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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.90500261F13.0.0Rel-1336.905 Addition of test points selection for 2UL inter-band CA spurious test cases Details R5-166110 agreedRAN5#72Keysight Techno... Details RP-161438 approvedRAN#73RAN513.1.0TEI11_Test, LTE...
See details 36.90500251F13.0.0Rel-13Test point analysis for NS_24 and NS_25 Details R5-166130 agreedRAN5#72Dish Network Details RP-161418 approvedRAN#73RAN513.1.0LTE_1980_2170_R...
See details 36.90500241F13.0.0Rel-13Change of test points and requirements for NS_05 A-MPR - Updates of test points analysis Details R5-166153 agreedRAN5#72KDDI Corporation Details RP-161427 approvedRAN#73RAN513.1.0TEI8_Test
See details 36.90500231F13.0.0Rel-13Addition of test point analysis for TC 7.3A.9 Reference sensitivity level for 4DL CA Details R5-166144 agreedRAN5#72NTT DOCOMO INC.... Details RP-161407 approvedRAN#73RAN513.1.0LTE_CA_Rel13-UE...
See details 36.90500191F13.0.0Rel-13Addition of test points analysis for CA_1A-3C to 36.905 Details R5-166146 agreedRAN5#72China Unicom Details RP-161407 approvedRAN#73RAN513.1.0LTE_CA_Rel13-UE...
See details 36.90500181F13.0.0Rel-13Introduction of test point analysis for CA_8A-42C (3DL) and test case 7.3A.5 Details R5-166032 agreedRAN5#72Ericsson, SoftBank Details RP-161407 approvedRAN#73RAN513.1.0LTE_CA_Rel13-UE...