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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 34.123-20724-F11.4.0Rel-11New ICS statement for DB-DC-HSDPA band configuration 4 (I&XI) and 5 (II&V) Details R5-145653 agreedRAN5#65Intel Corporation Details RP-142058 approvedRAN#66R511.5.0 2G
See details 34.123-20723-F11.4.0Rel-11Corrections to applicability of test case 15.8.4 Details R5-145652 agreedRAN5#65CATR Details RP-142053 approvedRAN#66R511.5.0TEI8_Test 2G
See details 34.123-20722-F11.4.0Rel-11Corrections in the Multiflow test case names Details R5-145642 agreedRAN5#65Nokia Networks Details RP-142072 approvedRAN#66R511.5.0HSDPA_MFTX-UEConTest 2G
See details 34.123-20721-F11.4.0Rel-11Change of release infromation for Feature pc_EUTRA Details R5-145519 agreedRAN5#657Layers Details RP-142053 approvedRAN#66R511.5.0TEI8_Test 2G
See details 34.123-20719-F11.4.0Rel-11Remove Applicability of Test Case 6.3.3.2 Details R5-145218 agreedRAN5#65Qualcomm Details RP-142053 approvedRAN#66R511.5.0TEI8_Test 2G
See details 34.123-20718-F11.4.0Rel-11Corrections to applicability conditions of NITZ test case Details R5-145089 agreedRAN5#65CATR Details RP-142053 approvedRAN#66R511.5.0TEI8_Test 2G
See details 34.123-20717-F11.4.0Rel-11Corrections to applicability of test case 15.9.2 Details R5-145088 agreedRAN5#65CATR Details RP-142053 approvedRAN#66R511.5.0TEI8_Test 2G
See details 34.123-20716-F11.4.0Rel-11Corrections to applicability of test case 15.8.7 Details R5-145087 agreedRAN5#65CATR Details RP-142053 approvedRAN#66R511.5.0TEI8_Test 2G