|
|
| 38.521-3 | 2010 | - | F | 19.2.0 | Rel-19 | Addition of EVM equalizer spectrum flatness for inter-band EN-DC including FR2 (5NR to 8NR CCs) |
R5-255636
| | RAN5#109 | Sporton Interna... |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 2009 | - | F | 19.2.0 | Rel-19 | Addition of EVM equalizer spectrum flatness for inter-band EN-DC including FR2 (2NR to 4NR CCs) |
R5-255635
| | RAN5#109 | Sporton Interna... |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 2008 | - | F | 19.2.0 | Rel-19 | Correction to 6.5B.3.3.2 for DC_5A-n2A |
R5-255576
| | RAN5#109 | Element Materia... |
| | | | | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 2007 | - | F | 19.2.0 | Rel-19 | Editorial Correction to Clause 6.2B.1.1 |
R5-255574
| | RAN5#109 | MediaTek Beijin... |
| | | | | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 2006 | - | F | 19.0.0 | Rel-19 | Updating REFSENS test cases with 5CC and 6CC |
R5-254805
| agreed | RAN5#108 | Huawei, HiSilicon |
RP-252284
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 2005 | - | F | 19.0.0 | Rel-19 | Adding Rel-19 ENDC configurations including n40-n71 |
R5-254803
| agreed | RAN5#108 | Huawei, HiSilicon |
RP-252283
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 2004 | - | F | 19.0.0 | Rel-19 | Completing several EN-DC configurations including band n40 |
R5-254795
| agreed | RAN5#108 | Huawei, HiSilicon |
RP-252299
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 2003 | 1 | F | 19.0.0 | Rel-19 | Jumbo CR for deltaTIB and deltaRIB |
R5-255384
| agreed | RAN5#108 | Huawei, HiSilic... |
RP-252284
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 2003 | - | F | 19.0.0 | Rel-19 | Jumbo CR for deltaTIB and deltaRIB |
R5-254792
| revised | RAN5#108 | Huawei, HiSilic... |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 2002 | - | F | 19.0.0 | Rel-19 | Jumbo CR for updating clause 5 for Rel-19 configurations |
R5-254790
| agreed | RAN5#108 | Huawei, HiSilicon |
RP-252283
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 2001 | - | F | 19.0.0 | Rel-19 | Jumbo CR for updating clause 5 for Rel-16 configurations |
R5-254789
| agreed | RAN5#108 | Huawei, HiSilicon |
RP-252235
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 2000 | - | F | 19.0.0 | Rel-19 | Jumbo CR for updating clause 5 for Rel-15 configurations |
R5-254788
| agreed | RAN5#108 | Huawei, HiSilicon |
RP-252299
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1999 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity requirements for Rel-18 FR1 3CC EN-DC for HPUE |
R5-254761
| agreed | RAN5#108 | Anritsu, KDDI C... |
RP-252248
| approved | RAN#109 | R5 | 19.1.0 | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1998 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity requirements for Rel-16 FR1 3CC EN-DC |
R5-254760
| withdrawn | RAN5#108 | Anritsu, KDDI C... |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1997 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity requirements for Rel-15 FR1 3CC EN-DC |
R5-254759
| withdrawn | RAN5#108 | Anritsu, KDDI C... |
| | | | | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1996 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity requirements for Rel-19 FR1 2CC EN-DC |
R5-254758
| agreed | RAN5#108 | Anritsu, Huawei... |
RP-252283
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1995 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity requirements for Rel-18 FR1 2CC EN-DC for HPUE |
R5-254757
| agreed | RAN5#108 | Anritsu, KDDI C... |
RP-252248
| approved | RAN#109 | R5 | 19.1.0 | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1994 | 1 | F | 19.0.0 | Rel-19 | Addition of reference sensitivity requirements for Rel-16 FR1 2CC EN-DC |
R5-255280
| agreed | RAN5#108 | Anritsu, Huawei... |
RP-252235
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1994 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity requirements for Rel-16 FR1 2CC EN-DC |
R5-254756
| revised | RAN5#108 | Anritsu, Huawei... |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1993 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity requirements for Rel-15 FR1 2CC EN-DC |
R5-254755
| agreed | RAN5#108 | Anritsu, Huawei... |
RP-252298
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1992 | 1 | F | 19.0.0 | Rel-19 | Cleanup of Reference sensitivity for 2CC FR1 EN-DC |
R5-255396
| agreed | RAN5#108 | Anritsu, Keysig... |
RP-252235
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1992 | - | F | 19.0.0 | Rel-19 | Cleanup of Reference sensitivity for 2CC FR1 EN-DC |
R5-254754
| revised | RAN5#108 | Anritsu, Keysig... |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1991 | - | F | 19.0.0 | Rel-19 | Editorial corrections to 6.5B.3.3.2 |
R5-254734
| agreed | RAN5#108 | Anritsu |
RP-252298
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1990 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity for Rel-19 3CC EN-DC configurations including n71A-n77A |
R5-254620
| agreed | RAN5#108 | Huawei, HiSilicon |
RP-252283
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1989 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity for Rel-19 3CC and 4CC EN-DC configurations |
R5-254487
| agreed | RAN5#108 | Huawei, HiSilicon |
RP-252283
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1988 | - | F | 19.0.0 | Rel-19 | Addition of Tx testing for Rel-19 n71 related EN-DC configurations |
R5-254486
| agreed | RAN5#108 | Huawei, HiSilicon |
RP-252283
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1987 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity for Rel-16 DC_1A-3A_n71A |
R5-254477
| agreed | RAN5#108 | Huawei, HiSilicon |
RP-252234
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1986 | - | F | 19.0.0 | Rel-19 | Addition of Tx testing for Rel-16 n71 related EN-DC configurations |
R5-254476
| agreed | RAN5#108 | Huawei, HiSilicon |
RP-252234
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1985 | - | F | 19.0.0 | Rel-19 | Editorial Correction to Clause headers for Tx test cases |
R5-254403
| agreed | RAN5#108 | TTA |
RP-252298
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1984 | - | F | 19.0.0 | Rel-19 | Update of Annex F |
R5-254390
| agreed | RAN5#108 | ROHDE & SCHWARZ |
RP-252298
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1983 | - | F | 19.0.0 | Rel-19 | Correction of Tx test cases |
R5-254388
| agreed | RAN5#108 | ROHDE & SCHWARZ |
RP-252297
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1982 | - | F | 19.0.0 | Rel-19 | Editorial correction in maximum input level test case |
R5-254385
| agreed | RAN5#108 | ROHDE & SCHWARZ |
RP-252297
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1981 | - | F | 19.0.0 | Rel-19 | Corrections on cross band isolation Refsens test requirements for PC2 DC_7A_n78A |
R5-254336
| withdrawn | RAN5#108 | ZTE Corporation |
| | | | | TEI17_Test, END... |
|
|
|
| 38.521-3 | 1980 | - | F | 19.0.0 | Rel-19 | Removal of R15 pending configurations for MSD test points for intermodulation interference |
R5-254332
| agreed | RAN5#108 | ZTE Corporation |
RP-252297
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1979 | - | F | 19.0.0 | Rel-19 | Corrections on UL Fc frequency for R15 EN-DC configurations for MSD test points |
R5-254331
| agreed | RAN5#108 | ZTE Corporation... |
RP-252297
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1978 | - | F | 19.0.0 | Rel-19 | Corrections on test requirements for cross band isolation Refsens for DC_7A_n78A |
R5-254330
| withdrawn | RAN5#108 | ZTE Corporation |
| | | | | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1977 | - | F | 19.0.0 | Rel-19 | Removal of R16 pending configurations for MSD test points for intermodulation interference |
R5-254320
| agreed | RAN5#108 | ZTE Corporation |
RP-252234
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1976 | 1 | F | 19.0.0 | Rel-19 | Corrections on UL Fc frequency for R16 EN-DC configurations for MSD test points |
R5-255279
| agreed | RAN5#108 | ZTE Corporation... |
RP-252235
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1976 | - | F | 19.0.0 | Rel-19 | Corrections on UL Fc frequency for R16 EN-DC configurations for MSD test points |
R5-254319
| revised | RAN5#108 | ZTE Corporation... |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1975 | - | F | 19.0.0 | Rel-19 | Updates on Refsens test case for EN-DC configuration DC_1A-41A_n78A |
R5-254317
| agreed | RAN5#108 | ZTE Corporation |
RP-252297
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1974 | 1 | F | 19.0.0 | Rel-19 | reference sensitivity for PC2 DC_66A_n41A |
R5-255400
| agreed | RAN5#108 | ZTE Corporation |
RP-252307
| approved | RAN#109 | R5 | 19.1.0 | TEI17_Test |
|
|
|
| 38.521-3 | 1974 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity for PC2 DC_66A_n41A |
R5-254315
| revised | RAN5#108 | ZTE Corporation |
| | | | | TEI17_Test, END... |
|
|
|
| 38.521-3 | 1973 | 1 | F | 19.0.0 | Rel-19 | Addition of reference sensitivity for new PC2 R19 EN-DC combos within FR1 |
R5-255277
| agreed | RAN5#108 | KDDI Corporation |
RP-252287
| approved | RAN#109 | R5 | 19.1.0 | HPUE_DC_LTE_NR_... |
|
|
|
| 38.521-3 | 1973 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity for new PC2 R19 EN-DC combos within FR1 |
R5-254223
| revised | RAN5#108 | KDDI Corporation |
| | | | | HPUE_DC_LTE_NR_... |
|
|
|
| 38.521-3 | 1972 | - | F | 19.0.0 | Rel-19 | Addition of UE maximum output power for new EN-DC combos within FR1 |
R5-254132
| agreed | RAN5#108 | KDDI Corporation |
RP-252248
| approved | RAN#109 | R5 | 19.1.0 | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1971 | - | F | 19.0.0 | Rel-19 | Addition of UE maximum output power for new R15 EN-DC combos within FR1 |
R5-254131
| withdrawn | RAN5#108 | KDDI Corporation |
| | | | | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1970 | - | F | 19.0.0 | Rel-19 | Editorial - References corrections in test case 7.6B.3.3 |
R5-254084
| agreed | RAN5#108 | Keysight Techno... |
RP-252296
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1969 | - | F | 19.0.0 | Rel-19 | REFSENS NSA - Test points corrections for DC_3A_n77A and DC_3A_n78A |
R5-254083
| withdrawn | RAN5#108 | Keysight Techno... |
| | | | | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1968 | - | F | 19.0.0 | Rel-19 | Addition of R15 EN-DC combos into clause 5 |
R5-253841
| agreed | RAN5#108 | KDDI Corporation |
RP-252295
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1967 | - | F | 19.0.0 | Rel-19 | Addition of R16 EN-DC combos into clause 5 |
R5-253840
| agreed | RAN5#108 | KDDI Corporation |
RP-252234
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1966 | 1 | F | 19.0.0 | Rel-19 | Addition of reference sensitivity for new R16 EN-DC combos within FR1 |
R5-255278
| agreed | RAN5#108 | KDDI Corporation |
RP-252235
| approved | RAN#109 | R5 | 19.1.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1966 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity for new R16 EN-DC combos within FR1 |
R5-253813
| revised | RAN5#108 | KDDI Corporation |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1965 | - | F | 19.0.0 | Rel-19 | Addition of delta TIBc for new R16 EN-DC combos within FR1 |
R5-253812
| withdrawn | RAN5#108 | KDDI Corporation |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1964 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity for new R15 EN-DC combos within FR1 |
R5-253810
| agreed | RAN5#108 | KDDI Corporation |
RP-252295
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1963 | - | F | 19.0.0 | Rel-19 | FR2 MU - Missing entries in 38-521-3 Annex F |
R5-253808
| agreed | RAN5#108 | Keysight Techno... |
RP-252295
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1962 | - | F | 19.0.0 | Rel-19 | FR2 MU - PC6 editor notes updates in 38.521-3 |
R5-253803
| agreed | RAN5#108 | Keysight Techno... |
RP-252295
| approved | RAN#109 | R5 | 19.1.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1961 | 1 | F | 19.0.0 | Rel-19 | Addition of reference sensitivity for new PC2 EN-DC combos within FR1 |
R5-255217
| agreed | RAN5#108 | KDDI Corporation |
RP-252248
| approved | RAN#109 | R5 | 19.1.0 | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1961 | - | F | 19.0.0 | Rel-19 | Addition of reference sensitivity for new PC2 EN-DC combos within FR1 |
R5-253798
| revised | RAN5#108 | KDDI Corporation |
| | | | | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1960 | - | F | 18.6.0 | Rel-18 | Clarifications for FR2 testing with NR-DC and NR-CA |
R5-252934
| agreed | RAN5#107 | Qualcomm Athero... |
RP-251059
| approved | RAN#108 | R5 | 18.7.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1959 | - | F | 18.6.0 | Rel-18 | Addition of UE maximum output power for PC2 DC_66A_n41A |
R5-252864
| agreed | RAN5#107 | ZTE Corporation |
RP-251119
| approved | RAN#108 | R5 | 18.7.0 | TEI17_Test, END... |
|
|
|
| 38.521-3 | 1958 | 1 | F | 18.6.0 | Rel-18 | Updates on 7.3B.2 for EN-DC reference sensitivity for DC_71A_n2A |
R5-253413
| agreed | RAN5#107 | ZTE Corporation |
RP-251059
| approved | RAN#108 | R5 | 18.7.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1958 | - | F | 18.6.0 | Rel-18 | Updates on 7.3B.2 for EN-DC reference sensitivity for DC_71A_n2A |
R5-252861
| revised | RAN5#107 | ZTE Corporation |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1957 | - | F | 18.6.0 | Rel-18 | Corrections on 6.5B.3.3.3 for spurious emission test case for DC_18A_n78A |
R5-252859
| agreed | RAN5#107 | ZTE Corporation |
RP-251117
| approved | RAN#108 | R5 | 18.7.0 | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1956 | - | F | 18.6.0 | Rel-18 | Corrections on 6.5B.3.3.3 for spurious emission test case for DC_18A_n77A |
R5-252857
| agreed | RAN5#107 | ZTE Corporation |
RP-251117
| approved | RAN#108 | R5 | 18.7.0 | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1955 | - | F | 18.6.0 | Rel-18 | Corrections on 6.5B.3.3.3 for spurious emission test case for Rel-16 DC_1A_n3A |
R5-252855
| agreed | RAN5#107 | ZTE Corporation |
RP-251054
| approved | RAN#108 | R5 | 18.7.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1954 | - | F | 18.6.0 | Rel-18 | Corrections on 7.3B.2.0.3.1 for UL harmonic interference REFSENS for DC_5A_n78A |
R5-252851
| agreed | RAN5#107 | ZTE Corporation... |
RP-251054
| approved | RAN#108 | R5 | 18.7.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1953 | - | F | 18.6.0 | Rel-18 | Corrections on EN-DC Refsens test requirement for DC_1A_n3A-n78A |
R5-252841
| agreed | RAN5#107 | ZTE Corporation |
RP-251117
| approved | RAN#108 | R5 | 18.7.0 | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1952 | - | F | 18.6.0 | Rel-18 | Corrections on EN-DC Refsens requirements for DC_1A_n28A-n78A and some other configurations |
R5-252840
| agreed | RAN5#107 | ZTE Corporation |
RP-251117
| approved | RAN#108 | R5 | 18.7.0 | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1951 | - | F | 18.6.0 | Rel-18 | Corrections on 7.3B.2.3_1.1.5 for TT denotation for Rel-17 PC2 EN-DC reference sensitivity test requirement table |
R5-252839
| agreed | RAN5#107 | ZTE Corporation |
RP-251119
| approved | RAN#108 | R5 | 18.7.0 | TEI17_Test, END... |
|
|
|
| 38.521-3 | 1950 | - | F | 18.6.0 | Rel-18 | Corrections on 7.3B.2.3_1.1.5 for TT denotation for Rel-17 EN-DC reference sensitivity test requirement table |
R5-252838
| agreed | RAN5#107 | ZTE Corporation |
RP-251059
| approved | RAN#108 | R5 | 18.7.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1949 | - | F | 18.6.0 | Rel-18 | Corrections on 7.3B.2.3.5 for TT denotation for Rel-16 EN-DC reference sensitivity test requirement table |
R5-252837
| agreed | RAN5#107 | ZTE Corporation |
RP-251054
| approved | RAN#108 | R5 | 18.7.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1948 | - | F | 18.6.0 | Rel-18 | Corrections on 7.3B.2.3_1.1.5 for TT denotation for Rel-15 EN-DC reference sensitivity test requirement table |
R5-252836
| agreed | RAN5#107 | ZTE Corporation |
RP-251117
| approved | RAN#108 | R5 | 18.7.0 | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1947 | - | F | 18.6.0 | Rel-18 | Updates on 7.3B.2.3.5 for PC2 EN-DC reference sensitivity test requirement table |
R5-252834
| agreed | RAN5#107 | ZTE Corporation |
RP-251119
| approved | RAN#108 | R5 | 18.7.0 | TEI17_Test, END... |
|
|
|
| 38.521-3 | 1946 | - | F | 18.6.0 | Rel-18 | Correction to 7.3B.2.3 for Rel-17 EN-DC configurations |
R5-252751
| agreed | RAN5#107 | Huawei, HiSilicon |
RP-251058
| approved | RAN#108 | R5 | 18.7.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1945 | 1 | F | 18.6.0 | Rel-18 | Correction to 7.3B.2.3 for Rel-16 EN-DC configurations |
R5-253467
| agreed | RAN5#107 | Huawei, HiSilicon |
RP-251054
| approved | RAN#108 | R5 | 18.7.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1945 | - | F | 18.6.0 | Rel-18 | Correction to 7.3B.2.3 for Rel-16 EN-DC configurations |
R5-252750
| revised | RAN5#107 | Huawei, HiSilicon |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1944 | 1 | F | 18.6.0 | Rel-18 | Correction to 7.3B.2.3 for Rel-15 EN-DC configurations |
R5-253471
| agreed | RAN5#107 | Huawei, HiSilic... |
RP-251118
| approved | RAN#108 | R5 | 18.7.0 | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1944 | - | F | 18.6.0 | Rel-18 | Correction to 7.3B.2.3 for Rel-15 EN-DC configurations |
R5-252749
| revised | RAN5#107 | Huawei, HiSilic... |
| | | | | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1943 | - | F | 18.6.0 | Rel-18 | Addition of Annex F.1.2 for 6.5H.2.3.3 |
R5-252748
| agreed | RAN5#107 | Huawei, HiSilicon |
RP-251120
| approved | RAN#108 | R5 | 18.7.0 | TEI18_Test, 4Rx... |
|
|
|
| 38.521-3 | 1942 | - | F | 18.6.0 | Rel-18 | Removal of unnecessary test requirement from 7.3B.2.3_1.1 |
R5-252509
| agreed | RAN5#107 | Anritsu |
RP-251117
| approved | RAN#108 | R5 | 18.7.0 | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1941 | - | F | 18.6.0 | Rel-18 | Update to FR1 inter-band EN-DC REFSENS for Rel-18 HPUE |
R5-252508
| agreed | RAN5#107 | Anritsu |
RP-251072
| approved | RAN#108 | R5 | 18.7.0 | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1940 | 2 | F | 18.6.0 | Rel-18 | Update to FR1 inter-band EN-DC REFSENS for Rel-17 |
R5-253650
| agreed | RAN5#107 | Anritsu |
RP-251059
| approved | RAN#108 | R5 | 18.7.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1940 | 1 | F | 18.6.0 | Rel-18 | Update to FR1 inter-band EN-DC REFSENS for Rel-17 |
R5-253468
| revised | RAN5#107 | Anritsu |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1940 | - | F | 18.6.0 | Rel-18 | Update to FR1 inter-band EN-DC REFSENS for Rel-17 |
R5-252507
| revised | RAN5#107 | Anritsu |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1939 | 1 | F | 18.6.0 | Rel-18 | Update to FR1 inter-band EN-DC REFSENS for Rel-16 |
R5-253466
| agreed | RAN5#107 | Anritsu |
RP-251054
| approved | RAN#108 | R5 | 18.7.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1939 | - | F | 18.6.0 | Rel-18 | Update to FR1 inter-band EN-DC REFSENS for Rel-16 |
R5-252506
| revised | RAN5#107 | Anritsu |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1938 | 1 | F | 18.6.0 | Rel-18 | Update to FR1 inter-band EN-DC REFSENS for Rel-15 |
R5-253470
| agreed | RAN5#107 | Anritsu |
RP-251118
| approved | RAN#108 | R5 | 18.7.0 | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1938 | - | F | 18.6.0 | Rel-18 | Update to FR1 inter-band EN-DC REFSENS for Rel-15 |
R5-252505
| revised | RAN5#107 | Anritsu |
| | | | | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1937 | 1 | F | 18.6.0 | Rel-18 | Update to 7.3B.2 minimum requirements for alignment with latest Rel-18 TS 38.101-3 |
R5-253469
| agreed | RAN5#107 | Anritsu |
RP-251070
| approved | RAN#108 | R5 | 18.7.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1937 | - | F | 18.6.0 | Rel-18 | Update to 7.3B.2 minimum requirements for alignment with latest Rel-18 TS 38.101-3 |
R5-252504
| revised | RAN5#107 | Anritsu |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1936 | - | F | 18.6.0 | Rel-18 | Update to note to avoid delta-MPR in MOP test cases for FR1 EN-DC |
R5-252503
| agreed | RAN5#107 | Anritsu |
RP-251119
| approved | RAN#108 | R5 | 18.7.0 | TEI17_Test, NR_... |
|
|
|
| 38.521-3 | 1935 | 1 | B | 18.6.0 | Rel-18 | Update to R18 Coverage enh higherpowerlimit TC of EN-DC |
R5-253646
| agreed | RAN5#107 | China Telecom |
RP-251086
| approved | RAN#108 | R5 | 18.7.0 | NR_cov_enh2-UEC... |
|
|
|
| 38.521-3 | 1935 | - | B | 18.6.0 | Rel-18 | Update to R18 Coverage enh higherpowerlimit TC of EN-DC |
R5-252430
| revised | RAN5#107 | China Telecom |
| | | | | NR_cov_enh2-UEC... |
|
|
|
| 38.521-3 | 1934 | - | F | 18.6.0 | Rel-18 | Include additional Note into general section of Chapter 7 |
R5-252419
| withdrawn | RAN5#107 | Verizon Spain |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1933 | - | F | 18.6.0 | Rel-18 | Include additional Note into general section of Chapter 6 |
R5-252418
| withdrawn | RAN5#107 | Verizon |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1932 | - | F | 18.6.0 | Rel-18 | Updates for NRDC FR1 FR2 band configurations |
R5-252415
| agreed | RAN5#107 | Verizon |
RP-251058
| approved | RAN#108 | R5 | 18.7.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1931 | - | F | 18.6.0 | Rel-18 | Correction of test case 6.5B.3.3.2 |
R5-252358
| agreed | RAN5#107 | ROHDE & SCHWARZ |
RP-251117
| approved | RAN#108 | R5 | 18.7.0 | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1930 | - | F | 18.6.0 | Rel-18 | NSA test 7.3B.2.3 - combo 2A n77A - corrections |
R5-252148
| agreed | RAN5#107 | Keysight Techno... |
RP-251058
| approved | RAN#108 | R5 | 18.7.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1929 | - | F | 18.6.0 | Rel-18 | UL harmonic for DC_8A_n77A and DC_8A_n78A not correctly tested - band 8 CBW correction |
R5-252147
| withdrawn | RAN5#107 | Keysight Techno... |
| | | | | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1928 | - | F | 18.6.0 | Rel-18 | Addition of 7.4E and 7.5E V2X test cases |
R5-252024
| agreed | RAN5#107 | Huawei, HiSilicon |
RP-251055
| approved | RAN#108 | R5 | 18.7.0 | 5G_V2X_NRSL_eV2... |
|
|
|
| 38.521-3 | 1927 | - | F | 18.6.0 | Rel-18 | Addition of 7.3E V2X test cases |
R5-252023
| agreed | RAN5#107 | Huawei, HiSilicon |
RP-251055
| approved | RAN#108 | R5 | 18.7.0 | 5G_V2X_NRSL_eV2... |
|
|
|
| 38.521-3 | 1926 | - | F | 18.6.0 | Rel-18 | Update to 6.5E V2X test cases |
R5-252013
| agreed | RAN5#107 | Huawei, HiSilicon |
RP-251055
| approved | RAN#108 | R5 | 18.7.0 | 5G_V2X_NRSL_eV2... |
|
|
|
| 38.521-3 | 1925 | - | F | 18.6.0 | Rel-18 | Update to 6.4E V2X test cases |
R5-252011
| agreed | RAN5#107 | Huawei, HiSilicon |
RP-251055
| approved | RAN#108 | R5 | 18.7.0 | 5G_V2X_NRSL_eV2... |
|
|
|
| 38.521-3 | 1924 | - | F | 18.6.0 | Rel-18 | Update to 6.2E V2X test cases |
R5-252010
| agreed | RAN5#107 | Huawei, HiSilicon |
RP-251055
| approved | RAN#108 | R5 | 18.7.0 | 5G_V2X_NRSL_eV2... |
|
|
|
| 38.521-3 | 1923 | 2 | F | 18.6.0 | Rel-18 | Correction of reference sensitivity for PC2 EN-DC combo within FR1 |
R5-253238
| agreed | RAN5#107 | KDDI Corporation |
RP-251072
| approved | RAN#108 | R5 | 18.7.0 | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1923 | 1 | F | 18.6.0 | Rel-18 | Correction of reference sensitivity for PC2 EN-DC combo within FR1 |
R5-253619
| revised | RAN5#107 | KDDI Corporation |
| | | | | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1923 | - | F | 18.6.0 | Rel-18 | Correction of reference sensitivity for PC2 EN-DC combo within FR1 |
R5-251915
| revised | RAN5#107 | KDDI Corporation |
| | | | | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1922 | - | F | 18.6.0 | Rel-18 | FR2 MU - Editor note update for NSA 7 NR CCs CA minimum output power test 6.3B.1.4_1.6 |
R5-251901
| agreed | RAN5#107 | Keysight Techno... |
RP-251117
| approved | RAN#108 | R5 | 18.7.0 | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1921 | - | F | 18.6.0 | Rel-18 | FR2 MU - PC3 update for OBW UL MIMO test in 38.521-3 |
R5-251900
| agreed | RAN5#107 | Keysight Techno... |
RP-251117
| approved | RAN#108 | R5 | 18.7.0 | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1920 | - | F | 18.6.0 | Rel-18 | FR2 MU - PC7 update for ACS and IBB tests in 38.521-3 |
R5-251894
| agreed | RAN5#107 | Keysight Techno... |
RP-251119
| approved | RAN#108 | R5 | 18.7.0 | TEI17_Test, NR_... |
|
|
|
| 38.521-3 | 1919 | - | F | 18.5.0 | Rel-18 | Corrections on Ch5 and Annex N for UE capability names |
R5-251097
| agreed | RAN5#106 | ZTE Corporation... |
RP-250731
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1918 | 1 | F | 18.5.0 | Rel-18 | Corrections on test coverage rules for NSA band combinations |
R5-251561
| agreed | RAN5#106 | ZTE Corporation... |
RP-250733
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1918 | - | F | 18.5.0 | Rel-18 | Corrections on test coverage rules for NSA band combinations |
R5-251096
| revised | RAN5#106 | ZTE Corporation... |
| | | | | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1917 | - | F | 18.5.0 | Rel-18 | Updates on Ch7 for PC2 cross band isloation MSD for DC_2A_n41A |
R5-251095
| agreed | RAN5#106 | ZTE Corporation |
RP-250740
| approved | RAN#107 | RAN5 | 18.6.0 | TEI17_Test |
|
|
|
| 38.521-3 | 1916 | 1 | F | 18.5.0 | Rel-18 | Additions on Ch7 for harmonic mixing MSD for DC_5A_n78A |
R5-251525
| agreed | RAN5#106 | ZTE Corporation |
RP-250733
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1916 | - | F | 18.5.0 | Rel-18 | Additions on Ch7 for harmonic mixing MSD for DC_5A_n78A |
R5-251094
| revised | RAN5#106 | ZTE Corporation |
| | | | | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1915 | - | F | 18.5.0 | Rel-18 | Updates on Ch7 for UL harmonic and harmonic mixing MSD for DC_3A_n77A and DC_3A_n78A |
R5-251093
| agreed | RAN5#106 | ZTE Corporation |
RP-250731
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1914 | - | F | 18.5.0 | Rel-18 | Corrections on Clause 7.3B.2 for intra-band contiguous EN-DC reference sensitivity |
R5-251092
| agreed | RAN5#106 | ZTE Corporation |
RP-250731
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1913 | - | F | 18.5.0 | Rel-18 | Corrections on Ch6 for UE capability names |
R5-251091
| agreed | RAN5#106 | ZTE Corporation... |
RP-250731
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1912 | 1 | F | 18.5.0 | Rel-18 | Updates on Ch7 for PC2 refsens test requirement handling |
R5-251701
| agreed | RAN5#106 | ZTE Corporation... |
RP-250685
| approved | RAN#107 | RAN5 | 18.6.0 | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1912 | - | F | 18.5.0 | Rel-18 | Updates on Ch7 for PC2 refsens test requirement handling |
R5-251080
| revised | RAN5#106 | ZTE Corporation... |
| | | | | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1911 | 1 | F | 18.5.0 | Rel-18 | Updates on Ch7 for EN-DC refsens test requirement handling |
R5-251700
| agreed | RAN5#106 | ZTE Corporation |
RP-250666
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1911 | - | F | 18.5.0 | Rel-18 | Updates on Ch7 for EN-DC refsens test requirement handling |
R5-251077
| revised | RAN5#106 | ZTE Corporation |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1910 | - | F | 18.5.0 | Rel-18 | Updates on Ch7 for cross band isloation MSD for DC_2A_n41A |
R5-251076
| agreed | RAN5#106 | ZTE Corporation |
RP-250666
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1909 | 2 | F | 18.5.0 | Rel-18 | CR for TS 38.521-3 to correct Test BW configuration of DC_5A-7A_n78A MSD |
R5-251440
| agreed | RAN5#106 | Samsung, Anritsu |
RP-250733
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1909 | 1 | F | 18.5.0 | Rel-18 | CR for TS 38.521-3 to correct Test BW configuration of DC_5A-7A_n78A MSD |
R5-251746
| revised | RAN5#106 | Samsung, Anritsu |
| | | | | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1909 | - | F | 18.5.0 | Rel-18 | CR for TS 38.521-3 to correct Test BW configuration of DC_5A-7A_n78A MSD |
R5-251054
| revised | RAN5#106 | Samsung, Anritsu |
| | | | | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1908 | - | F | 18.5.0 | Rel-18 | Update for EN-DC Reference sensitivity testing |
R5-251028
| agreed | RAN5#106 | Rohde & Schwarz... |
RP-250731
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1907 | 1 | F | 18.5.0 | Rel-18 | Correction to DL frequency of DC_66A_n77A in 7.3B.2.3 |
R5-251688
| agreed | RAN5#106 | Anritsu |
RP-250743
| approved | RAN#107 | RAN5 | 18.6.0 | TEI17_Test |
|
|
|
| 38.521-3 | 1907 | - | F | 18.5.0 | Rel-18 | Correction to DL frequency of DC_66A_n77A in 7.3B.2.3 |
R5-250965
| revised | RAN5#106 | Anritsu |
| | | | | TEI17_Test, END... |
|
|
|
| 38.521-3 | 1906 | - | F | 18.5.0 | Rel-18 | Correction to DL frequency of DC_66A_n41A in 7.3B.2.3 |
R5-250964
| agreed | RAN5#106 | Anritsu |
RP-250666
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1905 | - | F | 18.5.0 | Rel-18 | Correction to DL UL allocation in 7.3B.2 for Rel-17 FR1 inter-band EN-DC |
R5-250957
| agreed | RAN5#106 | Anritsu |
RP-250672
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1904 | 1 | F | 18.5.0 | Rel-18 | Correction to DL UL allocation in 7.3B.2 for Rel-16 FR1 inter-band EN-DC |
R5-251559
| agreed | RAN5#106 | Anritsu |
RP-250666
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1904 | - | F | 18.5.0 | Rel-18 | Correction to DL UL allocation in 7.3B.2 for Rel-16 FR1 inter-band EN-DC |
R5-250956
| revised | RAN5#106 | Anritsu |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1903 | - | F | 18.5.0 | Rel-18 | Correction to DL UL allocation in 7.3B.2 for Rel-15 FR1 inter-band EN-DC |
R5-250955
| agreed | RAN5#106 | Anritsu |
RP-250731
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1902 | - | F | 18.5.0 | Rel-18 | Correction of statistical testing of receiver characteristics for NR NSA |
R5-250947
| agreed | RAN5#106 | Anritsu |
RP-250730
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1901 | 2 | F | 18.5.0 | Rel-18 | Addition of UE maximum output power for new PC2 EN-DC combs within FR1 |
R5-251754
| agreed | RAN5#106 | vivo |
RP-250685
| approved | RAN#107 | RAN5 | 18.6.0 | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1901 | 1 | F | 18.5.0 | Rel-18 | Addition of UE maximum output power for new PC2 EN-DC combs within FR1 |
R5-251557
| revised | RAN5#106 | vivo |
| | | | | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1901 | - | F | 18.5.0 | Rel-18 | Addition of UE maximum output power for new PC2 EN-DC combs within FR1 |
R5-250874
| revised | RAN5#106 | vivo |
| | | | | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1900 | - | F | 18.5.0 | Rel-18 | Correction to test requirement of DC_1A_n78A_n79A in 7.3B.2 |
R5-250856
| withdrawn | RAN5#106 | NTT DOCOMO INC. |
| | | | | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1899 | 1 | F | 18.5.0 | Rel-18 | Correction to reference sensitivity for Rel-15 inter-band EN-DC configurations |
R5-251560
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250733
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1899 | - | F | 18.5.0 | Rel-18 | Correction to reference sensitivity for Rel-15 inter-band EN-DC configurations |
R5-250816
| revised | RAN5#106 | Huawei, HiSilicon |
| | | | | TEI15_Test, 5GS... |
|
|
|
| 38.521-3 | 1898 | 1 | F | 18.5.0 | Rel-18 | Addition of Annex F for a bunch of 3Tx inter-band EN-DC test cases |
R5-251556
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1898 | - | F | 18.5.0 | Rel-18 | Addition of Annex F for a bunch of 3Tx inter-band EN-DC test cases |
R5-250751
| revised | RAN5#106 | Huawei, HiSilicon |
| | | | | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1897 | - | F | 18.5.0 | Rel-18 | Addition of new test case 6.5L.5.3 for inter-band EN-DC with Tx Diversity |
R5-250750
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1896 | - | F | 18.5.0 | Rel-18 | Addition of new test case 6.5L.4.3 for inter-band EN-DC with Tx Diversity |
R5-250749
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1895 | 1 | F | 18.5.0 | Rel-18 | Addition of new test cases 6.5L.2.3 OOBE for inter-band EN-DC with Tx Diversity |
R5-251696
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1895 | - | F | 18.5.0 | Rel-18 | Addition of new test cases 6.5L.2.3 OOBE for inter-band EN-DC with Tx Diversity |
R5-250748
| revised | RAN5#106 | Huawei, HiSilicon |
| | | | | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1894 | - | F | 18.5.0 | Rel-18 | Addition of new test case 6.5L.1.3 OBW for inter-band EN-DC with Tx Diversity |
R5-250747
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1893 | 1 | F | 18.5.0 | Rel-18 | Addition of new test case 6.5H.5.3 for inter-band EN-DC with UL MIMO |
R5-251555
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1893 | - | F | 18.5.0 | Rel-18 | Addition of new test case 6.5H.5.3 for inter-band EN-DC with UL MIMO |
R5-250746
| revised | RAN5#106 | Huawei, HiSilicon |
| | | | | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1892 | - | F | 18.5.0 | Rel-18 | Addition of new test case 6.5H.4.3 for inter-band EN-DC with UL MIMO |
R5-250745
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1891 | 1 | F | 18.5.0 | Rel-18 | Addition of new test cases 6.5H.2.3 OOBE for inter-band EN-DC with UL MIMO |
R5-251695
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1891 | - | F | 18.5.0 | Rel-18 | Addition of new test cases 6.5H.2.3 OOBE for inter-band EN-DC with UL MIMO |
R5-250744
| revised | RAN5#106 | Huawei, HiSilicon |
| | | | | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1890 | - | F | 18.5.0 | Rel-18 | Addition of new test case 6.5H.1.3 OBW for inter-band EN-DC with UL MIMO |
R5-250743
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250688
| approved | RAN#107 | RAN5 | 18.6.0 | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1889 | - | F | 15.4.1 | Rel-15 | WP Rel-15 NR TX and RX Test Cases – Part 3 |
R5-250681
| withdrawn | RAN5#106 | Qualcomm Techno... |
| | | | | TEI15_Test, 5GS... |
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|
|
| 38.521-3 | 1888 | - | F | 18.5.0 | Rel-18 | Updating general rules in 4.5.0 for spurious emissions for UE co-existence testing |
R5-250442
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250729
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1887 | - | F | 18.5.0 | Rel-18 | Cleaning up R15 requirements in test case Spurious emission UE co-existence |
R5-250441
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250729
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1886 | - | F | 18.5.0 | Rel-18 | Updating test requirements of General spurious emissions for FR1 Inter-band EN-DC |
R5-250439
| agreed | RAN5#106 | Huawei, HiSilicon |
RP-250729
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1885 | 1 | F | 18.5.0 | Rel-18 | Missing test requirements for DC_14A_n66A in NSA test 6.5B.3.3.2 |
R5-251558
| agreed | RAN5#106 | Keysight Techno... |
RP-250666
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1885 | - | F | 18.5.0 | Rel-18 | Missing test requirements for DC_14A_n66A in NSA test 6.5B.3.3.2 |
R5-250290
| revised | RAN5#106 | Keysight Techno... |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1884 | - | F | 18.5.0 | Rel-18 | Missing test requirements for DC_1A_n8A in NSA test 6.2B.1.3 |
R5-250289
| agreed | RAN5#106 | Keysight Techno... |
RP-250666
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1883 | - | F | 18.5.0 | Rel-18 | Editorial correction to DC_14A-66A_n77A PC2 reference sensitivity test requirement |
R5-250278
| agreed | RAN5#106 | WE Certificatio... |
RP-250738
| approved | RAN#107 | RAN5 | 18.6.0 | TEI17_Test |
|
|
|
| 38.521-3 | 1882 | - | F | 18.5.0 | Rel-18 | Editorial correction to DC_14A-66A_n77A PC3 reference sensitivity test requirement |
R5-250276
| agreed | RAN5#106 | WE Certificatio... |
RP-250672
| approved | RAN#107 | RAN5 | 18.6.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1881 | - | F | 18.5.0 | Rel-18 | FR2 MU - General Updates in 38.521-3 Rx test cases |
R5-250212
| agreed | RAN5#106 | Keysight Techno... |
RP-250728
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1880 | - | F | 18.5.0 | Rel-18 | FR2 MU - General Updates in 38.521-3 Tx test cases |
R5-250211
| agreed | RAN5#106 | Keysight Techno... |
RP-250728
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1879 | 1 | F | 18.5.0 | Rel-18 | Correction of reference sensitivity for PC2 EN-DC combo within FR1 |
R5-251745
| withdrawn | RAN5#106 | KDDI Corporation |
| | | | | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1879 | - | F | 18.5.0 | Rel-18 | Correction of reference sensitivity for PC2 EN-DC combo within FR1 |
R5-250185
| revised | RAN5#106 | KDDI Corporation |
| | | | | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1878 | - | F | 18.5.0 | Rel-18 | Editorial correction to Reference sensitivity for DC |
R5-250160
| agreed | RAN5#106 | MediaTek Beijin... |
RP-250728
| approved | RAN#107 | RAN5 | 18.6.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1877 | - | F | 18.4.0 | Rel-18 | Editorial Correction to 6.2B.1.4D.x title and reference clauses |
R5-247445
| agreed | RAN5#105 | Bureau Veritas ADT |
RP-242735
| approved | RAN#106 | RAN5 | 18.5.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1876 | 1 | F | 18.4.0 | Rel-18 | Update the rules of high power applicability for high order combinations |
R5-247781
| agreed | RAN5#105 | ZTE Corporation... |
RP-242747
| approved | RAN#106 | RAN5 | 18.5.0 | TEI17_Test |
|
|
|
| 38.521-3 | 1876 | - | F | 18.4.0 | Rel-18 | Update the rules of high power applicability for high order combinations |
R5-247407
| revised | RAN5#105 | ZTE Corporation... |
| | | | | TEI17_Test |
|
|
|
| 38.521-3 | 1875 | 1 | F | 18.4.0 | Rel-18 | Addition of reference sensitivity for PC2 DC_2A_n41A |
R5-247780
| agreed | RAN5#105 | ZTE Corporation |
RP-242746
| approved | RAN#106 | RAN5 | 18.5.0 | TEI17_Test |
|
|
|
| 38.521-3 | 1875 | - | F | 18.4.0 | Rel-18 | Addition of reference sensitivity for PC2 DC_2A_n41A |
R5-247396
| revised | RAN5#105 | ZTE Corporation |
| | | | | TEI17_Test |
|
|
|
| 38.521-3 | 1874 | - | F | 18.4.0 | Rel-18 | Addition of UE maximum output power for PC2 DC_2A_n41A |
R5-247395
| agreed | RAN5#105 | ZTE Corporation |
RP-242745
| approved | RAN#106 | RAN5 | 18.5.0 | TEI17_Test |
|
|
|
| 38.521-3 | 1873 | 1 | F | 18.4.0 | Rel-18 | Update of status of FR2 SISO and UL MIMO test cases |
R5-247857
| agreed | RAN5#105 | ROHDE & SCHWARZ |
RP-242737
| approved | RAN#106 | RAN5 | 18.5.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1873 | - | F | 18.4.0 | Rel-18 | Update of status of FR2 SISO and UL MIMO test cases |
R5-247340
| revised | RAN5#105 | ROHDE & SCHWARZ |
| | | | | TEI15_Test |
|
|
|
| 38.521-3 | 1872 | - | F | 18.4.0 | Rel-18 | Correction to note of test configuration table in 6.5B.3.3.2 |
R5-247183
| agreed | RAN5#105 | Anritsu |
RP-242734
| approved | RAN#106 | RAN5 | 18.5.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1871 | - | F | 18.4.0 | Rel-18 | Correction to test configuration of 6.5B.3.3.2 for Rel-17 EN-DC configuration |
R5-247182
| agreed | RAN5#105 | Anritsu |
RP-242676
| approved | RAN#106 | RAN5 | 18.5.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1870 | - | F | 18.4.0 | Rel-18 | Correction to test configuration of 6.5B.3.3.2 for Rel-16 EN-DC configuration |
R5-247181
| agreed | RAN5#105 | Anritsu |
RP-242666
| approved | RAN#106 | RAN5 | 18.5.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1869 | - | F | 18.4.0 | Rel-18 | Correction to PC2 requirement level in 7.3B.2.3 |
R5-247180
| agreed | RAN5#105 | Anritsu |
RP-242739
| approved | RAN#106 | RAN5 | 18.5.0 | TEI16_Test |
|
|
|
| 38.521-3 | 1868 | 1 | F | 18.4.0 | Rel-18 | Update of MU for FR1 configured output power |
R5-247837
| agreed | RAN5#105 | Anritsu |
RP-242737
| approved | RAN#106 | RAN5 | 18.5.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1868 | - | F | 18.4.0 | Rel-18 | Update of MU for FR1 configured output power |
R5-247170
| revised | RAN5#105 | Anritsu |
| | | | | TEI15_Test |
|
|
|
| 38.521-3 | 1867 | - | F | 18.4.0 | Rel-18 | Removing n38 from V2X Tx test cases |
R5-247074
| agreed | RAN5#105 | Huawei, HiSilic... |
RP-242668
| approved | RAN#106 | RAN5 | 18.5.0 | 5G_V2X_NRSL_eV2... |
|
|
|
| 38.521-3 | 1866 | - | F | 18.4.0 | Rel-18 | Updating test coverage rules for NSA band configuration Spurious emission UE co-ex testing |
R5-247008
| agreed | RAN5#105 | Huawei, HiSilicon |
RP-242734
| approved | RAN#106 | RAN5 | 18.5.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1865 | - | F | 18.4.0 | Rel-18 | Updating REFSENS testing for DC_26A_n41A |
R5-247005
| agreed | RAN5#105 | Huawei, HiSilicon |
RP-242734
| approved | RAN#106 | RAN5 | 18.5.0 | TEI15_Test |
|
|
|
| 38.521-3 | 1864 | 1 | F | 18.4.0 | Rel-18 | Addition of Transmit ON/OFF time mask for Inter-Band EN-DC including FR2 (4 NR CCs) |
R5-247974
| agreed | RAN5#105 | Sporton Interna... |
RP-242666
| approved | RAN#106 | RAN5 | 18.5.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1864 | - | F | 18.4.0 | Rel-18 | Addition of Transmit ON/OFF time mask for Inter-Band EN-DC including FR2 (4 NR CCs) |
R5-246953
| revised | RAN5#105 | Sporton Interna... |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1863 | 1 | F | 18.4.0 | Rel-18 | Addition of Transmit ON/OFF time mask for Inter-Band EN-DC including FR2 (3 NR CCs) |
R5-247973
| agreed | RAN5#105 | Sporton Interna... |
RP-242666
| approved | RAN#106 | RAN5 | 18.5.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1863 | - | F | 18.4.0 | Rel-18 | Addition of Transmit ON/OFF time mask for Inter-Band EN-DC including FR2 (3 NR CCs) |
R5-246952
| revised | RAN5#105 | Sporton Interna... |
| | | | | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1862 | - | F | 18.4.0 | Rel-18 | Addition of Annex F for 3Tx inter-band EN-DC new test cases |
R5-246920
| agreed | RAN5#105 | Huawei, HiSilicon |
RP-242696
| approved | RAN#106 | RAN5 | 18.5.0 | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1861 | - | F | 18.4.0 | Rel-18 | Addition of new test cases 6.4L.x for inter-band EN-DC with TxD |
R5-246919
| agreed | RAN5#105 | Huawei, HiSilicon |
RP-242696
| approved | RAN#106 | RAN5 | 18.5.0 | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1860 | - | F | 18.4.0 | Rel-18 | Addition of new test cases 6.4H.x for inter-band EN-DC with UL MIMO |
R5-246918
| agreed | RAN5#105 | Huawei, HiSilicon |
RP-242696
| approved | RAN#106 | RAN5 | 18.5.0 | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1859 | - | F | 18.4.0 | Rel-18 | Addition of new test cases 6.3L.3.x for inter-band EN-DC with TxD |
R5-246917
| agreed | RAN5#105 | Huawei, HiSilic... |
RP-242696
| approved | RAN#106 | RAN5 | 18.5.0 | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1858 | - | F | 18.4.0 | Rel-18 | Addition of new test cases 6.3H.3.x for inter-band EN-DC with UL MIMO |
R5-246916
| agreed | RAN5#105 | Huawei, HiSilic... |
RP-242696
| approved | RAN#106 | RAN5 | 18.5.0 | 4Rx_low_NR_band... |
|
|
|
| 38.521-3 | 1857 | - | F | 18.4.0 | Rel-18 | Addition of many PC2 EN-DC combos reference sensitivity test |
R5-246790
| agreed | RAN5#105 | WE Certificatio... |
RP-242693
| approved | RAN#106 | RAN5 | 18.5.0 | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1856 | - | F | 18.4.0 | Rel-18 | Addition of many PC2 EN-DC combos to Ch5 |
R5-246789
| agreed | RAN5#105 | WE Certificatio... |
RP-242693
| approved | RAN#106 | RAN5 | 18.5.0 | HPUE_NR_CADC_NR... |
|
|
|
| 38.521-3 | 1855 | - | F | 18.4.0 | Rel-18 | Addition of EN-DC combo DC_2A-5A_n66A |
R5-246783
| withdrawn | RAN5#105 | WE Certificatio... |
| | | | | TEI15_Test |
|
|
|
| 38.521-3 | 1854 | - | F | 18.4.0 | Rel-18 | Addition of Rx requirements for many EN-DC combos |
R5-246782
| agreed | RAN5#105 | WE Certificatio... |
RP-242665
| approved | RAN#106 | RAN5 | 18.5.0 | NR_CADC_NR_LTE_... |
|
|
|
| 38.521-3 | 1853 | - | F | 18.4.0 | Rel-18 | Addition of configured output power requirements for many EN-DC combos |
R5-246781
| agreed | RAN5#105 | WE Certificatio... |
RP-242665
| approved | RAN#106 | RAN5 | 18.5.0 | NR_CADC_NR_LTE_... |
|