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| 38.521-3 | 1919 | - | F | 18.5.0 | Rel-18 | Corrections on Ch5 and Annex N for UE capability names |
R5-251097
| agreed | RAN5#106 | ZTE Corporation... |
RP-250731
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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|
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| 38.521-3 | 1918 | 1 | F | 18.5.0 | Rel-18 | Corrections on test coverage rules for NSA band combinations |
R5-251561
| agreed | RAN5#106 | ZTE Corporation... |
RP-250733
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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|
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| 38.521-3 | 1917 | - | F | 18.5.0 | Rel-18 | Updates on Ch7 for PC2 cross band isloation MSD for DC_2A_n41A |
R5-251095
| agreed | RAN5#106 | ZTE Corporation |
RP-250740
| approved | RAN#107 | RAN5 | 18.6.0 | TEI17_Test |
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|
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| 38.521-3 | 1916 | 1 | F | 18.5.0 | Rel-18 | Additions on Ch7 for harmonic mixing MSD for DC_5A_n78A |
R5-251525
| agreed | RAN5#106 | ZTE Corporation |
RP-250733
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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|
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| 38.521-3 | 1915 | - | F | 18.5.0 | Rel-18 | Updates on Ch7 for UL harmonic and harmonic mixing MSD for DC_3A_n77A and DC_3A_n78A |
R5-251093
| agreed | RAN5#106 | ZTE Corporation |
RP-250731
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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|
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| 38.521-3 | 1914 | - | F | 18.5.0 | Rel-18 | Corrections on Clause 7.3B.2 for intra-band contiguous EN-DC reference sensitivity |
R5-251092
| agreed | RAN5#106 | ZTE Corporation |
RP-250731
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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| 38.521-3 | 1913 | - | F | 18.5.0 | Rel-18 | Corrections on Ch6 for UE capability names |
R5-251091
| agreed | RAN5#106 | ZTE Corporation... |
RP-250731
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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|
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| 38.521-3 | 1912 | 1 | F | 18.5.0 | Rel-18 | Updates on Ch7 for PC2 refsens test requirement handling |
R5-251701
| agreed | RAN5#106 | ZTE Corporation... |
RP-250685
| approved | RAN#107 | RAN5 | 18.6.0 | HPUE_NR_CADC_NR... |
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| 38.521-3 | 1911 | 1 | F | 18.5.0 | Rel-18 | Updates on Ch7 for EN-DC refsens test requirement handling |
R5-251700
| agreed | RAN5#106 | ZTE Corporation |
RP-250666
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
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| 38.521-3 | 1910 | - | F | 18.5.0 | Rel-18 | Updates on Ch7 for cross band isloation MSD for DC_2A_n41A |
R5-251076
| agreed | RAN5#106 | ZTE Corporation |
RP-250666
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
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| 38.521-3 | 1909 | 2 | F | 18.5.0 | Rel-18 | CR for TS 38.521-3 to correct Test BW configuration of DC_5A-7A_n78A MSD |
R5-251440
| agreed | RAN5#106 | Samsung, Anritsu |
RP-250733
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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| 38.521-3 | 1908 | - | F | 18.5.0 | Rel-18 | Update for EN-DC Reference sensitivity testing |
R5-251028
| agreed | RAN5#106 | Rohde & Schwarz... |
RP-250731
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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|
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| 38.521-3 | 1907 | 1 | F | 18.5.0 | Rel-18 | Correction to DL frequency of DC_66A_n77A in 7.3B.2.3 |
R5-251688
| agreed | RAN5#106 | Anritsu |
RP-250743
| approved | RAN#107 | RAN5 | 18.6.0 | TEI17_Test |
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| 38.521-3 | 1906 | - | F | 18.5.0 | Rel-18 | Correction to DL frequency of DC_66A_n41A in 7.3B.2.3 |
R5-250964
| agreed | RAN5#106 | Anritsu |
RP-250666
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
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| 38.521-3 | 1905 | - | F | 18.5.0 | Rel-18 | Correction to DL UL allocation in 7.3B.2 for Rel-17 FR1 inter-band EN-DC |
R5-250957
| agreed | RAN5#106 | Anritsu |
RP-250672
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
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| 38.521-3 | 1904 | 1 | F | 18.5.0 | Rel-18 | Correction to DL UL allocation in 7.3B.2 for Rel-16 FR1 inter-band EN-DC |
R5-251559
| agreed | RAN5#106 | Anritsu |
RP-250666
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
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| 38.521-3 | 1903 | - | F | 18.5.0 | Rel-18 | Correction to DL UL allocation in 7.3B.2 for Rel-15 FR1 inter-band EN-DC |
R5-250955
| agreed | RAN5#106 | Anritsu |
RP-250731
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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| 38.521-3 | 1902 | - | F | 18.5.0 | Rel-18 | Correction of statistical testing of receiver characteristics for NR NSA |
R5-250947
| agreed | RAN5#106 | Anritsu |
RP-250730
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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| 38.521-3 | 1901 | 2 | F | 18.5.0 | Rel-18 | Addition of UE maximum output power for new PC2 EN-DC combs within FR1 |
R5-251754
| agreed | RAN5#106 | vivo |
RP-250685
| approved | RAN#107 | RAN5 | 18.6.0 | HPUE_NR_CADC_NR... |
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| 38.521-3 | 1899 | 1 | F | 18.5.0 | Rel-18 | Correction to reference sensitivity for Rel-15 inter-band EN-DC configurations |
R5-251560
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250733
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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|
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| 38.521-3 | 1898 | 1 | F | 18.5.0 | Rel-18 | Addition of Annex F for a bunch of 3Tx inter-band EN-DC test cases |
R5-251556
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
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| 38.521-3 | 1897 | - | F | 18.5.0 | Rel-18 | Addition of new test case 6.5L.5.3 for inter-band EN-DC with Tx Diversity |
R5-250750
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
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|
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| 38.521-3 | 1896 | - | F | 18.5.0 | Rel-18 | Addition of new test case 6.5L.4.3 for inter-band EN-DC with Tx Diversity |
R5-250749
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
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| 38.521-3 | 1895 | 1 | F | 18.5.0 | Rel-18 | Addition of new test cases 6.5L.2.3 OOBE for inter-band EN-DC with Tx Diversity |
R5-251696
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
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| 38.521-3 | 1894 | - | F | 18.5.0 | Rel-18 | Addition of new test case 6.5L.1.3 OBW for inter-band EN-DC with Tx Diversity |
R5-250747
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
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| 38.521-3 | 1893 | 1 | F | 18.5.0 | Rel-18 | Addition of new test case 6.5H.5.3 for inter-band EN-DC with UL MIMO |
R5-251555
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
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| 38.521-3 | 1892 | - | F | 18.5.0 | Rel-18 | Addition of new test case 6.5H.4.3 for inter-band EN-DC with UL MIMO |
R5-250745
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
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| 38.521-3 | 1891 | 1 | F | 18.5.0 | Rel-18 | Addition of new test cases 6.5H.2.3 OOBE for inter-band EN-DC with UL MIMO |
R5-251695
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
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| 38.521-3 | 1890 | - | F | 18.5.0 | Rel-18 | Addition of new test case 6.5H.1.3 OBW for inter-band EN-DC with UL MIMO |
R5-250743
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
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| 38.521-3 | 1888 | - | F | 18.5.0 | Rel-18 | Updating general rules in 4.5.0 for spurious emissions for UE co-existence testing |
R5-250442
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250729
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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|
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| 38.521-3 | 1887 | - | F | 18.5.0 | Rel-18 | Cleaning up R15 requirements in test case Spurious emission UE co-existence |
R5-250441
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250729
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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|
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| 38.521-3 | 1886 | - | F | 18.5.0 | Rel-18 | Updating test requirements of General spurious emissions for FR1 Inter-band EN-DC |
R5-250439
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250729
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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|
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| 38.521-3 | 1885 | 1 | F | 18.5.0 | Rel-18 | Missing test requirements for DC_14A_n66A in NSA test 6.5B.3.3.2 |
R5-251558
| agreed | RAN5#106 | Keysight Techno... |
RP-250666
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
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|
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| 38.521-3 | 1884 | - | F | 18.5.0 | Rel-18 | Missing test requirements for DC_1A_n8A in NSA test 6.2B.1.3 |
R5-250289
| agreed | RAN5#106 | Keysight Techno... |
RP-250666
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
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|
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| 38.521-3 | 1883 | - | F | 18.5.0 | Rel-18 | Editorial correction to DC_14A-66A_n77A PC2 reference sensitivity test requirement |
R5-250278
| agreed | RAN5#106 | WE Certificatio... |
RP-250738
| approved | RAN#107 | RAN5 | 18.6.0 | TEI17_Test |
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|
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| 38.521-3 | 1882 | - | F | 18.5.0 | Rel-18 | Editorial correction to DC_14A-66A_n77A PC3 reference sensitivity test requirement |
R5-250276
| agreed | RAN5#106 | WE Certificatio... |
RP-250672
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
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| 38.521-3 | 1881 | - | F | 18.5.0 | Rel-18 | FR2 MU - General Updates in 38.521-3 Rx test cases |
R5-250212
| agreed | RAN5#106 | Keysight Techno... |
RP-250728
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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|
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| 38.521-3 | 1880 | - | F | 18.5.0 | Rel-18 | FR2 MU - General Updates in 38.521-3 Tx test cases |
R5-250211
| agreed | RAN5#106 | Keysight Techno... |
RP-250728
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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|
|
| 38.521-3 | 1878 | - | F | 18.5.0 | Rel-18 | Editorial correction to Reference sensitivity for DC |
R5-250160
| agreed | RAN5#106 | MediaTek Beijin... |
RP-250728
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
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