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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1331379-B11.0.0Rel-11Introduction of e850_LB (Band 27) to TS 36.133 Details R4-123203 agreedRAN4#63NII Holdings, H... Details RP-120792 approvedRAN#56R411.1.0LTE_e850_LB-Perf
See details 36.1331368-A11.0.0Rel-11OCNG correction in Phase I eICIC test cases Details R4-123044 agreedRAN4#63Ericsson, ST-Er... Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.13313662A11.0.0Rel-11Phase IIbis eICIC TDD absolute and relative RSRP accuracy with MBSFN ABS Details R4-123647 agreedRAN4#63Ericsson, ST-Er... Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.13313642A11.0.0Rel-11Phase IIbis eICIC FDD absolute and relative RSRP accuracy with MBSFN ABS Details R4-123645 agreedRAN4#63Ericsson, ST-Er... Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.13313631A11.0.0Rel-11UL Transmit Timing Requirements Details R4-123642 agreedRAN4#63Renesas Mobile ... Details RP-120764 approvedRAN#56R411.1.0LTE-RF
See details 36.13313612A11.0.0Rel-11Correction of a timer period in inter-frequency measurement tests Details R4-123580 agreedRAN4#63Ericsson, ST-Er... Details RP-120766 approvedRAN#56R411.1.0TEI8
See details 36.1331355-A11.0.0Rel-11Editorial corrections Details R4-123026 agreedRAN4#63Ericsson, ST-Er... Details RP-120780 approvedRAN#56R411.1.0TEI10
See details 36.13313501B11.0.0Rel-11Introduction of Band 44 Details R4-123677 agreedRAN4#63Ericsson, ST-Er... Details RP-120794 approvedRAN#56R411.1.0LTE_APAC700-Perf
See details 36.1331349-B11.0.0Rel-11Introduction of Band 28 Details R4-122956 agreedRAN4#63Ericsson, ST-Er... Details RP-120793 approvedRAN#56R411.1.0LTE_APAC700-Core
See details 36.13313471A11.0.0Rel-11Clarification for cell identification condition in inter-RAT SI reading requirement R11 Details R4-123560 agreedRAN4#63Huawei, HiSilicon Details RP-120777 approvedRAN#56R411.1.0TEI10
See details 36.13313451A11.0.0Rel-11Add Band 25 Io values R11 Details R4-123443 agreedRAN4#63Huawei, HiSilicon Details RP-120795 approvedRAN#56R411.1.0TEI11
See details 36.1331342-A11.0.0Rel-11Correction to RSTD measurement reporting delay requirement in CA R11 Details R4-122881 agreedRAN4#63Huawei, HiSilicon Details RP-120779 approvedRAN#56R411.1.0TEI10
See details 36.13313381A11.0.0Rel-11TDD CA RSTD Measurement Reporting Delay Test Case (Rel-11) Details R4-123472 agreedRAN4#63Alcatel-Lucent, LGE Details RP-120782 approvedRAN#56R411.1.0TEI10
See details 36.13313371A11.0.0Rel-11FDD CA RSTD Measurement Reporting Delay Test Case (Rel-11) Details R4-123470 agreedRAN4#63Alcatel-Lucent, LGE Details RP-120780 approvedRAN#56R411.1.0TEI10
See details 36.1331336-A11.0.0Rel-11Correction to E-UTRAN TDD redirection to UTRAN FDD test configuration R11 Details R4-122866 agreedRAN4#63Huawei, HiSilicon Details RP-120770 approvedRAN#56R411.1.0TEI9
See details 36.13313311A11.0.0Rel-11Correction to E-UTRAN FDD/TDD - UTRAN FDD /TDD enhanced cell identification test case R11 Details R4-123467 agreedRAN4#63Huawei, HiSilicon Details RP-120769 approvedRAN#56R411.1.0TEI9
See details 36.1331328-A11.0.0Rel-11Correction to RLM requirements in eICIC with Autonomous gaps R11 Details R4-122844 agreedRAN4#63Huawei, HiSilicon Details RP-120779 approvedRAN#56R411.1.0TEI10
See details 36.1331322-A11.0.0Rel-11Addition of E-UTRAN TDD RSTD measurement accuracy test case in carrier aggregation R11 Details R4-122736 agreedRAN4#63Huawei, HiSilicon Details RP-120777 approvedRAN#56R411.1.0TEI10
See details 36.13313201A11.0.0Rel-11Addition of E-UTRAN FDD RSTD measurement accuracy test case in carrier aggregation R11 Details R4-123556 agreedRAN4#63Huawei, HiSilicon Details RP-120777 approvedRAN#56R411.1.0TEI10
See details 36.13313181B11.0.0Rel-11The introduction of Multi-TA timing requirements R11 Details R4-123542 agreedRAN4#63Huawei, HiSilicon Details RP-120788 approvedRAN#56R411.1.0LTE_CA_enh-Core
See details 36.1331310-A11.0.0Rel-11Inter-frequency and Inter-RAT Requirements for Measurements without Measurement Gaps Details R4-122656 agreedRAN4#63Ericsson, ST-Er... Details RP-120781 approvedRAN#56R411.1.0TEI10
See details 36.13313061A11.0.0Rel-11In-Sync RLM test case in MBSFN ABS for E-UTRAN TDD R11 Details R4-123460 agreedRAN4#63Huawei, HiSilicon Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.13313031A11.0.0Rel-11In-Sync RLM test case in MBSFN ABS for E-UTRAN FDD R11 Details R4-123458 agreedRAN4#63Huawei, HiSilicon Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.13312992F11.0.0Rel-11CR on TDD RSRQ test case under Time Domain Measurement Resource Restriction with MBSFN ABS Rel11 Details R4-123649 agreedRAN4#63LG Electronics Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.13312931A11.0.0Rel-11Clarification on the number of monitoring layers for CA UEs Details R4-123480 agreedRAN4#63NTT DOCOMO Details RP-120773 approvedRAN#56R411.1.0LTE_CA-Core
See details 36.13312891A11.0.0Rel-11On UE behavior in the uplink subframe after measurement GAP Details R4-123441 agreedRAN4#63CATT, Ericsson,... Details RP-120781 approvedRAN#56R411.1.0TEI10
See details 36.13312881A11.0.0Rel-11eICIC TDD out-of-sync RLM test case in MBSFN ABS Details R4-123454 agreedRAN4#63NTT DOCOMO Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.13312861A11.0.0Rel-11eICIC FDD out-of-sync RLM test case in MBSFN ABS Details R4-123452 agreedRAN4#63NTT DOCOMO Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.13312792A11.0.0Rel-11Intra-Frequency FDD RSRQ Accuracy under Time Domain Measurement Resource Restriction with MBSFN ABS Details R4-123651 agreedRAN4#63ZTE Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.13312771A11.0.0Rel-11RRM: Clarifications to the OCNG patterns Details R4-123573 agreedRAN4#63Rohde & Schwarz Details RP-120764 approvedRAN#56R411.1.0LTE-RF
See details 36.1331273-A11.0.0Rel-11Remove [ ] from eICIC RSRP, RSRQ Es/Iot side conditions Details R4-122255 agreedRAN4#63Anritsu Details RP-120782 approvedRAN#56R411.1.0TEI10
See details 36.1331271-A11.0.0Rel-11sr-ConfigIndex in TDD DRX test cases Details R4-122253 agreedRAN4#63Anritsu Details RP-120767 approvedRAN#56R411.1.0TEI8
See details 36.1331261-A11.0.0Rel-11Clarification on UE Rx-Tx with eICIC Details R4-122174 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120772 approvedRAN#56R411.1.0eICIC_LTE-Core
See details 36.1331260-A11.0.0Rel-11Bands 22, 23, 42 and 43 side conditions for inter-frequency measurements with autonomous gaps Details R4-122036 agreedRAN4#62-BISAnritsu Details RP-120777 approvedRAN#56R411.1.0TEI10
See details 36.1331251-A11.0.0Rel-11CR for 36.133: Aligning RSRQ measurement requirements in TS 36.133 with TS 36.101 regarding the modification of B41 REFSENS Details R4-121900 agreedRAN4#62-BISClearwire, Huaw... Details RP-120779 approvedRAN#56R411.1.0TEI10
See details 36.1331249-A11.0.0Rel-11RLM requirements with autonomous gaps for DRX Details R4-121757 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.13312431A11.0.0Rel-11Phase II eICIC TDD: absolute and relative RSRP accuracies in non-MBSFN ABS Details R4-122171 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.13312411B11.0.0Rel-11Phase II eICIC FDD: absolute and relative RSRP accuracies in non-MBSFN ABS Details R4-122169 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.1331239-A11.0.0Rel-11Cell identification requirements with DRX Details R4-121739 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.13312371A11.0.0Rel-11Reporting criteria requirements for carrier aggregation Details R4-122176 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120782 approvedRAN#56R411.1.0TEI10
See details 36.1331235-A11.0.0Rel-11Editorial corrections Details R4-121731 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120780 approvedRAN#56R411.1.0TEI10
See details 36.1331233-A11.0.0Rel-11No interruptions on PCell at SCell activation/ deactivation when measCycleSCell is smaller than 640 ms Details R4-121682 agreedRAN4#62-BISNTT DOCOMO Details RP-120781 approvedRAN#56R411.1.0TEI10
See details 36.1331231-A11.0.0Rel-11E-UTRAN FDD to UTRAN FDD RRC connection release with redirection test case when SI is not provided Details R4-121669 agreedRAN4#62-BISNTT DOCOMO, Hua... Details RP-120770 approvedRAN#56R411.1.0TEI9
See details 36.13312271A11.0.0Rel-11Finalization of Rel.9 cell reselection enhancement related test cases Details R4-122161 agreedRAN4#62-BISNTT DOCOMO Details RP-120770 approvedRAN#56R411.1.0TEI9
See details 36.1331223-A11.0.0Rel-11Test case for event-triggered reporting on deactivated SCell with PCell interruption Details R4-121530 agreedRAN4#62-BISCATT, Ericsson,... Details RP-120773 approvedRAN#56R411.1.0LTE_CA-Perf
See details 36.1331213-A11.0.0Rel-11CR to TS36.133 Corrections on RRC signalling in RLM test cases for eICIC Details R4-121306 agreedRAN4#62-BISZTE Details RP-120780 approvedRAN#56R411.1.0TEI10
See details 36.13312071A11.0.0Rel-11TDD RSRQ under Time Domain Measurement Resource Restriction with Non-MBSFN ABS R11 Details R4-122167 agreedRAN4#62-BISHuawei, HiSilicon Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.13312051A11.0.0Rel-11FDD RSRQ under Time Domain Measurement Resource Restriction with Non-MBSFN ABS R11 Details R4-122165 agreedRAN4#62-BISHuawei, HiSilicon Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.1331201-A11.0.0Rel-11E-UTRA TDD RRC connection release redirection to UTRA FDD test without SI provided R11 Details R4-121253 agreedRAN4#62-BISHuawei, HiSilic... Details RP-120770 approvedRAN#56R411.1.0TEI9
See details 36.1331198-A11.0.0Rel-11Addition of E-UTRAN TDD-CDMA2000 1X event triggered reporting under fading propagation conditions test case R11 Details R4-121250 agreedRAN4#62-BISHuawei, HiSilic... Details RP-120769 approvedRAN#56R411.1.0TEI9
See details 36.13311951A11.0.0Rel-11Addition of E-UTRAN TDD-HRPD event triggered reporting under fading propagation conditions test case R11 Details R4-122156 agreedRAN4#62-BISHuawei, HiSilic... Details RP-120777 approvedRAN#56R411.1.0TEI10
See details 36.1331192-A11.0.0Rel-11Addition of E-UTRAN FDD - TDD Inter-frequency identification of a new CGI of E-UTRA cell using autonomous gaps test case R11 Details R4-121241 agreedRAN4#62-BISHuawei, HiSilic... Details RP-120769 approvedRAN#56R411.1.0TEI9
See details 36.1331189-A11.0.0Rel-11Addition of E-UTRAN FDD-TDD Inter-frequency event triggered reporting when DRX is used under fading propagation conditions in asynchronous cells R11 Details R4-121238 agreedRAN4#62-BISHuawei, HiSilic... Details RP-120769 approvedRAN#56R411.1.0TEI9
See details 36.1331186-A11.0.0Rel-11Addition of E-UTRAN TDD - FDD Inter-frequency identification of a new CGI of E-UTRA cell using autonomous gaps test case R11 Details R4-121235 agreedRAN4#62-BISHuawei, HiSilic... Details RP-120769 approvedRAN#56R411.1.0TEI9
See details 36.1331183-A11.0.0Rel-11Addition of E-UTRAN TDD-FDD Inter-frequency event triggered reporting when DRX is used under fading propagation conditions in asynchronous cells test case R11 Details R4-121232 agreedRAN4#62-BISHuawei, HiSilic... Details RP-120769 approvedRAN#56R411.1.0TEI9
See details 36.1331176-A11.0.0Rel-11OCNG Patterns for MBSFN ABS Details R4-121192 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120784 approvedRAN#56R411.1.0eICIC_LTE-Perf
See details 36.1331174-A11.0.0Rel-11RRC Connection Release with Redirection from E-UTRAN TDD to GERAN without System Information Details R4-121187 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120771 approvedRAN#56R411.1.0TEI9
See details 36.1331171-A11.0.0Rel-11RRC Connection Release with Redirection from E-UTRAN FDD to GERAN without System Information Details R4-121184 agreedRAN4#62-BISEricsson, ST-Er... Details RP-120771 approvedRAN#56R411.1.0TEI9
See details 36.1331168-A11.0.0Rel-11OCNG and PDSCH for FDD-TDD event triggered reporting test cases Details R4-121181 agreedRAN4#62-BISAnritsu Details RP-120771 approvedRAN#56R411.1.0TEI9
See details 36.13311651A11.0.0Rel-11Corrections to FDD-TDD Inter-freq RSRP measurement accuracy test case parameters Details R4-122055 agreedRAN4#62-BISAnritsu Details RP-120770 approvedRAN#56R411.1.0TEI9
See details 36.1331162-A11.0.0Rel-11Resolve Band 41 omission between R4-120125 and R4-121106 Details R4-121174 agreedRAN4#62-BISAnritsu Details RP-120782 approvedRAN#56R411.1.0TEI10