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 1307 items in 7 pages
 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.90508811F18.1.0Rel-18Updates to TP analysis for FR1 RF phase continuity test Details R5-241744 agreedRAN5#102Apple Benelux B.V. Details RP-240186 approvedRAN#103RAN518.2.0NR_cov_enh-UEConTest
See details 38.9050881-F18.1.0Rel-18Updates to TP analysis for FR1 RF phase continuity test Details R5-241437 revisedRAN5#102Apple Benelux B.V.    NR_cov_enh-UEConTest
See details 38.90508801F18.1.0Rel-18Updates to TP analysis for FR2 RF phase continuity test Details R5-241743 agreedRAN5#102Apple Benelux B.V. Details RP-240186 approvedRAN#103RAN518.2.0NR_cov_enh-UEConTest
See details 38.9050880-F18.1.0Rel-18Updates to TP analysis for FR2 RF phase continuity test Details R5-241436 revisedRAN5#102Apple Benelux B.V.    NR_cov_enh-UEConTest
See details 38.90508791F18.1.0Rel-18Description of ephemeris calculation process Details R5-242014 agreedRAN5#102Keysight Techno... Details RP-240194 approvedRAN#103RAN518.2.0NR_NTN_solution...
See details 38.9050879-F18.1.0Rel-18Description of ephemeris calculation process Details R5-241401 revisedRAN5#102Keysight Techno...    NR_NTN_solution...
See details 38.90508781F18.1.0Rel-18Update of TP analysis for Spurious emissions test cases for FR1 UL CA Details R5-241903 agreedRAN5#102China Unicom Details RP-240174 approvedRAN#103RAN518.2.0NR_CADC_NR_LTE_...
See details 38.9050878-F18.1.0Rel-18Update of TP analysis for Spurious emissions test cases for FR1 UL CA Details R5-241368 revisedRAN5#102China Unicom    NR_CADC_NR_LTE_...
See details 38.90508771F18.1.0Rel-18Update of test point selection for 4DL CA configurations Details R5-241908 agreedRAN5#102ROHDE & SCHWARZ... Details RP-240180 approvedRAN#103RAN518.2.0NR_CADC_NR_LTE_...
See details 38.9050877-F18.1.0Rel-18Update of test point selection for 4DL CA configurations Details R5-241351 revisedRAN5#102ROHDE & SCHWARZ...    NR_CADC_NR_LTE_...
See details 38.90508761F18.1.0Rel-18Addition of REFSENS TP analysis for 3CC EN-DC for n78 and n79 in PC2 Details R5-241750 agreedRAN5#102NTT DOCOMO, INC. Details RP-240213 approvedRAN#103RAN518.2.0HPUE_NR_CADC_NR...
See details 38.9050876-F18.1.0Rel-18Addition of REFSENS TP analysis for 3CC EN-DC for n78 and n79 in PC2 Details R5-241056 revisedRAN5#102NTT DOCOMO, INC.    HPUE_NR_CADC_NR...
See details 38.9050875-F18.1.0Rel-18Addition of REFSENS TP analysis for 3CC EN-DC for n78 and n79 in PC3 Details R5-241055 withdrawnRAN5#102NTT DOCOMO, INC.    TEI15_Test
See details 38.90508741F18.1.0Rel-18Addition of REFSENS TP analysis for DC_19A_n78A and DC_19A_n77A in PC2 Details R5-241749 agreedRAN5#102NTT DOCOMO, INC. Details RP-240213 approvedRAN#103RAN518.2.0HPUE_NR_CADC_NR...
See details 38.9050874-F18.1.0Rel-18Addition of REFSENS TP analysis for DC_19A_n78A and DC_19A_n77A in PC2 Details R5-241054 revisedRAN5#102NTT DOCOMO, INC.    HPUE_NR_CADC_NR...
See details 38.9050873-F18.1.0Rel-18Addition of REFSENS TP analysis for DC_19A_n78A and DC_19A_n77A in PC3 Details R5-241053 withdrawnRAN5#102NTT DOCOMO INC.    TEI15_Test
See details 38.9050872-F18.1.0Rel-18Addition of test point analysis for R17 FR1 enhancement test cases Details R5-241008 agreedRAN5#102Huawei, HiSilicon Details RP-240182 approvedRAN#103RAN518.2.0NR_RF_FR1_enh-U...
See details 38.9050871-F18.1.0Rel-18Test points analysis for FR1 AMPR test case with NS_47 and PC 1.5 Details R5-241006 agreedRAN5#102Huawei, HiSilic... Details RP-240233 approvedRAN#103RAN518.2.0TEI16_Test, NR_...
See details 38.9050870-F18.1.0Rel-18TP analysis for AMPR, ASEM and ASE for V2X Details R5-241000 agreedRAN5#102Huawei, HiSilicon Details RP-240175 approvedRAN#103RAN518.2.05G_V2X_NRSL_eV2...
See details 38.90508691F18.1.0Rel-18Update reference sensitivity test cases for additional band configurations with PC2 UL Details R5-241748 agreedRAN5#102Verizon Spain Details RP-240213 approvedRAN#103RAN518.2.0HPUE_NR_CADC_NR...
See details 38.9050869-F18.1.0Rel-18Update reference sensitivity test cases for additional band configurations with PC2 UL Details R5-240895 revisedRAN5#102Verizon Spain    HPUE_NR_CADC_NR...
See details 38.9050868-F18.1.0Rel-18Update reference sensitivity test cases for additional band configurations Details R5-240891 agreedRAN5#102Verizon Details RP-240180 approvedRAN#103RAN518.2.0NR_CADC_NR_LTE_...
See details 38.90508671F18.1.0Rel-18Update reference sensitivity test cases for four bands configurations Details R5-241701 withdrawnRAN5#102Verizon    NR_CADC_NR_LTE_...
See details 38.9050867-F18.1.0Rel-18Update reference sensitivity test cases for four bands configurations Details R5-240883 revisedRAN5#102Verizon    NR_CADC_NR_LTE_...
See details 38.90508661F18.1.0Rel-18Test point analysis of EN-DC spurious emissions for DC_2A_n66A and DC_30A_n66A Details R5-241778 agreedRAN5#102WE Certificatio... Details RP-240228 approvedRAN#103RAN518.2.0TEI15_Test, 5GS...
See details 38.9050866-F18.1.0Rel-18Test point analysis of EN-DC spurious emissions for DC_2A_n66A and DC_30A_n66A Details R5-240881 revisedRAN5#102WE Certificatio...    TEI15_Test, 5GS...
See details 38.9050865-F18.1.0Rel-18Addition of TP analysis for NR-U test case 6.2F.4, Configured transmitted power for shared spectrum Details R5-240859 agreedRAN5#102Ericsson Details RP-240176 approvedRAN#103RAN518.2.0NR_unlic-UEConTest
See details 38.9050864-F18.1.0Rel-18Addition of TP analysis for NR-U test case 6.3F.4.3 Details R5-240858 agreedRAN5#102Ericsson Details RP-240176 approvedRAN#103RAN518.2.0NR_unlic-UEConTest
See details 38.9050863-F18.1.0Rel-18Introduction of spurious emission TP analysis for CA_n1A_n28A Details R5-240778 agreedRAN5#102Nokia, Nokia Sh... Details RP-240174 approvedRAN#103RAN518.2.0NR_CADC_NR_LTE_...
See details 38.9050862-F18.1.0Rel-18Introduction of reference sensitivity test point analysis for CA_n1A-n28A-n78A and CA_n3A-n28A-n78A Details R5-240776 agreedRAN5#102Nokia, Nokia Sh... Details RP-240180 approvedRAN#103RAN518.2.0NR_CADC_NR_LTE_...
See details 38.9050861-F18.1.0Rel-18Addition of reference sensitivity TP analysis for new PC2 EN-DC combos within FR1 Details R5-240674 agreedRAN5#102KDDI Corporation Details RP-240213 approvedRAN#103RAN518.2.0HPUE_NR_CADC_NR...
See details 38.9050860-F18.1.0Rel-18Introduction of spurious emission TP analysis for CA_n71A-n78A Details R5-240464 agreedRAN5#102Nokia, Nokia Sh... Details RP-240180 approvedRAN#103RAN518.2.0NR_CADC_NR_LTE_...
See details 38.9050859-F18.1.0Rel-18Introduction of reference sensitivity test point analysis for CA_n66A-n71A-n77(2A) and CA_n66A-n71A-n78(2A) Details R5-240462 agreedRAN5#102Nokia, Nokia Sh... Details RP-240180 approvedRAN#103RAN518.2.0NR_CADC_NR_LTE_...
See details 38.90508581F18.1.0Rel-18Correction to reference sensitivity test point analysis for CA_n28A-n78A Details R5-241777 agreedRAN5#102Nokia, Nokia Sh... Details RP-240228 approvedRAN#103RAN518.2.0TEI15_Test, 5GS...
See details 38.9050858-F18.1.0Rel-18Correction to reference sensitivity test point analysis for CA_n28A-n78A Details R5-240456 revisedRAN5#102Nokia, Nokia Sh...    5GS_NR_LTE-UECo...
See details 38.9050857-F18.1.0Rel-18TP analysis for ATG Configured Tx power Details R5-240389 withdrawnRAN5#102China Mobile Co...    NR_ATG-UEConTest
See details 38.9050856-F18.1.0Rel-18TP analysis for NR ATG test cases Details R5-240388 withdrawnRAN5#102China Mobile Co...    NR_ATG-UEConTest
See details 38.9050855-F18.1.0Rel-18Addition of reference sensitivity and spurious emissions TP analysis for new R17 NR CA combos within FR1 Details R5-240325 agreedRAN5#102KDDI Corporation Details RP-240180 approvedRAN#103RAN518.2.0NR_CADC_NR_LTE_...
See details 38.9050854-F18.1.0Rel-18Addition of reference sensitivity and spurious emissions TP analysis for new R16 NR CA combos within FR1 Details R5-240324 agreedRAN5#102KDDI Corporation Details RP-240174 approvedRAN#103RAN518.2.0NR_CADC_NR_LTE_...
See details 38.9050853-F18.1.0Rel-18Updating test points for FR1 REFSENS for SUL test case Details R5-240318 agreedRAN5#102Huawei, HiSilicon Details RP-240228 approvedRAN#103RAN518.2.0TEI15_Test, 5GS...
See details 38.9050852-F18.1.0Rel-18Updating test principle for AMPR for inter-band UL CA Details R5-240308 agreedRAN5#102Huawei, HiSilicon Details RP-240228 approvedRAN#103RAN518.2.0TEI15_Test, 5GS...
See details 38.90508511F18.1.0Rel-18Addition of test points analysis for ATG test cases in 38.521-1 Details R5-241765 agreedRAN5#102CAICT, CMCC Details RP-240216 approvedRAN#103RAN518.2.0NR_ATG-UEConTest
See details 38.9050851-F18.1.0Rel-18Addition of test points analysis for ATG test cases in 38.521-1 Details R5-240270 revisedRAN5#102CAICT, CMCC    NR_ATG-UEConTest
See details 38.9050850-F18.1.0Rel-18Update reference sensitivity test cases for CA_n1A-n8A-n78A Details R5-240234 agreedRAN5#102CU Digital Tech... Details RP-240174 approvedRAN#103RAN518.2.0NR_CADC_NR_LTE_...
See details 38.90508491F18.0.0Rel-18TP analysis for FR2 CA_NS_203 Details R5-237901 agreedRAN5#101China Unicom, H... Details RP-232795 approvedRAN#102RAN518.1.0NR_CADC_NR_LTE_...
See details 38.9050849-F17.10.0Rel-17TP analysis for FR2 CA_NS_203 Details R5-237130 revisedRAN5#101China Unicom, H...    NR_CADC_NR_LTE_...
See details 38.90508481F18.0.0Rel-18Adding Test point analysis for NR NTN frequency error test case Details R5-237931 agreedRAN5#101Keysight Techno... Details RP-232818 approvedRAN#102RAN518.1.0NR_NTN_solution...
See details 38.9050848-F18.0.0Rel-18Adding Test point analysis for NR NTN frequency error test case Details R5-237124 revisedRAN5#101Keysight Techno...    NR_NTN_solution...
See details 38.9050847-F18.0.0Rel-18Updating TP analysis for AMPR for CA testing for NS_17 NS_47 Details R5-237070 agreedRAN5#101Huawei, HiSilicon Details RP-232803 approvedRAN#102RAN518.1.0NR_PC2_CA_R17_2...
See details 38.9050846-F18.0.0Rel-18Updating TP analysis for FR1 test case Inband emissions for CA Details R5-237065 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.90508451F18.0.0Rel-18Updating TP analysis for FR1 test case Carrier Leakage for CA Details R5-237630 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.9050845-F18.0.0Rel-18Updating TP analysis for FR1 test case Carrier Leakage for CA Details R5-237063 revisedRAN5#101Huawei, HiSilicon    NR_RF_FR1-UEConTest
See details 38.9050844-F18.0.0Rel-18Updating TP analysis for FR1 test case EVM for CA Details R5-237061 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.9050843-F18.0.0Rel-18Updating TP analysis for FR1 test case Transmit intermodulation for CA Details R5-237059 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.9050842-F18.0.0Rel-18Updating TP analysis for Spurious emission for CA Details R5-237056 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.9050841-F18.0.0Rel-18Updating TP analysis for Frequency error testing for intra-band UL CA Details R5-237054 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.9050840-F18.0.0Rel-18Updating TP analysis for Minimum output power for CA Details R5-237052 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.9050839-F18.0.0Rel-18Updating TP analysis for Configured output power for CA Details R5-237049 agreedRAN5#101Huawei, HiSilicon Details RP-232796 approvedRAN#102RAN518.1.0NR_RF_FR1-UEConTest
See details 38.9050838-F18.0.0Rel-18Update reference sensitivity test cases for CA_n1A-n3A-n78A Details R5-236953 agreedRAN5#101ZTE, China Telecom Details RP-232795 approvedRAN#102RAN518.1.0NR_CADC_NR_LTE_...
See details 38.90508371F18.0.0Rel-18Addition of test point analysis for FR1 CA with UL MIMO test cases Details R5-237935 agreedRAN5#101Huawei, HiSilicon Details RP-232805 approvedRAN#102RAN518.1.0NR_RF_FR1_enh-U...
See details 38.9050837-F18.0.0Rel-18Addition of test point analysis for FR1 CA with UL MIMO test cases Details R5-236911 revisedRAN5#101Huawei, HiSilicon    NR_RF_FR1_enh-U...
See details 38.9050836-F18.0.0Rel-18Update to TP analysis for FR2 CA_NS_202 Details R5-236632 agreedRAN5#101Huawei, HiSilic... Details RP-232795 approvedRAN#102RAN518.1.0NR_CADC_NR_LTE_...
See details 38.90508351F18.0.0Rel-18TP analyze 6.2F.3 shared spectrum access NS_28 and NS_29 Details R5-237633 agreedRAN5#101Ericsson GmbH, ... Details RP-232799 approvedRAN#102RAN518.1.0NR_unlic-UEConTest
See details 38.9050835-F18.0.0Rel-18TP analyze 6.2F.3 shared spectrum access NS_28 and NS_29 Details R5-236526 revisedRAN5#101Ericsson GmbH, ...    NR_unlic-UEConTest
See details 38.9050834-F18.0.0Rel-18Addition of REFSENS TP analysis for 2CC EN-DC for n79 in PC2 Details R5-236504 agreedRAN5#101NTT DOCOMO, INC. Details RP-232832 approvedRAN#102RAN518.1.0HPUE_NR_CADC_NR...
See details 38.90508331F18.0.0Rel-18Addition of REFSENS TP analysis for 3CC EN-DC for n78 and n79 Details R5-237635 agreedRAN5#101DOCOMO Communic... Details RP-232845 approvedRAN#102RAN518.1.0TEI15_Test
See details 38.9050833-F18.0.0Rel-18Addition of REFSENS TP analysis for 3CC EN-DC for n78 and n79 Details R5-236501 revisedRAN5#101DOCOMO Communic...    TEI15_Test
See details 38.9050832-F18.0.0Rel-18Updated TP analysis for NR-U test cases SEM, MPR and ACLR Details R5-236482 agreedRAN5#101Ericsson Details RP-232799 approvedRAN#102RAN518.1.0NR_unlic-UEConTest
See details 38.9050831-F18.0.0Rel-18Addition of REFSENS TP analysis for 3CC EN-DC for n78 and n79 Details R5-236437 withdrawnRAN5#101NTT DOCOMO INC.    TEI15_Test
See details 38.9050830-F18.0.0Rel-18Addition of REFSENS TP analysis for 2CC EN-DC for n79 in PC2 Details R5-236435  RAN5#101NTT DOCOMO INC.    HPUE_NR_CADC_NR...
See details 38.90508291F18.0.0Rel-18Remove Editors Notes and made the necessary changes for Table 4.1.3.1-3 Details R5-237622 agreedRAN5#101Verizon Details RP-232852 approvedRAN#102RAN518.1.0NR_CADC_NR_LTE_...
See details 38.9050829-F18.0.0Rel-18Remove Editor’s Notes and made the necessary changes for Table 4.1.3.1-3 Details R5-236380 revisedRAN5#101Verizon    NR_CADC_NR_LTE_...
See details 38.9050828-F18.0.0Rel-18Update test point analysis clause for additional NR CA band configurations Details R5-236377 agreedRAN5#101Verizon Spain Details RP-232852 approvedRAN#102RAN518.1.0NR_CADC_NR_LTE_...
See details 38.9050827-F18.0.0Rel-18Update reference sensitivity test cases for additional three bands ENDC configurations Details R5-236371 agreedRAN5#101Verizon, Qualco... Details RP-232852 approvedRAN#102RAN518.1.0NR_CADC_NR_LTE_...
See details 38.9050826-F18.0.0Rel-18Test point analysis for several EN-DC and NR CA combos for spurious emissions Details R5-236356 agreedRAN5#101WE Certificatio... Details RP-232852 approvedRAN#102RAN518.1.0NR_CADC_NR_LTE_...
See details 38.9050825-F18.0.0Rel-18Addition of inter-band NR CA reference sensitivity PC2 exception cases Details R5-236287 agreedRAN5#101China Telecom Details RP-232803 approvedRAN#102RAN518.1.0NR_PC2_CA_R17_2...
See details 38.9050824-F17.10.0Rel-17Removal of technical content in TR 38.905 v17.10.0 and substitution with pointer to the next Release Details R5-236251 agreedRAN5#101ETSI Secretariat Details RP-232849 approvedRAN#102RAN517.11.0TEI17_Test
See details 38.90508231F18.0.0Rel-18Test point analysis for NR NTN test cases from 7.5 to 7.9 Details R5-237930 agreedRAN5#101CAICT Details RP-232818 approvedRAN#102RAN518.1.0NR_NTN_solution...
See details 38.9050823-F18.0.0Rel-18Test point analysis for NR NTN test cases from 7.5 to 7.9 Details R5-236152 revisedRAN5#101CAICT    NR_NTN_solution...
See details 38.90508221F18.0.0Rel-18Addition of reference sensitivity TP analysis for new R17 NR CA comb within FR1 Details R5-237619 agreedRAN5#101KDDI Corporation Details RP-232852 approvedRAN#102RAN518.1.0NR_CADC_NR_LTE_...
See details 38.9050822-F17.10.0Rel-17Addition of reference sensitivity TP analysis for new R17 NR CA comb within FR1 Details R5-236105 revisedRAN5#101KDDI Corporation    NR_CADC_NR_LTE_...
See details 38.90508211F18.0.0Rel-18Addition of reference sensitivity and spurious emissions TP analysis for new R16 NR CA comb within FR1 Details R5-237615 agreedRAN5#101KDDI Corporation Details RP-232795 approvedRAN#102RAN518.1.0NR_CADC_NR_LTE_...
See details 38.9050821-F17.10.0Rel-17Addition of reference sensitivity and spurious emissions TP analysis for new R16 NR CA comb within FR1 Details R5-236092 revisedRAN5#101KDDI Corporation    NR_CADC_NR_LTE_...
See details 38.9050820-F18.0.0Rel-18Introduction of spurious emission TP analysis for CA_n25A-n66A, CA_n25A-n77A, CA_n25A-n78A, CA_n66A-n78A Details R5-236081 agreedRAN5#101Nokia, Nokia Sh... Details RP-232852 approvedRAN#102RAN518.1.0NR_CADC_NR_LTE_...
See details 38.90508191F18.0.0Rel-18Introduction of reference sensitivity test point analysis for CA_n25A-n66A-n77(2A) and CA_n25A-n66A-n78(2A) Details R5-237617 agreedRAN5#101Nokia, Nokia Sh... Details RP-232852 approvedRAN#102RAN518.1.0NR_CADC_NR_LTE_...
See details 38.9050819-F18.0.0Rel-18Introduction of reference sensitivity test point analysis for CA_n25A-n66A-n77(2A) and CA_n25A-n66A-n78(2A) Details R5-236079 revisedRAN5#101Nokia, Nokia Sh...    NR_CADC_NR_LTE_...
See details 38.9050818-F18.0.0Rel-18Introduction of reference sensitivity test point analysis for CA_n1A-n3A-n28A-n78A Details R5-236074 agreedRAN5#101Nokia, Nokia Sh... Details RP-232795 approvedRAN#102RAN518.1.0NR_CADC_NR_LTE_...
See details 38.90508171F17.9.0Rel-17TP analysis for FR2 RF phase continuity test Details R5-235855 agreedRAN5#100Apple Benelux B.V. Details RP-231655 approvedRAN#101RAN517.10.0NR_cov_enh-UEConTest
See details 38.9050817-F17.9.0Rel-17TP analysis for FR2 RF phase continuity test Details R5-235224 revisedRAN5#100Apple Benelux B.V.    NR_cov_enh-UEConTest
See details 38.90508161F17.9.0Rel-17TP analysis for FR1 RF phase continuity test Details R5-235937 agreedRAN5#100Apple Benelux B.V. Details RP-231655 approvedRAN#101RAN517.10.0NR_cov_enh-UEConTest
See details 38.9050816-F17.9.0Rel-17TP analysis for FR1 RF phase continuity test Details R5-235223 revisedRAN5#100Apple Benelux B.V.    NR_cov_enh-UEConTest
See details 38.90508151F17.9.0Rel-17TP analysis for NTN TC 6.5.2.2 on Spectrum emission mask Details R5-235684 agreedRAN5#100Apple Benelux B.V. Details RP-231666 approvedRAN#101RAN517.10.0NR_NTN_solution...
See details 38.9050815-F17.9.0Rel-17TP analysis for NTN TC 6.5.2.2 on Spectrum emission mask Details R5-235219 revisedRAN5#100Apple Benelux B.V.    NR_NTN_solution...
See details 38.90508141F17.9.0Rel-17TP analysis for NTN TC 6.5.2.4 on ACLR Details R5-235682 agreedRAN5#100Apple Benelux B.V. Details RP-231666 approvedRAN#101RAN517.10.0NR_NTN_solution...
See details 38.9050814-F17.9.0Rel-17TP analysis for NTN TC 6.5.2.4 on ACLR Details R5-235218 revisedRAN5#100Apple Benelux B.V.    NR_NTN_solution...
See details 38.90508131F17.9.0Rel-17TP analysis for NTN TC 6.3.3 on Tx on-off time mask Details R5-235680 agreedRAN5#100Apple Benelux B.V. Details RP-231666 approvedRAN#101RAN517.10.0NR_NTN_solution...
See details 38.9050813-F17.9.0Rel-17TP analysis for NTN TC 6.3.3 on Tx on-off time mask Details R5-235217 revisedRAN5#100Apple Benelux B.V.    NR_NTN_solution...
See details 38.9050812-F17.9.0Rel-17Editorial correction of spurious emission TPA for DC_12A_n2A Details R5-235147 withdrawnRAN5#100ROHDE & SCHWARZ    NR_CADC_NR_LTE_...
See details 38.9050811-F17.9.0Rel-17Updating test point analysis for PC2 CA configuration REFSENS testing Details R5-235054 withdrawnRAN5#100Huawei, HiSilicon    NR_PC2_CA_R17_2...
See details 38.9050810-F17.9.0Rel-17Updating REFSENS for CA test point analysis for CA_n28A-n41A-n79A Details R5-235052 withdrawnRAN5#100Huawei, HiSilicon    NR_CADC_NR_LTE_...
See details 38.90508091F17.9.0Rel-17Updating REFSENS test point selection for CA_n39A-n41A Details R5-235622 agreedRAN5#100Huawei, HiSilicon Details RP-231635 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.9050809-F17.9.0Rel-17Updating REFSENS test point selection for CA_n39A-n41A Details R5-235050 revisedRAN5#100Huawei, Hisilicon    NR_CADC_NR_LTE_...
See details 38.9050808-F17.9.0Rel-17Updating test frequency selection for REFSENS exception testing for CA Details R5-235041 agreedRAN5#100Huawei, HiSilicon Details RP-231695 approvedRAN#101RAN517.10.0TEI15_Test, 5GS...
See details 38.9050807-F17.9.0Rel-17Addition of spurious emission TP analysis for CA_n3A-n8A Details R5-235015 agreedRAN5#100CU Digital Tech... Details RP-231635 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.90508061F17.9.0Rel-17TP analysis for NR-U MPR, SEM and ACLR test cases Details R5-235254 withdrawnRAN5#100Ericsson    NR_unlic-UEConTest
See details 38.9050806-F17.9.0Rel-17TP analysis for NR-U MPR, SEM and ACLR test cases Details R5-234930 revisedRAN5#100Ericsson    NR_unlic-UEConTest
See details 38.9050805-F17.9.0Rel-17Addition of TP analysis of 6.3A.3.3 2Tx-2Tx UL switching for inter-band CA Details R5-234849 agreedRAN5#100Huawei, HiSilicon Details RP-231649 approvedRAN#101RAN517.10.0NR_RF_FR1_enh-U...
See details 38.9050804-F17.9.0Rel-17Addition of TP analysis of spurious emission co-existence for CA_n28-n79 Details R5-234846 agreedRAN5#100Huawei, HiSilicon Details RP-231644 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.9050803-F17.9.0Rel-17Addition of TP analysis of SE-coex for intra-band non-contiguous CA Details R5-234839 agreedRAN5#100Huawei, HiSilicon Details RP-231636 approvedRAN#101RAN517.10.0NR_RF_FR1-UEConTest
See details 38.90508021F17.9.0Rel-17Update TP analysis of Ref sense exception of NR CA PC2 configs Details R5-235626 agreedRAN5#100CMCC, Huawei, H... Details RP-231645 approvedRAN#101RAN517.10.0NR_PC2_CA_R17_2...
See details 38.9050802-F17.9.0Rel-17Update TP analysis of Ref sense exception of NR CA PC2 configs Details R5-234733 revisedRAN5#100CMCC, Huawei, H...    NR_PC2_CA_R17_2...
See details 38.9050801-F17.9.0Rel-17Introduction of TP analysis of CA_n28A-n41A-n79A Ref Sense exception Details R5-234730 agreedRAN5#100CMCC Details RP-231644 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.9050800-F17.9.0Rel-17Introduction of TP analysis of CA_n3A_n41A Ref Sense exception Details R5-234728 agreedRAN5#100CMCC Details RP-231635 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.90507991F17.9.0Rel-17TP analysis update for NTN Details R5-235858 agreedRAN5#100Qualcomm France Details RP-231666 approvedRAN#101RAN517.10.0NR_NTN_solution...
See details 38.9050799-F17.9.0Rel-17TP analysis update for NTN Details R5-234643 revisedRAN5#100Qualcomm France    NR_NTN_solution...
See details 38.9050798-F17.9.0Rel-17TP analysis for NR NTN AMPR tests Details R5-234630 agreedRAN5#100Google Details RP-231666 approvedRAN#101RAN517.10.0NR_NTN_solution...
See details 38.90507971F17.9.0Rel-18Updates and additions to TP analyses for spurious emissions UE coexistence for EN-DC combinations as part of the introduction of LTE TDD Band 54 Details R5-235860 agreedRAN5#100Ligado Networks Details RP-231680 approvedRAN#101RAN518.0.0LTE_TDD_1670_16...
See details 38.9050797-F17.9.0Rel-18Updates and additions to TP analyses for spurious emissions UE coexistence for EN-DC combinations as part of the introduction of LTE TDD Band 54 Details R5-234620 revisedRAN5#100Ligado Networks    LTE_TDD_1670_16...
See details 38.9050796-F17.9.0Rel-18Updates to TP analyses for spurious emissions UE coexistence for CA combinations as part of the introduction of LTE TDD Band 54 Details R5-234619 agreedRAN5#100Ligado Networks Details RP-231680 approvedRAN#101RAN518.0.0LTE_TDD_1670_16...
See details 38.9050795-F17.9.0Rel-17Update 38.521-1_TPanalysis_6.5.4_TxIm_v3 for NR-U Details R5-234590 agreedRAN5#100Qualcomm France Details RP-231641 approvedRAN#101RAN517.10.0NR_unlic-UEConTest
See details 38.90507941F17.9.0Rel-17Update 38.905 for NR-U Details R5-235632 agreedRAN5#100Qualcomm France... Details RP-231641 approvedRAN#101RAN517.10.0NR_unlic-UEConTest
See details 38.9050794-F17.9.0Rel-17Update 38.905 for NR-U Details R5-234574 revisedRAN5#100Qualcomm France...    NR_unlic-UEConTest
See details 38.90507931F17.9.0Rel-17Introduction of spurious emission TP analysis for Rel-16 NR CA configuration CA_n5A-n66A. Details R5-235620 agreedRAN5#100Ericsson Details RP-231635 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.9050793-F17.9.0Rel-17Introduction of spurious emission TP analysis for Rel-16 NR CA configuration CA_n5A-n66A. Details R5-234532 revisedRAN5#100Ericsson    NR_CADC_NR_LTE_...
See details 38.9050792-F17.9.0Rel-17Test point analysis for reference sensitivity for several NR CA combos Details R5-234450 agreedRAN5#100WE Certificatio... Details RP-231644 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.90507911F17.9.0Rel-17Addition of spurious emissions TP analysis for new NRCA comb within FR1 Details R5-235649 agreedRAN5#100KDDI Corporation Details RP-231635 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.9050791-F17.9.0Rel-17Addition of spurious emissions TP analysis for new NRCA comb within FR1 Details R5-234294 revisedRAN5#100KDDI Corporation    NR_CADC_NR_LTE_...
See details 38.9050790-F17.9.0Rel-17Update reference sensitivity test cases for a few PC2 three band configurations Details R5-234204 agreedRAN5#100Verizon Spain, ... Details RP-231646 approvedRAN#101RAN517.10.0NR_UE_PC2_R17_C...
See details 38.9050789-F17.9.0Rel-17Update reference sensitivity test cases for additional three bands configurations Details R5-234200 agreedRAN5#100Verizon, Qualco... Details RP-231644 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.90507881F17.9.0Rel-17Ref sensitivity TP selection for DC_48A_n46A Details R5-235629 withdrawnRAN5#100Qualcomm France    NR_unlic-UEConTest
See details 38.9050788-F17.9.0Rel-17Ref sensitivity TP selection for DC_48A_n46A Details R5-234051 revisedRAN5#100Qualcomm France    NR_unlic-UEConTest
See details 38.90507871F17.9.0Rel-17Update TP analysis for 7.4A Details R5-235857 agreedRAN5#100Qualcomm France Details RP-231654 approvedRAN#101RAN517.10.0NR_DL1024QAM_FR...
See details 38.9050787-F17.9.0Rel-17Update TP analysis for 7.4A Details R5-234048 revisedRAN5#100Qualcomm France    NR_DL1024QAM_FR...
See details 38.90507861F17.9.0Rel-17Update TP analysis for 7.4 Details R5-235856 agreedRAN5#100Qualcomm France Details RP-231654 approvedRAN#101RAN517.10.0NR_DL1024QAM_FR...
See details 38.9050786-F17.9.0Rel-17Update TP analysis for 7.4 Details R5-234047 revisedRAN5#100Qualcomm France    NR_DL1024QAM_FR...
See details 38.90507851F17.9.0Rel-17Introduction of reference sensitivity test point analysis for CA_n20A-n78A Details R5-235848 agreedRAN5#100Nokia, Nokia Sh... Details RP-231635 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.9050785-F17.9.0Rel-17Introduction of reference sensitivity test point analysis for CA_n20A-n78A Details R5-233949 revisedRAN5#100Nokia, Nokia Sh...    NR_CADC_NR_LTE_...
See details 38.9050784-F17.9.0Rel-17Introduction of spurious emission TP analysis for CA_n20A-n78A Details R5-233948 agreedRAN5#100Nokia, Nokia Sh... Details RP-231635 approvedRAN#101RAN517.10.0NR_CADC_NR_LTE_...
See details 38.9050783-F17.8.0Rel-17TP Analysis for FR2 RF test case involving EIRP with UL-Gaps Details R5-233256 agreedRAN5#99Apple Inc Details RP-230960 approvedRAN#100TSG WG RAN517.9.0NR_RF_FR2_req_e...
See details 38.9050782-F17.8.0Rel-17Addition of Test Point Analysis for CA_NS_202 Details R5-233171 agreedRAN5#99ROHDE & SCHWARZ Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.90507811F17.8.0Rel-17Correction of test point analysis for CA_n66A-n71A Details R5-233530 agreedRAN5#99ROHDE & SCHWARZ Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050781-F17.8.0Rel-17Correction of test point analysis for CA_n66A-n71A Details R5-233167 revisedRAN5#99ROHDE & SCHWARZ    NR_CADC_NR_LTE_...
See details 38.9050780-F17.8.0Rel-17Updating TP analysis for Transmit ON/OFF time mask for CA Details R5-233094 agreedRAN5#99Huawei, HiSilicon Details RP-230919 approvedRAN#100TSG WG RAN517.9.0NR_RF_FR1-UEConTest
See details 38.90507791F17.8.0Rel-17Updating REFSENS exception test frequency selection for CA_n7A-n78A Details R5-233526 agreedRAN5#99Huawei, HiSilicon Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.9050779-F17.8.0Rel-17Updating REFSENS exception test frequency selection for CA_n7A-n78A Details R5-233089 revisedRAN5#99Huawei, HiSilicon    TEI15_Test, 5GS...
See details 38.9050778-F17.8.0Rel-17Introduction of TP analysis for A-MPR - New NR band n13 Details R5-232976 agreedRAN5#99Nokia, Nokia Sh... Details RP-230983 approvedRAN#100TSG WG RAN517.9.0TEI17_Test, NR_...
See details 38.90507771F17.8.0Rel-17Clarification/improvement of clause B9. Details R5-233523 agreedRAN5#99Ericsson Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.9050777-F17.8.0Rel-17Clarification/improvement of clause B9. Details R5-232881 revisedRAN5#99Ericsson    TEI15_Test, 5GS...
See details 38.9050776-F17.8.0Rel-17Addition of CA_n41A-n66A-n71A in sensitivity test case config table. Details R5-232878 agreedRAN5#99Ericsson Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050775-F17.8.0Rel-17Editorial in Table 4.1.3.1-2 Details R5-232876 agreedRAN5#99Ericsson Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050774-F17.8.0Rel-17TP analysis for PC2 n39 A-SE Details R5-232805 withdrawnRAN5#99CMCC    NR_UE_PC2_n39-U...
See details 38.90507732F17.8.0Rel-17TP analysis for PC2 PC3 n39 A-MPR and A-SE Details R5-233528 agreedRAN5#99CMCC Details RP-230988 approvedRAN#100TSG WG RAN517.9.0NR_UE_PC2_n39-U...
See details 38.90507731F17.8.0Rel-17TP analysis for PC2 PC3 n39 A-MPR and A-SE Details R5-233516 revisedRAN5#99CMCC    NR_UE_PC2_n39-U...
See details 38.9050773-F17.8.0Rel-17TP analysis for PC2 PC3 n39 A-MPR and A-SE Details R5-232803 revisedRAN5#99CMCC    NR_UE_PC2_n39-U...
See details 38.90507721F17.8.0Rel-17Correction to test point analysis for FR1 test cases Details R5-233522 agreedRAN5#99Huawei, HiSilicon Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.9050772-F17.8.0Rel-17Correction to test point analysis for FR1 test cases Details R5-232755 revisedRAN5#99Huawei, HiSilicon    TEI15_Test, 5GS...
See details 38.9050771-F17.8.0Rel-17Addition of reference sensitivity test point analysis for 19A_n77A Details R5-232720 withdrawnRAN5#99NTT DOCOMO INC.    TEI15_Test
See details 38.9050770-F17.8.0Rel-17Addition of reference sensitivity test point analysis for DC_21A_n28A Details R5-232718 agreedRAN5#99NTT DOCOMO INC. Details RP-230932 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050769-F17.8.0Rel-17Addition of reference sensitivity test point analysis for n28A-n77A Details R5-232709 agreedRAN5#99KDDI Corporation Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050768-F17.8.0Rel-17Addition of reference sensitivity test point analysis for n3A-n77A Details R5-232707 agreedRAN5#99KDDI Corporation Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.90507671F17.8.0Rel-17Spur_TpAnalysis for CA_n5A_n48A Details R5-233513 agreedRAN5#99Qualcomm India ... Details RP-230932 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050767-F17.8.0Rel-17Spur_TpAnalysis for CA_n5A_n48A Details R5-232610 revisedRAN5#99Qualcomm India ...    NR_CADC_NR_LTE_...
See details 38.9050766-F17.8.0Rel-17Ref sensitivity TP selection for DC_7A_n66A DC_7A_n77A and DC_66A_n25A Details R5-232608 agreedRAN5#99Qualcomm India ... Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.90507651F17.8.0Rel-17Ref sensitivity TP selection for DC_38A_n78A DC_18A_n77A and DC_19A_n77A Details R5-233519 agreedRAN5#99Qualcomm India ... Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.9050765-F17.8.0Rel-17Ref sensitivity TP selection for DC_38A_n78A DC_18A_n77A and DC_19A_n77A Details R5-232606 revisedRAN5#99Qualcomm India ...    TEI15_Test, 5GS...
See details 38.90507641F17.8.0Rel-17TP analysis for NR NTN configured transmission power tests Details R5-233514 agreedRAN5#99Google Details RP-230953 approvedRAN#100TSG WG RAN517.9.0NR_NTN_solution...
See details 38.9050764-F17.8.0Rel-17TP analysis for NR NTN configured transmission power tests Details R5-232518 revisedRAN5#99Google    NR_NTN_solution...
See details 38.9050763-F17.8.0Rel-17Addition of spurious emission TP analysis for CA_n1A-n3A Details R5-232424 agreedRAN5#99China Unicom Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.90507621F17.8.0Rel-17Correction to spurious emissions TP analysis for 21A_n28A Details R5-233512 agreedRAN5#99DOCOMO Communic... Details RP-230932 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050762-F17.8.0Rel-17Correction to spurious emissions TP analysis for 21A_n28A Details R5-232364 revisedRAN5#99DOCOMO Communic...    NR_CADC_NR_LTE_...
See details 38.90507611F17.8.0Rel-17FR1 MPR - ACLR - SEM - TP analysis update for almost contiguous RB allocation Details R5-233521 agreedRAN5#99Keysight Techno... Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.9050761-F17.8.0Rel-17FR1 MPR - ACLR - SEM - TP analysis update for almost contiguous RB allocation Details R5-232352 revisedRAN5#99Keysight Techno...    TEI15_Test, 5GS...
See details 38.90507601F17.8.0Rel-17TP analysis update for FR2 2 UL CA Tx tests to support PHR method Details R5-233518 agreedRAN5#99Keysight Techno... Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.9050760-F17.8.0Rel-17TP analysis update for FR2 2 UL CA Tx tests to support PHR method Details R5-232351 revisedRAN5#99Keysight Techno...    TEI15_Test, 5GS...
See details 38.9050759-F17.8.0Rel-17TP analysis updated for NTN maximum input level test case 7.4 Details R5-232347 agreedRAN5#99Keysight Techno... Details RP-230953 approvedRAN#100TSG WG RAN517.9.0NR_NTN_solution...
See details 38.90507581F17.8.0Rel-17Update inter-band NR CA reference sensitivity exception cases due to UL PC2 Details R5-233713 agreedRAN5#99Verizon Switzer... Details RP-230934 approvedRAN#100TSG WG RAN517.9.0NR_PC2_CA_R17_2...
See details 38.9050758-F17.8.0Rel-17Update inter-band NR CA reference sensitivity exception cases due to UL PC2 Details R5-232247 revisedRAN5#99Verizon Switzer...    NR_PC2_CA_R17_2...
See details 38.9050757-F17.8.0Rel-17Introduction of reference sensitivity test point analysis for CA_n28A-n78A Details R5-232116 agreedRAN5#99Nokia, Nokia Sh... Details RP-230976 approvedRAN#100TSG WG RAN517.9.0TEI15_Test, 5GS...
See details 38.9050756-F17.8.0Rel-17Introduction of spurious emission TP analysis for CA_n28A-n78A Details R5-232115 agreedRAN5#99Nokia, Nokia Sh... Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050755-F17.8.0Rel-17Introduction of MOP test point analysis for CA_n28A-n78A Details R5-232114 agreedRAN5#99Nokia, Nokia Sh... Details RP-230917 approvedRAN#100TSG WG RAN517.9.0NR_CADC_NR_LTE_...
See details 38.9050754-F17.7.0Rel-17Updated TP analysis for DC_25A_n41A Details R5-231311 agreedRAN5#98Ericsson Details RP-230251 approvedRAN#99TSG WG RAN517.8.0TEI15_Test, 5GS...
See details 38.90507531F17.7.0Rel-17Clarifications and alignment of REFSENS TP analysis for EN-DC and NR CA Details R5-231865 agreedRAN5#98Ericsson Details RP-230251 approvedRAN#99TSG WG RAN517.8.0TEI15_Test, 5GS...
See details 38.9050753-F17.7.0Rel-17Clarifications and alignment of REFSENS TP analysis for EN-DC and NR CA Details R5-231310 revisedRAN5#98Ericsson    TEI15_Test, 5GS...
See details 38.90507521F17.7.0Rel-17Reference sensitivity TP analysis for DC_66A_n41A Details R5-231616 agreedRAN5#98ZTE Corporation Details RP-230191 approvedRAN#99TSG WG RAN517.8.0NR_CADC_NR_LTE_...
See details 38.9050752-F17.7.0Rel-17Reference sensitivity TP analysis for DC_66A_n41A Details R5-231284 revisedRAN5#98ZTE Corporation    NR_CADC_NR_LTE_...
See details 38.9050751-F17.7.0Rel-17Test point analysis update for A-MPR test for NS_21 Details R5-231248 withdrawnRAN5#98Keysight Techno...    NR_bands_BW_R16...
See details 38.9050750-F17.7.0Rel-17Test point analysis update for A-MPR test for NS_21 Details R5-231241 agreedRAN5#98Keysight Techno... Details RP-230257 approvedRAN#99TSG WG RAN517.8.0NR_bands_BW_R16...
See details 38.90507491F17.7.0Rel-17Addition of CA_n41A-n71A. Details R5-231633 agreedRAN5#98Ericsson Details RP-230191 approvedRAN#99TSG WG RAN517.8.0NR_CADC_NR_LTE_...
See details 38.9050749-F17.7.0Rel-17Addition of CA_n41A-n71A. Details R5-231225 revisedRAN5#98Ericsson    NR_CADC_NR_LTE_...
See details 38.90507481F17.7.0Rel-17Update of spurious emission TP analysis for CA_n1A-n8A Details R5-231615 agreedRAN5#98China Unicom Details RP-230191 approvedRAN#99TSG WG RAN517.8.0NR_CADC_NR_LTE_...
See details 38.9050748-F17.7.0Rel-17Update of spurious emission TP analysis for CA_n1A-n8A Details R5-231212 revisedRAN5#98China Unicom    NR_CADC_NR_LTE_...
See details 38.9050747-F17.7.0Rel-17Addition of reference sensitivity test point analysis for DC_2A-66A_n5A Details R5-230947 agreedRAN5#98Huawei, HiSilicon Details RP-230191 approvedRAN#99TSG WG RAN517.8.0NR_CADC_NR_LTE_...
See details 38.9050746-F17.7.0Rel-17Addition of reference sensitivity test point analysis for DC_12A_n78A Details R5-230946 agreedRAN5#98Huawei, HiSilicon Details RP-230191 approvedRAN#99TSG WG RAN517.8.0NR_CADC_NR_LTE_...
See details 38.9050745-F17.7.0Rel-17Addition of reference sensitivity test point analysis for DC_8A_n41A Details R5-230945 agreedRAN5#98Huawei, HiSilicon Details RP-230191 approvedRAN#99TSG WG RAN517.8.0NR_CADC_NR_LTE_...
See details 38.9050744-F17.7.0Rel-17Addition of reference sensitivity test point analysis for DC_1A_n28A Details R5-230944 agreedRAN5#98Huawei, HiSilicon Details RP-230251 approvedRAN#99TSG WG RAN517.8.0TEI15_Test, 5GS...
See details 38.90507431F17.7.0Rel-17Adding Spurious emission TP for DC_12A_n2A Details R5-231611 agreedRAN5#98Qualcomm France Details RP-230191 approvedRAN#99TSG WG RAN517.8.0NR_CADC_NR_LTE_...
See details 38.9050743-F17.7.0Rel-17Adding Spurious emission TP for DC_12A_n2A Details R5-230914 revisedRAN5#98Qualcomm France    NR_CADC_NR_LTE_...
See details 38.90507421F17.7.0Rel-17Adding Spurious emission TP for DC_71A_n66A Details R5-231610 agreedRAN5#98Qualcomm France Details RP-230191 approvedRAN#99TSG WG RAN517.8.0NR_CADC_NR_LTE_...
See details 38.9050742-F17.7.0Rel-17Adding Spurious emission TP for DC_71A_n66A Details R5-230913 revisedRAN5#98Qualcomm France    NR_CADC_NR_LTE_...
See details 38.90507411F17.7.0Rel-17Adding Spurious emission TP for DC_71A_n2A Details R5-231614 agreedRAN5#98Qualcomm France Details RP-230207 approvedRAN#99TSG WG RAN517.8.0NR_CADC_NR_LTE_...