• Specification number WG Status
    select
    Meeting
    Target Release
    select
    TSG Status
    select
    Work Item
    Entities
Data pager
Data pager
1
Page size:
PageSizeComboBox
select
 56 items in 1 pages
 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.9031038-F18.6.0Rel-18Addition of TT analysis for NR-U test 12.5.1.1 Details R5-252975 agreedRAN5#107Qualcomm Korea Details RP-251139 approvedRAN#108R518.7.0TEI16_Test, NR_...
See details 38.9031037-F18.6.0Rel-18Addition of TT analysis for NR-U test 12.4.1.1 Details R5-252974 agreedRAN5#107Qualcomm Korea Details RP-251139 approvedRAN#108R518.7.0TEI16_Test, NR_...
See details 38.9031036-F18.6.0Rel-18Addition of TT analysis for NR-NTN test 14.3.2.1 Details R5-252973 agreedRAN5#107Qualcomm Korea Details RP-251064 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.9031035-F18.6.0Rel-18Addition of TT analysis for NR-NTN test 14.3.1.1 Details R5-252972 agreedRAN5#107Qualcomm Korea Details RP-251064 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.9031034-F18.6.0Rel-18Addition of TT analysis for NR-NTN test 14.4.4.1 Details R5-252971 agreedRAN5#107Qualcomm Korea Details RP-251063 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.9031033-F18.6.0Rel-18Addition of TT analysis for NR-NTN test 14.4.3.2.1 Details R5-252970 agreedRAN5#107Qualcomm Korea Details RP-251063 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.9031032-F18.6.0Rel-18Addition of TT analysis for NR-NTN test 14.4.3.1.1 Details R5-252969 agreedRAN5#107Qualcomm Korea Details RP-251063 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.9031031-F18.6.0Rel-18Addition of TT analysis for NR-NTN test 14.2.2.1.2 Details R5-252968 agreedRAN5#107Qualcomm Korea Details RP-251063 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.9031030-F18.6.0Rel-18Addition of TT analysis for NR-NTN test 14.2.2.1.1 Details R5-252967 agreedRAN5#107Qualcomm Korea Details RP-251063 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.90310271F18.6.0Rel-18Test Tolerance for R17 UE Rx-Tx time difference measurement accuracy Test Case 15.5.2 Details R5-253580 agreedRAN5#107Rohde & Schwarz Details RP-251119 approvedRAN#108R518.7.0TEI17_Test, NR_...
See details 38.90310261F18.6.0Rel-18Test Tolerance for R17 UE Rx-Tx time difference measurement accuracy Test Case 15.5.1 Details R5-253579 agreedRAN5#107Rohde & Schwarz Details RP-251119 approvedRAN#108R518.7.0TEI17_Test, NR_...
See details 38.90310251F18.6.0Rel-18Test Tolerance for R17 UE Rx-Tx time difference measurement accuracy Test Case 15.3.4 Details R5-253578 agreedRAN5#107Rohde & Schwarz Details RP-251119 approvedRAN#108R518.7.0TEI17_Test, NR_...
See details 38.90310241F18.6.0Rel-18Test Tolerance for R17 UE Rx-Tx time difference measurement accuracy Test Case 15.3.3 Details R5-253577 agreedRAN5#107Rohde & Schwarz Details RP-251119 approvedRAN#108R518.7.0TEI17_Test, NR_...
See details 38.90310231F18.6.0Rel-18Test Tolerance for NR NTN Beam failure detection and link recovery test cases Details R5-253618 agreedRAN5#107Keysight Techno... Details RP-251065 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.90310221F18.6.0Rel-18Test Tolerance analysis for time based and Location based measurement initiation to inter frequency NR cell reselection for Satellite Access test 14.1.7 and 14.1.8. Details R5-253626 agreedRAN5#107Qualcomm Innova... Details RP-251065 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.90310211F18.6.0Rel-18Test Tolerance analysis for inter frequency NR cell reselection for UE configured with enhanced requirements for Satellite Access test 14.1.6. Details R5-253545 agreedRAN5#107Qualcomm Innova... Details RP-251064 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.9031020-F18.6.0Rel-18Test Tolerance analysis for inter frequency NR cell reselection for Satellite Access test 14.1.5. Details R5-252799 agreedRAN5#107Qualcomm Innova... Details RP-251062 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.90310191F18.6.0Rel-18Test Tolerance analysis for intra frequency NR cell reselection for Satellite Access test 14.1.3 and 14.1.4. Details R5-253544 agreedRAN5#107Qualcomm Innova... Details RP-251064 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.90310181F18.6.0Rel-18Test Tolerance analysis for intra frequency NR cell reselection for Satellite Access test 14.1.1 and 14.1.2. Details R5-253543 agreedRAN5#107Qualcomm Innova... Details RP-251064 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.9031017-F18.6.0Rel-18Test Tolerance analysis for intra-frequency NES triggering conditional handover test case 7.3.3.3 Details R5-252777 agreedRAN5#107Ericsson Details RP-251085 approvedRAN#108R518.7.0Netw_Energy_NR-...
See details 38.90310151F18.6.0Rel-18TT analysis for ATG SS-SINR accuracy test cases 19.6.3.X Details R5-253557 agreedRAN5#107Huawei, HiSilicon Details RP-251075 approvedRAN#108R518.7.0NR_ATG-UEConTest
See details 38.90310141F18.6.0Rel-18TT analysis for ATG SS-RSRQ accuracy test cases 19.6.2.X Details R5-253556 agreedRAN5#107Huawei, HiSilicon Details RP-251075 approvedRAN#108R518.7.0NR_ATG-UEConTest
See details 38.90310131F18.6.0Rel-18TT analysis for ATG SS-RSRP accuracy test cases 19.6.1.X Details R5-253555 agreedRAN5#107Huawei, HiSilicon Details RP-251075 approvedRAN#108R518.7.0NR_ATG-UEConTest
See details 38.90310111F18.6.0Rel-18TT analysis for RRM TC 7.6.2.20 NR SA FR2-FR2 event triggered reporting using MUSIM gap with higher priority Details R5-253564 agreedRAN5#107Huawei, HiSilicon Details RP-251078 approvedRAN#108R518.7.0NR_DualTxRx_MUS...
See details 38.90310101F18.6.0Rel-18TT analysis for MUSIM RRM TC 6.6.2.14 NR SA FR1-FR1 event triggered reporting using MUSIM gap with shorter MGRP Details R5-253563 agreedRAN5#107Huawei, HiSilicon Details RP-251078 approvedRAN#108R518.7.0NR_DualTxRx_MUS...
See details 38.9031009-F18.6.0Rel-18TT analysis for MUSIM RRM TC 6.6.2.13 NR SA FR1-FR1 event triggered reporting using MUSIM gap with lower and higher priority Details R5-252653 agreedRAN5#107Huawei, HiSilicon Details RP-251078 approvedRAN#108R518.7.0NR_DualTxRx_MUS...
See details 38.9031008-F18.6.0Rel-18TT analysis for MUSIM RRM TC 6.6.1.9 NR SA FR1 event triggered reporting with MUSIM gap configured Details R5-252652 agreedRAN5#107Huawei, HiSilicon Details RP-251078 approvedRAN#108R518.7.0NR_DualTxRx_MUS...
See details 38.90310071F18.6.0Rel-18TT analysis for TC6.6.7.2 Details R5-253553 agreedRAN5#107Apple Details RP-251057 approvedRAN#108R518.7.0NR_RRM_enh-UEConTest
See details 38.9031006-F18.6.0Rel-18TT analysis for TC6.6.7.1 Details R5-252387 agreedRAN5#107Apple Details RP-251057 approvedRAN#108R518.7.0NR_RRM_enh-UEConTest
See details 38.9031005-F18.6.0Rel-18TT analysis for TC6.5.6.5.1 Details R5-252385 agreedRAN5#107Apple Details RP-251057 approvedRAN#108R518.7.0NR_RRM_enh-UEConTest
See details 38.90310041F18.6.0Rel-18TT analysis for TC6.5.6.3.1 Details R5-253552 agreedRAN5#107Apple Details RP-251057 approvedRAN#108R518.7.0NR_RRM_enh-UEConTest
See details 38.90310031F18.6.0Rel-18TT analysis for TC7.5.6.3.1 Details R5-253551 agreedRAN5#107Apple Details RP-251057 approvedRAN#108R518.7.0NR_RRM_enh-UEConTest
See details 38.90310021F18.6.0Rel-18TT analysis for TC5.5.6.5.1 and TC7.5.6.5.1 Details R5-253550 agreedRAN5#107Apple Details RP-251057 approvedRAN#108R518.7.0NR_RRM_enh-UEConTest
See details 38.90310011F18.6.0Rel-18TT analysis for TC5.5.3.6 Details R5-253549 agreedRAN5#107Apple Details RP-251057 approvedRAN#108R518.7.0NR_RRM_enh-UEConTest
See details 38.90310001F18.6.0Rel-18Addition of test tolerance analysis for 4.5.3.11 SCell activation of SSB-less Cell Details R5-253566 agreedRAN5#107Huawei, HiSilicon Details RP-251085 approvedRAN#108R518.7.0Netw_Energy_NR-...
See details 38.90309991F18.6.0Rel-18Test tolerance analysis of NR-DC SA FR1 CHO with Candidate SCG test case Details R5-253638 agreedRAN5#107Nokia Details RP-251098 approvedRAN#108R518.7.0NR_Mob_enh2-UEC...
See details 38.90309981F18.6.0Rel-18Addition of test tolerance analysis of the NR-DC SA FR1 CHO test case Details R5-253637 agreedRAN5#107Nokia Details RP-251098 approvedRAN#108R518.7.0NR_Mob_enh2-UEC...
See details 38.90309971F18.6.0Rel-18FR2 MU - PC3 update for OBW UL MIMO test in 38.903 Details R5-253536 agreedRAN5#107Keysight Techno... Details RP-251118 approvedRAN#108R518.7.0TEI15_Test, 5GS...
See details 38.90309961F18.6.0Rel-18FR2 MU - Update list of test cases with testability issues in 38.903 Details R5-253535 agreedRAN5#107Keysight Techno... Details RP-251118 approvedRAN#108R518.7.0TEI15_Test, 5GS...
See details 38.90309951F18.6.0Rel-18FR2 MU - PC7 update for ACS and IBB tests in 38.903 Details R5-253534 agreedRAN5#107Keysight Techno... Details RP-251119 approvedRAN#108R518.7.0TEI17_Test, NR_...
See details 38.90309941F18.6.0Rel-18FR2 MU - Editorial alignment to capture the MU for UL MIMO Details R5-253533 agreedRAN5#107Keysight Techno... Details RP-251118 approvedRAN#108R518.7.0TEI15_Test, 5GS...
See details 38.9030993-F18.6.0Rel-18Test Tolerance analysis for RRM Inter-frequency handover test cases in FR1 for ATG Details R5-251872 agreedRAN5#107Sporton Interna... Details RP-251073 approvedRAN#108R518.7.0NR_ATG-UEConTest
See details 38.9030992-F18.6.0Rel-18Test Tolerance analysis for RRM Intra-frequency handover test cases in FR1 for ATG Details R5-251870 agreedRAN5#107Sporton Interna... Details RP-251073 approvedRAN#108R518.7.0NR_ATG-UEConTest
See details 38.90309901F18.6.0Rel-18Addition of MU for RRM FR2 in case of PC6 Details R5-253528 agreedRAN5#107Nokia Details RP-251066 approvedRAN#108R518.7.0NR_HST_FR2-UEConTest
See details 38.90309891F18.6.0Rel-18Addition of test tolerance analysis of RLM OOS for less than 5 MHz test cases Details R5-253632 agreedRAN5#107Nokia Details RP-251077 approvedRAN#108R518.7.0NR_FR1_lessthan...
See details 38.90309881F18.6.0Rel-18Addition of test tolerance analysis of RLM IS 6.5.1.16 test case Details R5-253631 agreedRAN5#107Nokia Details RP-251077 approvedRAN#108R518.7.0NR_FR1_lessthan...
See details 38.9030987-F18.6.0Rel-18Addition of TT analysis for LTM TC 7.3.4.3 Details R5-251840 agreedRAN5#107MediaTek German... Details RP-251096 approvedRAN#108R518.7.0NR_Mob_enh2-UEC...
See details 38.90309861F18.6.0Rel-18Addition of TT analysis for LTM TC 7.3.4.2 Details R5-253568 agreedRAN5#107MediaTek German... Details RP-251097 approvedRAN#108R518.7.0NR_Mob_enh2-UEC...
See details 38.90309851F18.6.0Rel-18Addition of TT analysis for LTM TC 7.3.4.1 Details R5-253567 agreedRAN5#107MediaTek German... Details RP-251097 approvedRAN#108R518.7.0NR_Mob_enh2-UEC...
See details 38.90309841F18.6.0Rel-18Addition of TT analysis for less than 5MHz TC 6.6.2.15 Details R5-253559 agreedRAN5#107MediaTek German... Details RP-251077 approvedRAN#108R518.7.0NR_FR1_lessthan...
See details 38.90309831F18.6.0Rel-18Addition of TT analysis for less than 5MHz TC 6.6.1.12 Details R5-253558 agreedRAN5#107MediaTek German... Details RP-251077 approvedRAN#108R518.7.0NR_FR1_lessthan...
See details 38.9030982-F18.6.0Rel-18Addition of TT analysis for NR needforgap 6.6.24.2,6.6.24.3, and 6.6.24.4 Details R5-251827 agreedRAN5#107MediaTek (Shenz... Details RP-251104 approvedRAN#108R518.7.0NR_MG_enh2-UEConTest
See details 38.9030981-F18.6.0Rel-18Addition of TT analysis for NR needforgap 6.6.24.1 and 6.6.24.5 Details R5-251826 agreedRAN5#107MediaTek (Shenz... Details RP-251104 approvedRAN#108R518.7.0NR_MG_enh2-UEConTest
See details 38.90309801F18.6.0Rel-18Addition of TT analysis for LTM TC 7.7.15.1 Details R5-253541 agreedRAN5#107MediaTek Inc. Details RP-251097 approvedRAN#108R518.7.0NR_Mob_enh2-UEC...
See details 38.90309791F18.6.0Rel-18Addition of TT analysis for LTM TC 7.6.21.1 Details R5-253540 agreedRAN5#107MediaTek Inc. Details RP-251097 approvedRAN#108R518.7.0NR_Mob_enh2-UEC...
See details 38.90309781F18.6.0Rel-18Addition of TT analysis for LTM TC 7.6.20.1 Details R5-253539 agreedRAN5#107MediaTek Inc. Details RP-251097 approvedRAN#108R518.7.0NR_Mob_enh2-UEC...