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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 25.1330504-F3.11.0R1999Correction of UE parameters for Random Access Test Details R4-021651 agreedRAN4-#25 Details RP-020780 approvedRAN-#18R43.12.0TEI
See details 25.13304821F3.11.0R1999UE Timer accuracy Details R4-021713 agreedRAN4-#25 Details RP-020780 approvedRAN-#18R43.12.0TEI
See details 25.13304802F3.11.0R1999Required Window size for measurements using IPDL Details R4-021741 agreedRAN4-#25 Details RP-020780 approvedRAN-#18R43.12.0TEI
See details 25.13304781F3.11.0R1999Correction of Measurement Occasion Patterns for BSIC Reconfirmation Details R4-021705 agreedRAN4-#25 Details RP-020780 approvedRAN-#18R43.12.0TEI
See details 25.1330476-F3.11.0R1999Correction of UE Transmitted Power requirements in case of Compressed Mode gaps Details R4-021443 agreedRAN4-#25 Details RP-020780 approvedRAN-#18R43.12.0TEI
See details 25.13304371F3.11.0R1999Correction of interruption time in FDD/FDD Hard Handover Details R4-021403 agreedRAN4-#25 Details RP-020780 approvedRAN-#18R43.12.0TEI