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Spec #CR #Revision #Impacted VersionTarget ReleaseTitleWG TDoc #WG statusTSG TDoc #TSG statusNew Version
25.1420027-3.1.0R1999Test connection definitionR4-000523agreedRP-000212approved3.2.0
25.1420026-3.1.0R1999Conformance test description for spectrum emission maskR4-000522agreedRP-000212approved3.2.0
25.1420025-3.1.0R1999Revision of Annex C: Global in-channel Tx testR4-000479agreedRP-000212approved3.2.0
25.1420024-3.1.0R1999Correction on Receiver tests, terminating RX portR4-000483agreedRP-000212approved3.2.0
25.1420023-3.1.0R1999Relationship between RF generation and chip clockR4-000418agreedRP-000212approved3.2.0
25.1420022-3.1.0R1999Clarification of the specification on Peak Code Domain Error (PCDE)R4-000478agreedRP-000212approved3.2.0
25.1420021-3.1.0R1999Modification to the handling of BS TDD Measurement UncertaintyR4-000344agreedRP-000212approved3.2.0
25.1420020-3.1.0R1999Conformance test description for modulation accuracyR4-000417agreedRP-000212approved3.2.0
25.1420018-3.1.0R1999Correction of blocking requirementsR4-000348agreedRP-000212approved3.2.0
25.1420017-3.1.0R1999Definitions of maximum output power and rated output powerR4-000347agreedRP-000212approved3.2.0
25.1420016-3.1.0R1999Correction of the interfering power level for performance requirementsR4-000448agreedRP-000212approved3.2.0
25.1420015-3.1.0R1999Conformance test description for receiver dynamic range.R4-000447agreedRP-000212approved3.2.0
25.1420014-3.1.0R1999Regional requirements in TS 25.142R4-000343agreedRP-000212approved3.2.0
25.1420013-3.1.0R1999UL Reference Measurement ChannelsR4-000346agreedRP-000212approved3.2.0