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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1332420-F10.14.0Rel-10Clean up the correction on PDSCH allocation in PRS subframe R10 Details R4-143300 agreedRAN4#71Huawei, HiSilicon Details RP-140911 approvedRAN#64R410.15.0LTE-RF
See details 36.1332409-F10.14.0Rel-10Correction for RSTD Measurement Accuracy in CA in RRM tests R10 Details R4-143268 agreedRAN4#71Huawei, HiSilicon Details RP-140911 approvedRAN#64R410.15.0LTE-RF
See details 36.1332380-F10.14.0Rel-10RRM: Remove square brackets from eICIC RLM test requirement (Rel-10) Details R4-142816 agreedRAN4#71Rohde & Schwarz Details RP-140911 approvedRAN#64R410.15.0eICIC_LTE-Perf
See details 36.1332377-F10.14.0Rel-10Correction to periodicity of ABS pattern in eICIC RRM test cases Details R4-142800 agreedRAN4#71Anritsu Details RP-140911 approvedRAN#64R410.15.0eICIC_LTE-Perf
See details 36.1332367-D10.14.0Rel-10Editorial Correction Details R4-142692 agreedRAN4#71Alcatel-Lucent Details RP-140911 approvedRAN#64R410.15.0TEI10
See details 36.1332358-F10.14.0Rel-10Test case corrections for eICIC Details R4-142254 agreedRAN4#70-BISEricsson, Intel Details RP-140911 approvedRAN#64R410.15.0eICIC_LTE-Core
See details 36.13323551F10.14.0Rel-10Editorial corrections RRM Details R4-142317 agreedRAN4#70-BISEricsson Details RP-140911 approvedRAN#64R410.15.0TEI10
See details 36.13323511F10.14.0Rel-10RSTD inter-frequency requirements applicability Details R4-142316 agreedRAN4#70-BISEricsson Details RP-140910 approvedRAN#64R410.15.0LCS_LTE
See details 36.13323272F10.14.0Rel-10SCell activation and deactivation delay test case for known SCell    Details RP-140741 approvedRAN#64Ericsson, CATT, ALU10.15.0LTE_CA-Core
See details 36.1332317-F10.14.0Rel-10Clarification on E-UTRAN TDD - UE Timing Advance Adjustment Accuracy Test R10 Details R4-141656 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140911 approvedRAN#64R410.15.0LTE-RF
See details 36.1332313-F10.14.0Rel-10Correction for OCNG pattern number in RRM tests R10 Details R4-141650 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140911 approvedRAN#64R410.15.0LTE-RF
See details 36.1332310-A10.14.0Rel-10Clarification on UE Transmit Timing Accuracy test cases in DRX mode R10 Details R4-141647 agreedRAN4#70-BISHuawei, HiSilic... Details RP-140910 approvedRAN#64R410.15.0LTE-RF
See details 36.1332300-F10.14.0Rel-10Introduce the CGI reading requirements in CA R10 Details R4-141627 agreedRAN4#70-BISHuawei, HiSilicon Details RP-140911 approvedRAN#64R410.15.0LTE-RF
See details 36.1332276-F10.14.0Rel-10Removing DPCH for handover from E-UTRAN to UTRA TDD for Rel-10 Details R4-141417 agreedRAN4#70-BISCATT, Ericsson Details RP-140911 approvedRAN#64R410.15.0LTE_CA-Core
See details 36.13322651F10.14.0Rel-10RRM: Clean-up of time offset between cells in RSTD tests (Rel-10) Details R4-142371 agreedRAN4#70-BISRohde & Schwarz Details RP-140910 approvedRAN#64R410.15.0LCS_LTE