3GPP Portal > ChangeRequests

Please log-in with your EOL account.

Username:
Password:
Keep me signed in (more info)

Data pager

Page size:

PageSizeComboBox
	select

40 items in 1 pages

		Spec #	CR #	Revision #	CR Cat	Impacted Version	Target Release	Title	WG TDoc #	CR status at WG	WG meeting ref	WG Source information	TSG TDoc #	CR status at TSG	TSG meeting ref	TSG Source information	New Version	Work Items	Remarks


31.127	0030	-	F	18.2.0	Rel-18	Correction to UE identification TC 5.3.9	C6-250429		CT6#123	MediaTek Inc.						TEI18
31.127	0029	-	F	18.2.0	Rel-18	Correction to SUCI calculation TC 5.3.12	C6-250428		CT6#123	MediaTek Inc.						TEI18
31.127	0028	-	F	18.2.0	Rel-18	Correction to SUCI calculation TC 5.3.17	C6-250422		CT6#123	MediaTek Inc.						TEI18
31.127	0027	-	D	18.1.0	Rel-18	Change reference from ETSI TS 102 223 to 3GPP TS 31.111	C6-250350	agreed	CT6#122	Comprion GmbH	CP-251023	approved	CT#108	CT6	18.2.0	TEI18
31.127	0026	-	F	18.1.0	Rel-18	Correction to SUCI calculation TC 5.3.16	C6-250289	agreed	CT6#122	MediaTek Inc.	CP-251023	approved	CT#108	CT6	18.2.0	TEI18
31.127	0025	-	F	18.1.0	Rel-18	Correction to AKA TC 15.1.4 and 15.2.4	C6-250265	postponed	CT6#122	MediaTek Inc.						TEI18
31.127	0024	3	B	18.1.0	Rel-18	Example test environment for seamless testing	C6-250338	agreed	CT6#122	Apple AB Denmark	CP-251032	approved	CT#108	CT6	18.2.0	UEConTest_R18
31.127	0024	2	B	18.1.0	Rel-18	Example test environment for seamless testing	C6-250334	revised	CT6#122	Apple AB Denmark						UEConTest_R18
31.127	0024	1	B	18.1.0	Rel-18	Example test environment for seamless testing	C6-250332	revised	CT6#122	Apple AB Denmark						UEConTest_R18
31.127	0024	-	B	18.1.0	Rel-18	Example test environment for seamless testing	C6-250261	revised	CT6#122	Apple AB Denmark						UEConTest_R18
31.127	0023	-	F	17.3.0	Rel-17	editorial correction	C6-250260	withdrawn	CT6#122	Apple AB Denmark						nrUICC_UEConTest
31.127	0022	-	F	18.1.0	Rel-18	Correction to 5G-AKA TC 15.2.5	C6-250240	agreed	CT6#122	MediaTek Inc.	CP-251023	approved	CT#108	CT6	18.2.0	TEI18
31.127	0021	-	F	18.1.0	Rel-18	Correction to default EF5GS3GPPNSC and EF5GSN3GPPNSC	C6-250238	agreed	CT6#122	MediaTek Inc.	CP-251023	approved	CT#108	CT6	18.2.0	TEI18
31.127	0020	-	F	18.1.0	Rel-18	Correction to EFEPSLOCI for TC 10.1.2	C6-250222	agreed	CT6#122	MediaTek Inc.	CP-251023	approved	CT#108	CT6	18.2.0	TEI18
31.127	0019	-	F	18.1.0	Rel-18	Correction to EFEPSLOCI in clause 4.5.4	C6-250221	agreed	CT6#122	MediaTek Inc.	CP-251023	approved	CT#108	CT6	18.2.0	TEI18
31.127	0018	-	F	18.1.0	Rel-18	Correction to EF5GS3GPPLOCI for TC 7.4.7	C6-250220	agreed	CT6#122	MediaTek Inc.	CP-251023	approved	CT#108	CT6	18.2.0	TEI18
31.127	0017	-	F	18.1.0	Rel-18	Correction to EFIMSI in clause 4.6.2	C6-250219	agreed	CT6#122	MediaTek Inc.	CP-251023	approved	CT#108	CT6	18.2.0	TEI18
31.127	0016	-	F	18.0.0	Rel-18	Correction to CSG TC 10.1.8	C6-250038	agreed	CT6#121	MediaTek Inc.	CP-250065	approved	CT#107	CT6	18.1.0	UEConTest_R18
31.127	0015	-	F	18.0.0	Rel-18	Correction to EFIMSI in clauses 4.3 and 4.6.x	C6-250037	agreed	CT6#121	MediaTek Inc.	CP-250065	approved	CT#107	CT6	18.1.0	UEConTest_R18
31.127	0014	-	B	18.0.0	Rel-18	Addition of SSIM test cases	C6-250025	agreed	CT6#121	Comprion GmbH	CP-250065	approved	CT#107	CT6	18.1.0	UEConTest_R18
31.127	0013	-	B	18.0.0	Rel-18	UE recognising the search period of the Higher priority PLMN – NG-RAN	C6-250022	agreed	CT6#121	Comprion GmbH	CP-250065	approved	CT#107	CT6	18.1.0	UEConTest_R18
31.127	0012	-	B	18.0.0	Rel-18	Introduction of voice centric support for TS 31.127 5G tests	C6-250021	agreed	CT6#121	Comprion GmbH	CP-250065	approved	CT#107	CT6	18.1.0	UEConTest_R18
31.127	0011	-	F	18.0.0	Rel-18	Correction to Unified Access Control Testcases 5.4.x	C6-250020	agreed	CT6#121	Comprion GmbH	CP-250065	approved	CT#107	CT6	18.1.0	UEConTest_R18
31.127	0010	-	F	18.0.0	Rel-18	Correction in 15.xA.x test cases	C6-250019	agreed	CT6#121	Comprion GmbH	CP-250065	approved	CT#107	CT6	18.1.0	UEConTest_R18
31.127	0009	-	F	18.0.0	Rel-18	Correction in default value definitions	C6-250018	agreed	CT6#121	Comprion GmbH	CP-250065	approved	CT#107	CT6	18.1.0	UEConTest_R18
31.127	0008	2	F	17.2.0	Rel-18	TS 31.127 Correction to Test Env in section 4 and Annex A	C6-240684	agreed	CT6#120-bis	Qualcomm Techno...	CP-243163	approved	CT#106	CT6	18.0.0	UEConTest_R18
31.127	0008	1	A	17.2.0	Rel-18	TS 31.127 Correction to Test Env in section 4 and Annex A	C6-240674	revised	CT6#120-bis	Qualcomm Techno...						UEConTest_R18
31.127	0008	-	A	17.2.0	Rel-18	TS 31.127 Correction to Test Env in section 4 and Annex A	C6-240672	revised	CT6#120-bis	Qualcomm Techno...						UEConTest_R18
31.127	0007	2	F	17.2.0	Rel-17	TS 31.127 Annex Z Test toolkit applet requirements	C6-240683	agreed	CT6#120-bis	Qualcomm Techno...	CP-243162	approved	CT#106	CT6	17.3.0	UEConTest_R18
31.127	0007	1	B	17.2.0	Rel-17	TS 31.127 Annex Z Test toolkit applet requirements	C6-240673	revised	CT6#120-bis	Qualcomm Techno...						UEConTest_R18
31.127	0007	-	B	17.2.0	Rel-17	TS 31.127 Annex Z Test toolkit applet requirements	C6-240671	revised	CT6#120-bis	Qualcomm Techno...						UEConTest_R18
31.127	0006	-	D	17.2.0	Rel-17	TS 31.127 - Files, options and functions update to Rel-18	C6-240669	postponed	CT6#120-bis	Comprion GmbH						UEConTest_R18
31.127	0005	2	F	17.2.0	Rel-17	TS 31.127 Correction to Test Env in section 4 and Annex A	C6-240533	postponed	CT6#119-bis	Qualcomm, Apple...						nrUICC_UEConTest
31.127	0005	1	F	17.2.0	Rel-17	TS 31.127 Correction to Test Env in section 4 and Annex A	C6-240528	revised	CT6#119-bis	Qualcomm, Apple...						nrUICC_UEConTest
31.127	0005	-	F	17.2.0	Rel-17	TS 31.127 Correction to Test Env in section 4 and Annex A	C6-240470	revised	CT6#119-bis	Qualcomm Techno...						nrUICC_UEConTest
31.127	0004	1	F	17.1.0	Rel-17	Correction of PIN handling tests	C6-240266	agreed	CT6#119	Comprion GmbH	CP-241209	approved	CT#104	CT6	17.2.0	nrUICC_UEConTest
31.127	0004	-	F	17.1.0	Rel-17	Correction of PIN handling tests	C6-240218	revised	CT6#119	Comprion GmbH						nrUICC_UEConTest
31.127	0003	-	F	17.0.0	Rel-17	Insertion of a clause 17 header and correction of TC 17.1.1	C6-240028	agreed	CT6#118	Comprion GmbH	CP-240135	approved	CT#103	CT6	17.1.0	TEI17
31.127	0002	-	B	17.0.0	Rel-17	Addition of test case	C6-240026	agreed	CT6#118	Comprion GmbH	CP-240135	approved	CT#103	CT6	17.1.0	TEI17
31.127	0001	-	F	17.0.0	Rel-17	Correction of codings in the 5G test UICC definitions	C6-240024	agreed	CT6#118	Comprion GmbH	CP-240135	approved	CT#103	CT6	17.1.0	TEI17