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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.90400371F12.1.0Rel-12Update of NAICS demod TT analyses to clarify handling of flatness Details R5-162899 agreedRAN5#71ANRITSU LTD Details RP-160838 approvedRAN#72TSG WG RAN512.2.0LTE_NAICS-UEConTest
See details 36.9040036-F12.1.0Rel-12Add Test Tolerance analysis for Power Control Relative power tolerance for CA (intra-band contiguous DL CA and UL CA) test case Details R5-162173 agreedRAN5#71ANRITSU LTD Details RP-160856 approvedRAN#72TSG WG RAN512.2.0TEI10_Test
See details 36.90400351F12.1.0Rel-12Add Test Tolerance analysis for TDD PDSCH Closed Loop Single Layer Spatial Multiplexing 2x2 with TM4 Interference Model - Enhanced Details R5-162951 agreedRAN5#71MediaTek Inc. Details RP-160838 approvedRAN#72TSG WG RAN512.2.0LTE_NAICS-UEConTest
See details 36.90400341F12.1.0Rel-12Add Test Tolerance analysis for FDD PDSCH Closed Loop Single Layer Spatial Multiplexing 2x2 with TM4 Interference Model - Enhanced Performance Requirement Type B (8.2.1.4.4) Details R5-162950 agreedRAN5#71MediaTek Inc. Details RP-160838 approvedRAN#72TSG WG RAN512.2.0LTE_NAICS-UEConTest