF_FR2_req_e...
See details 38.52202681F17.8.0Rel-17Add applicability of new test cases for gap enhancement- Pre-MG and NCSG Details R5-233690 agreedRAN5#99MediaTek Inc. Details RP-230963 approvedRAN#100TSG WG RAN517.9.0NR_MG_enh-UEConTest