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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.90510041F18.5.0Rel-18TP Analysis for 2AoA spherical coverage test Details R5-251519 agreedRAN5#106Apple Trading Details RP-250710 approvedRAN#107RAN518.6.0NR_FR2_multiRX_...
See details 38.90510011F18.5.0Rel-18TP analysis of 6.5E.3.2 Spurious emissions for UE co-existence for V2X intra-band concurrent operation Details R5-251542 agreedRAN5#106Huawei, HiSilicon Details RP-250678 approvedRAN#107RAN518.6.0NR_SL_enh-UEConTest
See details 38.90510001F18.5.0Rel-18TP analysis of 7.5E NR V2X Adjacent channel selectivity Details R5-251508 agreedRAN5#106Huawei, HiSilicon Details RP-250667 approvedRAN#107RAN518.6.05G_V2X_NRSL_eV2...
See details 38.9050999-F18.5.0Rel-18TP analysis of 7.4E NR V2X Maximum input level Details R5-251121 agreedRAN5#106Huawei, HiSilicon Details RP-250667 approvedRAN#107RAN518.6.05G_V2X_NRSL_eV2...
See details 38.9050998-F18.5.0Rel-18TP analysis of 6.4E.2.5 EVM equalizer spectrum flatness for V2X Details R5-251118 agreedRAN5#106Huawei, HiSilicon Details RP-250667 approvedRAN#107RAN518.6.05G_V2X_NRSL_eV2...
See details 38.9050997-F18.5.0Rel-18TP analysis of 6.4E.2.4 In-band emissions for V2X Details R5-251116 agreedRAN5#106Huawei, HiSilicon Details RP-250667 approvedRAN#107RAN518.6.05G_V2X_NRSL_eV2...
See details 38.9050996-F18.5.0Rel-18Updates on TP analysis for Refsens for PC2 DC_2A_n41A Details R5-251101 agreedRAN5#106ZTE Corporation Details RP-250740 approvedRAN#107RAN518.6.0TEI17_Test
See details 38.9050995-F18.5.0Rel-18Updates on TP analysis for Refsens for DC_5A_n78A Details R5-251100 agreedRAN5#106ZTE Corporation Details RP-250731 approvedRAN#107RAN518.6.0TEI15_Test
See details 38.9050994-F18.5.0Rel-18Updates on TP analysis for Refsens for DC_3A_n77A and DC_3A_n78A Details R5-251099 agreedRAN5#106ZTE Corporation Details RP-250731 approvedRAN#107RAN518.6.0TEI15_Test
See details 38.9050993-F18.5.0Rel-18Corrections on refsens exception types for 2CC and 3CC EN-DC configurations Details R5-251098 agreedRAN5#106ZTE Corporation Details RP-250731 approvedRAN#107RAN518.6.0TEI15_Test
See details 38.9050992-F18.5.0Rel-18Corrections on missing refsens exception type for two bands CA configurations Details R5-251078 agreedRAN5#106ZTE Corporation Details RP-250666 approvedRAN#107RAN518.6.0NR_CADC_NR_LTE_...
See details 38.9050990-F18.5.0Rel-18Inclination correction in orbital format GSO ephemeris files Details R5-250755 agreedRAN5#106Keysight Techno... Details RP-250712 approvedRAN#107RAN518.6.0NR_NTN_enh_plus...
See details 38.9050989-F18.5.0Rel-18Addition of MSD test point analysis for PC1.5 CA configurations Details R5-250742 agreedRAN5#106Huawei, HiSilicon Details RP-250688 approvedRAN#107RAN518.6.04Rx_low_NR_band...
See details 38.9050988-F18.5.0Rel-18TP analyze 6.2F.3 shared spectrum access NS_53 and NS_54 Details R5-250654 agreedRAN5#106Ericsson Details RP-250669 approvedRAN#107RAN518.6.0NR_unlic-UEConTest
See details 38.9050987-F18.5.0Rel-18Addition of test case 6.3F.3.2 General ON/OFF time mask in 38.905 Details R5-250653 agreedRAN5#106Ericsson Details RP-250669 approvedRAN#107RAN518.6.0NR_unlic-UEConTest
See details 38.9050986-F18.5.0Rel-18Updating the TP analysis for FR1 Out-of-band Blocking testing Details R5-250608 agreedRAN5#106Huawei, HiSilicon Details RP-250730 approvedRAN#107RAN518.6.0TEI15_Test
See details 38.9050985-F18.5.0Rel-18Updating TP analysis for FR1 NS_43U AMPR testing Details R5-250435 agreedRAN5#106Huawei, HiSilicon Details RP-250684 approvedRAN#107RAN518.6.0HPUE_NR_FR1_FDD...
See details 38.90509841F18.5.0Rel-18FR2 - TP analysis update for CA NS 202 for PCx other than PC1 Details R5-251522 agreedRAN5#106Keysight Techno... Details RP-250733 approvedRAN#107RAN518.6.0TEI15_Test
See details 38.9050983-F18.5.0Rel-18Addition of UL-MIMO test point analysis for band n26: AMPR_NS_12_13_14_15 Details R5-250240 agreedRAN5#106Nokia Details RP-250682 approvedRAN#107RAN518.6.0NR_bands_UL_MIM...
See details 38.9050982-F18.5.0Rel-18Addition of UL-MIMO test point analysis for band n13: AMPR NS_06, NS_07 Details R5-250239 agreedRAN5#106Nokia Details RP-250682 approvedRAN#107RAN518.6.0NR_bands_UL_MIM...
See details 38.9050981-F18.5.0Rel-18Addition of reference sensitivity test point analysis for CA_n28A-n78A PC2 Details R5-250233 agreedRAN5#106Nokia Details RP-250738 approvedRAN#107RAN518.6.0TEI17_Test
See details 38.9050980-F18.5.0Rel-18Addition of A-MPR test point analysis for NS_17/NS_01 PC2 Details R5-250232 agreedRAN5#106Nokia Details RP-250738 approvedRAN#107RAN518.6.0TEI17_Test
See details 38.9050979-F18.5.0Rel-18Addition of reference sensitivity TP analysis for new 4CC NRCA combo within FR1 Details R5-250227 agreedRAN5#106KDDI Corporation Details RP-250683 approvedRAN#107RAN518.6.0NR_CADC_NR_LTE_...
See details 38.90509781F18.5.0Rel-18Addition of reference sensitivity TP analysis for new PC1.5 2CC NRCA combo within FR1 Details R5-251521 agreedRAN5#106KDDI Corporation Details RP-250742 approvedRAN#107RAN518.6.0TEI17_Test
See details 38.90509771F18.5.0Rel-18Addition of reference sensitivity TP analysis for new HPUE NRCA and EN-DC combos within FR1 Details R5-251436 agreedRAN5#106KDDI Corporation Details RP-250685 approvedRAN#107RAN518.6.0HPUE_NR_CADC_NR...
See details 38.90509761F18.5.0Rel-18Introduce new TC 6.4J.1 Frequency error and 6.5J.2.2 test case for ATG Details R5-251515 agreedRAN5#106Ericsson Details RP-250687 approvedRAN#107RAN518.6.0NR_ATG-UEConTest
See details 38.9050975-F18.5.0Rel-18Update REFSENSE TP analysis for CA_n41C-n79C Details R5-250122 agreedRAN5#106CMCC Details RP-250683 approvedRAN#107RAN518.6.0NR_CADC_NR_LTE_...
See details 38.9050974-F18.5.0Rel-18Addition of TP analysis for ATG TCs Details R5-250115 agreedRAN5#106CMCC Details RP-250686 approvedRAN#107RAN518.6.0NR_ATG-UEConTest