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 1771 items in 9 pages
 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.90311671F19.1.0Rel-19Test tolerance analysis for the Inter-frequency measurement test cases for ATG Details R5-261537 agreedRAN5#110Ericsson Details RP-260100  RAN#111RAN5 NR_ATG-UEConTest
See details 38.9031167-F19.1.0Rel-19Test tolerance analysis for the Inter-frequency measurement test cases for ATG Details R5-260975 revisedRAN5#110Ericsson    NR_ATG-UEConTest
See details 38.90311661F19.1.0Rel-19Test tolerance analysis for the Intra-frequency measurement test cases for ATG Details R5-261536 agreedRAN5#110Ericsson Details RP-260100  RAN#111RAN5 NR_ATG-UEConTest
See details 38.9031166-F19.1.0Rel-19Test tolerance analysis for the Intra-frequency measurement test cases for ATG Details R5-260974 revisedRAN5#110Ericsson    NR_ATG-UEConTest
See details 38.90311651F19.1.0Rel-19Test tolerance analysis for FR2 inter-frequency SSB-based L1-RSRP measurement test case 7.6.22.1 Details R5-261678 agreedRAN5#110Ericsson Details RP-260115  RAN#111RAN5 NR_Mob_enh2-UEC...
See details 38.9031165-F19.1.0Rel-19Test tolerance analysis for FR2 inter-frequency SSB-based L1-RSRP measurement test case 7.6.22.1 Details R5-260971 revisedRAN5#110Ericsson    NR_Mob_enh2-UEC...
See details 38.90311641F19.1.0Rel-19Addition of MU terms missing for 2AoA and 3AoA FR2 MultiRx RRM Details R5-261565 agreedRAN5#110Keysight Techno... Details RP-260116  RAN#111RAN5 NR_FR2_multiRX_...
See details 38.9031164-F19.1.0Rel-19Addition of MU terms missing for 2AoA and 3AoA FR2 MultiRx RRM Details R5-260948 revisedRAN5#110Keysight Techno...    NR_FR2_multiRX_...
See details 38.90311631F19.1.0Rel-19Test Tolerance for RRM NR-NTN Event Triggered Test Cases without gap Details R5-261679 agreedRAN5#110Rohde & Schwarz Details RP-260162  RAN#111RAN5 TEI17_Test
See details 38.9031163-F19.1.0Rel-19Test Tolerance for RRM NR-NTN Event Triggered Test Cases without gap Details R5-260928 revisedRAN5#110Rohde & Schwarz    TEI17_Test, NR_...
See details 38.9031162-F19.1.0Rel-19Test Tolerance update for Positioning test case 16.3.1 Details R5-260926 agreedRAN5#110Rohde & Schwarz Details RP-260155  RAN#111RAN5 TEI16_Test
See details 38.9031161-F19.1.0Rel-19Editorial correction in E.3.5 Details R5-260826 agreedRAN5#110Anritsu Details RP-260152  RAN#111RAN5 TEI15_Test
See details 38.9031160-F19.1.0Rel-19Update for Uncertainty of the Network Analyzer in FR2 RRM test cases Details R5-260825 agreedRAN5#110Anritsu Details RP-260152  RAN#111RAN5 TEI15_Test
See details 38.90311591F19.1.0Rel-19TT analysis for NR FeMG RRM test case 8.4.3.2 Details R5-261532 agreedRAN5#110Huawei, HiSilicon Details RP-260118  RAN#111RAN5 NR_MG_enh2-UEConTest
See details 38.9031159-F19.1.0Rel-19TT analysis for NR FeMG RRM test case 8.4.3.2 Details R5-260758 revisedRAN5#110Huawei, HiSilicon    NR_MG_enh2-UEConTest
See details 38.90311581F19.1.0Rel-19TT analysis for NR FeMG RRM test case 6.6.23.3 Details R5-261531 agreedRAN5#110Huawei, HiSilicon Details RP-260118  RAN#111RAN5 NR_MG_enh2-UEConTest
See details 38.9031158-F19.1.0Rel-19TT analysis for NR FeMG RRM test case 6.6.23.3 Details R5-260757 revisedRAN5#110Huawei, HiSilicon    NR_MG_enh2-UEConTest
See details 38.90311571F19.1.0Rel-19TT analysis for NR FeMG RRM test case 6.6.22.2 Details R5-261530 agreedRAN5#110Huawei, HiSilicon Details RP-260118  RAN#111RAN5 NR_MG_enh2-UEConTest
See details 38.9031157-F19.1.0Rel-19TT analysis for NR FeMG RRM test case 6.6.22.2 Details R5-260756 revisedRAN5#110Huawei, HiSilicon    NR_MG_enh2-UEConTest
See details 38.90311561F19.1.0Rel-19TT analysis for NR FeMG RRM test case 6.6.22.1 Details R5-261529 agreedRAN5#110Huawei, HiSilicon Details RP-260118  RAN#111RAN5 NR_MG_enh2-UEConTest
See details 38.9031156-F19.1.0Rel-19TT analysis for NR FeMG RRM test case 6.6.22.1 Details R5-260755 revisedRAN5#110Huawei, HiSilicon    NR_MG_enh2-UEConTest
See details 38.90311551F19.1.0Rel-19TT analysis for NR ATG RRM test case 19.6.8.2.2 Details R5-261607 agreedRAN5#110Huawei, HiSilicon Details RP-260101  RAN#111RAN5 NR_ATG-UEConTest
See details 38.9031155-F19.1.0Rel-19TT analysis for NR ATG RRM test case 19.6.8.2.2 Details R5-260738 revisedRAN5#110Huawei, HiSilicon    NR_ATG-UEConTest
See details 38.90311541F19.1.0Rel-19TT analysis for NR ATG RRM test case 19.6.8.2.1 Details R5-261606 agreedRAN5#110Huawei, HiSilicon Details RP-260101  RAN#111RAN5 NR_ATG-UEConTest
See details 38.9031154-F19.1.0Rel-19TT analysis for NR ATG RRM test case 19.6.8.2.1 Details R5-260737 revisedRAN5#110Huawei, HiSilicon    NR_ATG-UEConTest
See details 38.90311531F19.1.0Rel-19TT analysis for NR ATG RRM test case 19.6.7.2.2 Details R5-261605 agreedRAN5#110Huawei, HiSilicon Details RP-260101  RAN#111RAN5 NR_ATG-UEConTest
See details 38.9031153-F19.1.0Rel-19TT analysis for NR ATG RRM test case 19.6.7.2.2 Details R5-260736 revisedRAN5#110Huawei, HiSilicon    NR_ATG-UEConTest
See details 38.90311521F19.1.0Rel-19TT analysis for NR ATG RRM test case 19.6.7.2.1 Details R5-261604 agreedRAN5#110Huawei, HiSilicon Details RP-260101  RAN#111RAN5 NR_ATG-UEConTest
See details 38.9031152-F19.1.0Rel-19TT analysis for NR ATG RRM test case 19.6.7.2.1 Details R5-260735 revisedRAN5#110Huawei, HiSilicon    NR_ATG-UEConTest
See details 38.90311511F19.1.0Rel-19TT analysis for NR ATG RRM test case 19.6.6.2.2 Details R5-261603 agreedRAN5#110Huawei, HiSilicon Details RP-260101  RAN#111RAN5 NR_ATG-UEConTest
See details 38.9031151-F19.1.0Rel-19TT analysis for NR ATG RRM test case 19.6.6.2.2 Details R5-260734 revisedRAN5#110Huawei, HiSilicon    NR_ATG-UEConTest
See details 38.90311501F19.1.0Rel-19TT analysis for NR ATG RRM test case 19.6.6.2.1 Details R5-261525 agreedRAN5#110Huawei, HiSilicon Details RP-260100  RAN#111RAN5 NR_ATG-UEConTest
See details 38.9031150-F19.1.0Rel-19TT analysis for NR ATG RRM test case 19.6.6.2.1 Details R5-260733 revisedRAN5#110Huawei, HiSilicon    NR_ATG-UEConTest
See details 38.9031149-F19.1.0Rel-19Editorial correction to Table 8-2 Details R5-260667 agreedRAN5#110Apple Details RP-260151  RAN#111RAN5 TEI15_Test
See details 38.90311481F19.1.0Rel-19Clarification on the MUs definition for minimum output power test Details R5-261566 agreedRAN5#110Keysight Techno... Details RP-260154  RAN#111RAN5 TEI15_Test
See details 38.9031148-F19.1.0Rel-19Clarification on the MUs definition for minimum output power test Details R5-260324 revisedRAN5#110Keysight Techno...    TEI15_Test, 5GS...
See details 38.90311471F19.1.0Rel-19Modification of TT analysis for FR1 SS-RSRP inter-frequency absolute measurement accuracy test cases Details R5-261519 agreedRAN5#110Keysight Techno... Details RP-260154  RAN#111RAN5 TEI15_Test
See details 38.9031147-F19.1.0Rel-19Modification of TT analysis for FR1 SS-RSRP inter-frequency absolute measurement accuracy test cases Details R5-260067 revisedRAN5#110Keysight Techno...    TEI15_Test, 5GS...
See details 38.9031146-F19.1.0Rel-19Modification of TT analysis for FR1 SS-RSRP intra-frequency absolute measurement accuracy test cases Details R5-260066 agreedRAN5#110Keysight Techno... Details RP-260150  RAN#111RAN5 TEI15_Test
See details 38.9031145-F19.1.0Rel-19Addition of test tolerance analysis of idle mode CA/DC measurement of SCell with less than 5M bandwidth test case Details R5-260064 agreedRAN5#110Nokia Details RP-260129  RAN#111RAN5 NR_FR1_lessthan...
See details 38.90311441F19.1.0Rel-19Addition of test tolerance analysis of intra-frequency FR1 deactivated PSCell measurement test with 12 PRB SSB bandwidth Details R5-261562 agreedRAN5#110Nokia Details RP-260129  RAN#111RAN5 NR_FR1_lessthan...
See details 38.9031144-F19.1.0Rel-19Addition of test tolerance analysis of intra-frequency FR1 deactivated PSCell measurement test with 12 PRB SSB bandwidth Details R5-260062 revisedRAN5#110Nokia    NR_FR1_lessthan...
See details 38.9031143-F19.1.0Rel-19Updation of test tolerance and measurement uncertainty analysis for test case 6.5.1.16 Details R5-260059 agreedRAN5#110Nokia Details RP-260163  RAN#111RAN5 TEI18_Test
See details 38.9031142-F19.1.0Rel-19Updation of test tolerance and measurement uncertainty analysis for test case 6.5.1.15 Details R5-260058 agreedRAN5#110Nokia Details RP-260163  RAN#111RAN5 TEI18_Test
See details 38.9031141-F19.1.0Rel-19Updation of test tolerance and measurement uncertainty analysis for test case 6.5.1.14 Details R5-260057 agreedRAN5#110Nokia Details RP-260163  RAN#111RAN5 TEI18_Test
See details 38.9031140-F19.1.0Rel-19Updation of test tolerance and measurement uncertainty analysis for test case 6.5.1.13 Details R5-260056 agreedRAN5#110Nokia Details RP-260163  RAN#111RAN5 TEI18_Test
See details 38.9031139-F19.1.0Rel-19Updation of test tolerance and measurement uncertainty analysis for test case 6.3.1.18 Details R5-260055 agreedRAN5#110Nokia Details RP-260163  RAN#111RAN5 TEI18_Test
See details 38.9031138-F19.1.0Rel-19Updation of test tolerance and measurement uncertainty analysis for test case 6.1.1.9 Details R5-260054 agreedRAN5#110Nokia Details RP-260163  RAN#111RAN5 TEI18_Test
See details 38.90311371F19.1.0Rel-19Adding TT analysis for NR positioning test case 14.3.9 Details R5-261669 agreedRAN5#110CATT Details RP-260113  RAN#111RAN5 NR_pos_enh2-UEC...
See details 38.9031137-F19.1.0Rel-19Adding TT analysis for NR positioning test case 14.3.9 Details R5-260051 revisedRAN5#110CATT    NR_pos_enh2-UEC...
See details 38.90311361F19.1.0Rel-19Adding TT analysis for NR positioning test case 14.2.11 Details R5-261668 agreedRAN5#110CATT Details RP-260113  RAN#111RAN5 NR_pos_enh2-UEC...
See details 38.9031136-F19.1.0Rel-19Adding TT analysis for NR positioning test case 14.2.11 Details R5-260050 revisedRAN5#110CATT    NR_pos_enh2-UEC...
See details 38.90311351F19.1.0Rel-19TT analysis for ATG RRM test cases 19.2.3.2.3 and 19.2.3.2.4 Details R5-261520 agreedRAN5#110ZTE Corporation Details RP-260100  RAN#111RAN5 NR_ATG-UEConTest
See details 38.9031135-F19.1.0Rel-19TT analysis for ATG RRM test cases 19.2.3.2.3 and 19.2.3.2.4 Details R5-260049 revisedRAN5#110ZTE Corporation    NR_ATG-UEConTest
See details 38.90311341F19.1.0Rel-19TT analysis for ATG RRM test case 19.4.2.2 Details R5-261523 agreedRAN5#110ZTE Corporation Details RP-260100  RAN#111RAN5 NR_ATG-UEConTest
See details 38.9031134-F19.1.0Rel-19TT analysis for ATG RRM test case 19.4.2.2 Details R5-260045 revisedRAN5#110ZTE Corporation    NR_ATG-UEConTest
See details 38.90311331F19.1.0Rel-19TT analysis for ATG RRM test case 19.4.2.1 Details R5-261522 agreedRAN5#110ZTE Corporation Details RP-260100  RAN#111RAN5 NR_ATG-UEConTest
See details 38.9031133-F19.1.0Rel-19TT analysis for ATG RRM test case 19.4.2.1 Details R5-260042 revisedRAN5#110ZTE Corporation    NR_ATG-UEConTest
See details 38.9031132-F19.1.0Rel-19TT analysis for ATG RRM test case 19.3.3.1 Details R5-260039 agreedRAN5#110ZTE Corporation Details RP-260099  RAN#111RAN5 NR_ATG-UEConTest
See details 38.90311311F19.1.0Rel-19TT analysis for ATG RRM test case 19.3.1.1 Details R5-261558 agreedRAN5#110ZTE Corporation Details RP-260101  RAN#111RAN5 NR_ATG-UEConTest
See details 38.9031131-F19.1.0Rel-19TT analysis for ATG RRM test case 19.3.1.1 Details R5-260036 revisedRAN5#110ZTE Corporation    NR_ATG-UEConTest
See details 38.9031130-F19.1.0Rel-19Addition of TT analysis for SCPAC TC 7.5.18.1 Details R5-260030 agreedRAN5#110MediaTek Inc. Details RP-260114  RAN#111RAN5 NR_Mob_enh2-UEC...
See details 38.9031129-F19.1.0Rel-19Addition of TT analysis for positioning test case 15.3.8 Details R5-260029 agreedRAN5#110CATT Details RP-260112  RAN#111RAN5 NR_pos_enh2-UEC...
See details 38.90311281F19.1.0Rel-19Addition of TT analysis for positioning test case 15.3.7 Details R5-261667 agreedRAN5#110CATT Details RP-260113  RAN#111RAN5 NR_pos_enh2-UEC...
See details 38.9031128-F19.1.0Rel-19Addition of TT analysis for positioning test case 15.3.7 Details R5-260028 revisedRAN5#110CATT    NR_pos_enh2-UEC...
See details 38.90311271F19.1.0Rel-19Addition of TT analysis for positioning test case 15.2.13 Details R5-261666 agreedRAN5#110CATT Details RP-260113  RAN#111RAN5 NR_pos_enh2-UEC...
See details 38.9031127-F19.1.0Rel-19Addition of TT analysis for positioning test case 15.2.13 Details R5-260027 revisedRAN5#110CATT    NR_pos_enh2-UEC...
See details 38.90311261F19.1.0Rel-19Addition of TT analysis for positioning test case 15.2.12 Details R5-261665 agreedRAN5#110CATT Details RP-260113  RAN#111RAN5 NR_pos_enh2-UEC...
See details 38.9031126-F19.1.0Rel-19Addition of TT analysis for positioning test case 15.2.12 Details R5-260026 revisedRAN5#110CATT    NR_pos_enh2-UEC...
See details 38.90311251F19.1.0Rel-19Addition of TT analysis for positioning test case 15.2.11 Details R5-261664 agreedRAN5#110CATT Details RP-260113  RAN#111RAN5 NR_pos_enh2-UEC...
See details 38.9031125-F19.1.0Rel-19Addition of TT analysis for positioning test case 15.2.11 Details R5-260025 revisedRAN5#110CATT    NR_pos_enh2-UEC...
See details 38.9031124-F19.0.0Rel-19Test Tolerance analysis for MAC CE based pathloss reference signal switch delay for ATG test 19.4.5.1. Details R5-256493 withdrawnRAN5#109Qualcomm Wirele...    NR_ATG-UEConTest
See details 38.9031123-F19.0.0Rel-19Test Tolerance analysis for MAC CE based pathloss reference signal switch delay for ATG test 19.4.5.1. Details R5-256492 agreedRAN5#109Qualcomm Wirele... Details RP-253547 approvedRAN#110RAN519.1.0NR_ATG-UEConTest
See details 38.9031122-F19.0.0Rel-19Test Tolerance analysis for UE specific CBW change on PCell in non DRX for ATG test 19.4.4.1. Details R5-256491 agreedRAN5#109Qualcomm Wirele... Details RP-253547 approvedRAN#110RAN519.1.0NR_ATG-UEConTest
See details 38.9031121-F19.0.0Rel-19Test Tolerance analysis for RRC based DL active BWP switch in non DRX for ATG test 19.4.3.2.1. Details R5-256490 agreedRAN5#109Qualcomm Wirele... Details RP-253547 approvedRAN#110RAN519.1.0NR_ATG-UEConTest
See details 38.9031120-F19.0.0Rel-19Test Tolerance analysis for DCI based DL active BWP switch in non DRX for ATG test 19.4.3.1.1. Details R5-256489 agreedRAN5#109Qualcomm Wirele... Details RP-253547 approvedRAN#110RAN519.1.0NR_ATG-UEConTest
See details 38.90311191F19.0.0Rel-19TT analysis for TC7.6.5.1 Details R5-256897 agreedRAN5#109Apple Details RP-253534 approvedRAN#110RAN519.1.0NR_RRM_enh-UEConTest
See details 38.9031119-F19.0.0Rel-19TT analysis for TC7.6.5.1 Details R5-256466 revisedRAN5#109Apple    NR_RRM_enh-UEConTest
See details 38.9031118-F19.0.0Rel-19TT analysis for TC7.6.2.9 Details R5-256464 agreedRAN5#109Apple Details RP-253534 approvedRAN#110RAN519.1.0NR_RRM_enh-UEConTest
See details 38.90311171F19.0.0Rel-19Test tolerance analysis for RLM IS test cases 19.4.1.x Details R5-256907 agreedRAN5#109Ericsson Details RP-253548 approvedRAN#110RAN519.1.0NR_ATG-UEConTest
See details 38.9031117-F19.0.0Rel-19Test tolerance analysis for RLM IS test cases 19.4.1.x Details R5-256437 revisedRAN5#109Ericsson    NR_ATG-UEConTest
See details 38.90311161F19.0.0Rel-19Test tolerance analysis for RLM OOS test cases 19.4.1.x Details R5-256906 agreedRAN5#109Ericsson Details RP-253548 approvedRAN#110RAN519.1.0NR_ATG-UEConTest
See details 38.9031116-F19.0.0Rel-19Test tolerance analysis for RLM OOS test cases 19.4.1.x Details R5-256436 revisedRAN5#109Ericsson    NR_ATG-UEConTest
See details 38.90311151F19.0.0Rel-19Test tolerance analysis for FR2 inter-frequency SSB-based L1-RSRP measurement test case 7.6.22.1 Details R5-256991 withdrawnRAN5#109Ericsson    NR_Mob_enh2-UEC...
See details 38.9031115-F19.0.0Rel-19Test tolerance analysis for FR2 inter-frequency SSB-based L1-RSRP measurement test case 7.6.22.1 Details R5-256414 revisedRAN5#109Ericsson    NR_Mob_enh2-UEC...
See details 38.90311141F19.0.0Rel-19Update of OBW MU for FR2 UL MIMO Details R5-256891 agreedRAN5#109Anritsu Details RP-253595 approvedRAN#110RAN519.1.0TEI15_Test
See details 38.9031114-F19.0.0Rel-19Update of OBW MU for FR2 UL MIMO Details R5-256252 revisedRAN5#109Anritsu    TEI15_Test, 5GS...
See details 38.90311131F19.0.0Rel-19CR to amend missing uncertainty info of B.2.2.29 for PC6 Details R5-256944 agreedRAN5#109Samsung, Xiaomi Details RP-253540 approvedRAN#110RAN519.1.0NR_HST_FR2-UEConTest
See details 38.9031113-F19.0.0Rel-19CR to amend missing uncertainty info of B.2.2.29 for PC6 Details R5-256230 revisedRAN5#109Samsung, Xiaomi    NR_HST_FR2-UEConTest
See details 38.9031112-F19.0.0Rel-19TT analysis for concurrent measurement gap with NCSG test cases 6.6.23.1 and 6.6.23.2 Details R5-256153 agreedRAN5#109Huawei, HiSilicon Details RP-253568 approvedRAN#110RAN519.1.0NR_MG_enh2-UEConTest
See details 38.90311111F19.0.0Rel-19TT analysis for ATG intra-frequency CSI-SINR accuracy test cases 19.6.8.1 Details R5-256905 agreedRAN5#109Huawei, HiSilicon Details RP-253548 approvedRAN#110RAN519.1.0NR_ATG-UEConTest
See details 38.9031111-F19.0.0Rel-19TT analysis for ATG intra-frequency CSI-SINR accuracy test cases 19.6.8.1 Details R5-256146 revisedRAN5#109Huawei, HiSilicon    NR_ATG-UEConTest
See details 38.90311101F19.0.0Rel-19TT analysis for ATG intra-frequency CSI-RSRQ accuracy test cases 19.6.7.1 Details R5-256904 agreedRAN5#109Huawei, HiSilicon Details RP-253548 approvedRAN#110RAN519.1.0NR_ATG-UEConTest
See details 38.9031110-F19.0.0Rel-19TT analysis for ATG intra-frequency CSI-RSRQ accuracy test cases 19.6.7.1 Details R5-256145 revisedRAN5#109Huawei, HiSilicon    NR_ATG-UEConTest
See details 38.90311091F19.0.0Rel-19TT analysis for ATG intra-frequency CSI-RSRP accuracy test cases 19.6.6.1.x Details R5-256903 agreedRAN5#109Huawei, HiSilicon Details RP-253548 approvedRAN#110RAN519.1.0NR_ATG-UEConTest
See details 38.9031109-F19.0.0Rel-19TT analysis for ATG intra-frequency CSI-RSRP accuracy test cases 19.6.6.1.x Details R5-256144 revisedRAN5#109Huawei, HiSilicon    NR_ATG-UEConTest
See details 38.9031108-F19.0.0Rel-19TT analysis for ATG CGI reporting test cases 19.5.5.1 Details R5-256143 agreedRAN5#109Huawei, HiSilicon Details RP-253546 approvedRAN#110RAN519.1.0NR_ATG-UEConTest
See details 38.9031107-F19.0.0Rel-19TT analysis for ATG L1-SINR reporting test cases 19.5.4.x Details R5-256142 agreedRAN5#109Huawei, HiSilicon Details RP-253546 approvedRAN#110RAN519.1.0NR_ATG-UEConTest
See details 38.90311061F19.0.0Rel-19TT analysis for ATG L1-RSRP reporting test cases 19.5.3.x Details R5-256902 agreedRAN5#109Huawei, HiSilicon Details RP-253548 approvedRAN#110RAN519.1.0NR_ATG-UEConTest
See details 38.9031106-F19.0.0Rel-19TT analysis for ATG L1-RSRP reporting test cases 19.5.3.x Details R5-256141 revisedRAN5#109Huawei, HiSilicon    NR_ATG-UEConTest
See details 38.90311051F19.0.0Rel-19Introduction of Test Tolerance analysis for 14.5.3.3 NR SA FR1 CSI-RS based L1-RSRP measurement for Satellite Access Details R5-256896 agreedRAN5#109Anritsu Details RP-253539 approvedRAN#110RAN519.1.0NR_NTN_solution...
See details 38.9031105-F19.0.0Rel-19Introduction of Test Tolerance analysis for 14.5.3.3 NR SA FR1 CSI-RS based L1-RSRP measurement for Satellite Access Details R5-256108 revisedRAN5#109Anritsu    NR_NTN_solution...
See details 38.9031104-F19.0.0Rel-19Addition of TT analysis for 7.5.13.4.1 and 7.5.13.5.1 TCI switch Details R5-256027 agreedRAN5#109Huawei, HiSilicon Details RP-253556 approvedRAN#110RAN519.1.0NR_MIMO_evo_DL_...
See details 38.90311031F19.0.0Rel-19Addition of TT analysis for 6.5.13.1 TCI switch for mTRP mDCI Details R5-256909 agreedRAN5#109Huawei, HiSilicon Details RP-253556 approvedRAN#110RAN519.1.0NR_MIMO_evo_DL_...
See details 38.9031103-F19.0.0Rel-19Addition of TT analysis for 6.5.13.1 TCI switch for mTRP mDCI Details R5-256026 revisedRAN5#109Huawei, HiSilicon    NR_MIMO_evo_DL_...
See details 38.90311021F19.0.0Rel-19Addition of Test Tolerance analysis for NR NTN TC 14.1.11 and 14.1.12 Details R5-256912 agreedRAN5#109China Unicom Details RP-253566 approvedRAN#110RAN519.1.0NR_NTN_enh_plus...
See details 38.9031102-F19.0.0Rel-19Addition of Test Tolerance analysis for NR NTN TC 14.1.11 and 14.1.12 Details R5-255905 revisedRAN5#109China Unicom    NR_NTN_enh_plus...
See details 38.9031101-F19.0.0Rel-19Removal of duplicated attachments Details R5-255712 agreedRAN5#109Rohde & Schwarz Details RP-253596 approvedRAN#110RAN519.1.0TEI16_Test
See details 38.9031100-F19.0.0Rel-19Test Tolerance for Positioning test case 15.2.2 Details R5-255711 agreedRAN5#109Rohde & Schwarz Details RP-253596 approvedRAN#110RAN519.1.0TEI16_Test
See details 38.9031099-F19.0.0Rel-19Test Tolerance update for Positioning test cases 15.2.1 and 15.4.1 Details R5-255710 agreedRAN5#109Rohde & Schwarz Details RP-253596 approvedRAN#110RAN519.1.0TEI16_Test
See details 38.90310981F19.0.0Rel-19Test Tolerance for RRM NR-NTN Event Triggered Test Cases without gap Details R5-256985 withdrawnRAN5#109Rohde & Schwarz    NR_NTN_solution...
See details 38.9031098-F19.0.0Rel-19Test Tolerance for RRM NR-NTN Event Triggered Test Cases without gap Details R5-255707 revisedRAN5#109Rohde & Schwarz    NR_NTN_solution...
See details 38.90310971F19.0.0Rel-19Documentation of MU for FR2 multi-Rx RRM test cases Details R5-256887 agreedRAN5#109ROHDE & SCHWARZ Details RP-253565 approvedRAN#110RAN519.1.0NR_FR2_multiRX_...
See details 38.9031097-F19.0.0Rel-19Documentation of MU for FR2 multi-Rx RRM test cases Details R5-255706 revisedRAN5#109ROHDE & SCHWARZ    NR_FR2_multiRX_...
See details 38.90310961F19.0.0Rel-19TT analysis for ATG RRM test cases 19.2.3.2.1 and 19.2.3.2.2 Details R5-256901 agreedRAN5#109ZTE Corporation Details RP-253548 approvedRAN#110RAN519.1.0NR_ATG-UEConTest
See details 38.9031096-F19.0.0Rel-19TT analysis for ATG RRM test cases 19.2.3.2.1 and 19.2.3.2.2 Details R5-255647 revisedRAN5#109ZTE Corporation    NR_ATG-UEConTest
See details 38.90310951F19.0.0Rel-19FR2 MU - PC3 update for OBW UL MIMO test in 38.903 Details R5-256892 agreedRAN5#109Keysight Techno... Details RP-253595 approvedRAN#110RAN519.1.0TEI15_Test
See details 38.9031095-F19.0.0Rel-19FR2 MU - PC3 update for OBW UL MIMO test in 38.903 Details R5-255631 revisedRAN5#109Keysight Techno...    TEI15_Test, 5GS...
See details 38.9031094-F19.0.0Rel-19Adding MU value for Spurious emissions NS_205. Details R5-255586 withdrawnRAN5#109Ericsson    NR_mmWave_prote...
See details 38.9031093-F19.0.0Rel-19Adding influence of noise for NS_205 Details R5-255585 withdrawnRAN5#109Ericsson    NR_mmWave_prote...
See details 38.90310921F19.0.0Rel-19FR2 MU - MU and relaxation update for NS_202 and NS_205 additional spurious in 38.903 Details R5-256889 agreedRAN5#109Keysight Techno... Details RP-253583 approvedRAN#110RAN519.1.0NR_mmWave_prote...
See details 38.9031092-F19.0.0Rel-19FR2 MU - MU and relaxation update for NS_202 and NS_205 additional spurious in 38.903 Details R5-255561 revisedRAN5#109Keysight Techno...    NR_mmWave_prote...
See details 38.9031091-F19.0.0Rel-19Addition of test tolerance analysis for NR SA FR2 SSB-based L1-RSRP measurement test for PC6 UEs Details R5-255546 agreedRAN5#109Nokia Details RP-253540 approvedRAN#110RAN519.1.0NR_HST_FR2-UEConTest
See details 38.9031090-F19.0.0Rel-19Addition of test tolerance analysis for UE transmit timing test case for PC6 UEs Details R5-255543 agreedRAN5#109Nokia Details RP-253540 approvedRAN#110RAN519.1.0NR_HST_FR2-UEConTest
See details 38.9031089-F19.0.0Rel-19Addition of test tolerance analysis of NR-DC SA FR2 CHO with candidate SCG test case Details R5-255537 agreedRAN5#109Nokia Details RP-253563 approvedRAN#110RAN519.1.0NR_Mob_enh2-UEC...
See details 38.90310881F19.0.0Rel-19Addition of test tolerance for beam failure detection and link recovery test case for a UE operating on a cell with 3 MHz BW Details R5-256908 agreedRAN5#109Nokia Details RP-253549 approvedRAN#110RAN519.1.0NR_FR1_lessthan...
See details 38.9031088-F19.0.0Rel-19Addition of test tolerance for beam failure detection and link recovery test case for a UE operating on a cell with 3 MHz BW Details R5-255533 revisedRAN5#109Nokia    NR_FR1_lessthan...
See details 38.9031087-F19.0.0Rel-19Addition of TT analysis for NR NTN inter TC 14.2.4 Details R5-255529 agreedRAN5#109Mediatek India ... Details RP-253566 approvedRAN#110RAN519.1.0NR_NTN_enh_plus...
See details 38.9031086-F19.0.0Rel-19Addition of TT analysis for NR NTN intra TC 14.2.3 Details R5-255528 agreedRAN5#109Mediatek India ... Details RP-253566 approvedRAN#110RAN519.1.0NR_NTN_enh_plus...
See details 38.90310851F19.0.0Rel-19Addition of TT analysis for sidelink relay test case 9.1.7.1.1 Details R5-256954 agreedRAN5#109CATT Details RP-253541 approvedRAN#110RAN519.1.0NR_SL_relay-UEC...
See details 38.9031085-F19.0.0Rel-19Addition of TT analysis for sidelink relay test case 9.1.7.1.1 Details R5-255527 revisedRAN5#109CATT    NR_SL_relay-UEC...
See details 38.9031084-F19.0.0Rel-19Addition of TT analysis for sidelink relay test case 9.1.6.3 Details R5-255526 agreedRAN5#109CATT Details RP-253541 approvedRAN#110RAN519.1.0NR_SL_relay-UEC...
See details 38.90310831F18.7.3Rel-18TT analysis separation for NR-U and legacy SCell activation and deactivation tests Details R5-255331 agreedRAN5#108QUALCOMM Europe... Details RP-252304 approvedRAN#109R518.8.0TEI16_Test
See details 38.9031083-F18.7.3Rel-18TT analysis separation for NR-U and legacy SCell activation and deactivation tests Details R5-254851 revisedRAN5#108QUALCOMM Europe...    TEI16_Test, NR_...
See details 38.9031082-F18.7.3Rel-18Addition of TT analysis for NR-NTN pathloss RS switch test case 14.4.5.1 Details R5-254850 agreedRAN5#108QUALCOMM Europe... Details RP-252240 approvedRAN#109R518.8.0NR_NTN_solution...
See details 38.9031081-F18.7.3Rel-18Test tolerance analysis for MG enhancement NR SA FR2 event-triggered reporting test cases Details R5-254705 agreedRAN5#108Ericsson Details RP-252275 approvedRAN#109R518.8.0NR_MG_enh2-UEConTest
See details 38.9031080-F18.7.3Rel-18Test tolerance analysis for FR2 inter-frequency SSB-based L1-RSRP measurement test case 7.6.22.1 Details R5-254697 withdrawnRAN5#108Ericsson    NR_Mob_enh2-UEC...
See details 38.90310791F18.7.3Rel-18Test Tolerance analysis for intra-frequency RACH-less Soft Satellite switching for Satellite Access test 14.2.2.5. Details R5-255369 agreedRAN5#108Qualcomm Korea Details RP-252273 approvedRAN#109R518.8.0NR_NTN_enh_plus...
See details 38.9031079-F18.7.3Rel-18Test Tolerance analysis for intra-frequency RACH-less Soft Satellite switching for Satellite Access test 14.2.2.5. Details R5-254683 revisedRAN5#108Qualcomm Korea    NR_NTN_enh_plus...
See details 38.90310781F18.7.3Rel-18Test Tolerance analysis for intra-frequency RACH-based Hard Satellite switching for Satellite Access test 14.2.2.4. Details R5-255368 agreedRAN5#108Qualcomm Korea Details RP-252273 approvedRAN#109R518.8.0NR_NTN_enh_plus...
See details 38.9031078-F18.7.3Rel-18Test Tolerance analysis for intra-frequency RACH-based Hard Satellite switching for Satellite Access test 14.2.2.4. Details R5-254682 revisedRAN5#108Qualcomm Korea    NR_NTN_enh_plus...
See details 38.90310771F18.7.3Rel-18Test Tolerance analysis for intra-frequency RACH-less Handover for Satellite Access test 14.2.1.8. Details R5-255367 agreedRAN5#108Qualcomm Korea Details RP-252272 approvedRAN#109R518.8.0NR_NTN_enh_plus...
See details 38.9031077-F18.7.3Rel-18Test Tolerance analysis for intra-frequency RACH-less Handover for Satellite Access test 14.2.1.8. Details R5-254681 revisedRAN5#108Qualcomm Korea    NR_NTN_enh_plus...
See details 38.9031076-F18.7.3Rel-18TT analysis for RRM TC 7.6.2.21 NR SA FR2-FR2 event triggered reporting using MUSIM gap with shorter MGRP Details R5-254631 agreedRAN5#108Huawei, HiSilicon Details RP-252308 approvedRAN#109R518.8.0TEI18_Test
See details 38.90310751F18.7.3Rel-18TT analysis for ATG L1-SINR accuracy RRM test cases 19.6.5.x Details R5-255328 agreedRAN5#108Huawei, HiSilicon Details RP-252251 approvedRAN#109R518.8.0NR_ATG-UEConTest
See details 38.9031075-F18.7.3Rel-18TT analysis for ATG L1-SINR accuracy RRM test cases 19.6.5.x Details R5-254555 revisedRAN5#108Huawei, HiSilicon    NR_ATG-UEConTest
See details 38.90310741F18.7.3Rel-18TT analysis for ATG L1-RSRP accuracy RRM test cases 19.6.4.x Details R5-255327 agreedRAN5#108Huawei, HiSilicon Details RP-252251 approvedRAN#109R518.8.0NR_ATG-UEConTest
See details 38.9031074-F18.7.3Rel-18TT analysis for ATG L1-RSRP accuracy RRM test cases 19.6.4.x Details R5-254554 revisedRAN5#108Huawei, HiSilicon    NR_ATG-UEConTest
See details 38.90310731F18.7.3Rel-18TT analysis for TC7.6.5.1 Details R5-255391 withdrawnRAN5#108Apple    NR_RRM_enh-UEConTest
See details 38.9031073-F18.7.3Rel-18TT analysis for TC7.6.5.1 Details R5-254423 revisedRAN5#108Apple    NR_RRM_enh-UEConTest
See details 38.90310721F18.7.3Rel-18TT analysis for TC7.6.2.9 Details R5-255390 withdrawnRAN5#108Apple    NR_RRM_enh-UEConTest
See details 38.9031072-F18.7.3Rel-18TT analysis for TC7.6.2.9 Details R5-254421 revisedRAN5#108Apple    NR_RRM_enh-UEConTest
See details 38.9031071-F18.7.3Rel-18TT analysis for TC7.5.2.2 Details R5-254419 agreedRAN5#108Apple Details RP-252236 approvedRAN#109R518.8.0NR_RRM_enh-UEConTest
See details 38.90310701F18.7.3Rel-18TT analysis for TC5.6.5.1 Details R5-255389 agreedRAN5#108Apple Details RP-252236 approvedRAN#109R518.8.0NR_RRM_enh-UEConTest
See details 38.9031070-F18.7.3Rel-18TT analysis for TC5.6.5.1 Details R5-254417 revisedRAN5#108Apple    NR_RRM_enh-UEConTest
See details 38.9031069-F18.7.3Rel-18TT analysis for TC5.5.10.1 and TC7.5.10.1 Details R5-254415 agreedRAN5#108Apple Details RP-252236 approvedRAN#109R518.8.0NR_RRM_enh-UEConTest
See details 38.9031068-F18.7.3Rel-18TT analysis for TC5.5.2.8 Details R5-254412 agreedRAN5#108Apple Details RP-252236 approvedRAN#109R518.8.0NR_RRM_enh-UEConTest
See details 38.9031067-F18.7.3Rel-18TT analysis for TC5.5.2.7 Details R5-254410 agreedRAN5#108Apple Details RP-252236 approvedRAN#109R518.8.0NR_RRM_enh-UEConTest
See details 38.90310661F18.7.3Rel-18Revised Test Tolerances analysis for A-TRS based SSB-less SCell activation test cases Details R5-255329 agreedRAN5#108Nokia Details RP-252258 approvedRAN#109R518.8.0Netw_Energy_NR-...
See details 38.9031066-F18.7.3Rel-18Revised Test Tolerances analysis for A-TRS based SSB-less SCell activation test cases Details R5-254369 revisedRAN5#108Nokia    Netw_Energy_NR-...
See details 38.9031065-F18.7.3Rel-18Addition of test tolerances analysis for TRS based SSB-less SCell activation test case Details R5-254368 agreedRAN5#108Nokia Details RP-252258 approvedRAN#109R518.8.0Netw_Energy_NR-...
See details 38.90310641F18.7.3Rel-18Addition of test tolerance analysis for intra-frequency HST FR2 cell re-selection test case Details R5-255370 agreedRAN5#108Nokia Details RP-252242 approvedRAN#109R518.8.0NR_HST_FR2-UEConTest
See details 38.9031064-F18.7.3Rel-18Addition of test tolerance analysis for intra-frequency HST FR2 cell re-selection test case Details R5-254363 revisedRAN5#108Nokia    NR_HST_FR2-UEConTest
See details 38.9031063-F18.7.3Rel-18Addition of Test tolerance analysis of NR-DC SA FR2 CHO with Target SCG test case Details R5-254354 agreedRAN5#108Nokia Details RP-252269 approvedRAN#109R518.8.0NR_Mob_enh2-UEC...
See details 38.9031062-F18.7.3Rel-18Updation of Test tolerance analysis of NR-DC SA FR1 CHO with Candidate SCG test case Details R5-254353 agreedRAN5#108Nokia Details RP-252269 approvedRAN#109R518.8.0NR_Mob_enh2-UEC...
See details 38.9031061-F18.7.3Rel-18Addition of test tolerance for RLM IS in non-DRX mode with less than 5M bandwidth test case Details R5-254350 agreedRAN5#108Nokia Details RP-252252 approvedRAN#109R518.8.0NR_FR1_lessthan...
See details 38.90310601F18.7.3Rel-18Addition of TT analysis for NR-NTN test 14.2.2.3.1 Details R5-255376 agreedRAN5#108Keysight Techno... Details RP-252240 approvedRAN#109R518.8.0NR_NTN_solution...
See details 38.9031060-F18.7.3Rel-18Addition of TT analysis for NR-NTN test 14.2.2.3.1 Details R5-254299 revisedRAN5#108Keysight Techno...    NR_NTN_solution...
See details 38.9031059-F18.7.3Rel-18Test Tolerance for RRM NRU Test Case 11.6.3.4 Details R5-254242 agreedRAN5#108Rohde & Schwarz Details RP-252302 approvedRAN#109R518.8.0TEI16_Test
See details 38.9031058-F18.7.3Rel-18Test Tolerance for RRM NRU Test Case 11.6.2.4 Details R5-254241 agreedRAN5#108Rohde & Schwarz Details RP-252302 approvedRAN#109R518.8.0TEI16_Test
See details 38.9031057-F18.7.3Rel-18TT analysis for new test case 6.5.12.2 Details R5-254197 agreedRAN5#108Xiaomi Details RP-252269 approvedRAN#109R518.8.0NR_Mob_enh2-UEC...
See details 38.9031056-F18.7.3Rel-18TT analysis for new test case 6.5.12.1 Details R5-254196 agreedRAN5#108Xiaomi Details RP-252269 approvedRAN#109R518.8.0NR_Mob_enh2-UEC...
See details 38.9031055-F18.7.3Rel-18TT analysis for new test case 6.3.3.5 Details R5-254195 agreedRAN5#108Xiaomi Details RP-252269 approvedRAN#109R518.8.0NR_Mob_enh2-UEC...
See details 38.9031054-F18.7.3Rel-18CR to update acronyms and symbols Details R5-254046 agreedRAN5#108Keysight Techno... Details RP-252296 approvedRAN#109R518.8.0TEI15_Test
See details 38.90310531F18.7.3Rel-18Clarification on the applicability of re-positioning approach for QoQZ MU Details R5-255345 agreedRAN5#108Keysight Techno... Details RP-252301 approvedRAN#109R518.8.0TEI15_Test
See details 38.9031053-F18.7.3Rel-18Clarification on the applicability of re-positioning approach for QoQZ MU Details R5-254045 revisedRAN5#108Keysight Techno...    TEI15_Test, 5GS...
See details 38.90310521F18.7.3Rel-18TT analysis for new test case 19.2.3.3.1 NR SA FR1-FR1 RRC connection release with Redirection Details R5-255326 agreedRAN5#108CAICT Details RP-252251 approvedRAN#109R518.8.0NR_ATG-UEConTest
See details 38.9031052-F18.7.3Rel-18TT analysis for new test case 19.2.3.3.1 NR SA FR1-FR1 RRC connection release with Redirection Details R5-253959 revisedRAN5#108CAICT    NR_ATG-UEConTest
See details 38.9031051-F18.7.3Rel-18Introduction of Test Tolerance analysis for 14.5.3.1 NR SA FR1 SSB based L1-RSRP measurement for Satellite Access Details R5-253838 agreedRAN5#108Anritsu Details RP-252238 approvedRAN#109R518.8.0NR_NTN_solution...
See details 38.90310501F18.7.3Rel-18Test Tolerance analysis for RRM Inter-frequency RRC Re-establishment in FR1 for ATG Details R5-255325 agreedRAN5#108Sporton Interna... Details RP-252251 approvedRAN#109R518.8.0NR_ATG-UEConTest
See details 38.9031050-F18.7.3Rel-18Test Tolerance analysis for RRM Inter-frequency RRC Re-establishment in FR1 for ATG Details R5-253832 revisedRAN5#108Sporton Interna...    NR_ATG-UEConTest
See details 38.9031049-F18.7.3Rel-18Test Tolerance analysis for RRM Intra-frequency RRC Re-establishment in FR1 for ATG Details R5-253830 agreedRAN5#108Sporton Interna... Details RP-252249 approvedRAN#109R518.8.0NR_ATG-UEConTest
See details 38.9031048-F18.7.3Rel-18Test Tolerance analysis for RRM Inter-frequency distance-based conditional Handover from FR1 to FR1 for ATG Details R5-253828 agreedRAN5#108Sporton Interna... Details RP-252249 approvedRAN#109R518.8.0NR_ATG-UEConTest
See details 38.9031047-F18.7.3Rel-18Test Tolerance analysis for RRM Intra-frequency distance-based conditional Handover from FR1 to FR1 for ATG Details R5-253826 agreedRAN5#108Sporton Interna... Details RP-252249 approvedRAN#109R518.8.0NR_ATG-UEConTest
See details 38.9031046-F18.7.3Rel-18Test Tolerance for RRM NR NTN SS-RSRQ Test Case 14.6.2.2 Details R5-253824 agreedRAN5#108Rohde & Schwarz Details RP-252238 approvedRAN#109R518.8.0NR_NTN_solution...
See details 38.9031045-F18.7.3Rel-18Test Tolerance for RRM NR NTN SS-RSRQ Test Case 14.6.2.1 Details R5-253823 agreedRAN5#108Rohde & Schwarz Details RP-252238 approvedRAN#109R518.8.0NR_NTN_solution...
See details 38.9031044-F18.7.3Rel-18Test Tolerance for RRM NR NTN SS-RSRP Test Case 14.6.1.2 Details R5-253822 agreedRAN5#108Rohde & Schwarz Details RP-252238 approvedRAN#109R518.8.0NR_NTN_solution...
See details 38.9031043-F18.7.3Rel-18Test Tolerance for RRM NR NTN SS-RSRP Test Case 14.6.1.1 Details R5-253821 agreedRAN5#108Rohde & Schwarz Details RP-252238 approvedRAN#109R518.8.0NR_NTN_solution...
See details 38.90310421F18.7.3Rel-18FR2 MU - PC3 update for OBW UL MIMO test in 38.903 Details R5-255298 agreedRAN5#108Keysight Techno... Details RP-252300 approvedRAN#109R518.8.0TEI15_Test
See details 38.9031042-F18.7.3Rel-18FR2 MU - PC3 update for OBW UL MIMO test in 38.903 Details R5-253805 revisedRAN5#108Keysight Techno...    TEI15_Test, 5GS...
See details 38.9031041-F18.7.3Rel-18FR2 MU - PC6 MU definition for spherical tests in 38.903 Details R5-253799 agreedRAN5#108Keysight Techno... Details RP-252242 approvedRAN#109R518.8.0NR_HST_FR2-UEConTest
See details 38.9031040-F18.7.3Rel-18Addition of TT analysis for NR NTN TC 14.2.2.2.1 and 14.2.2.2.2 Details R5-253729 agreedRAN5#108MediaTek Beijin... Details RP-252238 approvedRAN#109R518.8.0NR_NTN_solution...
See details 38.9031039-F18.7.3Rel-18Addition of TT analysis for E-UTRAN event-triggered TC 6.6.25.1, 6.6.25.2 and 6.6.25.3 Details R5-253718 agreedRAN5#108MediaTek Inc. Details RP-252275 approvedRAN#109R518.8.0NR_MG_enh2-UEConTest
See details 38.9031038-F18.6.0Rel-18Addition of TT analysis for NR-U test 12.5.1.1 Details R5-252975 agreedRAN5#107Qualcomm Korea Details RP-251139 approvedRAN#108R518.7.0TEI16_Test, NR_...
See details 38.9031037-F18.6.0Rel-18Addition of TT analysis for NR-U test 12.4.1.1 Details R5-252974 agreedRAN5#107Qualcomm Korea Details RP-251139 approvedRAN#108R518.7.0TEI16_Test, NR_...
See details 38.9031036-F18.6.0Rel-18Addition of TT analysis for NR-NTN test 14.3.2.1 Details R5-252973 agreedRAN5#107Qualcomm Korea Details RP-251064 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.9031035-F18.6.0Rel-18Addition of TT analysis for NR-NTN test 14.3.1.1 Details R5-252972 agreedRAN5#107Qualcomm Korea Details RP-251064 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.9031034-F18.6.0Rel-18Addition of TT analysis for NR-NTN test 14.4.4.1 Details R5-252971 agreedRAN5#107Qualcomm Korea Details RP-251063 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.9031033-F18.6.0Rel-18Addition of TT analysis for NR-NTN test 14.4.3.2.1 Details R5-252970 agreedRAN5#107Qualcomm Korea Details RP-251063 approvedRAN#108R518.7.0NR_NTN_solution...
See details 38.9031032-F18.6.0Rel-18Addition of TT analysis for NR-NTN test 14.4.3.1.1 Details R5-252969 agreedRAN5#107Qualcomm Korea Details RP-251063 approvedRAN#108R518.7.0NR_NTN_solution...