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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 34.229-115581F17.1.0Rel-17Updates to SRVCC related generic test procedures Details R5-247689 agreedRAN5#105MCC TF160 Details RP-242726 approvedRAN#106RAN517.2.0TEI8_Test
See details 34.229-115571F17.1.0Rel-17Correction to VOLTE TC 17.1 Details R5-247609 agreedRAN5#105Huawei, Hisilicon Details RP-242726 approvedRAN#106RAN517.2.0TEI8_Test
See details 34.229-11556-F17.1.0Rel-17IETF reference updates to Annex H.8.3 Details R5-247113 agreedRAN5#105Ericsson Details RP-242729 approvedRAN#106RAN517.2.0TEI12_Test
See details 34.229-11555-F17.1.0Rel-17IETF reference updates to Annex H.8.2 Details R5-247112 agreedRAN5#105Ericsson Details RP-242729 approvedRAN#106RAN517.2.0TEI12_Test
See details 34.229-11554-F17.1.0Rel-17IETF reference updates to TC 19.5.7 Details R5-247111 agreedRAN5#105Ericsson Details RP-242727 approvedRAN#106RAN517.2.0TEI9_Test
See details 34.229-11553-F17.1.0Rel-17IETF reference updates to TC 19.5.6 Details R5-247110 agreedRAN5#105Ericsson Details RP-242727 approvedRAN#106RAN517.2.0TEI9_Test
See details 34.229-11552-F17.1.0Rel-17IETF reference updates to TC 19.5.1 Details R5-247109 agreedRAN5#105Ericsson Details RP-242727 approvedRAN#106RAN517.2.0TEI9_Test
See details 34.229-11551-F17.1.0Rel-17IETF reference updates to TC 19.4.5 Details R5-247108 agreedRAN5#105Ericsson Details RP-242727 approvedRAN#106RAN517.2.0TEI9_Test
See details 34.229-11550-F17.1.0Rel-17IETF reference updates to TC 19.4.2 Details R5-247107 agreedRAN5#105Ericsson Details RP-242727 approvedRAN#106RAN517.2.0TEI9_Test
See details 34.229-11549-F17.1.0Rel-17IETF reference updates to TC 19.4.1 Details R5-247106 agreedRAN5#105Ericsson Details RP-242727 approvedRAN#106RAN517.2.0TEI9_Test
See details 34.229-11548-F17.1.0Rel-17IETF reference updates to TC 19.3.1 Details R5-247105 agreedRAN5#105Ericsson Details RP-242727 approvedRAN#106RAN517.2.0TEI9_Test
See details 34.229-11547-F17.1.0Rel-17IETF reference updates to TC 12.12 Details R5-247104 agreedRAN5#105Ericsson Details RP-242726 approvedRAN#106RAN517.2.0TEI8_Test
See details 34.229-11546-F17.1.0Rel-17IETF reference updates to TC 8.13 Details R5-247103 agreedRAN5#105Ericsson Details RP-242726 approvedRAN#106RAN517.2.0TEI8_Test
See details 34.229-11545-F17.1.0Rel-17IETF reference updates to TC 8.12 Details R5-247102 agreedRAN5#105Ericsson Details RP-242726 approvedRAN#106RAN517.2.0TEI8_Test
See details 34.229-11544-F17.1.0Rel-17IETF reference updates to TC 8.3 Details R5-247101 agreedRAN5#105Ericsson Details RP-242726 approvedRAN#106RAN517.2.0TEI8_Test
See details 34.229-11543-F17.1.0Rel-17IETF reference updates to TC 8.2 Details R5-247100 agreedRAN5#105Ericsson Details RP-242726 approvedRAN#106RAN517.2.0TEI8_Test
See details 34.229-115421F17.1.0Rel-17Corrections and clarifications for use of conditions in test cases Details R5-247607 agreedRAN5#105MCC TF160 Details RP-242726 approvedRAN#106RAN517.2.0TEI8_Test
See details 34.229-11541-F17.1.0Rel-17Corrections and clarifications for use of conditions in annex C Details R5-246633 agreedRAN5#105MCC TF160 Details RP-242726 approvedRAN#106RAN517.2.0TEI8_Test
See details 34.229-11540-F17.1.0Rel-17Corrections and clarifications for conditions in SIP default message contents Details R5-246632 agreedRAN5#105MCC TF160 Details RP-242726 approvedRAN#106RAN517.2.0TEI8_Test
See details 34.229-115391F17.1.0Rel-17Update NG.114 version Details R5-247606 agreedRAN5#105Ericsson Details RP-242736 approvedRAN#106RAN517.2.0TEI15_Test