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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 38.9050048-F15.0.0Rel-15Discussion on test point selection for EVM equalizer spectrum flatness for Pi/2 BPSK in FR1 Details R5-187593 agreedRAN5#81ROHDE & SCHWARZ Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050047-F15.0.0Rel-15Discussion on test point selection for EVM equalizer spectrum flatness in FR2 Details R5-187589 agreedRAN5#81ROHDE & SCHWARZ Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050046-F15.0.0Rel-15Discussion on test point selection for In-band Emissions in FR2 Details R5-187587 agreedRAN5#81ROHDE & SCHWARZ Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050045-F15.0.0Rel-15Update of test point selection for EVM equalizer spectrum flatness in FR1 Details R5-187584 agreedRAN5#81ROHDE & SCHWARZ Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050044-F15.0.0Rel-15Discussion on test point selection for Carrier Leakage in FR2 Details R5-187583 agreedRAN5#81ROHDE & SCHWARZ Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050043-F15.0.0Rel-15Discussion on test point selection for EVM in FR2 Details R5-187582 agreedRAN5#81ROHDE & SCHWARZ Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050042-F15.0.0Rel-15TP analysis for FR1 test case 6.3.4.3, relative power tolerance Details R5-187489 agreedRAN5#81Ericsson France Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.90500411F15.0.0Rel-15Test Point analysis for FR2 Maximum Output Power Details R5-188227 agreedRAN5#81Ericsson Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.90500391F15.0.0Rel-15Update of TR 38.905 with EN-DC A-MPR test point analyses, NS_04 Details R5-188240 agreedRAN5#81Ericsson-LG Co., LTD Details RP-182689 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050037-F15.0.0Rel-15Update of TR 38.905 with SA FR1 A-MPR test point analyses, NS_04 Details R5-187396 agreedRAN5#81Ericsson-LG Co., LTD Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.90500361F15.0.0Rel-15TP analysis for wideband intermodulation tests for FR1 SA Details R5-187809 agreedRAN5#81Anritsu Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.90500351F15.0.0Rel-15TP analysis for receiver spurious emission tests for FR1 SA Details R5-187808 agreedRAN5#81Anritsu Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.90500341F15.0.0Rel-15TP analysis for wideband intermodulation tests for FR1 inter-band EN-DC Details R5-187818 agreedRAN5#81Anritsu Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.90500331F15.0.0Rel-15TP analysis for receiver spurious emission tests for FR1 inter-band EN-DC Details R5-187817 agreedRAN5#81Anritsu Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050031-F15.0.0Rel-15Update test points analysis for multiple FR1 test cases Details R5-187035 agreedRAN5#81Huawei, HiSilic... Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050029-F15.0.0Rel-15TP analysis SEM intraband contiguous EN-DC Details R5-186792 agreedRAN5#81Keysight Techno... Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050028-F15.0.0Rel-15TP analysis OBW intraband contiguous EN-DC Details R5-186791 agreedRAN5#81Keysight Techno... Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.90500251F15.0.0Rel-15Test Point analysis for FR2 7.4 Maximum input level Details R5-187836 agreedRAN5#81CAICT, Huawei Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.90500241F15.0.0Rel-15Test Point analysis for FR1 MPR test case Details R5-187907 agreedRAN5#81CAICT, Huawei Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.90500231F15.0.0Rel-15Test Point analysis for FR1 7.4 Maximum input level Details R5-187806 agreedRAN5#81CAICT, Huawei Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050022-F15.0.0Rel-15TP analysis for test case 6.2B.2.4, UE Maximum Output Power reduction for Inter-Band EN-DC including FR2 Details R5-186710 agreedRAN5#81Ericsson Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050021-F15.0.0Rel-15Test point analysis for AMPR Intra-band contiguous EN-DC in FR1 for NS_35 Details R5-186674 agreedRAN5#81Ericsson-LG Co., LTD Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050020-F15.0.0Rel-15TP analysis for Reference sensitivity for Inter-band EN-DC with FR1 Details R5-186611 agreedRAN5#81Qualcomm Inc Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050019-F15.0.0Rel-15TP analysis for Reference sensitivity for Intra-band Contiguous EN-DC with FR1 Details R5-186610 agreedRAN5#81Qualcomm Inc Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050018-F15.0.0Rel-15TP_analysis for TX spurious emission UE co-existence for intra-band contiguous EN-DC with FR1 Details R5-186609 agreedRAN5#81Qualcomm Inc Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050017-F15.0.0Rel-15TP analysis for EN-DC test case 6.2B.2.3 Details R5-186455 agreedRAN5#81Ericsson Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest
See details 38.9050016-F15.0.0Rel-15TP analysis for test case 6.5.2.4.2 Details R5-186454 agreedRAN5#81Ericsson Details RP-182272 approvedRAN#82RAN515.1.05GS_NR_LTE-UEConTest