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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.13339751B13.4.0Rel-13Correction of transmit timing for category M1    Details RP-161830 approvedRAN#73Intel Corporati...13.5.0LTE_MTCe2_L1-Core
See details 36.1333967-F13.4.0Rel-13Rx-Tx time difference reporting Details R4-166740 agreedRAN4#80Intel Corporation Details RP-161640 approvedRAN#73RAN413.5.0TEI13
See details 36.13339651F13.4.0Rel-13Corrections on TDD Radio Link Monitoring Test for In-sync for Cat-M1 UE in CEModeA Details R4-166768 agreedRAN4#80Qualcomm Incorp... Details RP-161781 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13339631F13.4.0Rel-13Corrections on TDD Radio Link Monitoring Test for Out-of-sync for Cat-M1 UE in CEModeA Details R4-166767 agreedRAN4#80Qualcomm Incorp... Details RP-161781 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13339611F13.4.0Rel-13Corrections on HD-FDD Radio Link Monitoring Test for In-sync for Cat-M1 UE in CEModeA Details R4-166766 agreedRAN4#80Qualcomm Incorp... Details RP-161781 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13339591F13.4.0Rel-13Corrections on FD-FDD Radio Link Monitoring Test for In-sync for Cat-M1 UE in CEModeA Details R4-166765 agreedRAN4#80Qualcomm Incorp... Details RP-161781 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13339571F13.4.0Rel-13Corrections on FD-FDD Radio Link Monitoring Test for Out-of-sync for Cat-M1 UE in CEModeA Details R4-166764 agreedRAN4#80Qualcomm Incorp... Details RP-161781 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.1333953-F13.4.0Rel-13Correction to Radio Link Monitoring Requirements for NB-IoT Details R4-166554 agreedRAN4#80Qualcomm Incorp... Details RP-161637 approvedRAN#73RAN413.5.0NB_IOT-Core
See details 36.1333950-F13.4.0Rel-13Correction CR on UE Measurement Capability for NB-IOT Details R4-166510 agreedRAN4#80Qualcomm Incorp... Details RP-161637 approvedRAN#73RAN413.5.0NB_IOT-Core
See details 36.13339461B13.4.0Rel-13HD-FDD Radio Link Monitoring Test for Out-of-sync for Cat-M1 UE in CEModeA Details R4-166763 agreedRAN4#80Qualcomm Incorp... Details RP-161781 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13339441B13.4.0Rel-13E-UTRAN UE Timing Advance Adjustment Accuracy Test for NB-IoT UE in Enhanced Coverage Details R4-166692 agreedRAN4#80Ericsson, Huawe... Details RP-161609 approvedRAN#73RAN413.5.0NB_IOT-Perf
See details 36.13339331B13.4.0Rel-13Intra-frequency absolute and relative CSI-RSRP accuracies for SCell with FS3 Details R4-166838 agreedRAN4#80Nokia, Anritsu Details RP-161614 approvedRAN#73RAN413.5.0LTE_LAA-Perf
See details 36.1333932-B13.4.0Rel-13Inter-frequency event triggered reporting Details R4-166409 agreedRAN4#80Nokia Details RP-161614 approvedRAN#73RAN413.5.0LTE_LAA-Perf
See details 36.13339311B13.4.0Rel-13CR on eD2D RRM tests Details R4-166751 agreedRAN4#80Qualcomm Incorp... Details RP-161611 approvedRAN#73RAN413.5.0LTE_eD2D_Prox-Perf
See details 36.1333929-A13.4.0Rel-13CR for correction to some parameters in D2D RRM tests Details R4-166244 agreedRAN4#80Qualcomm Incorp... Details RP-161634 approvedRAN#73RAN413.5.0LTE_D2D_Prox-Perf
See details 36.13339241B13.4.0Rel-13CR OCNG pattern for in-band RRM tests Details R4-166676 agreedRAN4#80Ericsson Details RP-161780 approvedRAN#73RAN413.5.0NB_IOT-Perf
See details 36.1333922-A13.4.0Rel-13CR of test principle for DC test cases with different bandwidth combinations R13 Details R4-166089 agreedRAN4#80Huawei, HiSilicon Details RP-161784 approvedRAN#73RAN413.5.0TEI12
See details 36.13339191F13.4.0Rel-13Modification on Conditions for NB-IoT inter-frequency Accuracy Requirements for UE Category NB1 R13 Details R4-166648 agreedRAN4#80Huawei, HiSilicon Details RP-161609 approvedRAN#73RAN413.5.0NB_IOT-Perf
See details 36.1333917-B13.4.0Rel-13Introduce inter-frequency NRSRQ measurement accuracy requirement R13 Details R4-166084 agreedRAN4#80Huawei, HiSilicon Details RP-161609 approvedRAN#73RAN413.5.0NB_IOT-Perf
See details 36.13339131B13.4.0Rel-13CR of OCNG pattern for guard band for NB-IoT test cases Details R4-167111 agreedRAN4#80Huawei, HiSilicon Details RP-161780 approvedRAN#73RAN413.5.0NB_IOT-Perf
See details 36.1333912-B13.4.0Rel-13Draft CR: RMCs for NPDCCH RMCs for standalone and guard band NB-IoT test cases Details R4-166077 agreedRAN4#80Huawei, HiSilicon Details RP-161609 approvedRAN#73RAN413.5.0NB_IOT-Perf
See details 36.1333911-B13.4.0Rel-13Draft CR: RMCs for NPDCCH RMCs for standalone and guard band NB-IoT test cases Details R4-166076 agreedRAN4#80Huawei, HiSilicon Details RP-161609 approvedRAN#73RAN413.5.0NB_IOT-Perf
See details 36.13339093B13.4.0Rel-13HD-FDD Inter-frequency RRC Re-establishment for UE category NB1 under enhanced coverage R13 Details R4-167082 agreedRAN4#80Huawei, HiSilicon Details RP-161609 approvedRAN#73RAN413.5.0NB_IOT-Perf
See details 36.13339073B13.4.0Rel-13HD-FDD Intra-frequency RRC Re-establishment for UE category NB1 under normal coverage R13 Details R4-167081 agreedRAN4#80Huawei, HiSilicon Details RP-161609 approvedRAN#73RAN413.5.0NB_IOT-Perf
See details 36.13339051B13.4.0Rel-13CR for OCNG pattern for NB-IoT standalone operation R13 Details R4-166655 agreedRAN4#80Huawei, HiSilicon Details RP-161780 approvedRAN#73RAN413.5.0NB_IOT-Perf
See details 36.13339031F13.4.0Rel-13CR for Conditions on NSCH s/Iot of identified and of the neighbour cell R13 Details R4-166651 agreedRAN4#80Huawei, HiSilicon Details RP-161637 approvedRAN#73RAN413.5.0NB_IOT-Core
See details 36.13338991F13.4.0Rel-13Modification on requirement of measurement in RRC_CONNECTED for NB-IoT R13 Details R4-167113 revisedRAN4#80Huawei, HiSilicon Details RP-161637 approvedRAN#73RAN413.5.0NB_IOT-Core
See details 36.13338912F13.4.0Rel-13CR for NB-IoT RRC re-establishment R13 Details R4-167066 agreedRAN4#80Huawei, HiSilicon Details RP-161637 approvedRAN#73RAN413.5.0NB_IOT-Core
See details 36.1333889-F13.4.0Rel-13Correction on UE Category M1 measurement requirement R13 Details R4-166040 agreedRAN4#80Huawei, HiSilicon, Details RP-161639 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Core
See details 36.1333885-F13.4.0Rel-13CGI requirement for eMTC R13 Details R4-166036 agreedRAN4#80Huawei, HiSilic... Details RP-161639 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Core
See details 36.13338831F13.4.0Rel-13CR on eMTC maintenance R13 Details R4-166758 agreedRAN4#80Huawei, HiSilicon Details RP-161639 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Core
See details 36.13338771F13.4.0Rel-13CR on PRACH configuration reference R13 Details R4-167014 agreedRAN4#80Huawei, HiSilicon Details RP-161782 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13338751B13.4.0Rel-13RSRP Intra frequency case for Cat-M1 UE in CEModeB R13 Details R4-167013 agreedRAN4#80Huawei, HiSilicon, Details RP-161610 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13338731B13.4.0Rel-13E-UTRAN TDD-TDD intra-frequency event triggered reporting under fading propagation conditions for Cat-M1 UE in CEModeB R13 Details R4-167012 agreedRAN4#80Huawei, HiSilicon, Details RP-161610 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13338711B13.4.0Rel-13E-UTRAN HD-FDD intra-frequency event triggered reporting under fading propagation conditions for Cat-M1 UE in CEModeB R13 Details R4-167011 agreedRAN4#80Huawei, HiSilicon Details RP-161610 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13338691B13.4.0Rel-13E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions for Cat-M1 UE in CEModeB R13 Details R4-167010 agreedRAN4#80Huawei, HiSilicon Details RP-161610 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13338671B13.4.0Rel-13E-UTRAN Intra frequency case for Cat-M1 UE in enhanced coverage R13 Details R4-166769 agreedRAN4#80Huawei, HiSilicon Details RP-161610 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.1333865-A13.4.0Rel-13Correction on accuracy test cases for CRS based measurement R13 Details R4-166005 agreedRAN4#80Huawei Details RP-161785 approvedRAN#73RAN413.5.0LTE_SC_enh_L1-Perf
See details 36.1333862-F13.4.0Rel-13Correction of Band group for TDD SCE test R13 Details R4-166002 agreedRAN4#80Huawei, HiSilicon Details RP-161785 approvedRAN#73RAN413.5.0LTE_SC_enh_L1-Perf
See details 36.1333859-A13.4.0Rel-13Correction ondiscovery signal conditions for SCE R13 Details R4-165999 agreedRAN4#80Huawei, HiSilicon Details RP-161785 approvedRAN#73RAN413.5.0LTE_SC_enh_L1-Perf
See details 36.1333856-A13.4.0Rel-13Modification on CSI-RS related CA test cases R13 Details R4-165996 agreedRAN4#80Huawei, HiSilicon, Details RP-161785 approvedRAN#73RAN413.5.0LTE_SC_enh_L1-Perf
See details 36.1333853-A13.4.0Rel-13Modification on inter-frequency CSI-RS related test cases R13 Details R4-165993 agreedRAN4#80Huawei, HiSilicon, Details RP-161785 approvedRAN#73RAN413.5.0LTE_SC_enh_L1-Perf
See details 36.13338472F13.4.0Rel-13Correction on discovery signal conditions in LAA R13 Details R4-167160 agreedRAN4#80Huawei, HiSilicon Details RP-161638 approvedRAN#73RAN413.5.0LTE_LAA-Core
See details 36.13338451F13.4.0Rel-13CR on inter-frequency infinite measurement in LAA R13 Details R4-166813 agreedRAN4#80Huawei, HiSilicon Details RP-161638 approvedRAN#73RAN413.5.0LTE_LAA-Core
See details 36.1333843-B13.4.0Rel-13Intra-frequency event triggered reporting under fading propagation conditions in synchronous cells in DRX based on CRS under Operation with Frame Structure 3 Details R4-165977 agreedRAN4#80Huawei, HiSilicon Details RP-161614 approvedRAN#73RAN413.5.0LTE_LAA-Perf
See details 36.1333841-B13.4.0Rel-13Intra-frequency event triggered reporting under fading propagation conditions in synchronous cells in non-DRX based on CRS under Operation with Frame Structure 3 Details R4-165975 agreedRAN4#80Huawei, HiSilicon Details RP-161614 approvedRAN#73RAN413.5.0LTE_LAA-Perf
See details 36.1333839-F13.4.0Rel-13Editorial correction on LAA measurement requirements Details R4-165973 agreedRAN4#80Huawei, HiSilicon Details RP-161638 approvedRAN#73RAN413.5.0LTE_LAA-Core
See details 36.1333837-B13.4.0Rel-13Difinition and abbreviation of frame structure 3 Details R4-165971 agreedRAN4#80Huawei, HiSilicon Details RP-161638 approvedRAN#73RAN413.5.0LTE_LAA-Core
See details 36.13338332B13.4.0Rel-13CR on TDD-TDD inter-frequency RS-SINR accuracy test case R13 Details R4-167163 agreedRAN4#80Huawei, HiSilicon, Details RP-161612 approvedRAN#73RAN413.5.0LTE_MC_load-Perf
See details 36.13338312B13.4.0Rel-13CR on FDD-FDD inter-frequency RS-SINR accuracy test case R13 Details R4-167162 agreedRAN4#80Huawei, HiSilicon, Details RP-161612 approvedRAN#73RAN413.5.0LTE_MC_load-Perf
See details 36.1333827-A13.4.0Rel-13Correction to DL RMCs for Cell1 in A 8.16.25 Details R4-165885 agreedRAN4#80Anritsu Details RP-161635 approvedRAN#73RAN413.5.0LTE_CA_B1_B40-Perf
See details 36.13338212B13.4.0Rel-13Power headroom reporting requirements Details R4-167119 agreedRAN4#80Ericsson Details RP-161609 approvedRAN#73RAN413.5.0NB_IOT-Perf
See details 36.1333800-B13.4.0Rel-13RRC Re-establishment test for eMTC UEs in CEModeB Details R4-165852 agreedRAN4#80Ericsson Details RP-161610 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13337951B13.4.0Rel-13E-UTRAN UE Transmit Timing Accuracy Tests for Cat-M1 UE in CEModeB Details R4-166773 agreedRAN4#80Ericsson Details RP-161610 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13337941F13.4.0Rel-13Resolving TBDs in HD-FDD RLM test-cases for Rel-12 category 0 UEs Details R4-167042 agreedRAN4#80Ericsson Details RP-161634 approvedRAN#73RAN413.5.0LC_MTC_LTE-Core
See details 36.1333790-B13.4.0Rel-13RMCs for NPDSCH and NPDCCH for in-band for NB-IoT test cases Details R4-165816 agreedRAN4#80NTT DOCOMO, INC. Details RP-161609 approvedRAN#73RAN413.5.0NB_IOT-Perf
See details 36.1333786-F13.4.0Rel-13Correction to Band 66 notes in E-UTRA band groups in Rel-13 Details R4-165805 agreedRAN4#80Dish Network Details RP-161635 approvedRAN#73RAN413.5.0LTE_AWS_EXT
See details 36.1333784-A13.4.0Rel-13Correction to RSTD Test Cases for 1.4 MHz Details R4-165778 agreedRAN4#80Qualcomm Incorp... Details RP-161631 approvedRAN#73RAN413.5.0LCS_LTE, TEI9
See details 36.1333772-B13.4.0Rel-13Event triggered reporting on LAA deactivated SCells and interruption probability (0.5%) without DRX Details R4-165731 agreedRAN4#80CATT, CATR Details RP-161783 approvedRAN#73RAN413.5.0LTE_LAA-Perf
See details 36.1333770-B13.4.0Rel-13LAA SCell activation and deactivation for known SCells without DRX Details R4-165729 agreedRAN4#80CATT, CATR Details RP-161614 approvedRAN#73RAN413.5.0LTE_LAA-Perf
See details 36.13337681F13.4.0Rel-13Editing change in TS36.133 for Rel-13 Details R4-166647 agreedRAN4#80CATT Details RP-161636 approvedRAN#73RAN413.5.0NB_IOT-Core
See details 36.1333766-F13.4.0Rel-13CR on modification on report mapping of TADV measurement in TS36.133 for Rel-13 Details R4-165718 agreedRAN4#80CATT Details RP-161640 approvedRAN#73RAN413.5.0TEI13
See details 36.13337601B13.4.0Rel-13CR for Cat-M1 CEMode A RLM test cases: DRX TDD Details R4-166762 agreedRAN4#80Nokia Details RP-161781 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13337581B13.4.0Rel-13CR for Cat-M1 CEMode A RLM test cases: DRX HD-FDD Details R4-166761 agreedRAN4#80Nokia Details RP-161781 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13337561B13.4.0Rel-13CR for Cat-M1 CEMode A RLM test cases: DRX FDD Details R4-166760 agreedRAN4#80Nokia Details RP-161781 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.1333750-B13.4.0Rel-13CR of TDD intrafrequency RSRQ meaurement accuracy test for SCell with FS3 Details R4-165618 agreedRAN4#80LG Electronics Details RP-161783 approvedRAN#73RAN413.5.0LTE_LAA-Perf
See details 36.1333749-B13.4.0Rel-13CR of FDD intrafrequency RSRQ meaurement accuracy test for SCell with FS3 Details R4-165617 agreedRAN4#80LG Electronics Details RP-161783 approvedRAN#73RAN413.5.0LTE_LAA-Perf
See details 36.1333748-B13.4.0Rel-13CR of TDD intrafrequency absolute and relative RSRP accuracy test for SCell with FS3 Details R4-165616 agreedRAN4#80LG Electronics Details RP-161783 approvedRAN#73RAN413.5.0LTE_LAA-Perf
See details 36.1333747-B13.4.0Rel-13CR of FDD intrafrequency absolute and relative RSRP accuracy test for SCell with FS3 Details R4-165615 agreedRAN4#80LG Electronics Details RP-161783 approvedRAN#73RAN413.5.0LTE_LAA-Perf
See details 36.13337421F13.4.0Rel-13CR on RS-SINR measurement accuracy requirements Details R4-166744 agreedRAN4#80ZTE, CMCC Details RP-161612 approvedRAN#73RAN413.5.0LTE_MC_load-Perf
See details 36.13337392B13.4.0Rel-13CR on RS-SINR FDD-TDD inter-frequency accuracy test case Details R4-167036 agreedRAN4#80ZTE Details RP-161612 approvedRAN#73RAN413.5.0LTE_MC_load-Perf
See details 36.13337383B13.4.0Rel-13CR on RS-SINR TDD-FDD inter-frequency accuracy test case Details R4-167164 agreedRAN4#80ZTE Details RP-161612 approvedRAN#73RAN413.5.0LTE_MC_load-Perf
See details 36.13337281B13.4.0Rel-13CR: Cat-M1 PRACH test cases for TDD in Enhanced Coverage Details R4-166772 agreedRAN4#80Nokia Details RP-161782 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13337261B13.4.0Rel-13CR: Cat-M1 PRACH test cases for HD-FDD in Enhanced Coverage Details R4-166771 agreedRAN4#80Nokia Details RP-161782 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.13337241B13.4.0Rel-13CR: Cat-M1 PRACH test cases for FDD in Enhanced Coverage Details R4-166770 agreedRAN4#80Nokia Details RP-161782 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.1333720-F13.4.0Rel-13CR: Correction of Transmit Timing Accuracy Tests for Cat-M1 UE in CEModeA Details R4-165428 agreedRAN4#80Nokia Details RP-161610 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.1333718-F13.4.0Rel-13CR: Correction of Cat-M1 Intra-frequency handover test cases for CEModeA Details R4-165426 agreedRAN4#80Nokia Details RP-161610 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf
See details 36.1333714-F13.4.0Rel-13CR: Correction of E-CID RSRP measurement requirements for Cat-M1 UEs Details R4-165421 agreedRAN4#80Nokia Details RP-161639 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Core
See details 36.1333708-F13.4.0Rel-13CR: Corrections on Section 4.6 "Cell Selection and Re-selection Requirements for UE category NB1" Details R4-165414 agreedRAN4#80Nokia Details RP-161639 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Core
See details 36.1333706-B13.4.0Rel-13CR: Reference NPRACH Configuration for NB-IoT RRM test cases Details R4-165412 agreedRAN4#80Nokia Details RP-161780 approvedRAN#73RAN413.5.0NB_IOT-Perf
See details 36.1333704-B13.4.0Rel-13Channel occupancy accuracy requirements Details R4-165300 agreedRAN4#80Ericsson, Anritsu Details RP-161783 approvedRAN#73RAN413.5.0LTE_LAA-Perf
See details 36.13337022F13.4.0Rel-13Known cell requirements Details R4-167154 agreedRAN4#80Ericsson Details RP-161638 approvedRAN#73RAN413.5.0LTE_LAA-Core
See details 36.13336981F13.4.0Rel-13Applicability of intra-frequency maximum measurement time requirements Details R4-166833 agreedRAN4#80Ericsson Details RP-161638 approvedRAN#73RAN413.5.0LTE_LAA-Core
See details 36.13336961B13.4.0Rel-13Intra-frequency TDD test cases for RS-SINR Details R4-166746 agreedRAN4#80Ericsson Details RP-161612 approvedRAN#73RAN413.5.0LTE_MC_load-Perf
See details 36.13336941B13.4.0Rel-13Intra-frequency FDD test cases for RS-SINR Details R4-166745 agreedRAN4#80Ericsson Details RP-161612 approvedRAN#73RAN413.5.0LTE_MC_load-Perf
See details 36.1333688-B13.4.0Rel-13LAA Average RSSI accuracy test Details R4-165121 agreedRAN4#80Ericsson Details RP-161614 approvedRAN#73RAN413.5.0LTE_LAA-Perf
See details 36.13336861B13.4.0Rel-13LBT model for LAA RRM tests Details R4-166784 agreedRAN4#80Ericsson Details RP-161783 approvedRAN#73RAN413.5.0LTE_LAA-Perf
See details 36.1333684-B13.4.0Rel-13LAA channel occupancy test Details R4-165117 agreedRAN4#80Ericsson Details RP-161614 approvedRAN#73RAN413.5.0LTE_LAA-Perf
See details 36.1333682-F13.4.0Rel-13Square bracket removal for RLM antenna connection for 4 Rx capable UEs Details R4-165108 agreedRAN4#80Ericsson Details RP-161613 approvedRAN#73RAN413.5.0LTE_4Rx_AP_DL-Perf
See details 36.1333680-F13.4.0Rel-13Duration of T3 in RRM 4DL/5DL Test cases A.8.16.55, A.8.16.56, A.8.16.73, A.8.16.74. Details R4-164999 agreedRAN4#80Anritsu Details RP-161631 approvedRAN#73RAN413.5.0TEI9
See details 36.1333678-A13.4.0Rel-13Duration of T3 in RRM 3DL Test cases A.8.16.31, A.8.16.32, A.8.16.33, A.8.16.34. Details R4-164992 agreedRAN4#80Anritsu Details RP-161634 approvedRAN#73RAN413.5.0LTE_CA_B1_B3_B5-Perf
See details 36.13333762B13.4.0Rel-13CR: OCNG patterns for Cat-M1 RRM Tests Details R4-166759 agreedRAN4#80Nokia Details RP-161610 approvedRAN#73RAN413.5.0LTE_MTCe2_L1-Perf