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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 25.1420046-F3.3.0R1999Correction to reference measurement channels Details R4-000967 agreedRAN4-#14 Details RP-000594 approvedRAN-#10R43.4.0TEI
See details 25.1420045-F3.3.0R1999Editorial correction to ACLR test Details R4-000965 agreedRAN4-#14 Details RP-000594 approvedRAN-#10R43.4.0TEI
See details 25.1420044-F3.3.0R1999Conformance test description for performance requirements Details R4-000859 agreedRAN4-#14 Details RP-000594 approvedRAN-#10R43.4.0TEI
See details 25.1420043-F3.3.0R1999Conformance test description for occupied bandwidth Details R4-000858 agreedRAN4-#14 Details RP-000594 approvedRAN-#10R43.4.0TEI
See details 25.1420042-F3.3.0R1999Conformance test description for transmit ON/OFF power Details R4-000857 agreedRAN4-#14 Details RP-000594 approvedRAN-#10R43.4.0TEI
See details 25.1420041-F3.3.0R1999Conformance test description for power control dynamic range Details R4-000856 agreedRAN4-#14 Details RP-000594 approvedRAN-#10R43.4.0TEI
See details 25.1420040-F3.3.0R1999Conformance test description for inner loop power control Details R4-000855 agreedRAN4-#14 Details RP-000594 approvedRAN-#10R43.4.0TEI
See details 25.1420039-F3.3.0R1999Conformance test description for frequency stability Details R4-000854 agreedRAN4-#14 Details RP-000594 approvedRAN-#10R43.4.0TEI
See details 25.1420038-F3.3.0R1999Clarifications for EVM definition Details R4-000821 agreedRAN4-#14 Details RP-000594 approvedRAN-#10R43.4.0TEI