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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1332745-A12.5.0Rel-12Requirements for multicarrier handover from EUTRA to UTRA Details R4-146221 agreedRAN4#72-BISEricsson Details RP-142150 approvedRAN#66R412.6.0TEI11
See details 36.1332743-B12.5.0Rel-12Introduction of 2UL inter-band CA   Huawei Details RP-142021 approvedRAN#66Huawei12.6.0LTE_CA_2UL-A1-C...
See details 36.1332742-B12.5.0Rel-12Introduction of 2UL non-contiguous intra-band CA Details R4-148098 agreedRAN4#73Nokia Corporation Details RP-142186 approvedRAN#66R412.6.0LTE_CA_NC_2UL-Core
See details 36.1332741-B12.5.0Rel-12CR on parallel reporting criteria for eMBMS Details R4-147874 agreedRAN4#73Ericsson, Alcat... Details RP-142178 approvedRAN#66R412.6.0MBMS_LTE_OS-Core
See details 36.1332740-A12.5.0Rel-12Test case for inter-RAT HO to multicarrier UTRA Details R4-147457 agreedRAN4#73Ericsson Details RP-142149 approvedRAN#66R412.6.0TEI11
See details 36.1332738-A12.5.0Rel-12Corrections to E-UTRAN TDD RLM Out-of-sync under Time Domain Measurement Resource Restriction with CRS Assistance Information Details R4-147794 agreedRAN4#73ZTE, Anritsu Details RP-142149 approvedRAN#66R412.6.0TEI11
See details 36.1332736-A12.5.0Rel-12Corrections to E-UTRAN TDD RLM In-sync under Time Domain Measurement Resource Restriction with CRS assistance information Details R4-147792 agreedRAN4#73ZTE, Anritsu Details RP-142149 approvedRAN#66R412.6.0TEI11
See details 36.1332727-F12.5.0Rel-12RSTD accuracy requirements for smaller and larger bandwidths Details R4-147486 agreedRAN4#73Ericsson, AT&T,... Details RP-142188 approvedRAN#66R412.6.0TEI12
See details 36.13327251B12.5.0Rel-12Intra-frequency and inter-frequency measurement accuracy requirements with DMTC Details R4-147851 agreedRAN4#73Ericsson, ZTE Details RP-142179 approvedRAN#66R412.6.0LTE_SC_enh_L1-Core
See details 36.13327221B12.5.0Rel-12MBMS requirements in section 9 Details R4-147873 agreedRAN4#73Ericsson Details RP-142178 approvedRAN#66R412.6.0MBMS_LTE_OS-Core
See details 36.13327161F12.5.0Rel-12Different TDD configurations in CA Details R4-147902 agreedRAN4#73Ericsson, Huawe... Details RP-142161 approvedRAN#66R412.6.0LTE_CA-Core, LT...
See details 36.13327151B12.5.0Rel-12Requirements for increased carrier monitoring in RRC connected state 36.133 Details R4-147914 agreedRAN4#73Ericsson, Intel... Details RP-142172 approvedRAN#66R412.6.0LTE_UTRA_IncMon-Core
See details 36.13327141B12.5.0Rel-12Requirements for increased carrier monitoring for idle mode 36.133 Details R4-147913 agreedRAN4#73Ericsson, CATT,... Details RP-142172 approvedRAN#66R412.6.0LTE_UTRA_IncMon-Core
See details 36.13327121F12.5.0Rel-12Introduction of High Doppler measurement accuracy requierments Details R4-147901 agreedRAN4#73Ericsson, CATT Details RP-142188 approvedRAN#66R412.6.0TEI12
See details 36.13327101B12.5.0Rel-12CA RRM Testing for Fall back CA Configuration Details R4-147835 agreedRAN4#73Ericsson, Qualc... Details RP-142177 approvedRAN#66R412.6.0LTE_CA_TDD_FDD-Perf
See details 36.13327091B12.5.0Rel-12CA RRM Testing for Multiple Duplex Modes Details R4-147865 agreedRAN4#73Ericsson, CMCC Details RP-142177 approvedRAN#66R412.6.0LTE_CA_TDD_FDD-Perf
See details 36.13327081F12.5.0Rel-12UE Behaviour after Measurement Gap in CA Details R4-147829 agreedRAN4#73Ericsson, CATT,... Details RP-142158 approvedRAN#66R412.6.0LTE_CA_TDD_FDD-Core
See details 36.13327071F12.5.0Rel-12PCell Interruption in Rel-12 CA Details R4-147831 agreedRAN4#73Ericsson, Nokia... Details RP-142188 approvedRAN#66R412.6.0
See details 36.1332703-A12.5.0Rel-12CR on PRS Signal Levels in RSTD Reporting Tests for Carrier Aggregation Details R4-147378 agreedRAN4#73Spirent Communi... Details RP-142144 approvedRAN#66R412.6.0TEI10
See details 36.13326991B12.5.0Rel-12CR on measurement for MBSFN MDT Details R4-147872 agreedRAN4#73Nokia Network, ... Details RP-142178 approvedRAN#66R412.6.0MBMS_LTE_OS-Core
See details 36.13326981B12.5.0Rel-12Introduction of TDD-FDD CA test cases Details R4-147905 agreedRAN4#73Nokia Networks,... Details RP-142177 approvedRAN#66R412.6.0LTE_CA_TDD_FDD-Perf
See details 36.13326971B12.5.0Rel-12Measurement and reporting of BLER in section 9 Details R4-147875 agreedRAN4#73CATT Details RP-142178 approvedRAN#66R412.6.0MBMS_LTE_OS-Perf
See details 36.13326961B12.5.0Rel-12Introduction of measurement requirements for Dual Connectivity Details R4-147877 agreedRAN4#73NTT DOCOMO, INC. Details RP-142180 approvedRAN#66R412.6.0LTE_SC_enh_dual...
See details 36.13326951B12.5.0Rel-12Introduction of RRM requirements for Dual Connectivity Details R4-147853 agreedRAN4#73NTT DOCOMO, INC. Details RP-142180 approvedRAN#66R412.6.0LTE_SC_enh_dual...
See details 36.1332694-B12.5.0Rel-12CR for TS36.133 on Cell phase accuracy for Dual Connectivity Details R4-147252 agreedRAN4#73NTT DOCOMO, INC... Details RP-142180 approvedRAN#66R412.6.0LTE_SC_enh_dual...
See details 36.13326901F12.5.0Rel-12Ecat clarification for iRAT Details R4-147904 agreedRAN4#73Nokia Corporati... Details RP-142188 approvedRAN#66R412.6.0TEI12
See details 36.13326881B12.5.0Rel-12Introduction of RSRP measurement accuracy requirement for DRS based measurement Details R4-147852 agreedRAN4#73ZTE, Huawei, LGE Details RP-142179 approvedRAN#66R412.6.0LTE_SC_enh_L1-Core
See details 36.1332687-F12.5.0Rel-12Correction on E-UTRAN TDD - Non-Contention Based Random Access Test For Scell Details R4-147211 agreedRAN4#73Huawei, HiSilicon Details RP-142188 approvedRAN#66R412.6.0LTE_CA-Perf
See details 36.1332686-A12.5.0Rel-12Correction on CA test cases in R12 Details R4-147208 agreedRAN4#73Huawei, HiSilicon Details RP-142144 approvedRAN#66R412.6.0LTE_CA-Perf
See details 36.13326821F12.5.0Rel-12Introducing positioning enhancement requirement for UE Rx-Tx accuracy Details R4-148054 agreedRAN4#73Huawei, HiSilicon Details RP-142143 approvedRAN#66R412.6.0LCS_LTE
See details 36.1332679-F12.5.0Rel-12E-UTRAN TDD RSTD Measurement Accuracy in Carrier Aggregation for 20MHz+10MHz Details R4-147198 agreedRAN4#73Huawei, HiSilic... Details RP-142162 approvedRAN#66R412.6.0LTE_CA_C_B39-Perf
See details 36.13326781F12.5.0Rel-12TDD RSRQ for E-UTRAN Carrier Aggregation for 20MHz+10MHz Details R4-147903 agreedRAN4#73Huawei, HiSilic... Details RP-142162 approvedRAN#66R412.6.0LTE_CA_C_B39-Perf
See details 36.1332677-F12.5.0Rel-12TDD RSRP for E-UTRAN Carrier Aggregation for 20MHz+10MHz Details R4-147196 agreedRAN4#73Huawei, HiSilic... Details RP-142162 approvedRAN#66R412.6.0LTE_CA_C_B39-Perf
See details 36.1332676-F12.5.0Rel-12E-UTRAN TDD RSTD Measurement Reporting Test Case for 20MHz+10MHz Details R4-147195 agreedRAN4#73Huawei, HiSilic... Details RP-142162 approvedRAN#66R412.6.0LTE_CA_C_B39-Perf
See details 36.1332675-F12.5.0Rel-12E-UTRAN TDD event triggered reporting on deactivating SCell with PCell interruption in non-DRX for 20MHz+10MHz Details R4-147194 agreedRAN4#73Huawei, HiSilicon Details RP-142162 approvedRAN#66R412.6.0LTE_CA_C_B39-Perf
See details 36.1332674-F12.5.0Rel-12E-UTRAN TDD event triggered reporting under deactivated SCell in non-DRX for 20MHz+10MHz Details R4-147193 agreedRAN4#73Huawei, HiSilic... Details RP-142162 approvedRAN#66R412.6.0LTE_CA_C_B39-Perf
See details 36.13326712B12.5.0Rel-12Introducing interruption requirements for dual connectivity into TS36.133 Details R4-148053 agreedRAN4#73Huawei, HiSilic... Details RP-142180 approvedRAN#66R412.6.0LTE_SC_enh_dual...
See details 36.13326701B12.5.0Rel-12Introducing requirements for small cell enhancement in TS36.133 Details R4-147850 agreedRAN4#73Huawei,HiSilicon Details RP-142179 approvedRAN#66R412.6.0LTE_SC_enh_L1-Core
See details 36.13326691F12.5.0Rel-12Introducing test case for TDD-TDD Inter-frequency event triggered reporting for TDD UL/DL configuration 0 Details R4-147861 agreedRAN4#73Huawei, HiSilicon, Details RP-142174 approvedRAN#66R412.6.0LTE_TDD_eIMTA-Perf
See details 36.1332666-F12.5.0Rel-12Introduce RLM requirements for LC-MTC in TS36.133 Details R4-147164 agreedRAN4#73Huawei, HiSilicon Details RP-142176 approvedRAN#66R412.6.0LC_MTC_LTE-Core
See details 36.1332665-F12.5.0Rel-12Correction on autonomous time adjustment in MTAG case Details R4-147163 agreedRAN4#73Huawei, HiSilicon Details RP-142144 approvedRAN#66R412.6.0LTE_CA-Core
See details 36.1332656-A12.5.0Rel-12Correction to RSTD Intra Frequency Delay Test Case Details R4-147019 agreedRAN4#73Samsung Details RP-142144 approvedRAN#66R412.6.0TEI10
See details 36.1332644-A12.5.0Rel-12Clarifications to RSTD values Details R4-146854 agreedRAN4#73Spirent Communi... Details RP-142144 approvedRAN#66R412.6.0TEI10
See details 36.1332640-F12.5.0Rel-12Revision of RSRP absolute accuracy requirements in Rel-12 Details R4-146656 agreedRAN4#72-BISCMCC Details RP-142188 approvedRAN#66R412.6.0TEI12
See details 36.1332639-F12.5.0Rel-12Changes to RSTD CA Reporting Delay tests Details R4-146630 agreedRAN4#72-BISSpirent Communi... Details RP-142144 approvedRAN#66R412.6.0TEI10
See details 36.1332630-B12.5.0Rel-12SI reading requirements for UE category 0 with 1 Rx in FDD, TDD and HD-FDD Details R4-146422 agreedRAN4#72-BISEricsson Details RP-142176 approvedRAN#66R412.6.0LC_MTC_LTE-Core
See details 36.13326191B12.5.0Rel-12RSRP accuracy test cases for TDD-FDD CA Details R4-146645 agreedRAN4#72-BISEricsson, Huawe... Details RP-142177 approvedRAN#66R412.6.0LTE_CA_TDD_FDD-Perf
See details 36.1332614-B12.5.0Rel-12RRM requirements for RSTD in 3 DL CA Details R4-146197 agreedRAN4#72-BISEricsson, Nokia... Details RP-142164 approvedRAN#66R412.6.0LTE_CA_B2_B5_B3...
See details 36.13326111F12.5.0Rel-12Interruptions with RSTD Measurements for 3DL CA Details R4-146678 agreedRAN4#72-BISAlcatel-Lucent,... Details RP-142164 approvedRAN#66R412.6.0LTE_CA_B1_B19_B...
See details 36.13326061F12.5.0Rel-12Clarification of parallel reporting criteria (E-UTRA) Details R4-146619 agreedRAN4#72-BISNokia Corporati... Details RP-142188 approvedRAN#66R412.6.0TEI12
See details 36.1332599-F12.5.0Rel-12Range increase for RSRQ Details R4-146061 agreedRAN4#72-BISHuawei, HiSilicon Details RP-142188 approvedRAN#66R412.6.0TEI12
See details 36.1332598-F12.5.0Rel-12Correction on Io value in CA 10MHz+5MHz RSRQ test case R12 Details R4-146060 agreedRAN4#72-BISHuawei, HiSilicon Details RP-142163 approvedRAN#66R412.6.0LTE_CA_NC_B23-Perf
See details 36.1332597-A12.5.0Rel-12Correction on Io value in CA 20MHz RSRQ test case R12 Details R4-146059 agreedRAN4#72-BISHuawei, HiSilicon Details RP-142147 approvedRAN#66R412.6.0LTE_CA-Perf
See details 36.13325861B12.5.0Rel-12RSRQ accuracy test case in TDD-FDD CA when Pcell is TDD R12 Details R4-146644 agreedRAN4#72-BISHuawei, HiSilic... Details RP-142177 approvedRAN#66R412.6.0LTE_CA_TDD_FDD-Perf
See details 36.13325851B12.5.0Rel-12RSRQ accuracy test case in TDD-FDD CA when Pcell is FDD R12 Details R4-146643 agreedRAN4#72-BISHuawei, HiSilic... Details RP-142177 approvedRAN#66R412.6.0LTE_CA_TDD_FDD-Perf
See details 36.13325732F12.5.0Rel-12Clarification on cell identification for TDD config 0 Details R4-146700 agreedRAN4#72-BISHuawei, HiSilicon Details RP-142157 approvedRAN#66R412.6.0LTE_TDD_eIMTA-Core
See details 36.1332569-A12.5.0Rel-12SCell activation and deactivation delay test case for unknown SCell R12 Details R4-145990 agreedRAN4#72-BISHuawei, HiSilic... Details RP-142144 approvedRAN#66R412.6.0LTE_CA-Perf
See details 36.1332566-A12.5.0Rel-12Correction to ABS pattern and CRS Es/Iot in feICIC RRM test cases Details R4-145987 agreedRAN4#72-BISAnritsu Details RP-142147 approvedRAN#66R412.6.0eICIC_enh_LTE-Perf
See details 36.13325561F12.5.0Rel-12CR on inter frequency RSRQ test case for eIMTA Details R4-146639 agreedRAN4#72-BISLG Electronics,... Details RP-142174 approvedRAN#66R412.6.0LTE_TDD_eIMTA-Perf
See details 36.13325551F12.5.0Rel-12CR on inter frequency RSRP test case for eIMTA Details R4-146638 agreedRAN4#72-BISLG Electronics,... Details RP-142174 approvedRAN#66R412.6.0LTE_TDD_eIMTA-Perf
See details 36.13325531A12.5.0Rel-12Clarification on time to identify the target UTRA TDD cell for blind redirection from E-UTRA to UTRA TDD Details R4-146613 agreedRAN4#72-BISRAN4 Details RP-142144 approvedRAN#66R412.6.0TEI10
See details 36.13325471F12.5.0Rel-12Intrudutcion of PDSCH FRC for TDD UL-DL configuration 0 Details R4-146637 agreedRAN4#72-BISCATT Details RP-142174 approvedRAN#66R412.6.0LTE_TDD_eIMTA-Perf
See details 36.1332538-A12.5.0Rel-12Correction of Es/Noc values in inter-frequency RSTD tests Details R4-145608 agreedRAN4#72-BISSpirent Communi... Details RP-142144 approvedRAN#66R412.6.0TEI10
See details 36.1332534-A12.5.0Rel-12Correction of PRS Signal Levels in RSTD Reporting Tests Details R4-145597 agreedRAN4#72-BISQualcomm Incorp... Details RP-142143 approvedRAN#66R412.6.0LCS_LTE
See details 36.13325063B12.5.0Rel-12Measurements requirements for UE category 0 with 1 Rx Details R4-147421 agreedRAN4#73Ericsson, Huawe... Details RP-142176 approvedRAN#66R412.6.0LC_MTC_LTE-Core
See details 36.13324842F12.5.0Rel-12Introducing measurement accuracy requirements for UE category 0 in TS36.133 Clause 9 Details R4-146659 agreedRAN4#72-BISHuawei, HiSilicon Details RP-142176 approvedRAN#66R412.6.0LC_MTC_LTE-Core