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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1334572-F12.14.0Rel-12PCC and SCC assignment in 20MHz+10MHz test case A.8.16.21 and A.8.20.4B Details R4-1701611 agreedRAN4#82ANRITSU LTD Details RP-170582 approvedRAN#75RAN412.15.0LTE_CA_B39_B41-Perf
See details 36.1334548-F12.14.0Rel-12Correction of RMC reference in the cat-0 HD-FDD intra-frequency event-triggered reporting under fading propogation in asynchronous cells test Details R4-1701539 agreedRAN4#82Ericsson Details RP-170581 approvedRAN#75RAN412.15.0LC_MTC_LTE-Perf
See details 36.1334523-F12.14.0Rel-12Correction on SCE event triggered reporting for CSI-RS based test cases Details R4-1701444 agreedRAN4#82Huawei, HiSilicon Details RP-170584 approvedRAN#75RAN412.15.0LTE_SC_enh_L1-Perf
See details 36.1334511-F12.14.0Rel-12CR for the correction on the testcases of Proximity-based Services and measurement performance requirement in R12 Details R4-1701423 agreedRAN4#82Huawei, HiSilicon Details RP-170585 approvedRAN#75RAN412.15.0TEI12
See details 36.1334478-F12.14.0Rel-12Correction on test parameter in RSRP Intra frequency case for UE category 0 R12 Details R4-1701373 agreedRAN4#82Huawei, HiSilicon Details RP-170581 approvedRAN#75RAN412.15.0LC_MTC_LTE-Perf