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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.9050720-F17.6.0Rel-17Editorial corrections on TpAnalysisSpur filename Details R5-227294 agreedRAN5#97ZTE Corporation Details RP-222794 approvedRAN#98-eTSG WG RAN517.7.0TEI15_Test, 5GS...
See details 38.90507191F17.6.0Rel-17Introduction of CA_n48A-n77A and CA_n71A-n77A test point analyses Details R5-227727 agreedRAN5#97Dish Network Details RP-222761 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050719-F17.6.0Rel-17Introduction of CA_n48A-n77A and CA_n71A-n77A test point analyses Details R5-227279 revisedRAN5#97Dish Network    NR_CADC_NR_LTE_...
See details 38.9050718-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-17 NR CA configuration CA_n48A-n71A Details R5-227228 agreedRAN5#97Ericsson Details RP-222761 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050717-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-17 NR CA configuration CA_n48A-n70A Details R5-227227 withdrawnRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.9050716-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-17 NR CA configuration CA_n26A-n70A Details R5-227226 withdrawnRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.9050715-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-17 NR CA configuration CA_n26A-n66A Details R5-227225 withdrawnRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.9050714-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-17 NR CA configuration CA_n24A-n77A Details R5-227224 withdrawnRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.9050713-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-17 NR CA configuration CA_n24A-n48A Details R5-227223 withdrawnRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.9050712-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-17 NR CA configuration CA_n24A-n41A Details R5-227222 withdrawnRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.90507111F17.6.0Rel-17Updating TP analysis for 6.2G.2 to add power class 3 Details R5-227912 agreedRAN5#97Huawei, HiSilicon Details RP-222767 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_TxD-UEConTest
See details 38.9050711-F17.6.0Rel-17Updating TP analysis for 6.2G.2 to add power class 3 Details R5-226901 revisedRAN5#97Huawei, HiSilicon    NR_RF_TxD-UEConTest
See details 38.90507101F17.6.0Rel-17Test point analysis for mpr-PowerBoost tests 6.4.2.1_1, 6.5.2.1_1, 6.5.3.1_1, 6.5.3.2_1 and 6.5.3.3_1 Details R5-227909 agreedRAN5#97Keysight Techno... Details RP-222752 approvedRAN#98-eTSG WG RAN517.7.0NR_RF_FR2_req_e...
See details 38.9050710-F17.6.0Rel-17Test point analysis for mpr-PowerBoost tests 6.4.2.1_1, 6.5.2.1_1, 6.5.3.1_1, 6.5.3.2_1 and 6.5.3.3_1 Details R5-226884 revisedRAN5#97Keysight Techno...    NR_RF_FR2_req_e...
See details 38.90507091F17.6.0Rel-17Updating TP analysis for NS_49 Details R5-227904 agreedRAN5#97Huawei, Hisilicon Details RP-222758 approvedRAN#98-eTSG WG RAN517.7.0NR_lic_bands_BW...
See details 38.9050709-F17.6.0Rel-17Updating TP analysis for NS_49 Details R5-226869 revisedRAN5#97Huawei, Hisilicon    NR_lic_bands_BW...
See details 38.9050708-F17.6.0Rel-17Correction of test point analysis for reference sensitivity exception case 7.3A.1_1 test analysis for band CA_n70A-n71A Details R5-226832 withdrawnRAN5#97WE Certificatio...    NR_CADC_NR_LTE_...
See details 38.9050707-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n70A-n71A Details R5-226831 withdrawnRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.9050706-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n66A-n77A Details R5-226830 agreedRAN5#97Ericsson Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050705-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n66A-n71A Details R5-226829 withdrawnRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.90507041F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n5A-n77A Details R5-227726 agreedRAN5#97Ericsson Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050704-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n5A-n77A Details R5-226828 revisedRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.90507031F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n48A-n66A Details R5-227725 agreedRAN5#97Ericsson Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050703-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n48A-n66A Details R5-226827 revisedRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.90507021F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n41A-n79A Details R5-227724 agreedRAN5#97Ericsson Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050702-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n41A-n79A Details R5-226826 revisedRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.90507011F17.6.0Rel-17Introduction of spurious emission TP analysis for Rel-16 NR CA configuration CA_n3A-n41A Details R5-227723 agreedRAN5#97Ericsson Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050701-F17.6.0Rel-17Introduction of spurious emission TP analysis for Rel-16 NR CA configuration CA_n3A-n41A Details R5-226825 revisedRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.90507001F17.6.0Rel-17Introduction of spurious emission TP analysis for Rel-16 NR CA configuration CA_n39A-n41A Details R5-227722 agreedRAN5#97Ericsson Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050700-F17.6.0Rel-17Introduction of spurious emission TP analysis for Rel-16 NR CA configuration CA_n39A-n41A Details R5-226824 revisedRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.90506991F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n2A-n77A Details R5-227721 agreedRAN5#97Ericsson Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050699-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n2A-n77A Details R5-226823 revisedRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.90506981F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n28A-n41A Details R5-227720 agreedRAN5#97Ericsson Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050698-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n28A-n41A Details R5-226771 revisedRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.90506971F17.6.0Rel-17Introduction of spurious emission TP analysis for Rel-16 NR CA configuration CA_n1A-n79A Details R5-227719 agreedRAN5#97Ericsson Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050697-F17.6.0Rel-17Introduction of spurious emission TP analysis for Rel-16 NR CA configuration CA_n1A-n79A Details R5-226770 revisedRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.90506961F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n1A-n78A Details R5-227718 agreedRAN5#97Ericsson Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050696-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-16 NR CA configuration CA_n1A-n78A Details R5-226769 revisedRAN5#97Ericsson    NR_CADC_NR_LTE_...
See details 38.9050695-F17.6.0Rel-17Addition of CA_n41-n66/- in sensitivity test case config table. Details R5-226701 agreedRAN5#97Ericsson Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.90506941F17.6.0Rel-17Ref_sense_TpAnalysis for CA_n2A_n5A Details R5-227713 agreedRAN5#97Qualcomm Korea Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050694-F17.6.0Rel-17Ref_sense_TpAnalysis for CA_n2A_n5A Details R5-226592 revisedRAN5#97Qualcomm Korea    NR_CADC_NR_LTE_...
See details 38.9050693-F17.6.0Rel-17Update test frequency for DC_5A_n77A Details R5-226589 agreedRAN5#97Qualcomm Korea Details RP-222761 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.90506921F17.6.0Rel-17Update test frequency for DC_48A_n66A Details R5-227907 agreedRAN5#97Qualcomm Korea Details RP-222743 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050692-F17.6.0Rel-17Update test frequency for DC_48A_n66A Details R5-226588 revisedRAN5#97Qualcomm Korea    NR_CADC_NR_LTE_...
See details 38.90506911F17.6.0Rel-17Ref sense TP analysis for DC_12A_n66A Details R5-227915 agreedRAN5#97Qualcomm Korea Details RP-222798 approvedRAN#98-eTSG WG RAN517.7.0TEI15_Test, 5GS...
See details 38.9050691-F17.6.0Rel-17Ref sense TP analysis for DC_12A_n66A Details R5-226587 revisedRAN5#97Qualcomm Korea    TEI15_Test, 5GS...
See details 38.90506901F17.6.0Rel-17Ref sense TP analysis for DC_66A_n5A Details R5-227914 agreedRAN5#97Qualcomm Korea Details RP-222798 approvedRAN#98-eTSG WG RAN517.7.0TEI15_Test, 5GS...
See details 38.9050690-F17.6.0Rel-17Ref sense TP analysis for DC_66A_n5A Details R5-226586 revisedRAN5#97Qualcomm Korea    TEI15_Test, 5GS...
See details 38.9050689-F17.6.0Rel-17Ref sense TP analysis for DC_30A_n66A Details R5-226585 agreedRAN5#97Qualcomm Korea Details RP-222792 approvedRAN#98-eTSG WG RAN517.7.0TEI15_Test, 5GS...
See details 38.90506881F17.6.0Rel-17Addition of refsence sensitivity test point analysis for 18A_n77A and 18A_n78A Details R5-227717 agreedRAN5#97KDDI Corporation Details RP-222797 approvedRAN#98-eTSG WG RAN517.7.0TEI15_Test, 5GS...
See details 38.9050688-F17.6.0Rel-17Addition of refsence sensitivity test point analysis for 18A_n77A and 18A_n78A Details R5-226526 revisedRAN5#97KDDI Corporation    5GS_NR_LTE-UECo...
See details 38.90506871F17.6.0Rel-17Introduction of spurious emissions TP analysis for 18A_n78A Details R5-227716 agreedRAN5#97KDDI Corporation Details RP-222797 approvedRAN#98-eTSG WG RAN517.7.0TEI15_Test, 5GS...
See details 38.9050687-F17.6.0Rel-17Introduction of spurious emissions TP analysis for 18A_n78A Details R5-226525 revisedRAN5#97KDDI Corporation    5GS_NR_LTE-UECo...
See details 38.90506861F17.6.0Rel-17Introduction of spurious emissions TP analysis for 18A_n77A Details R5-227715 agreedRAN5#97KDDI Corporation Details RP-222797 approvedRAN#98-eTSG WG RAN517.7.0TEI15_Test, 5GS...
See details 38.9050686-F17.6.0Rel-17Introduction of spurious emissions TP analysis for 18A_n77A Details R5-226524 revisedRAN5#97KDDI Corporation    5GS_NR_LTE-UECo...
See details 38.9050685-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-15 NR CA configuration CA_n8A-n78A Details R5-226522 agreedRAN5#97Ericsson Details RP-222792 approvedRAN#98-eTSG WG RAN517.7.0TEI15_Test, 5GS...
See details 38.9050684-F17.6.0Rel-17Update of spurious emission TP analysis for Rel-15 NR CA configuration CA_n3A-n78A Details R5-226521 agreedRAN5#97Ericsson Details RP-222792 approvedRAN#98-eTSG WG RAN517.7.0TEI15_Test, 5GS...
See details 38.9050683-F17.6.0Rel-17Addtion of refsence sensitivity test point analysis for three bands within FR1 Details R5-226519 agreedRAN5#97KDDI Corporation Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.90506821F17.6.0Rel-17Update TP analysis for reference sensitivity frequency selections Details R5-227714 agreedRAN5#97Verizon Switzer... Details RP-222761 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050682-F17.6.0Rel-17Update TP analysis for reference sensitivity frequency selections Details R5-226417 revisedRAN5#97Verizon Switzer...    NR_CADC_NR_LTE_...
See details 38.90506811F17.6.0Rel-17Update TP analysis for ref sensitivity for Rel-16 NR CA combos Details R5-227897 agreedRAN5#97Verizon Switzer... Details RP-222743 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050681-F17.6.0Rel-17Update TP analysis for ref sensitivity for Rel-16 NR CA combos Details R5-226414 revisedRAN5#97Verizon Switzer...    NR_CADC_NR_LTE_...
See details 38.90506801F17.6.0Rel-17Update TP analysis of reference sensitivity for CA_n66A-n77A Details R5-227895 agreedRAN5#97Verizon Switzer... Details RP-222743 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050680-F17.6.0Rel-17Update TP analysis of reference sensitivity for CA_n66A-n77A Details R5-226412 revisedRAN5#97Verizon Switzer...    NR_CADC_NR_LTE_...
See details 38.9050679-F17.6.0Rel-17Addition of NS_03U in Table 4.1.2.1-1 and correction of number of test points for NS_03 and NS_100 Details R5-226298 agreedRAN5#97CAICT Details RP-222791 approvedRAN#98-eTSG WG RAN517.7.0TEI15_Test, 5GS...
See details 38.90506781F17.6.0Rel-17Update TP analysis for AMPR NS_49 Details R5-227916 withdrawnRAN5#97MediaTek Beijin...    NR_PC2_UE_FDD-U...
See details 38.9050678-F17.6.0Rel-17Update TP analysis for AMPR NS_49 Details R5-226221 revisedRAN5#97MediaTek Beijin...    NR_PC2_UE_FDD-U...
See details 38.90506771F17.6.0Rel-17Spur_TpAnalysis for CA_n2A_n48A Details R5-227712 agreedRAN5#97Qualcomm Korea Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050677-F17.6.0Rel-17Spur_TpAnalysis for CA_n2A_n48A Details R5-226000 revisedRAN5#97Qualcomm Korea    NR_CADC_NR_LTE_...
See details 38.90506761F17.6.0Rel-17Spur_TpAnalysis for CA_n2A_n5A Details R5-227711 agreedRAN5#97Qualcomm Korea Details RP-222742 approvedRAN#98-eTSG WG RAN517.7.0NR_CADC_NR_LTE_...
See details 38.9050676-F17.6.0Rel-17Spur_TpAnalysis for CA_n2A_n5A Details R5-225999 revisedRAN5#97Qualcomm Korea    NR_CADC_NR_LTE_...
See details 38.9050675-F15.3.0Rel-15Removal of technical content in 38.905 v15.3.0 and substitution with pointer to the next Release Details R5-225995 agreedRAN5#97ETSI Secretariat Details RP-222790 approvedRAN#98-eTSG WG RAN515.4.0TEI15_Test
See details 38.90506741F17.5.0Rel-17Updated TP analysis MPR for CA in FR2 Details R5-225832 agreedRAN5#96-eEricsson Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test
See details 38.9050674-F17.5.0Rel-17Updated TP analysis MPR for CA in FR2 Details R5-225232 revisedRAN5#96-eEricsson    TEI15_Test
See details 38.9050673-F17.5.0Rel-17Editorial correction for DC_1A_n5A Details R5-225108 agreedRAN5#96-eROHDE & SCHWARZ Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050672-F17.5.0Rel-17Updating TP analysis for FR1 test case 6.3A.3.1_1 Details R5-225076 agreedRAN5#96-eHuawei, Hisilicon Details RP-221953 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR1-UEConTest
See details 38.9050671-F17.5.0Rel-17Adding TP analysis for new FR1 test case 6.3C.3.2 Details R5-225074 agreedRAN5#96-eHuawei, Hisilicon Details RP-221953 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR1-UEConTest
See details 38.9050670-F17.5.0Rel-17Updating test point selection criteria for FR1 SUL test cases Details R5-225065 agreedRAN5#96-eHuawei, Hisilicon Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050669-F17.5.0Rel-17Incorrect TP analysis revision for test case 6.2D.2 Details R5-224965 agreedRAN5#96-eEricsson Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050668-F17.5.0Rel-17Editorial corrections to spurious emission test cases for DC_8A_n3A, DC_8A_n20A and DC_20A_n3A Details R5-224959 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050667-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_66A_n41A Details R5-224955 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050666-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_48A_n66A Details R5-224953 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050665-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_48A_n5A Details R5-224951 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050664-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n1A Details R5-224949 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050663-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_13A_n2A Details R5-224948 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050662-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n41A Details R5-224947 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050661-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n3A Details R5-224945 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050660-F17.5.0Rel-17Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_2A_n41A Details R5-224944 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050659-F17.5.0Rel-17Introduction of reference sensitivity test point analysis for DC_2A-66A_n41A Details R5-224940 agreedRAN5#96-eZTE Corporation Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050658-F17.5.0Rel-17Editorial corrections to the timeline for introduction of test points Details R5-224938 agreedRAN5#96-eZTE Corporation Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050657-F17.5.0Rel-17General rule for TP selection for NR_U test cases Details R5-224901 agreedRAN5#96-eQualcomm Austri... Details RP-221966 approvedRAN#97-eTSG WG RAN517.6.0NR_unlic-UEConTest
See details 38.90506561F17.5.0Rel-17Ref sensitivity TP selection for DC_21A_n79A Details R5-225831 agreedRAN5#96-eQualcomm Austri... Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050656-F17.5.0Rel-17Ref sensitivity TP selection for DC_21A_n79A Details R5-224894 revisedRAN5#96-eQualcomm Austri...    TEI15_Test, 5GS...
See details 38.90506551F17.5.0Rel-17Ref sensitivity TP selection for DC_8A_n79A Details R5-225830 agreedRAN5#96-eQualcomm Austri... Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050655-F17.5.0Rel-17Ref sensitivity TP selection for DC_8A_n79A Details R5-224893 revisedRAN5#96-eQualcomm Austri...    TEI15_Test, 5GS...
See details 38.90506541F17.5.0Rel-17Ref sensitivity TP selection for DC_5A_n78A Details R5-225829 agreedRAN5#96-eQualcomm Austri... Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050654-F17.5.0Rel-17Ref sensitivity TP selection for DC_5A_n78A Details R5-224892 revisedRAN5#96-eQualcomm Austri...    TEI15_Test, 5GS...
See details 38.90506531F17.5.0Rel-17Ref sensitivity TP selection for DC_8A_n78A Details R5-225828 agreedRAN5#96-eQualcomm Austri... Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050653-F17.5.0Rel-17Ref sensitivity TP selection for DC_8A_n78A Details R5-224891 revisedRAN5#96-eQualcomm Austri...    TEI15_Test, 5GS...
See details 38.90506521F17.5.0Rel-17Ref sensitivity TP selection for DC_3A_n77A Details R5-225827 agreedRAN5#96-eQualcomm Austri... Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050652-F17.5.0Rel-17Ref sensitivity TP selection for DC_3A_n77A Details R5-224890 revisedRAN5#96-eQualcomm Austri...    TEI15_Test, 5GS...
See details 38.90506511F17.5.0Rel-17Ref sensitivity TP selection for DC_1A_n77A Details R5-225826 agreedRAN5#96-eQualcomm Austri... Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050651-F17.5.0Rel-17Ref sensitivity TP selection for DC_1A_n77A Details R5-224889 revisedRAN5#96-eQualcomm Austri...    TEI15_Test, 5GS...
See details 38.90506501F17.5.0Rel-17Update Spurious emission TP R16 DC_5A_n2A Details R5-225716 agreedRAN5#96-eQualcomm Austri... Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050650-F17.5.0Rel-17Update Spurious emission TP R16 DC_5A_n2A Details R5-224887 revisedRAN5#96-eQualcomm Austri...    NR_CADC_NR_LTE_...
See details 38.9050649-F17.5.0Rel-17TP analysis for additional spurious emission for NS_14 Details R5-224886 agreedRAN5#96-eQualcomm Austri... Details RP-221952 approvedRAN#97-eTSG WG RAN517.6.0NR_bands_BW_R16...
See details 38.90506481F17.5.0Rel-17Ref sensitivity TP selection for DC_2A_n41A Details R5-225825 agreedRAN5#96-eQualcomm Austri... Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050648-F17.5.0Rel-17Ref sensitivity TP selection for DC_2A_n41A Details R5-224884 revisedRAN5#96-eQualcomm Austri...    TEI15_Test, 5GS...
See details 38.9050647-F17.5.0Rel-17A-MPR TP analysis for Rel-17 CA_n24-n77 Details R5-224873 agreedRAN5#96-eLigado Networks Details RP-221973 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050646-F17.5.0Rel-17A-MPR TP analysis for Rel-17 CA_n24-n48 Details R5-224872 agreedRAN5#96-eLigado Networks Details RP-221973 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.90506451F17.5.0Rel-17A-MPR TP analysis for Rel-17 CA_n24-n41 Details R5-225739 agreedRAN5#96-eLigado Networks Details RP-221973 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050645-F17.5.0Rel-17A-MPR TP analysis for Rel-17 CA_n24-n41 Details R5-224871 revisedRAN5#96-eLigado Networks    NR_CADC_NR_LTE_...
See details 38.90506441F17.5.0Rel-17Test point analysis for reference sensitivity for many 4CA combos Details R5-225738 agreedRAN5#96-eWE Certificatio... Details RP-221973 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050644-F17.5.0Rel-17Test point analysis for reference sensitivity for many 4CA combos Details R5-224870 revisedRAN5#96-eWE Certificatio...    NR_CADC_NR_LTE_...
See details 38.90506431F17.5.0Rel-17Tx Spurious emissions test point analysis for many UL CA combos Details R5-225737 agreedRAN5#96-eWE Certificatio... Details RP-221973 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050643-F17.5.0Rel-17Tx Spurious emissions test point analysis for many UL CA combos Details R5-224866 revisedRAN5#96-eWE Certificatio...    NR_CADC_NR_LTE_...
See details 38.90506421F17.5.0Rel-17Update to MPR for CA TP analysis to add PC2 requirements Details R5-225779 agreedRAN5#96-eHuawei, HiSilicon Details RP-221979 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR1_enh-U...
See details 38.9050642-F17.5.0Rel-17Update to MPR for CA TP analysis to add PC2 requirements Details R5-224836 revisedRAN5#96-eHuawei, HiSilicon    NR_RF_FR1_enh-U...
See details 38.90506411F17.5.0Rel-17Update TP analysis for AMPR NS_05 and NS_05U Details R5-225746 agreedRAN5#96-eMediaTek Beijin... Details RP-221978 approvedRAN#97-eTSG WG RAN517.6.0NR_PC2_UE_FDD-U...
See details 38.9050641-F17.5.0Rel-17Update TP analysis for AMPR NS_05 and NS_05U Details R5-224813 revisedRAN5#96-eMediaTek Beijin...    NR_PC2_UE_FDD-U...
See details 38.9050640-F17.5.0Rel-17Addition of test point analysis for TxD test cases Details R5-224792 agreedRAN5#96-eHuawei, HiSilicon Details RP-221980 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_TxD-UEConTest
See details 38.9050639-F17.5.0Rel-17Update of test point analysis for AMPR intra band non contiguous EN DC test case Details R5-224652 withdrawnRAN5#96-eEricsson    TEI15_Test, 5GS...
See details 38.90506381F17.5.0Rel-17TP analysis for ref sensitivity for Rel-16 NR CA combos Details R5-225715 agreedRAN5#96-eVerizon Switzer... Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050638-F17.5.0Rel-17TP analysis for ref sensitivity for Rel-16 NR CA combos Details R5-224364 revisedRAN5#96-eVerizon Switzer...    NR_CADC_NR_LTE_...
See details 38.90506371F17.5.0Rel-17Update TP analysis for Rel-16 CA_n66A_n77A Details R5-225714 agreedRAN5#96-eVerizon Switzer... Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050637-F17.5.0Rel-17Update TP analysis for Rel-16 CA_n66A_n77A Details R5-224362 revisedRAN5#96-eVerizon Switzer...    NR_CADC_NR_LTE_...
See details 38.90506361F17.5.0Rel-17Update TP analysis for Rel-16 CA_n5A_n77A Details R5-225713 agreedRAN5#96-eVerizon Switzer... Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050636-F17.5.0Rel-17Update TP analysis for Rel-16 CA_n5A_n77A Details R5-224361 revisedRAN5#96-eVerizon Switzer...    NR_CADC_NR_LTE_...
See details 38.90506351F17.5.0Rel-17Update TP analysis for Rel-16 CA_n2A_n77A Details R5-225712 agreedRAN5#96-eVerizon Switzer... Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050635-F17.5.0Rel-17Update TP analysis for Rel-16 CA_n2A_n77A Details R5-224360 revisedRAN5#96-eVerizon Switzer...    NR_CADC_NR_LTE_...
See details 38.9050634-F17.5.0Rel-17Correction of test points analysis of some Rx test cases in 38.521-1 for the addition of test points for asymmetric channel bandwidths and UL-MIMO Details R5-224254 agreedRAN5#96-eCAICT Details RP-222007 approvedRAN#97-eTSG WG RAN517.6.0TEI15_Test, 5GS...
See details 38.9050633-F17.5.0Rel-17Adding test point analysis for A_MPR NS_27 with 30 MHz channel bandwidth Details R5-224207 agreedRAN5#96-eEricsson Details RP-221969 approvedRAN#97-eTSG WG RAN517.6.0NR_lic_bands_BW...
See details 38.90506321F17.5.0Rel-17Introduction of spurious emission TP analysis for CA_n48A-n70A Details R5-225749 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221967 approvedRAN#97-eTSG WG RAN517.6.0LTE_NR_DC_CA_en...
See details 38.9050632-F17.5.0Rel-17Introduction of spurious emission TP analysis for CA_n48A-n70A Details R5-224168 revisedRAN5#96-eNokia, Nokia Sh...    LTE_NR_DC_CA_en...
See details 38.9050631-F17.5.0Rel-17Introduction of reference sensitivity test point analysis for DC_3A-7A-20A_n8A Details R5-224158 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.90506301F17.5.0Rel-17Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_3A_n8A Details R5-225711 agreedRAN5#96-eNokia, Nokia Sh... Details RP-221950 approvedRAN#97-eTSG WG RAN517.6.0NR_CADC_NR_LTE_...
See details 38.9050630-F17.5.0Rel-17Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_3A_n8A Details R5-224157 revisedRAN5#96-eNokia, Nokia Sh...    NR_CADC_NR_LTE_...
See details 38.90506291F17.5.0Rel-17Test point analysis for test 6.2.4_1 Configured transmitted power with Power Boost Details R5-225745 agreedRAN5#96-eKeysight techno... Details RP-221963 approvedRAN#97-eTSG WG RAN517.6.0NR_RF_FR2_req_e...
See details 38.9050629-F17.5.0Rel-17Test point analysis for test 6.2.4_1 Configured transmitted power with Power Boost Details R5-224073 revisedRAN5#96-eKeysight techno...    NR_RF_FR2_req_e...
See details 38.90506281F17.4.0Rel-17Update_TP_analysis for AMPR NS_27 Details R5-223696 agreedRAN5#95-eSamsung Details RP-221085 approvedRAN#96TSG WG RAN517.5.0NR_bands_BW_R16...
See details 38.9050628-F17.4.0Rel-17Update_TP_analysis for AMPR NS_27 Details R5-223216 revisedRAN5#95-eSamsung    NR_bands_BW_R16...
See details 38.90506271F17.4.0Rel-17Updating A-MPR and A-SE TP analysis for NS_48 Details R5-223732 agreedRAN5#95-eHuawei, Hisilicon Details RP-221106 approvedRAN#96TSG WG RAN517.5.0NR_lic_bands_BW...
See details 38.9050627-F17.4.0Rel-17Updating A-MPR and A-SE TP analysis for NS_48 Details R5-223132 revisedRAN5#95-eHuawei, Hisilicon    NR_lic_bands_BW...
See details 38.9050626-F17.4.0Rel-17Update of test points analysis per CA configuration Table Details R5-223050 agreedRAN5#95-eChina Unicom Details RP-221083 approvedRAN#96TSG WG RAN517.5.0NR_CADC_NR_LTE_...
See details 38.9050625-F17.4.0Rel-17Update of test point analysis for MPR, SEM and NR ACLR for UL MIMO Details R5-223017 agreedRAN5#95-eHuawei, HiSilicon Details RP-221091 approvedRAN#96TSG WG RAN517.5.0NR_eMIMO-UEConTest
See details 38.9050624-F17.4.0Rel-17Addition of test point analysis for new test case 6.2G.3 Details R5-222929 agreedRAN5#95-eHuawei, HiSilicon Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.9050623-F17.4.0Rel-17Addition of test point analysis for new test cases 6.2G.2 and 6.5G.2.3.1 Details R5-222928 agreedRAN5#95-eHuawei, HiSilicon Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.9050622-F17.4.0Rel-17Addition of test point analysis for new test case 6.2G.1 Details R5-222927 agreedRAN5#95-eHuawei, HiSilicon Details RP-221110 approvedRAN#96TSG WG RAN517.5.0NR_RF_TxD-UEConTest
See details 38.9050621-F17.4.0Rel-17Removing test case 6.5D.1_1 Occupied bandwidth for UL MIMO (Rel-16 onward) from 38.905 Details R5-222915 agreedRAN5#95-eEricsson Details RP-221091 approvedRAN#96TSG WG RAN517.5.0NR_eMIMO-UEConTest
See details 38.9050620-F17.4.0Rel-17Addition of TP analysis for FR1 RedCap requirements Details R5-222903 agreedRAN5#95-eHuawei, HiSilicon Details RP-221112 approvedRAN#96TSG WG RAN517.5.0NR_redcap_plus_...
See details 38.9050619-F17.4.0Rel-17Update to TP analysis of A-MPR to add ULFPTx Details R5-222886 agreedRAN5#95-eHuawei, HiSilicon Details RP-221091 approvedRAN#96TSG WG RAN517.5.0NR_eMIMO-UEConTest
See details 38.90506181F17.4.0Rel-17Addition of test point analysis for 6.2B.4.1.3_1 Configured Output Power Details R5-223771 agreedRAN5#95-eHuawei, HiSilicon Details RP-221105 approvedRAN#96TSG WG RAN517.5.0DC_Pcmax_3UL_CC...