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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.521-31336-F12.7.0Rel-12Introduction of cell configuration mapping for Intra Frequency RSRP Accuracy for UE category 0 Test Cases Details R5-155776 agreedRAN5#69AT4 wireless S.A. Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-31335-F12.7.0Rel-12Introduction of test case 9.1.43.2 - TDD Intra Frequency Relative RSRP Accuracy for UE category 0 Details R5-155775 agreedRAN5#69AT4 wireless S.A. Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-31334-F12.7.0Rel-12Introduction of test case 9.1.43.1 - TDD Intra Frequency Absolute RSRP Accuracy for UE category 0 Details R5-155774 agreedRAN5#69AT4 wireless S.A. Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-31333-F12.7.0Rel-12Introduction of test case 9.1.42.2 - HD-FDD Intra Frequency Relative RSRP Accuracy for UE category 0 Details R5-155773 agreedRAN5#69AT4 wireless S.A. Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-31332-F12.7.0Rel-12Introduction of test case 9.1.42.1 - HD-FDD Intra Frequency Absolute RSRP Accuracy for UE category 0 Details R5-155772 agreedRAN5#69AT4 wireless S.A. Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-31331-F12.7.0Rel-12Introduction of test case 9.1.41.2 - FD-FDD Intra Frequency Relative RSRP Accuracy for UE category 0 Details R5-155771 agreedRAN5#69AT4 wireless S.A. Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-31330-F12.7.0Rel-12Introduction of test case 9.1.41.1 - FD-FDD Intra Frequency Absolute RSRP Accuracy for UE category 0 Details R5-155770 agreedRAN5#69AT4 wireless S.A. Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-31329-F12.7.0Rel-12Adding new RRM test case 8.16.36 for 3DL CA Details R5-155681 agreedRAN5#69Ericsson LM Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-31328-F12.7.0Rel-12Adding new RRM test case 8.16.35 for 3DL CA Details R5-155680 agreedRAN5#69Ericsson LM Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-313271F12.7.0Rel-12Updating 3DL CA test cases 8.16.29 and 8.16.30 Details R5-155869 agreedRAN5#69Ericsson LM Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-313261F12.7.0Rel-12Addition of UE transmit timing accuracy test case for PRoSe Direct discovery. Details R5-156015 agreedRAN5#69QUALCOMM UK Ltd Details RP-151705 approvedRAN#70RAN512.8.0LTE_D2D_Prox-UE...
See details 36.521-313251F12.7.0Rel-12Addition of new SCE-L1 RRM TC 8.22.4 E-UTRAN TDD-TDD inter-frequency event triggered reporting under fading propagation conditions in DRX based on CRS based discovery signal Details R5-156070 agreedRAN5#69Huawei Details RP-151709 approvedRAN#70RAN512.8.0LTE_SC_enh_L1-U...
See details 36.521-313241F12.7.0Rel-12Addition of new SCE-L1 RRM TC 8.22.3 E-UTRAN FDD-FDD inter-frequency event triggered reporting under fading propagation conditions in DRX based on CRS based discovery signal Details R5-156069 agreedRAN5#69Huawei Details RP-151709 approvedRAN#70RAN512.8.0LTE_SC_enh_L1-U...
See details 36.521-313231F12.7.0Rel-12Addition of new SCE-L1 RRM TC 8.22.2 E-UTRAN TDD-TDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells in DRX based on CRS based discovery signal Details R5-1561068 agreedRAN5#69Huawei Details RP-151709 approvedRAN#7012.8.0LTE_SC_enh_L1-U...
See details 36.521-313221F12.7.0Rel-12Addition of new SCE-L1 RRM TC 8.22.1 E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in synchronous cells in DRX based on CRS based discovery signal Details R5-156067 agreedRAN5#69Huawei Details RP-151709 approvedRAN#70RAN512.8.0LTE_SC_enh_L1-U...
See details 36.521-313211F12.7.0Rel-12Uncerts and Test Tols for TCs 8.16.31+8.16.32+8.16.33+8.16.34 36.521-3 CR Details R5-155880 agreedRAN5#69Huawei, Anritsu Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-313201F12.7.0Rel-12Introduction of new 3DL CA RRM test case TC 8.16.41 “3 DL FDD CA activation and deactivation of unknown SCell in non-DRX” Details R5-155868 agreedRAN5#697LAYERS GmbH Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-31319-F12.7.0Rel-12Incorrect Io values for eICIC tests Details R5-155574 agreedRAN5#69Rohde & Schwarz Details RP-151689 approvedRAN#70RAN512.8.0TEI10_Test
See details 36.521-313161F12.7.0Rel-12Addition of missing applicability release to test case 9.2.39 Details R5-155867 agreedRAN5#69Rohde & Schwarz Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-313151F12.7.0Rel-12Clarification on frequency swapping and references to connection diagrams in 3DL CA RRM test cases Details R5-155866 agreedRAN5#69Rohde & Schwarz Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-313141F12.7.0Rel-12Corrections to message contents for RRM 3DL CA TCs 8.16.27+8.16.28  RAN5#69ZTE Corporation Details RP-151700 approvedRAN#7012.8.0
See details 36.521-313131F12.7.0Rel-12Correction to message contents for RRM 3DL CA TC 9.2.41  RAN5#69ZTE Corporation Details RP-151700 approvedRAN#7012.8.0
See details 36.521-313111F12.7.0Rel-12Correction to 3DL CA RSRP/RSRQ test cases Details R5-156034 agreedRAN5#69Anritsu Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-31310-F12.7.0Rel-12Removable of wait time after activation of Scell Details R5-155437 agreedRAN5#69Anritsu Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-313091F12.7.0Rel-12Correction to test applicability in 3DL CA RRM test cases Details R5-155864 agreedRAN5#69Anritsu Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-313081F12.7.0Rel-12Update of Annex E for 3DL CA RRM Details R5-156033 agreedRAN5#69Anritsu Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-31307-F12.7.0Rel-12Update to 3DL PCell in FDD RSRQ for E-UTRAN in Carrier Aggregation Details R5-155429 agreedRAN5#69LG Electronics Inc. Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-31305-F12.7.0Rel-12Uncertainties and Test Tolerances for 3DL FDD RSRP for E-UTRAN in Carrier Aggregation Details R5-155427 agreedRAN5#69LG Electronics Inc. Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-31304-F12.7.0Rel-12Addition of cell configuration mapping for newly introduced MTC tests Details R5-155399 agreedRAN5#69Bureau Veritas Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-313012F12.7.0Rel-12Update of test applicabilities for R12 RRM cases in 36.521-3  RAN5#69CMCC Details RP-151696 approvedRAN#7012.8.0
See details 36.521-312991F12.7.0Rel-12Update of message contents for 3DL CA RSRP and RSRQ Accuracy tests Details R5-155863 agreedRAN5#69CMCC Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-312981F12.7.0Rel-12Update Test applicability for test case 7.1.7 and 7.2.5 Details R5-156009 agreedRAN5#69Bureau Veritas Details RP-151707 approvedRAN#70RAN512.8.0LTE_CA_Rel12_2U...
See details 36.521-31297-F12.7.0Rel-12Correction to test case 7.1.2 Details R5-155270 agreedRAN5#69Bureau Veritas Details RP-151684 approvedRAN#70RAN512.8.0TEI8_Test
See details 36.521-312961F12.7.0Rel-12Add new LC MTC test case 8.1.22 E-UTRAN HD - FDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps with DRX for UE category 0 Details R5-155899 agreedRAN5#69Tejet Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312951F12.7.0Rel-12Add new LC MTC test case 8.1.21 E-UTRAN HD - FDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps for UE category 0 Details R5-155898 agreedRAN5#69Tejet Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312941F12.7.0Rel-12Add new LC MTC test case  8.1.20 E-UTRAN FDD - FDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps with DRX for UE category 0. Details R5-155897 agreedRAN5#69Tejet Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312931F12.7.0Rel-12Add new LC MTC test case 8.1.19 E-UTRAN FD - FDD Intra-frequency identification of a new CGI of E-UTRA cell using autonomous gaps for UE category 0 Details R5-155896 agreedRAN5#69Tejet Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312921F12.7.0Rel-12Add new LC MTC test case 6.1.7 E-UTRAN HD-FDD Intra-frequency RRC Re-establishment for UE category 0category 0 Details R5-156054 agreedRAN5#69Tejet Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312911F12.7.0Rel-12Add new LC MTC test case 6.1.6 E-UTRAN FD-FDD Intra-frequency RRC Re-establishment for UE category 0 Details R5-156053 agreedRAN5#69Tejet Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312901F12.7.0Rel-12Uncertainties and Test Tolerances for 3DL E-UTRA for Carrier Aggregation RSRQ Accuracy Test cases Details R5-155879 agreedRAN5#69ANRITSU LTD, ZTE Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-312891F12.7.0Rel-12Uncertainties and Test Tolerances for 3DL E-UTRA for Carrier Aggregation RSRP Accuracy Test cases Details R5-156032 agreedRAN5#69ANRITSU LTD Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-312881F12.7.0Rel-12Uncertainties and Test Tolerances for 3DL CA Event Triggered Reporting under Deactivated SCells in Non-DRX Test cases Details R5-155878 agreedRAN5#69ANRITSU LTD Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-312871F12.7.0Rel-12Uncertainties and Test Tolerances for 2DL CA activation and deactivation of known SCell in non-DRX Test cases Details R5-155889 agreedRAN5#69ANRITSU LTD Details RP-151689 approvedRAN#70RAN512.8.0TEI10_Test
See details 36.521-31286-F12.7.0Rel-12Uncertainties and Test Tolerance for E-UTRAN TDD – UE Timing Advanced Adjustment Accuracy Test for SCell in sTAG Details R5-155197 agreedRAN5#69SGS Wireless, A... Details RP-151707 approvedRAN#70RAN512.8.0LTE_CA_Rel12_2U...
See details 36.521-312851F12.7.0Rel-12Update RSRQ and reported values for serving cell Intra Frequency Absolute RSRQ Accuracy Test cases Details R5-155888 agreedRAN5#69ANRITSU LTD Details RP-151689 approvedRAN#70RAN512.8.0TEI10_Test
See details 36.521-312841F12.7.0Rel-12Update to RSRP accuracy test cases for FDD-TDD CA Details R5-155862 agreedRAN5#69QUALCOMM UK Ltd Details RP-151700 approvedRAN#70RAN512.8.0LTE_CA_Rel12_3D...
See details 36.521-312831F12.7.0Rel-12Adding new MTC TDD RLM test case for in-sync in DRX Details R5-155839 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312821F12.7.0Rel-12Adding new MTC TDD RLM test case for out-of-sync in DRX Details R5-155838 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312811F12.7.0Rel-12Adding new MTC TDD RLM test case for in-sync Details R5-155837 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312801F12.7.0Rel-12Adding new MTC TDD RLM test case for out-of-sync Details R5-155836 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312791F12.7.0Rel-12Adding new MTC HD-FDD RLM test case for in-sync in DRX Details R5-155835 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312781F12.7.0Rel-12Adding new MTC HD-FDD RLM test case for out-of-sync in DRX Details R5-155834 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312771F12.7.0Rel-12Adding new MTC HD-FDD RLM test case for in-sync Details R5-155833 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312761F12.7.0Rel-12Adding new MTC HD-FDD RLM test case for out-of-sync Details R5-155832 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312751F12.7.0Rel-12Adding new MTC FD-FDD RLM test case for in-sync in DRX Details R5-155831 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312741F12.7.0Rel-12Adding new MTC FD-FDD RLM test case for out-of-sync in DRX Details R5-155830 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312731F12.7.0Rel-12Adding new MTC FD-FDD RLM test case for in-sync Details R5-155829 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312721F12.7.0Rel-12Adding new MTC FD-FDD RLM test case for out-of-sync and definition update Details R5-155828 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-31271-F12.7.0Rel-12Uncertainties and Test tolerances for Test case 8.20.4B Details R5-155149 agreedRAN5#69Rohde & Schwarz Details RP-151689 approvedRAN#70RAN512.8.0TEI10_Test
See details 36.521-31270-F12.7.0Rel-12Uncertainties and Test tolerances for Test case 8.20.4A Details R5-155147 agreedRAN5#69Rohde & Schwarz Details RP-151689 approvedRAN#70RAN512.8.0TEI10_Test
See details 36.521-31269-F12.7.0Rel-12Uncertainties and Test tolerances for Test case 8.20.2A Details R5-155145 agreedRAN5#69Rohde & Schwarz Details RP-151689 approvedRAN#70RAN512.8.0TEI10_Test
See details 36.521-31268-F12.7.0Rel-12Uncertainties and Test tolerances for Test cases 4.5.1.1 and 4.5.2.1 Details R5-155143 agreedRAN5#69Rohde & Schwarz Details RP-151684 approvedRAN#70RAN512.8.0TEI8_Test
See details 36.521-31267-F12.7.0Rel-12Uncertainties and Test tolerances for Test cases 4.4.1 and 4.4.2 Details R5-155141 agreedRAN5#69Rohde & Schwarz Details RP-151684 approvedRAN#70RAN512.8.0TEI8_Test
See details 36.521-31266-F12.7.0Rel-12Uncertainties and Test tolerances for Test cases 4.3.2 and 4.3.4.2 Details R5-155139 agreedRAN5#69Rohde & Schwarz Details RP-151687 approvedRAN#70RAN512.8.0TEI9_Test
See details 36.521-312651F12.7.0Rel-12Updating and aligning of RMC tables in TS36.521-3 Details R5-155806 agreedRAN5#69Ericsson LM Details RP-151713 approvedRAN#70RAN512.8.0TEI12_Test
See details 36.521-31264-F12.7.0Rel-12Adding abbreviations and SS HD-FDD testing information Details R5-155136 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-31263-F12.7.0Rel-12Adding RMCs for MTC to Annex A Details R5-155135 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-31262-F12.7.0Rel-12Updating Annex E and F with newly introduced test cases for MTC Details R5-155134 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312611F12.7.0Rel-12Adding new MTC handover test case 5.1.12 Details R5-155827 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312601F12.7.0Rel-12Adding new MTC handover test case 5.1.11 Details R5-155826 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312591F12.7.0Rel-12Adding new MTC handover test case 5.1.10 Details R5-155825 agreedRAN5#69Ericsson LM Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-31258-F12.7.0Rel-12Correction to test procedure of inter-frequency autonomous gaps test cases Details R5-155108 agreedRAN5#69QUALCOMM UK Ltd Details RP-151687 approvedRAN#70RAN512.8.0TEI9_Test
See details 36.521-312571F12.7.0Rel-12Updated to TC 7.1.4A Details R5-155881 agreedRAN5#69Bureau Veritas ... Details RP-151707 approvedRAN#70RAN512.8.0LTE_CA_Rel12_2U...
See details 36.521-312561F12.7.0Rel-12Update minimum requirements for test case 8.1.1 Details R5-155805 agreedRAN5#69Bureau Veritas ADT Details RP-151684 approvedRAN#70RAN512.8.0TEI8_Test
See details 36.521-312551F12.7.0Rel-12Introduction of new test case 8.1.18 MTC Details R5-155824 agreedRAN5#69Bureau Veritas ADT Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312541F12.7.0Rel-12Introduction of new test case 8.1.17 MTC Details R5-155823 agreedRAN5#69Bureau Veritas ADT Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312531F12.7.0Rel-12Introduction of new test case 8.1.13 MTC Details R5-155822 agreedRAN5#69Bureau Veritas ADT Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312521F12.7.0Rel-12Introduction of new test case 8.1.12 MTC Details R5-155821 agreedRAN5#69Bureau Veritas ADT Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312511F12.7.0Rel-12Introduction of new test case 8.1.11 MTC Details R5-156051 agreedRAN5#69Bureau Veritas ADT Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest
See details 36.521-312501F12.7.0Rel-12Introduction of new test case 6.1.8 MTC Details R5-155820 agreedRAN5#69Bureau Veritas ADT Details RP-151706 approvedRAN#70RAN512.8.0LC_MTC_LTE-UEConTest