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 Spec #CR #Revision #CR CatImpacted VersionTarget ReleaseTitleWG TDoc #CR status at WGWG meeting refWG Source informationTSG TDoc #CR status at TSGTSG meeting refTSG Source informationNew VersionWork ItemsRemarks
See details 36.1336188-B15.4.0Rel-15CR on introducing test cases of interruptions due to V2X CA Details R4-1816764 agreedRAN4#89Huawei, HiSilicon Details RP-182369 approvedRAN#82RAN415.5.0LTE_eV2X-Perf
See details 36.1336187-B15.4.0Rel-15CR on introducing test cases of Synchronization Reference Source Selection/Reselection requirements for V2X CA Details R4-1816763 agreedRAN4#89Huawei, HiSilicon Details RP-182369 approvedRAN#82RAN415.5.0LTE_eV2X-Perf
See details 36.1336186-A15.4.0Rel-15Corrections to incmon testcases Details R4-1816762 agreedRAN4#89Ericsson Details RP-182379 approvedRAN#82RAN415.5.0LTE_UTRA_IncMon-Perf
See details 36.1336178-F15.4.0Rel-15Side conditions for inter-RAT NR measurements in non-EN-DC case Details R4-1815757 agreedRAN4#89Ericsson Details RP-182360 approvedRAN#82RAN415.5.0NR_newRAT-Core
See details 36.1336177-F15.4.0Rel-15Side conditions for inter-RAT NR measurements in EN-DC case Details R4-1815756 agreedRAN4#89Ericsson Details RP-182360 approvedRAN#82RAN415.5.0NR_newRAT-Core
See details 36.1336176-B15.4.0Rel-15Inter-RAT NR measurement accuracy requirements Details R4-1815755 agreedRAN4#89Ericsson Details RP-182362 approvedRAN#82RAN415.5.0NR_newRAT-Perf
See details 36.1336175-A15.4.0Rel-15Correction in FeMTC RSTD test cases Details R4-1815754 agreedRAN4#89Ericsson Details RP-182383 approvedRAN#82RAN415.5.0LTE_feMTC-Core
See details 36.13361732B15.4.0Rel-15Inter-frequency TDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Details R4-1816574 agreedRAN4#89Ericsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Perf
See details 36.13361721B15.4.0Rel-15Inter-frequency HD-FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Details R4-1816097 agreedRAN4#89Ericsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Perf
See details 36.13361711B15.4.0Rel-15Inter-frequency FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Details R4-1816096 agreedRAN4#89Ericsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Perf
See details 36.13361702B15.4.0Rel-15Intra-frequency TDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Details R4-1816573 agreedRAN4#89Ericsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Perf
See details 36.13361692B15.4.0Rel-15Intra-frequency HD-FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Details R4-1816572 agreedRAN4#89Ericsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Perf
See details 36.13361682B15.4.0Rel-15Intra-frequency FDD test cases for RSTD measurement period under new measurement gaps for CE Mode B Details R4-1816571 agreedRAN4#89Ericsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Perf
See details 36.13361671F15.4.0Rel-15Corrections in network-based CRS interference mitigation requirements Details R4-1816550 agreedRAN4#89Ericsson Details RP-182386 approvedRAN#82RAN415.5.0LTE_NW_CRS_IM-Core
See details 36.13361602F15.4.0Rel-15SIB5 reporting corrections for Idle Mode CA Measurement Details R4-1816567 agreedRAN4#89Ericsson Details RP-182386 approvedRAN#82RAN415.5.0LTE_euCA-Core
See details 36.13361582F15.4.0Rel-15Correction of side condition in FR2 handover in section 6.1.1 Details R4-1816584 agreedRAN4#89Ericsson Details RP-182360 approvedRAN#82RAN415.5.0NR_newRAT-Core
See details 36.13361572F15.4.0Rel-15Corrections to DRX cycle for EN-DC operation Details R4-1816580 agreedRAN4#89Ericsson Details RP-182360 approvedRAN#82RAN415.5.0NR_newRAT-Core
See details 36.13361561F15.4.0Rel-15Introduction of search window for 4ms MGL in LTE interfrequency requirements Details R4-1816142 agreedRAN4#89Ericsson Details RP-182360 approvedRAN#82RAN415.5.0NR_newRAT-Core
See details 36.13361551F15.4.0Rel-15Correction to CRS muting applicability in efeMTC Details R4-1816092 agreedRAN4#89Huawei, HiSilicon Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Core
See details 36.1336153-A15.4.0Rel-15Applicability of non-BL CE requriements for Cat-1bis Details R4-1815553 agreedRAN4#89Huawei, HiSilicon Details RP-182383 approvedRAN#82RAN415.5.0LTE_feMTC-Core
See details 36.1336149-A15.4.0Rel-15Clarification on the applicability of side condition for CE UE R15 Details R4-1815549 agreedRAN4#89Huawei, HiSilicon Details RP-182382 approvedRAN#82RAN415.5.0TEI13
See details 36.1336136-A15.4.0Rel-15Corrections on Conditions for Selection/Reselection to Intra-frequency SyncRef UE R15 Details R4-1815517 agreedRAN4#89Huawei, HiSilicon Details RP-182385 approvedRAN#82RAN415.5.0LTE_V2X-Perf
See details 36.1336134-A15.4.0Rel-15Corrections on V2X core requirements in TS36.133 R15 Details R4-1815515 agreedRAN4#89Huawei, HiSilicon Details RP-182385 approvedRAN#82RAN415.5.0LTE_V2X-Core
See details 36.13361321F15.4.0Rel-15Addition of missing Band 71 in 36.133 NB-IoT bands Details R4-1816055 agreedRAN4#89Dish Network Details RP-182386 approvedRAN#82RAN415.5.0NB_IOTenh2-Core
See details 36.1336129-B15.4.0Rel-15Introduction of WUS requirements for efeMTC Details R4-1815461 agreedRAN4#89Ericsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Core
See details 36.1336128-B15.4.0Rel-15Remaining work on minimum WUS reception requirements for NB-IoT Details R4-1815460 agreedRAN4#89Ericsson Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13361271B15.4.0Rel-15Introduction of enhanced PHR for category NB1 Details R4-1816057 agreedRAN4#89Ericsson Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13361242F15.4.0Rel-15Correction of references in CONNECTED mode requirements for category M1 Details R4-1816787 agreedRAN4#89Ericsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Core
See details 36.13361221B15.4.0Rel-15Cell re-selection test case for TDD Intra frequency case for UE category NB1 in in-band mode in enhanced coverage Details R4-1816060 agreedRAN4#89Ericsson Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13361211B15.4.0Rel-15Cell re-selection test case for TDD Inter- frequency case for UE category NB1 in in-band mode in enhanced coverage Details R4-1816059 agreedRAN4#89Ericsson Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13361201B15.4.0Rel-15TDD Intra-frequency RRC Re-establishment for UE category NB1 in In-Band mode under enhanced coverage Details R4-1816064 agreedRAN4#89Ericsson Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13361191B15.4.0Rel-15UE Timing advance adjustment test Test for category NB1 UE standalone under Enhanced coverage Details R4-1816070 agreedRAN4#89Ericsson Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13361181B15.4.0Rel-15UE Transmit Timing Accuracy Test for category NB1 UE In-Band in Enhanced coverage Details R4-1816069 agreedRAN4#89Ericsson Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13361151B15.4.0Rel-15UE Transmit Timing Accuracy Test for category NB1 UE In-Band in Normal coverage Details R4-1816068 agreedRAN4#89Ericsson Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13361141B15.4.0Rel-15TDD Inter-frequency RRC Re-establishment for UE category NB1 in In-Band mode under normal coverage Details R4-1816063 agreedRAN4#89Ericsson Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13361131B15.4.0Rel-15Cell re-selection test case for TDD Intra frequency case for UE category NB1 in in-band mode in normal coverage Details R4-1816058 agreedRAN4#89Ericsson Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13361081F15.4.0Rel-15Introducing enhanced utilization of CA and direct activation in HO Details R4-1816101 agreedRAN4#89Nokia, Nokia Sh... Details RP-182386 approvedRAN#82RAN415.5.0LTE_euCA-Core
See details 36.13361051F15.4.0Rel-15UE known dormant SCell condition Details R4-1816128 agreedRAN4#89Nokia, Nokia Sh... Details RP-182386 approvedRAN#82RAN415.5.0LTE_euCA-Core
See details 36.13361041B15.4.0Rel-15CR introducing Out-of-sync RLM test for NB-IoT TDD in enhanced coverage without DRX in guard band Details R4-1816078 agreedRAN4#89Nokia, Nokia Sh... Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13361031B15.4.0Rel-15CR introducing Out-of-sync RLM test for NB-IoT TDD in normal coverage without DRX in stand alone mode Details R4-1816077 agreedRAN4#89Nokia, Nokia Sh... Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13361021B15.4.0Rel-15CR introducing in-sync RLM test for NB-IoT TDD in enhanced coverage without DRX Details R4-1816076 agreedRAN4#89Nokia, Nokia Sh... Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13361011B15.4.0Rel-15CR introducing in-sync RLM test for NB-IoT TDD in normal coverage without DRX Details R4-1816075 agreedRAN4#89Nokia, Nokia Sh... Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13361001B15.4.0Rel-15CR introducing in-sync RLM test for NB-IoT TDD in enhanced coverage with DRX Details R4-1816074 agreedRAN4#89Nokia, Nokia Sh... Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13360991B15.4.0Rel-15CR introducing in-sync RLM test for NB-IoT TDD in normal coverage with DRX Details R4-1816073 agreedRAN4#89Nokia, Nokia Sh... Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13360981B15.4.0Rel-15CR introducing out-of-sync RLM test for NB-IoT TDD in enhanced coverage with DRX Details R4-1816072 agreedRAN4#89Nokia, Nokia Sh... Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13360971B15.4.0Rel-15CR introducing out-of-sync RLM test for NB-IoT TDD in normal coverage with DRX Details R4-1816071 agreedRAN4#89Nokia, Nokia Sh... Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.1336095-A15.4.0Rel-15Introduction of MSG3-based channel quality reporting test Details R4-1815238 agreedRAN4#89Ericsson Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh-Perf
See details 36.1336093-F15.4.0Rel-15Defining MG starting point in 36.133 Details R4-1815161 agreedRAN4#89Huawei, HiSilicon Details RP-182361 approvedRAN#82RAN415.5.0NR_newRAT-Perf
See details 36.13360921F15.4.0Rel-15CR on PSCell addition delay in TS36.133 Details R4-1816685 agreedRAN4#89Huawei, HiSilicon Details RP-182361 approvedRAN#82RAN415.5.0NR_newRAT
See details 36.13360891B15.4.0Rel-15Introducing principle for LTE UE connected to 5GC test cases Details R4-1816131 agreedRAN4#89Huawei, HiSilicon Details RP-182370 approvedRAN#82RAN415.5.0LTE_5GCN_connect
See details 36.1336087-A15.4.0Rel-15CR on NB random access test cases R15 Details R4-1815116 agreedRAN4#89Huawei, HiSilicon Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh-Perf
See details 36.13360791A15.4.0Rel-15CR on NRSRP accuracy applicability for UE Category NB1 and NB2 R15 Details R4-1816757 agreedRAN4#89Huawei, HiSilicon Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh-Core
See details 36.13360762F15.4.0Rel-15CR on TDD support in measurement accuracy requirements for NB-IoT Details R4-1816765 agreedRAN4#89Huawei, HiSilicon Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.1336075-F15.4.0Rel-15CR on TDD support in conditions for NB-IoT measurements Details R4-1815104 agreedRAN4#89Huawei, HiSilicon Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13360742B15.4.0Rel-15TDD idle inter-frequency RSTD measurement test case under enhanced coverage Details R4-1816566 agreedRAN4#89Huawei, HiSilicon Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13360732B15.4.0Rel-15TDD idle intra-frequency RSTD measurement test case under enhanced coverage Details R4-1816565 agreedRAN4#89Huawei, HiSilicon Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13360721B15.4.0Rel-15TDD inter-frequency RSTD measurement accuracy test case under enhanced coverage Details R4-1816082 agreedRAN4#89Huawei, HiSilicon Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13360711B15.4.0Rel-15TDD intra-frequency RSTD measurement accuracy test case under enhanced coverage Details R4-1816081 agreedRAN4#89Huawei, HiSilicon Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13360701B15.4.0Rel-15TDD inter-frequency RSTD measurement accuracy test case under normal coverage Details R4-1816080 agreedRAN4#89Huawei, HiSilicon Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13360691B15.4.0Rel-15TDD intra-frequency RSTD measurement accuracy test case under normal coverage Details R4-1816079 agreedRAN4#89Huawei, HiSilicon Details RP-182367 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13360681B15.4.0Rel-15TDD contention based random access test case on non-anchor carriers Details R4-1816067 agreedRAN4#89Huawei, HiSilicon Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13360671B15.4.0Rel-15TDD contention based random access test case under enhanced coverage Details R4-1816066 agreedRAN4#89Huawei, HiSilicon Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.13360661B15.4.0Rel-15TDD contention based random access test case under normal coverage Details R4-1816065 agreedRAN4#89Huawei, HiSilicon Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.1336065-B15.4.0Rel-15Introducing TDD NPRACH configuration for NB test cases Details R4-1815094 agreedRAN4#89Huawei, HiSilicon Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.1336062-F15.4.0Rel-15Corrections to generic CA RRM test cases for 6 and 7 DL CCs (Rel-15) Details R4-1814993 agreedRAN4#89Rohde & Schwarz Details RP-182388 approvedRAN#82RAN415.5.0TEI15
See details 36.1336061-F15.4.0Rel-15Corrections to generic CA RRM test cases up to 5 DL CCs (Rel-15) Details R4-1814992 agreedRAN4#89Rohde & Schwarz Details RP-182388 approvedRAN#82RAN415.5.0TEI15
See details 36.1336058-A15.4.0Rel-15Corrections to feMTC RRM test case A.8.1.28 (Rel-15) Details R4-1814989 agreedRAN4#89Rohde & Schwarz Details RP-182382 approvedRAN#82RAN415.5.0TEI13
See details 36.13360522F15.4.0Rel-15CR on updating requirement for BWP switching interruption in TS36.133 (Section 7.32.2.7) Details R4-1816586 agreedRAN4#89MediaTek inc. Details RP-182360 approvedRAN#82RAN415.5.0NR_newRAT-Core
See details 36.13360511A15.4.0Rel-15NB-IoT RSTD accuracy tests using Type 2 NPRS - Rel15 Details R4-1816570 agreedRAN4#89Qualcomm Incorp... Details RP-182384 approvedRAN#82RAN415.5.0NB_IOTenh
See details 36.1336044-F15.4.0Rel-15Correction to DL CA Activation and Deactivation Test cases Details R4-1814520 agreedRAN4#89ANRITSU LTD Details RP-182388 approvedRAN#82RAN415.5.0TEI15
See details 36.1336043-A15.4.0Rel-15Correction to FDD-FS3 Intra-frequency event triggered reporting in DRX Details R4-1814519 agreedRAN4#89ANRITSU LTD Details RP-182381 approvedRAN#82RAN415.5.0LTE_LAA-Perf
See details 36.1336040-F15.4.0Rel-15CR for correction on measurement gap sharing in EN-DC Details R4-1814463 agreedRAN4#89Samsung Details RP-182361 approvedRAN#82RAN415.5.0NR_newRAT
See details 36.1336039-B15.4.0Rel-15Inter-frequency FDD test cases for RSTD measurement period under new measurement gaps for CE Mode A Details R4-1814273 agreedRAN4#88-BisEricsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Perf
See details 36.13360384B15.4.0Rel-15CR for 36.133 on E-UTRAN measurement to support gap pattern 4, 6,7,8,10 (section 8.1.2.1, 8.1.2.3.1.2, 8.1.2.3.2.2, 8.17.3) Details R4-1816141 agreedRAN4#89CMCC, MediaTek,... Details RP-182362 approvedRAN#82RAN415.5.0NR_newRAT
See details 36.1336035-A15.4.0Rel-15Correction to RSTD measurement accuracy requirement in NB-IoT R15 Details R4-1813514 agreedRAN4#88-BisQualcomm Incorp... Details RP-182384 approvedRAN#82RAN415.5.0NB_IOTenh
See details 36.13360321B15.4.0Rel-15RRM test for dormant SCell Details R4-1814064 agreedRAN4#88-BisQualcomm Incorp... Details RP-182371 approvedRAN#82RAN415.5.0LTE_euCA
See details 36.1336030-A15.4.0Rel-15Correction to downlink channel quality reporting R15 Details R4-1813505 agreedRAN4#88-BisQualcomm Incorp... Details RP-182384 approvedRAN#82RAN415.5.0NB_IOTenh
See details 36.13360281F15.4.0Rel-15UE known dormant SCell condition and activation delay requirements for unknown dormant SCell Details R4-1814212 agreedRAN4#88-BisNokia, Nokia Sh... Details RP-182386 approvedRAN#82RAN415.5.0LTE_euCA-Core
See details 36.13360271B15.4.0Rel-15Introduction of OCNG patterns for NB-IoT TDD Details R4-1814211 agreedRAN4#88-BisEricsson Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.1336026-A15.4.0Rel-15CR 36.133 Correction of NB-IoT OCNG patterns Rel-15 Details R4-1813436 agreedRAN4#88-BisEricsson Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh-Perf
See details 36.1336024-A15.4.0Rel-15CR 36.133 Correction of references in OCNG patterns Rel-15 Details R4-1813434 agreedRAN4#88-BisEricsson Details RP-182379 approvedRAN#82RAN415.5.0TEI12
See details 36.13360171F15.4.0Rel-15CR 36.133 Inter-RAT and EN-DC SFTD measurement accuracy for FR2 Details R4-1815909 agreedRAN4#89Ericsson Details RP-182361 approvedRAN#82RAN415.5.0NR_newRAT-Perf
See details 36.1336001-A15.4.0Rel-15Correction to inter-frequency handover test case for UE category M1/M2 in CEModeB Details R4-1813101 agreedRAN4#88-BisEricsson Details RP-182383 approvedRAN#82RAN415.5.0LTE_feMTC-Perf
See details 36.1335987-F15.4.0Rel-15CR on interruption during DRX operation in TS 36.133 Details R4-1813036 agreedRAN4#88-BisHuawei, HiSilicon Details RP-182361 approvedRAN#82RAN415.5.0NR_newRAT
See details 36.13359833F15.4.0Rel-15Requirements for high velocity measurement for efeMTC Details R4-1816091 agreedRAN4#89Huawei, HiSilicon Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Core
See details 36.13359682F15.4.0Rel-15CR to 36.133 on SFTD measurement requirements (Section 8.17.2, 8.1.2.4.25) Details R4-1815910 agreedRAN4#89ZTE, MediaTek, ... Details RP-182360 approvedRAN#82RAN415.5.0NR_newRAT-Core
See details 36.13359671A15.4.0Rel-15Correction in RSTD measurement requirements Details R4-1813940 agreedRAN4#88-BisEricsson Details RP-182383 approvedRAN#82RAN415.5.0LTE_feMTC-Core
See details 36.13359651B15.4.0Rel-15Inter-frequency TDD test cases for RSTD measurement period under new measurement gaps for CE Mode A Details R4-1813681 agreedRAN4#88-BisEricsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Perf
See details 36.13359641B15.4.0Rel-15Inter-frequency HD-FDD test cases for RSTD measurement period under new measurement gaps for CE Mode A Details R4-1813680 agreedRAN4#88-BisEricsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Perf
See details 36.13359621B15.4.0Rel-15Intra-frequency TDD test cases for RSTD measurement period under new measurement gaps for CE Mode A Details R4-1813678 agreedRAN4#88-BisEricsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Perf
See details 36.13359611B15.4.0Rel-15Intra-frequency HD-FDD test cases for RSTD measurement period under new measurement gaps for CE Mode A Details R4-1813677 agreedRAN4#88-BisEricsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Perf
See details 36.13359602B15.4.0Rel-15Intra-frequency FDD test cases for RSTD measurement period under new measurement gaps for CE Mode A Details R4-1814272 agreedRAN4#88-BisEricsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Perf
See details 36.13359591F15.4.0Rel-15Applicability rules for UE supporting new gaps Details R4-1813675 agreedRAN4#88-BisEricsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Perf
See details 36.13359561F15.4.0Rel-15Addition of side condition for CGI reading delay for Rel-15 eFeMTC UE Details R4-1813672 agreedRAN4#88-BisEricsson Details RP-182365 approvedRAN#82RAN415.5.0LTE_eMTC4-Core
See details 36.13359551B15.4.0Rel-15RMC for NB-IoT TDD RRM test cases Details R4-1813939 agreedRAN4#88-BisEricsson Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh2-Perf
See details 36.1335954-A15.4.0Rel-15Finalize MSG3-based channel quality report for NB-IoT Details R4-1812812 agreedRAN4#88-BisEricsson Details RP-182366 approvedRAN#82RAN415.5.0NB_IOTenh-Core
See details 36.1335948-F15.4.0Rel-15CR on UE measurement capability with MOs configured by MN and SN in TS36.133 Details R4-1812137 agreedRAN4#88-BisIntel Corporation Details RP-182360 approvedRAN#82RAN415.5.0NR_newRAT-Core
See details 36.1335946-F15.4.0Rel-15Interuption requirements correction for EN-DC in 36.133 Details R4-1812104 agreedRAN4#88-BisEricsson Details RP-182360 approvedRAN#82RAN415.5.0NR_newRAT-Core