• Specification number WG Status
    select
    Meeting
    Target Release
    select
    TSG Status
    select
    Work Item
    Entities
Data pager
Data pager
First PagePrevious Page
1
Next PageLast Page
Page size:
PageSizeComboBox
select
 40 items in 1 pages
 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 34.123-12428-F8.4.0Rel-8Corrections to HSDPA test case 11.1.1.1a Details R5-085557 agreedRAN5#41Rohde & Schwarz Details RP-081069 approvedRAN#42R58.5.0TEI5_Test
See details 34.123-12427-F8.4.0Rel-8Correction to No. of HARQ Process for HSDPA CAT 10 in RAB test cases Details R5-085536 agreedRAN5#41Anite Details RP-081069 approvedRAN#42R58.5.0TEI5_Test
See details 34.123-12426-F8.4.0Rel-8Enhanced CELL_FACH: New Test Case for UE Identification on HS-SCCH in CELL_FACH Details R5-085505 agreedRAN5#41Nokia Details RP-080965 approvedRAN#42R58.5.0RANimp-UEConTes...
See details 34.123-12425-F8.4.0Rel-8Correction to network selection enhancements test case 6.1.1.12 Details R5-085504 agreedRAN5#41Nokia Details RP-080952 approvedRAN#42R58.5.0TEI_Test
See details 34.123-12424-F8.4.0Rel-8Addition 1.28 Mcps TDD contents in 8.5.1.14 and 8.5.1.15 Details R5-085466 agreedRAN5#41CATT Details RP-080968 approvedRAN#42R58.5.0MBMSE-RANPhysLC...
See details 34.123-12423-F8.4.0Rel-8New RLC test case for Flexible handling of RLC PDU sizes for AM RLC in uplink (7.2.3.38) Details R5-085423 agreedRAN5#41Ericsson Details RP-080967 approvedRAN#42R58.5.0RANimp-UEConTes...
See details 34.123-12422-F8.4.0Rel-8Correction to TB test points and generic test procedure for Enhanced L2 radio bearer test cases Details R5-085396 agreedRAN5#41Ericsson, TF160 Details RP-080956 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12421-F8.4.0Rel-8Inconsistent applicability concerning MT-LR test cases Details R5-085332 agreedRAN5#41CETECOM GmbH Details RP-080952 approvedRAN#42R58.5.0TEI_Test
See details 34.123-12420-F8.4.0Rel-8Correction to GCF WI-14 HSDPA RRC testcase 8.3.1.37 Details R5-085319 agreedRAN5#41Anite Details RP-081069 approvedRAN#42R58.5.0TEI5_Test
See details 34.123-12419-F8.4.0Rel-8Correction to MRAT Idle mode testcase 6.2.1.1, 6.2.1.6, 6.2.1.7 and 6.2.1.8 Details R5-085303 agreedRAN5#41Anite Details RP-080952 approvedRAN#42R58.5.0TEI_Test
See details 34.123-12418-F8.4.0Rel-8Correction to GCF WI-24 MM testcase 9.4.8 Details R5-085298 agreedRAN5#41Anite Details RP-080952 approvedRAN#42R58.5.0TEI_Test
See details 34.123-12417-F8.4.0Rel-8Removal of PICS information USIM removal possible without powering down from NAS test cases 12.4.1.4b and 12.4.2.5b Details R5-085289 agreedRAN5#41Nokia Details RP-080952 approvedRAN#42R58.5.0TEI_Test
See details 34.123-12416-F8.4.0Rel-8Modification of cell powers in TC 8.3.4.8 Details R5-085288 agreedRAN5#41Nokia Details RP-080952 approvedRAN#42R58.5.0TEI_Test
See details 34.123-12415-F8.4.0Rel-8Correction to DTX-DRX Parameters for CPC test cases Details R5-085287 agreedRAN5#41Nokia Details RP-080956 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12414-F8.4.0Rel-8Correction to UL DPCCH Slot Format for UL DTX/DRX Test cases Details R5-085286 agreedRAN5#41Nokia Details RP-080956 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12413-F8.4.0Rel-8Correction to test case 7.1.6.3.3 Details R5-085285 agreedRAN5#41Nokia Details RP-080956 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12412-F8.4.0Rel-8Correction to WI-10 test case 6.1.2.2 Details R5-085248 agreedRAN5#41NEC Details RP-080952 approvedRAN#42R58.5.0TEI_Test
See details 34.123-12411-F8.4.0Rel-8to 34.123-1: Contents addition for LCR TDD in 7.1.6.4.3 Details R5-085183 agreedRAN5#41RITT, CMCC, CAT... Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12410-F8.4.0Rel-8New RLC test case for Flexible handling of RLC PDU sizes for UM RLC in uplink (7.2.2.15) Details R5-085166 agreedRAN5#41Ericsson Details RP-080967 approvedRAN#42R58.5.0RANimp-UEConTes...
See details 34.123-12409-F8.4.0Rel-8New testcase 8.3.1.33a to verify the features and operation of multi-frequency and UpPCH Shifting for LTDD Details R5-085143 agreedRAN5#41RITT Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12408-F8.4.0Rel-8New testcase 8.2.6.39c to verify the features and operation of multi-frequency and UpPCH Shifting for LTDD Details R5-085142 agreedRAN5#41RITT Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12407-F8.4.0Rel-8New testcase 8.2.4.36a to verify the features and operation of multi-frequency and UpPCH Shifting for LTDD Details R5-085141 agreedRAN5#41RITT Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12406-F8.4.0Rel-8New testcase 18.1.2.13.1a to verify the features and operation of multi-frequency and UpPCH Shifting for LTDD Details R5-085140 agreedRAN5#41RITT Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12405-F8.4.0Rel-8New testcase 18.1.2.4a to verify the features and operation of multi-frequency and UpPCH Shifting for LTDD Details R5-085139 agreedRAN5#41RITT Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12404-F8.4.0Rel-8Modification of testcase 8.4.1.1a to verify the features and operation of multi-frequency and UpPCH Shifting for LTDD Details R5-085138 agreedRAN5#41RITT Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12403-F8.4.0Rel-8New testcase 8.3.1.1b to verify the features and operation of multi-frequency and UpPCH Shifting for LTDD Details R5-085137 agreedRAN5#41RITT Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12402-F8.4.0Rel-8New testcase 8.2.3.31a to verify the features and operation of multi-frequency and UpPCH Shifting for LTDD Details R5-085136 agreedRAN5#41RITT Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12401-F8.4.0Rel-8New testcase 8.2.2.36a to verify the features and operation of multi-frequency and UpPCH Shifting for LTDD Details R5-085135 agreedRAN5#41RITT Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12400-F8.4.0Rel-8New testcase 8.2.1.27b to verify the features and operation of multi-frequency and UpPCH Shifting for LTDD Details R5-085134 agreedRAN5#41RITT Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12399-F8.4.0Rel-8Correction to RRC connection establishment test case in section 8.1.2.10 for LTDD Details R5-085128 agreedRAN5#41CATT, Spreadstrum Details RP-080952 approvedRAN#42R58.5.0TEI_Test
See details 34.123-12398-F8.4.0Rel-8Correction of Rel-7 CPC test case 8.3.11.15 Details R5-085073 agreedRAN5#41Anritsu Ltd Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12397-F8.4.0Rel-8Correction of Rel-7 CPC test case 8.2.6.61 Details R5-085072 agreedRAN5#41Anritsu Ltd Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12396-F8.4.0Rel-8Correction to GCF Rel7 CPC test case 8.2.2.52 Details R5-085071 agreedRAN5#41Anritsu Ltd Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12395-F8.4.0Rel-8Correction to Rel7 CPC test case 8.2.1.38 Details R5-085070 agreedRAN5#41Anritsu Ltd Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12394-F8.4.0Rel-8Correction to GCF Rel7 Improved L2 test case 7.1.5a.4 Details R5-085069 agreedRAN5#41Anritsu Ltd Details RP-080955 approvedRAN#42R58.5.0TEI7_Test
See details 34.123-12393-F8.4.0Rel-8Correction to testcases 8.5.1.2, 8.5.1.12, 8.5.1.13 Details R5-085062 agreedRAN5#41Ericsson Details RP-080954 approvedRAN#42R58.5.0TEI6_Test
See details 34.123-12392-F8.4.0Rel-8Correction to test case 8.2.6.52 Details R5-085038 agreedRAN5#41NTT DOCOMO Details RP-080954 approvedRAN#42R58.5.0TEI6_Test
See details 34.123-12391-F8.4.0Rel-8Correction to E-DCH TC 8.2.6.51 for 3.84Mcps and 7.68Mcps TDD Details R5-085036 agreedRAN5#41IPWireless Details RP-080952 approvedRAN#42R58.5.0TEI_Test
See details 34.123-12390-F8.4.0Rel-8Enhanced CELL_FACH: New test case for Reconfiguration between FACH/E-FACH Details R5-083537 agreedRAN5#40Agilent Technologies Details RP-080965 approvedRAN#42R58.5.0
See details 34.123-11129-F8.4.0Rel-8Addition of references for UE’s supporting a release-independent frequency band Details R5-083830 agreedRAN5#40Agilent Technologies Details RP-081069 approvedRAN#42R58.5.0TEI5_Test