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6 items in 1 pages

		Spec #	CR #	Revision #	CR Cat	Impacted Version	Target Release	Title	WG TDoc #	CR status at WG	WG meeting ref	WG Source information	TSG TDoc #	CR status at TSG	TSG meeting ref	TSG Source information	New Version	Work Items	Remarks


		51.010-2	0724	-	F	9.7.0	Rel-9	CR 51.010-2-0724 New test cases EFTA added part 2	GP-111529	agreed	GERAN3new#52-ELECTRONIC ME	ST-Ericsson	GP-111529	approved	GERAN3new#52-ELECTRONIC ME	G3new	9.8.0	TEI_Test
		51.010-2	0722	-	F	9.7.0	Rel-9	CR 51.010-2-0722 26.19.5 Split into separate TCs per execution counter in applicability table	GP-111515	agreed	GERAN3new#52-ELECTRONIC ME	Rohde & Schwarz	GP-111515	approved	GERAN3new#52-ELECTRONIC ME	G3new	9.8.0	TEI_Test
		51.010-2	0721	-	F	9.7.0	Rel-9	CR 51.010-2-0721 VAMOS Signalling test cases applicability table.	GP-111514	agreed	GERAN3new#52-ELECTRONIC ME	Rohde & Schwarz	GP-111514	approved	GERAN3new#52-ELECTRONIC ME	G3new	9.8.0
		51.010-2	0720	-	F	9.7.0	Rel-9	CR 51.010-2-0720 New test case for layer 2 fill bits randomisation added to applicability table	GP-111512	agreed	GERAN3new#52-ELECTRONIC ME	Anite, Rohde & ...	GP-111512	approved	GERAN3new#52-ELECTRONIC ME	G3new	9.8.0	TEI_Test
		51.010-2	0719	-	F	9.7.0	Rel-9	CR 51.010-2-0719 Table A.2 - Correct the duplicated PICS conditions	GP-111510	agreed	GERAN3new#52-ELECTRONIC ME	CGC Inc.	GP-111510	approved	GERAN3new#52-ELECTRONIC ME	G3new	9.8.0	TEI_Test
		51.010-2	0718	-	F	9.7.0	Rel-9	CR 51.010-2-0718 Correction to applicability condtion for test case 26.6.11.3	GP-111508	agreed	GERAN3new#52-ELECTRONIC ME	Research In Mot...	GP-111508	approved	GERAN3new#52-ELECTRONIC ME	G3new	9.8.0	TEI_Test